WO2023280125A1 - 射线成像系统以及射线成像方法 - Google Patents

射线成像系统以及射线成像方法 Download PDF

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Publication number
WO2023280125A1
WO2023280125A1 PCT/CN2022/103739 CN2022103739W WO2023280125A1 WO 2023280125 A1 WO2023280125 A1 WO 2023280125A1 CN 2022103739 W CN2022103739 W CN 2022103739W WO 2023280125 A1 WO2023280125 A1 WO 2023280125A1
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Prior art keywords
plane
detector
detector arm
projection
arm frame
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PCT/CN2022/103739
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English (en)
French (fr)
Inventor
张丽
孙运达
金鑫
梁午阳
赵振华
胡克敏
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Tsinghua University
Nuctech Co Ltd
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Tsinghua University
Nuctech Co Ltd
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Priority to EP22836876.7A priority Critical patent/EP4382896A4/en
Priority to US18/574,706 priority patent/US12566145B2/en
Publication of WO2023280125A1 publication Critical patent/WO2023280125A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing

Definitions

  • the present disclosure relates to object detection systems, and more particularly to radiographic systems and radiographic methods.
  • Radiography is a kind of radiography technology combined with computer digital image processing technology and ray radiation technology. It has the advantages of clear image quality, fast imaging speed, and low radiation dose, and is widely used in medical and security inspection fields. Its basic principle is that after the ray interacts with the object, due to the different physical properties of the object, the dose of the emitted ray reaching the detector is different. According to the detected ray signal, a radiography projection image can be formed.
  • the ray source and the detector are located in the same plane, which is perpendicular to the object transmission direction.
  • the detector is in the shape of a broken line, has a main detector arm frame and a non-main detector arm frame, and a ray source is arranged in a plane formed by the main detector arm frame and the non-main detector arm frame.
  • the arrangement that the ray source and the detector are located on the same plane may not be able to make full use of the ray source and the detector.
  • the radiation source and the detector need to be arranged in the same plane, there are also many restrictions on the design of the radiation imaging system.
  • the present disclosure provides a radiography system and a radiography method, aiming at at least solving at least one of the above-mentioned problems.
  • One mode related to the present disclosure is a radiation imaging system, which includes: a detector, the detector is installed on the detector arm frame, and the detector arm frame is formed in the first plane; and a radiation source, the radiation source and the first The planes are not coplanar.
  • the detector arm frame includes a first detector arm frame and at least one second detector arm frame on which the detector is installed.
  • an image processing device is further included, and the image processing device is based on the target point of the radiation source, the positions of the first detector arm frame and the second detector arm frame, the moving speed of the detected object, and the first The detection values of the detector arm frame and the second detector arm frame obtain corrected detection images.
  • the image processing device includes: a projection acquisition part, which acquires the projection of the target point and the second detector arm on a plane perpendicular to the first plane and the second plane, and the second plane is The plane formed by the target point and the first detector arm frame; the time deviation correction part obtains the angle between the first plane and the second plane by using the projection on the plane perpendicular to the first plane and the second plane, and calculates the angle between the first plane and the second plane according to the angle correcting the time deviation of the detection data due to the distance of the detected object from the first plane to the second plane in the conveying direction; The detected value is corrected for spatial deviation, and a final image of the detected object is generated based on the corrected detected value and the detected value of the first detector arm.
  • the time offset correction unit includes: an included angle calculation unit, which uses a vertical plane to calculate the included angle between the second detector arm frame and the projection detector arm frame, and the projection detector arm frame is The projection of the second detector arm frame on the second plane in the conveying direction of the detected object; the deviation ratio calculation part is calculated according to the included angle, the preset equivalent height of the detected object, and the moving speed of the detected object The ratio of the deviation distance between the detector of the second detector arm frame and its projection in the transport direction of the detected object to the reference deviation distance of the difference between the detector of the second detector arm frame of the equivalent height and its projection; and detection data
  • the correction unit corrects the time deviation of the time series of the acquired detection data according to the ratio and the time sampling period of the detection source, so as to obtain the corrected Time skew corrected data.
  • the spatial deviation correction unit projects the second detector arm frame onto the same straight line as the first detector arm frame again to obtain the final image of the detected object.
  • detection data at time points other than the sampling time are obtained by an interpolation method.
  • the interpolation method is one of the nearest neighbor interpolation method, linear interpolation method, and quadratic interpolation method.
  • multiple rows of detectors are included in different planes, and multiple second detector arms are located in the second plane.
  • the image processing device includes: a sampling point determination unit, which selects a row of detectors in the plurality of rows of detectors, and acquires the data from the first detector arm frame and the second detector arm frame of a row of detectors.
  • the image processing device includes: a projection point determination unit, which selects a row of detectors in the plurality of rows of detectors, and constitutes the first detector arm frame of the row of detectors at the target point of the radiation source In the projection plane of the second plane, any point in the projection plane that is located on the opposite side of the arm frame of the first detector relative to the second plane and has an intersection point with the second plane is obtained as a projection point; the intersection acquisition part obtains the target The intersection point of the connection line between the point and the projected point and the second plane; the projected point pixel value acquisition unit calculates the detected value of the intersection point according to the position of each detector pixel in the second plane and its detected value, as the detected value of the projected point; and a corrected image acquisition part, projecting the projected point onto the same straight line as the main detector arm frame again, and generating Corrected image of the detected object.
  • a projection point determination unit which selects a row of detectors in the plurality of rows of detectors, and constitutes the first detector arm frame of the row of
  • the detection value of the intersection point is obtained by an interpolation method.
  • the interpolation method is one of the nearest neighbor interpolation method, linear interpolation method, and quadratic interpolation method.
  • the farther the selected row of detectors is from the radiation source the larger the imaging range of the image of the object to be detected is.
  • the sampling points are equally spaced or randomly spaced.
  • the multiple rows of detectors have equal intervals or unequal intervals.
  • the detectors are arranged in a straight line or in an arc.
  • the first detector arm frame is a part on which a single detector is installed or a single module on which a plurality of linear detectors are installed.
  • the present disclosure also relates to a radiography method, which is used in the above-mentioned radiography system, comprising: a projection acquisition step, which acquires the distance between the target point and the second detector arm on a vertical plane perpendicular to the first plane and the second plane Projection, the second plane is the plane formed by the target point and the first detector arm frame; the time deviation correction step uses the projection on the vertical plane to obtain the angle between the first plane and the second plane, and corrects the detection data according to the angle Due to the time deviation generated by the distance of the detected object from the first plane to the second plane in the conveying direction; and the space deviation correction step, the detection value of the projection of each pixel on the second detector armrest on the second plane is carried out. The spatial deviation is corrected, and a final image of the detected object is generated based on the corrected detection value and the detection value of the first detector arm.
  • the time offset correction step includes: an included angle calculation step, using a vertical plane to calculate the included angle between the second detector arm frame and the projection detector arm frame, where the projection detector arm frame is The projection of the second detector arm frame on the second plane in the conveying direction of the detected object; the deviation ratio calculation step is calculated according to the included angle, the preset equivalent height of the detected object, and the moving speed of the detected object.
  • the time deviation of the time series of the detection data acquired is corrected according to the ratio and the time sampling period of the radiation source, so as to obtain the corrected Time skew corrected data.
  • the second detector arm is projected onto the same straight line as the first detector arm again to obtain a final image of the detected object.
  • the present disclosure also relates to a radiography method, which is used in the radiography system above, including: a sampling point determination step, selecting a row of detectors in multiple rows of detectors, and obtaining a row of detectors from the first detector arm and the second A plurality of sampling points on the extension line extended by the intersection point of the two detector arms; the intersection point acquisition step is to obtain the intersection of the target point of the ray source and a plurality of sampling points with the second plane respectively; the pixel value acquisition step of the sampling point , according to the position of each detector pixel in the second plane and the detection value thereof, obtain the detection value of multiple intersection points, as the detection value of multiple sampling points; and the image acquisition step, according to the detection value of multiple sampling points and the first The detected values of the detector on the detector arm generate an image of the detected object.
  • the present disclosure also relates to a radiography method, which is used in the above-mentioned radiography system, including: a step of determining the projection point projection, selecting a row of detectors among multiple rows of detectors, and selecting a row of detectors in a row of detectors, and selecting In the projection plane formed by a detector arm frame, any point in the projection plane located on the opposite side to the first detector arm frame relative to the second plane and having an intersection with the second plane is obtained as a projection point;
  • the intersection acquisition step is to acquire the intersection point of the connection line between the target point and the projection point and the second plane;
  • the projection point pixel value acquisition step is to obtain the detection value of the intersection according to the position of each detector pixel in the second plane and the detection value thereof, as the detection value of the projection point;
  • the correction image acquisition step the projection point is re-projected on the same straight line as the main detector arm frame, and according to the corrected detection value and the first detector arm frame of a row of detectors
  • a radiation imaging system capable of making full use of radiation sources and detectors is provided.
  • FIG. 1 is a schematic diagram of an example of a radiographic imaging system involved in the present disclosure
  • FIG. 2 is a schematic diagram of another example of a radiography system involved in the present disclosure
  • FIG. 3 is a structural diagram of a graphics processing device involved in Embodiment 1 of the present disclosure.
  • Fig. 4 is a schematic diagram of obtaining projections in the radiography system involved in the present disclosure
  • Fig. 5 is a schematic diagram of the non-detector projection arm frame, the projection non-detector arm frame and the ray source when viewed from the X-axis direction;
  • FIG. 6 is a flowchart of image processing of the radiographic imaging system according to Embodiment 1 of the present disclosure.
  • Fig. 7 is a schematic diagram showing that the multi-row detector arm frame and the target point are not coplanar with the detector installed;
  • Fig. 8 is a side view of the radiography system shown in Fig. 7 viewed from the X-axis direction;
  • FIG. 9 is a structural diagram of an image processing device of a radiographic imaging system according to Embodiment 2 of the present disclosure.
  • FIG. 10 is a flow chart of the image processing method of the radiographic imaging system according to Embodiment 2 of the present disclosure.
  • FIG. 11 is a structural diagram of an image processing device according to Embodiment 3 of the present disclosure.
  • FIG. 12 is a flowchart of an image processing method for the radiographic system according to the third embodiment.
  • the radiation imaging system involved in the present disclosure will be described in detail below with reference to FIG. 1 and FIG. 2 .
  • the radiation imaging system of the present disclosure includes: a detector installed on a detector arm frame formed in a first plane; and a radiation source not coplanar with the first plane.
  • FIG. 1 is a schematic diagram of an example of a radiographic imaging system involved in the present disclosure.
  • the radiation imaging system 100 includes a radiation source S and a detector L.
  • the detector L is installed on the main detector arm frame L1 and the non-main detector arm frame L2, and the main detector arm frame L1 and the non-main detector arm frame L2 form a plane P.
  • the ray source may be a distributed ray source or a ray target point source, and the following embodiments will be described by taking the ray target point source as an example.
  • the radiation source S is located outside the above-mentioned plane P, that is, the radiation source S and the detector L are located in different planes.
  • the object M to be inspected is an object to be inspected by ray scanning.
  • the rays emitted by the ray source S are vertically incident on the detector L or obliquely incident on the detector L, and are received by the detector L.
  • FIG. 2 is a schematic diagram of another example of a radiography system involved in the present disclosure.
  • the radiation imaging system 200 includes a radiation source Sd and a detector Ld.
  • the detector arm frame of the detector Ld is formed in an arc shape, the radiation source Sd is located outside the plane of the arc, and the radiation source Sd and the detector Ld are formed in different planes.
  • the selection of the main detector boom and the non-main detector boom is relative.
  • the rest of the detector booms are non-main detector booms.
  • L1 in Figure 1 is the main detector arm
  • L2 is the non-main detector arm
  • L2 can also be set as the main detector arm
  • L1 is the non-main detector arm.
  • one or more groups of detectors that are not coplanar with the radiation source can be added to the original radiography system, which can improve the utilization rate of the radiation source.
  • the image processing device in the above radiation imaging system will be described below.
  • the detection image directly obtained according to the set optical path is generally deformed and may be compressed or stretched.
  • the reason for this deformation is that there is a sudden change in the projection of the detector at the place where the booms are handed over.
  • the detection data of the detector can be re-projected onto the straight line where the main detector is located by means of known spatial geometry correction.
  • the image deformation of the detected object obtained according to the detection data cannot be corrected by means of spatial geometric correction.
  • the inventors of the present disclosure found that the reason is that the detected objects are not in the same perspective except in space In addition to the projection, there is also a certain delay in time. Therefore, the deformation problem of the detected object cannot be solved simply by two-dimensional spatial geometric correction.
  • the inventors of the present disclosure have solved the above-mentioned problems by performing corrections in space and time.
  • FIG. 3 is a schematic structural diagram of an image processing device according to Embodiment 1 of the present disclosure.
  • the image processing device obtains the corrected image according to the target point of the ray source, the position of the main detector arm and the non-main detector arm, the moving speed of the detected object, and the detection values of the main detector arm and the non-main detector arm. images of the detected object.
  • the image processing device 10 includes a projection acquisition unit 101 , a temporal deviation correction unit 102 , and a spatial deviation correction unit 103 .
  • Fig. 4 is a schematic diagram of obtaining projections in the radiography system involved in the present disclosure.
  • the radiography system in FIG. 4 is taken as an example for description.
  • the main detector boom L1 and the non-main detector booms L2 and L3 form a plane P, which is usually perpendicular to the ground (that is, the plane P is located in the plane formed by the X-axis and the Y-axis in the Cartesian coordinate system).
  • the radiation source Sa is located outside the plane P.
  • the ray source Sa and the main detector arm frame L1 form a plane P' other than the plane P.
  • the inventors of the present disclosure came up with the following solutions after discovering the above problems and their causes: project the non-main detector arm L2 onto the plane P', that is, project the non-main detector arm L2 into the In the plane P' constituted, thereby eliminating the above-mentioned time difference.
  • the projection acquisition unit 101 acquires the projections of the ray source Sa and the non-main detector arm bracket L2 (L3) on a plane perpendicular to both the plane P and the plane P', where the plane P' is the projection of the ray source Sa and the main detector The plane formed by the boom L1.
  • Fig. 5 is a schematic diagram of the non-main detector projection arm frame, the projection detector arm frame and the ray source viewed from the X-axis direction. The following description will be made with reference to FIG. 4 and FIG. 5 .
  • the plane P' is formed by the ray source Sa and the main detector arm support L1. Since the main detector arm L1 is located in the plane P', there is no need to process the detection value of the main detector L1, only the non-main detector arms L2 and L3 need to be projected onto the plane P' to eliminate the detected When the object W is transported along the direction Z perpendicular to the direction X and the direction Y, the detector in the main detector arm frame L1 and the detectors in the non-main detector arm frames L2 and L3 accept the radiation emitted by the ray source Sa Time difference.
  • the projection of the non-main detector arm L2 on the plane P' along the conveying direction of the detected object W is called the projection non-main detector arm L2', and the non-main detector arm L3 is projected on the plane P' along the conveying direction of the detected object W.
  • the projection on P' is called the projection.
  • the non-main detector arm is located at L3'.
  • the non-main detector arm frame L3 is taken as an example for illustration. Referring to FIG. , perpendicular to the ground, so here the non-main detector arm L3 and the projected non-main detector arm L3' constitute a plane perpendicular to the plane P and the plane P' respectively, and the projection of the ray source Sa on the intersecting plane is Sa '. That is, the plane perpendicular to the plane P and the plane P' is the plane formed by the projection Sa' of the ray source and the non-main detector arm support L3.
  • the time offset correction unit 102 uses the projection on the vertical plane to acquire the angle ⁇ between the plane P and the plane P′, and corrects the detection data according to the angle ⁇ .
  • the time offset due to the distance from plane P to plane P' in the transport direction Z.
  • the time deviation correction unit 102 includes an included angle calculation unit, a deviation ratio calculation unit, and a detection data correction unit.
  • the included angle calculation unit can calculate the size of the included angle ⁇ between the plane P and the plane P′ by using trigonometric functions as described above.
  • the distance Z0 is shown as a fixed value here, but since there may be deviations in actual conditions, the distance Z0 may also be shown as a variable parameter, which is determined according to the image correction effect.
  • the deviation ratio calculation part calculates the difference between the detectors on the non-main detector arm frame in the conveying direction of the detected object W according to the above-mentioned calculated angle, the equivalent height of the detected object, and the moving speed of the detected object.
  • the equivalent height Hb of the detected object W may be any height from the bottom height to the top height of the detected object.
  • the equivalent height refers to the vertical distance from a certain point of the detected object W to the following plane, which refers to the plane parallel to the coordinate XZ plane containing the ray source Sa. Therefore, the bottom height refers to the vertical distance between the bottom of the detected object W and the above-mentioned plane, and the top height refers to the vertical distance between the top of the detected object W and the above-mentioned plane.
  • the tangent function is used to obtain it here.
  • the angle between the non-main detector boom L3 and its projection is a small angle, such as less than 5 degrees, other trigonometric function values such as sine values or The angle itself is found.
  • the distance deviation Gi of the detected object W at the equivalent height Hb where Gi is the reference distance deviation.
  • the reference distance deviation Gi depends on the value of Hb. Therefore, in the transmission direction of the detected object W, the deviation Si between the detector of the non-main detector arm frame and its projection distance Si is the same as the reference distance deviation Gi of the detector of the non-main detector arm frame and its projection at the equivalent height Hb
  • the ratio Si/Gi detection data at time points other than the sampling time point may be obtained by an interpolation method.
  • the interpolation method can be one of nearest neighbor interpolation method, linear interpolation method and quadratic interpolation method.
  • the detection data correction unit for the time series of image data collected by the detectors in the non-main detector boom, according to the above-mentioned ratio Si/Gi and the time sampling period of the detectors
  • the time series of the detection data is corrected, so as to obtain the corrected time deviation corrected detection data. Therefore, the time deviation of the detection data is eliminated, and the detection data located on different planes are projected onto the same plane, in this embodiment, into the plane P'.
  • r(t) p*r(t-t1*T0)+(1-p)*r(t-t2*T0),
  • the ceil function represents the smallest integer greater than the corresponding value
  • the floor function represents the largest integer smaller than the corresponding value
  • r(t) p*r(t+t1*T0)+(1-p)*r(t+t2*T0),
  • the ceil function represents the smallest integer greater than the corresponding value
  • the floor function represents the largest integer smaller than the corresponding value
  • the sampling data r(t) can be delayed or advanced, thereby eliminating the deviation caused by the non-coplanarity of the detector and the ray source.
  • the above-mentioned processing is carried out for each detector on the arm of the non-main detector, so that the time deviation of the detection values of all the detectors on the arm of the non-main detector can be corrected. Since the main detector arm is in the plane P', there is no need to process the detection values of all the detectors on the main detector arm. In this way, the detection values of all detector pixels within the plane P' without time deviation can be acquired.
  • the projection imaging of the object W to be detected may be partially compressed or elongated.
  • the spatial deviation correcting unit 103 again projects the projected second detector arm frame projected onto the plane P' onto the same straight line as the main detector arm frame, thereby generating the final image of the detected object W.
  • the above processing it is possible to obtain the corrected image of the radiation imaging system when the radiation source and the detector are located in different planes, that is, not coplanar. Moreover, according to the above processing, the spatial and temporal deviations of the detection image of the detected object can be eliminated at the same time, and an accurate image of the detected object can be obtained.
  • FIG. 6 is a flowchart showing image processing applied to the radiographic imaging system of Embodiment 1 of the present disclosure.
  • step S11 the projection of the target point of the ray source and the non-main detector arm frame on the vertical plane is obtained.
  • the main detector arm frame and the non-main detector arm frame are equipped with detectors and are located in the first plane.
  • the point and the arm frame of the main detector form a second plane, and the vertical plane is perpendicular to the above-mentioned first plane and the second plane.
  • step S12 the included angle between the non-main detector arm frame and the projected detector arm frame of the projection on the second plane is calculated. The included angle is obtained by using the above-mentioned trigonometric function, which will not be repeated here.
  • step S13 the distance difference Gi between the pixels of the non-main detector arm frame at the equivalent height of the detected object and its projection on the conveying direction of the detected object is determined.
  • step S14 the distance difference Si between each pixel of the arm frame of the non-main detector and its projection on the conveying direction of the detected object is determined.
  • step S15 the ratio Si/Gi is determined.
  • step S16 time offset correction is performed on the collected image data according to the above-mentioned ratio.
  • step S17 the spatial deviation is corrected for the detected values of the projections of the pixels on the second plane on the non-main detector arms, and the final result is generated based on the corrected detection values and the detection values of the main detector arms. Image of the detected object.
  • Embodiment 2 of the image processing device of the radiographic imaging system of the present disclosure will be described with reference to 7 and 8 .
  • Embodiment 2 illustrates a radiation imaging system in the case where detectors and targets are not on the same plane and there are multiple rows of detector arms.
  • Fig. 7 is a schematic diagram showing a radiation imaging system in which the multi-row detector arm frame and the target point are not coplanar.
  • FIG. 8 is a side view of the radiation imaging system shown in FIG. 7 viewed from the X-axis direction.
  • the ray imaging system includes a ray source and multiple rows of detector arm frames that are not coplanar with the ray source and located on different planes, and each row of detector arm frames includes a main detector arm frame and a non-main detector arm frame.
  • the rays emitted by the ray source can be incident to the detector vertically or obliquely.
  • FIG. 9 is a structural diagram of an image processing device of a radiographic imaging system shown in Embodiment 2 of the present disclosure.
  • the sampling point determination unit 201 selects a row of detectors among multiple rows of detectors, and obtains the intersection point of the slave main detector arm frame and the non-main detector arm frame of a row of detectors A plurality of sampling points on the extended extension line;
  • the intersection point acquisition part 202 respectively obtains the intersection point of the plane formed by the connection line between the position of the ray source and the plurality of sampling points and the non-main detector arm frame;
  • the sampling point pixel value acquisition part 203 According to the position of each detector pixel in the plane formed by each non-main detector arm frame and the detection value thereof, the detection values of multiple intersection points are obtained as the detection values of multiple sampling points;
  • the image acquisition unit 204 according to multiple The detected values of the sampling points and the detected values of the detectors on the first detector arm support form a corrected image.
  • the radiography system in FIG. 7 includes a ray source S1 and a multi-row detector arm frame.
  • Each row of detector arms in the multi-row detector arms includes a main detector arm LB and a non-main detector arm LA.
  • the non-main detector arm frame LA constitutes the non-main detector plane Pa.
  • the sampling point determination unit 201 first selects a row of detector arms from the multiple rows of detector arms, here the outermost detector arm is selected, and obtains the slave main detector arms L and B of the row of detectors.
  • it is assumed that the plurality of sampling points X are equally spaced, but they may also be unequally spaced.
  • the intersection acquisition unit 202 respectively acquires intersection points when the line connecting the radiation source S1 and the sampling point X passes through a plane Pa, where the plane Pa is a plane where multiple rows of non-main detector arms are located. That is, according to the coordinates (sx, sy, sz) of the target point S1 of the ray source, the coordinates (xi, yi, zi) of the sampling point, and the plane Pa where the multi-row non-main detector arms are located, determine the marked x-ray and the plane Pa Intersection (xc,yc,zc).
  • the sampling point pixel value acquisition unit 203 calculates the detection values of multiple intersection points (xc, yc, zc) according to the position of each detector pixel in the plane Pa and its detection value, as the detection values of multiple sampling points.
  • the detection value at the position of the intersection point (xc, yc, zc) is obtained by interpolation, and the detection value is used as the projection of the intersection point (xc, yc, zc)
  • the reading of the point that is, the detection value of the sampling point X.
  • the interpolation method may be one of the nearest neighbor interpolation method, linear interpolation method, and quadratic interpolation method.
  • the image acquisition unit 204 forms an image of the detected object according to the detection values of multiple sampling points and the detection values of the detectors on the main detector arm LB.
  • the detection value of each row of detector arms can obtain an image of the detected object.
  • the farther the detector arm is from the ray source target the larger the imaging range of the detected object image.
  • the row where the detector arm is closest to the target of the ray source has the smallest imaging range of the detected object. Therefore, the appropriate detector arm can be selected according to the needs.
  • FIG. 10 is a flowchart of an image processing method of the radiographic imaging system according to Embodiment 2 of the present disclosure.
  • step S21 one row of detectors among the multiple rows of detectors is selected, and multiple sampling points on an extension line extending from the intersection of the main detector arm frame and the non-main detector arm frame of the row of detectors are acquired.
  • step S22 the intersection points of the line connecting the target point of the ray source and the plurality of sampling points with the plane formed by the arm frame of the non-main detector are obtained respectively.
  • step S23 according to the position of each detector pixel and its detection value in the plane formed by the non-main detectors, the detection values of the plurality of intersection points are obtained as the detection values of the plurality of sampling points.
  • step S24 an image of the detected object is formed according to the detection values of the plurality of sampling points and the detection values of the detectors on the main detector arm.
  • FIG. 11 is a configuration diagram of an image processing device shown in Embodiment 3 of the present disclosure.
  • the image processing device 30 includes a projection point specifying unit 301 instead of the sampling point specifying unit in the second embodiment.
  • the projection point determination unit 301 selects a row of detectors in multiple rows of detectors, and obtains a detector located at a position relative to the plane Pa in the projection plane formed by the target point of the ray source and the main detector arm frame of the selected row of detectors. Any point in the projection plane on the side opposite to the main detector arm frame LB that intersects with the plane Pa is taken as the projection point.
  • intersection point acquisition unit 302 and the sampling point pixel value acquisition unit 303 are the same as those of the intersection point acquisition unit 202 and the sampling point pixel value acquisition unit 203 in Embodiment 2, and will not be repeated here.
  • the corrected image acquisition unit 305 corrects the detected value of the projection point, and generates a corrected image of the detected object according to the corrected detected value and the detected value of the detectors on the main detector arm frame of the row of detectors. image. Since in the above projection, the non-main detector arm is projected into the projection plane, that is, projected into the plane formed by the target point and the main detector arm, according to Embodiment 1, this operation can eliminate the deviation in time. It is also necessary to further correct the spatial deviation of the detection data, which is the same as the method mentioned in Embodiment 1, and will not be repeated here.
  • FIG. 12 is a flowchart of an image processing method for the image processing apparatus shown in Embodiment 3.
  • step S31 select a row of detectors in multiple rows of detectors, and obtain the position relative to the non-main detector arm frame in the projection plane formed by the target point and the main detector arm frame of the row of detectors.
  • the second plane is located in the projection plane on the side opposite to the main detector arm frame, and any point of intersection of the second plane is used as the projection point.
  • step S32 the intersection point of the line connecting the ray source and the projection point with the plane formed by the arm frame of the non-main detector is obtained.
  • step S33 according to the position of each detector pixel in the plane formed by the non-main detector arm frame and its detection value, the detection value of the upper intersection point is obtained as the detection value of the projection point.
  • step S34 the detection value of the projection point is corrected, and the projection point is re-projected on the same straight line as the main detector arm frame, and according to the corrected detection value and the main detector arm frame of the row of detectors The detection values of the detectors on generate a corrected image of the detected object.
  • the image processing device in the radiography system has been described in detail above. But the present disclosure is not limited thereto.
  • the detector arm frame described in the above embodiments is described by taking a zigzag-shaped detector arm frame as an example, but it is not limited thereto, and may also be in the shape of an arc.
  • the choice of the main detector jib is not limited and can be arbitrary. After the main detector boom is determined, other detector booms are non-main detector booms.
  • the selection of the main detector arm frame is determined by one of the linearly arranged detector modules or one pixel.
  • the above-mentioned detectors are described by taking an unclosed arrangement as an example, but they may also be arranged in a closed arrangement.
  • the non-coplanar distribution of multiple detector arm frames for a single light source is used as an example to illustrate, but it can also be a structure with multiple light sources and a single detector arm frame, or multiple light sources corresponding to multiple The structure of the detector arm.
  • the radiation target point source is taken as an example for description, but there may also be multiple radiation sources, such as distributed radiation sources and traditional optical machines. Such an arrangement is beneficial to reduce the space and improve the utilization rate of the light source and the detector.
  • processors may be, but are not limited to, general purpose processors, special purpose processors, application specific processors, or field programmable logic circuits. It can also be understood that each block in the block diagrams and/or flowcharts and combinations of blocks in the block diagrams and/or flowcharts can also be realized by dedicated hardware for performing specified functions or actions, or can be implemented by dedicated hardware and Combination of computer instructions to achieve.

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Abstract

射线成像系统以及射线成像方法。射线成像系统包括：探测器(L)，探测器(L)安装于多个探测器臂架(L1，L2)上，多个探测器臂架(L1，L2)形成在第一平面(P)内；以及射线源(S)，射线源(S)与第一平面(P)不共面。射线成像系统还包括图像处理装置(10)。

Description

射线成像系统以及射线成像方法
相关申请的交叉引用
本公开要求享有于2021年07月07日提交的名称为“射线成像系统以及射线成像方法”的中国专利申请202110768526.4的优先权，该申请的全部内容通过引用并入本文中。
技术领域
本公开涉及物品检测系统，更具体地涉及射线成像系统以及射线成像方法。
背景技术
射线成像技术(digital radiography，DR)是计算机数字图像处理技术与射线放射技术相结合的一种射线成像技术。它具有图像质量清晰、成像速度快、辐射量小等优点，被广泛应用在医疗和安检领域。它的基本原理是射线与物体相互作用之后，由于物体的物理性质不同，出射的射线达到探测器的剂量就不同。根据探测到的射线信号，便可以形成一幅射线成像投影图像。
通常的射线成像系统，射线源与探测器位于相同平面内，该平面与物体传送方向垂直。例如，探测器为折线状，具有主探测器臂架和非主探测器臂架，在主探测器臂架和非主探测器臂架构成的平面内，设置有射线源。
但是，该射线源与探测器位于相同平面的设置存在无法充分利用射线源和探测器的情况。另外，由于需要将射线源与探测器布置在相同平面内，因此在射线成像系统的设计上也存在较多的限制。
发明内容
本公开提供了一种射线成像系统以及射线成像方法，其目的在于 至少解决的上述至少一个问题。
本公开涉及的一个方式是一种射线成像系统，其中，包括：探测器，探测器安装于探测器臂架上，探测器臂架形成在第一平面内；以及射线源，射线源与第一平面不共面。
在上述方式的射线成像系统中，探测器臂架包括安装探测器的第一探测器臂架和至少一个第二探测器臂架。
在上述方式的射线成像系统中，还包括图像处理装置，图像处理装置根据射线源的靶点、第一探测器臂架和第二探测器臂架的位置、被检测物的移动速度以及第一探测器臂架和第二探测器臂架的检测值获取校正后的检测图像。
在上述方式的射线成像系统中，图像处理装置包括：投影获取部，其获取靶点、第二探测器臂架在与第一平面和第二平面的垂直的平面上的投影，第二平面是靶点与第一探测器臂架构成的平面；时间偏差校正部，利用与第一平面和第二平面垂直的平面上的投影获取第一平面与第二平面的夹角，并根据夹角来校正检测数据由于被检测物在传送方向上从第一平面到第二平面的距离而产生的时间偏差；以及空间偏差校正部，对第二探测器臂架上各像素在第二平面的投影的检测值进行空间偏差的校正，并基于校正后的检测值与第一探测器臂架的检测值生成最终的被检测物的图像。
在上述方式的射线成像系统中，时间偏差校正部包括：夹角计算部，利用垂直平面计算第二探测器臂架与投影探测器臂架之间的夹角，投影探测器臂架是在被检测物的运送方向上第二探测器臂架在第二平面上的投影；偏差比例计算部，根据夹角、预先设定的被检测物的等效高度、被检测物的移动速度，计算在被检测物的运送方向上第二探测器臂架的探测器与其投影相差的偏差距离相对于等效高度的第二探测器臂架的探测器与其投影相差的参考偏差距离的比例；以及检测数据校正部，针对第二探测器臂架中的探测器采集的检测数据的时间序列，根据比例以及探测源的时间采样周期对获取的检测数据的时间序列的时间偏差进行校正，从而得到校正后的时间偏差校正数据。
在上述方式的射线成像系统中，空间偏差校正部再次将投影第二探测 器臂架投影到与第一探测器臂架相同的直线上，获取最终的被检测物的图像。
在上述方式的射线成像系统中，通过插值法获取采样时间以外的时间点的检测数据。
在上述方式的射线成像系统中，插值法为最邻近插值法、线性插值法、二次插值法中的一种。
在上述方式的射线成像系统中，包含位于不同平面的多排探测器，多个第二探测器臂架位于第二平面内。
在上述方式的射线成像系统中，图像处理装置包括：采样点确定部，选择多排探测器中一排探测器，获取一排探测器的从第一探测器臂架与第二探测器臂架的交点延伸的延长线上的多个采样点；交点获取部，分别获取射线源的靶点与多个采样点的连线同第二平面的交点；采样点像素值获取部，根据第二平面中各探测器像素的位置及其检测值求出多个交点的检测值，作为多个采样点的检测值；以及图像获取部，根据多个采样点的检测值与第一探测器臂架上的探测器的检测值生成被检测物的图像。
在上述方式的射线成像系统中，图像处理装置包括：投影点确定部，选择多排探测器中的一排探测器，在射线源的靶点与一排探测器的第一探测器臂架构成的投影平面中，获取处于相对于第二平面而位于与第一探测器臂架相反侧的投影平面中的、且与第二平面存在交点的任意一点，作为投影点；交点获取部，获取靶点与投影点的连线同第二平面的交点；投影点像素值获取部，根据第二平面中各探测器像素的位置及其检测值求出交点的检测值，作为投影点的检测值；以及校正图像获取部，将投影点再次投影到与主探测器臂架相同的直线上，并根据校正后的检测值与一排探测器的第一探测器臂架上的探测器的检测值生成校正后的被检测物的图像。
在上述方式的射线成像系统中，通过插值法获取交点的检测值。
在上述方式的射线成像系统中，插值法为最邻近插值法、线性插值法、二次插值法中的一种。
在上述方式的射线成像系统中，所选择的一排探测器距离射线源越远，被检测物的图像的成像范围越大。
在上述方式的射线成像系统中，采样点是等间隔的或者是任意间隔的。
在上述方式的射线成像系统中，多排探测器的之间具有相等的间隔或不相等的间隔。
在上述方式的射线成像系统中，探测器为直线状排布或呈弧状排布。
在上述方式的射线成像系统中，在探测器呈弧状排布时，第一探测器臂架是安装有单个探测器的部分或者是安装有呈直线的多个探测器的单个模块。
本公开还涉及一种射线成像方法，用于上述的射线成像系统，包括：投影获取步骤，其获取靶点与第二探测器臂架在垂直于第一平面和第二平面的垂直平面上的投影，第二平面是靶点与第一探测器臂架构成的平面；时间偏差校正步骤，利用垂直平面上的投影获取第一平面与第二平面的夹角，并根据夹角来校正检测数据由于被检测物在传送方向上从第一平面到第二平面的距离而产生的时间偏差；以及空间偏差校正步骤，对第二探测器臂架上各像素在第二平面的投影的检测值进行空间偏差的校正，并基于校正后的检测值与第一探测器臂架的检测值生成最终的被检测物的图像。
在上述方式的射线成像方法中，时间偏差校正步骤包括：夹角计算步骤，利用垂直平面计算第二探测器臂架与投影探测器臂架之间的夹角，投影探测器臂架是在被检测物的运送方向上第二探测器臂架在第二平面上的投影；偏差比例计算步骤，根据夹角、预先设定的被检测物的等效高度、被检测物的移动速度，计算在被检测物的传送方向上第二探测器臂架的探测器与其投影相差的偏差距离相对于等效高度的第二探测器臂架的探测器与其投影相差的参考偏差距离的比例；以及检测数据校正步骤，针对第二探测器臂架中的探测器采集的检测数据的时间序列，根据比例以及射线源的时间采样周期对获取的检测数据的时间序列的时间偏差进行校正，从而得到校正后的时间偏差校正数据。
在上述方式的射线成像方法中，在空间偏差校正步骤中，再次将投影第二探测器臂架投影到与第一探测器臂架相同的直线上，获取最终的被检测物的图像。
本公开还涉及一种射线成像方法，用于上述射线成像系统，包括：采 样点确定步骤，选择多排探测器中一排探测器，获取一排探测器的从第一探测器臂架与第二探测器臂架的交点延伸的延长线上的多个采样点；交点获取步骤，分别获取射线源的靶点与多个采样点的连线同第二平面的交点；采样点像素值获取步骤，根据第二平面中各探测器像素的位置及其检测值求出多个交点的检测值，作为多个采样点的检测值；以及图像获取步骤，根据多个采样点的检测值与第一探测器臂架上的探测器的检测值生成被检测物的图像。
本公开还涉及一种射线成像方法，用于上述射线成像系统，包括：投影点投影确定步骤，选择多排探测器中的一排探测器，在射线源的靶点与一排探测器的第一探测器臂架构成的投影平面中，获取处于相对于第二平面而位于与第一探测器臂架相反侧的投影平面中的、且与第二平面存在交点的任意一点，作为投影点；交点获取步骤，获取靶点与投影点的连线同第二平面的交点；投影点像素值获取步骤，根据第二平面中各探测器像素的位置及其检测值求出交点的检测值，作为投影点的检测值；以及校正图像获取步骤，将投影点再次投影到与主探测器臂架相同的直线上，并根据校正后的检测值与一排探测器的第一探测器臂架上的探测器的检测值生成校正后的被检测物的图像。
根据本公开，提供能够充分利用射线源与探测器的射线成像系统。另外，提供能够不受设计空间的限制来进行设计的射线成像系统。
附图说明
图1是本公开涉及的一例射线成像系统的示意图；
图2是本公开涉及的另一例射线成像系统的示意图；
图3是本公开实施例1所涉及的图形处理装置的结构图；
图4是本公开涉及的射线成像系统中获取投影的示意图；
图5是从X轴方向观察时的非探测器投影臂架与投影非探测器臂架以及射线源的概略示意图；
图6是本公开实施例1所涉及的射线成像系统的图像处理的流程图；
图7是示出安装有探测器的多排探测器臂架与靶点不共面的射线成像 系统的示意图；
图8是从X轴方向观察图7所示的射线成像系统的侧视图；
图9是本公开实施例2所涉及的射线成像系统的图像处理装置的结构图；
图10是本公开实施例2所涉及的射线成像系统的图像处理方法的流程图；
图11是本公开实施例3所涉及的图像处理装置的结构图；
图12是对实施例3所涉及的射线成像系统的图像处理方法的流程图。
具体实施方式
下面将详细描述本公开的各个方面的特征和示例性实施例，为了使本公开的目的、技术方案及优点更加清楚明白，以下结合附图及具体实施例，对本公开进行进一步详细描述。应理解，此处所描述的具体实施例仅被配置为解释本公开，并不被配置为限定本公开。对于本领域技术人员来说，本公开可以在不需要这些具体细节中的一些细节的情况下实施。下面对实施例的描述仅仅是为了通过示出本公开的示例来提供对本公开更好的理解。
下面参照图1和图2，来详细本公开涉及的射线成像系统。本公开的射线成像系统包括：探测器，探测器安装于探测器臂架上，探测器臂架形成在第一平面内；以及射线源，射线源与第一平面不共面。
图1是本公开涉及的一例射线成像系统的示意图。射线成像系统100包括射线源S和探测器L。探测器L安装于主探测器臂架L1和非主探测器臂架L2，主探测器臂架L1和非主探测器臂架L2构成平面P。射线源可以是分布式射线源也可以是射线靶点源，下面的实施例以射线靶点源为例来进行说明。射线源S位于上述平面P之外，即射线源S与探测器L位于不同的平面中。被检测物M为要通过射线扫描而被进行检测的物体。射线源S射出的射线垂直入射到探测器L或者倾斜入射到探测器L，并由探测器L接收。
图2是本公开涉及的另一例射线成像系统的示意图。射线成像系统200包括射线源Sd和探测器Ld。探测器Ld的探测器臂架形成为弧形，射线源 Sd位于弧形所在的平面以外，射线源Sd与探测器Ld为位于不同平面的构成。
这里，主探测器臂架与非主探测臂架的选择是相对的，在某探测器臂架被选为主探测器臂架时，其余的探测器臂架均为非主探测器臂架。例如图1中的L1为主探测器臂架，L2为非主探测器臂架，但是根据需要也可以设定L2为主探测器臂架，而L1为非主探测器臂架。
因此，在为了更清楚地形成被检测物的图像时，可以在原有的射线成像系统中增加一组或多组与射线源不共面的探测器，能够提高射线源的利用率。
另外，通过上述设置，在射线成像系统的安装空间有限时，不要求将探测器与射线源设置在相同的平面内，而可以将射线源偏离探测器所在的平面设置，提高了射线成像系统的设计的自由度。
下面对上述射线成像系统中的图像处理装置进行说明。在折线状或弧状探测器与射线源位于相同平面的情况下，根据该设置的光路直接获得的检测图像一般情况来说是有形变的，会发生被压缩或被拉伸的情况。该形变的原因在于探测器在臂架交接的地方出现了投影的突变。在出现该问题时，可以通过已知的空间几何校正的方式，将探测器的检测数据重新投影到主探测器所在的直线上。但是在本公开的射线成像系统中，根据检测数据而获得的被检测物的图像变形无法通过空间几何校正方式得到校正，本公开发明人发现其原因在于被检测物除了在空间上不是相同的视角投影外，在时间上也有一定的延迟，因此，单纯的通过二维空间几何校正是解决不了被检测物的形变问题的。本公开的发明人通过空间和时间上的进行校正而解决了上述问题。
实施例1
图3是本公开实施例1涉及的图像处理装置的结构示意图。图像处理装置根据射线源的靶点、主探测器臂架和非主探测器臂架的位置、被检测物的移动速度以及主探测器臂架和非主探测器臂架的检测值获取校正后的被检测物的图像。图像处理装置10包括投影获取部101、时间偏差校正部102以及空间偏差校正部103。
图4是本公开涉及的射线成像系统中获取投影的示意图。以图4的射线成像系统为例来进行说明。主探测器臂架L1与非主探测器臂架L2、L3构成平面P，该平面P通常垂直于地面(即平面P位于直角坐标系中X轴与Y轴构成的平面)。射线源Sa位于平面P以外。该射线源Sa与主探测器臂架L1构成平面P以外的平面P’，被检测物W在沿传送方向(即垂直于X方向和Y方向的Z方向)移动时，经过平面P和平面P’时接受射线存在时间差，由于该时间差而检测图像会发生弯折。因此为了消除该弯折，需要消除该时间差所带来的偏差。因此，本公开的发明人在发现上述问题及其原因后想到了以下解决办法：将非主探测器臂架L2投影到平面P’中，即投影到由射线源S和主探测器臂架L1构成的平面P’中，从而消除上述时间差。
首先，投影获取部101获取射线源Sa、非主探测器臂架L2(L3)在与平面P和平面P’均垂直的平面上的投影，其中，平面P’是射线源Sa与主探测器臂架L1构成的平面。
图5是从X轴方向观察时的非主探测器投影臂架与投影探测器臂架以及射线源的概略示意图。下面参照图4和图5进行说明。
在确定投影时，由射线源Sa与主探测器臂架L1构成平面P’。由于主探测器臂架L1位于该平面P’内，所以不需要对主探测器L1的检测值进行处理，仅需要将非主探测器臂L2和L3投影到平面P’中，以消除被检测物W沿垂直于方向X和方向Y的方向Z传送时的、主探测器臂架L1中的探测器与非主探测器臂架L2和L3中的探测器的接受射线源Sa发出的射线的时间差。非主探测器臂架L2沿被检测物W传送方向在平面P’上的投影称为投影非主探测器臂架L2’，非主探测器臂架L3沿被检测物W的传送方向在平面P’上的投影称为投影非主探测器臂架位于L3’。这里，以非主探测器臂架L3为例进行说明，参照图4，由于主探测器臂架L1与非主探测器臂架L2(L3)构成的平面通常设置为与坐标XY平面平行，即，垂直于地面的，因此这里非主探测器臂架L3与投影非主探测器臂架L3’构成分别与平面P和平面P’垂直的平面，射线源Sa在该相交平面上的投影为Sa’。即，与平面P和平面P’均垂直的平面为由射线源的投影Sa’与非主探测器 臂架L3构成的平面。
由此在投影获取部101获取投影后，时间偏差校正部102利用垂直平面上的投影获取平面P与平面P’的夹角α，并根据该夹角α来校正检测数据由于被检测物W在传送方向Z上从平面P到平面P’的距离而产生的时间偏差。
具体地，时间偏差校正部102包括夹角计算部、偏差比例计算部以及检测数据校正部。
由于射线成像系统安装后，探测器臂架与射线源之间的位置关系固定，因此在垂直平面上射线源投影Sa’到非主探测器L2的延长线的距离Z0以及非主探测器臂架方向上的H0的距离是已知的，夹角计算部能够以及上述利用三角函数求出平面P与平面P’的夹角α的大小。
Figure PCTCN2022103739-appb-000001
可选地，这里距离Z0作为固定值示出，但是由于实际情况可能存在偏差，因此距离Z0也可以作为可变参数示出，根据图像校正效果来进行确定。
接着，偏差比例计算部根据上述计算出的夹角、被检测物的等效高度、被检测物的移动速度，计算在被检测物W的传送方向上非主探测器臂架上的探测器与其投影相差的距离相对于等效高度的非主探测器臂架的探测器与其投影相差的距离的比例。
这里，被检测物W的等效高度Hb可以是被检测物的底部高度到顶部高度的任意高度。这里，等效高度是指被检测物W的某一点到以下平面垂直距离，该平面是指包含射线源Sa的、与坐标XZ平面平行的平面。因此，底部高度指的是被检测物W的底部距离上述平面的垂直距离，顶部高度指的是被检测物W的顶部距离上述平面的垂直距离。
在α已知的情况下，根据非主探测器臂架L3上的每个探测器像素的位置而Hi是确定的，因此能够求出非主探测器臂架L3的每个探测器像素i在被检测物W传送方向上到投影平面P’的距离偏差Si。
Si＝Hi*tanα
可选地，这里利用了正切函数求出，但是，当非主探测器臂架L3与其 投影的夹角为小角度时，例如为5度以下时，也可以通过正弦值等其他三角函数值或者角度本身求出。
并且，确定被检测物W在等效高度Hb处的距离偏差Gi，这里Gi为参考距离偏差。在传送速度固定的情况下，参考距离偏差Gi依赖于Hb的数值。从而能够计算出在被检测物W的传送方向上，非主探测器臂架的探测器与其投影距离偏差Si同等效高度Hb处的非主探测器臂架的探测器与其投影的参考距离偏差Gi的比例Si/Gi。此时，可以通过插值法求出采样时间点以外的时间点的检测数据。该插值法可以最邻近插值法、线性插值法、二次插值法中的一种。
在获取上述比例Si/Gi的情况下，检测数据校正部针对非主探测器臂架中的探测器采集的图像数据的时间序列，根据上述比例Si/Gi以及探测器的时间采样周期对获取的检测数据的时间序列进行校正，从而得到校正后的时间偏差校正检测数据。从而，消除了检测数据在时间上存在的偏差，把位于不同平面的检测数据投影到相同平面中，在本实施例中，投影到平面P’中。
假设探测器i在时间方向上读数为r(t)，时间采样周期是T0。
在探测器i处数据相对于主探测器臂架数据延迟时，假设t1＝ceil(Si/Gi)，t2＝floor(Si/Gi)，p＝Si/Gi-t2，则
r(t)＝p*r(t-t1*T0)+(1-p)*r(t-t2*T0)，
其中ceil函数表示大于对应值的最小整数，floor函数表示小于对应值的最大整数。
在探测器i处数据相对于主探测器臂架数据提前时，t1＝ceil(Si/Gi)，t2＝floor(Si/Gi)，p＝Si/Gi-t2，则
r(t)＝p*r(t+t1*T0)+(1-p)*r(t+t2*T0)，
其中ceil函数表示大于对应值的最小整数，floor函数表示小于对应值的最大整数。
通过上述处理，能够对采样数据r(t)进行延迟或提前，从而消除由于探测器与射线源不共面而导致的偏差。
对于非主探测器臂架上的每一个探测器都进行上述的处理，从而能够 对非主探测器臂架上的所有探测器的检测值的时间偏差进行校对。主探测器臂架由于处于平面P’内，所以不需要对主探测器臂架上的所有探测器的检测值进行处理。这样，可以获取在平面P’内的没有时间偏差的所有探测器像素的检测值。
此时，由于探测器在臂架交接的地方出现了投影的突变，对被检测物W的投影成像可能存在部分压缩或者伸长的情况。该情况下，空间偏差校正部103再次将投影到平面P’的投影第二探测器臂架投影到与主探测器臂架相同的直线上，从而生成最终的被检测物W的图像。
关于该空间校正技术可以采用公知技术，这里不再赘述。
通过上述处理，能够获取针对射线源与探测器分处于不同平面、即不共面时的射线成像系统的校正图像。并且，根据上述处理，能够同时消除了被检测物的探测图像在空间和时间上的偏差，获取了准确的被检测物的图像。
图6是示出应用于本公开实施例1的射线成像系统的图像处理的流程图。
在步骤S11中，获取射线源的靶点、非主探测器臂架在垂直平面上的投影，主探测器臂架与非主探测器臂架安装有探测器，并位于第一平面内，靶点与主探测器臂架构成第二平面，该垂直平面垂直于上述第一平面和第二平面。在步骤S12中，计算非主探测器臂架与其在第二平面上的投影的投影探测器臂架之间的夹角。利用上述的三角函数求出该夹角，这里不再赘述。在步骤S13中，确定被检测物等效高度处非主探测器臂架的像素与其投影在被检测物传送方向上的距离差Gi。在步骤S14中，确定非主探测器臂架的每个像素与其投影在被检测物传送方向上的距离差Si。在步骤S15中，确定Si/Gi的比值。在步骤S16中，根据上述比值对采集的图像数据进行时间偏差校正。在步骤S17中，对非主探测器臂架上各像素在第二平面上的投影的检测值进行空间偏差的校正，并基于校正后的检测值与主探测器臂架的检测值生成最终的被检测物的图像。
上面对射线成像处理的图像处理方法进行了描述，其细节可参考对装置的描述。
实施例2
下面，参照7和8对本公开的射线成像系统的图像处理装置的实施例2进行说明。
该实施例2示出针对探测器和靶点不在一个平面的存在多排探测器臂架的情况下的射线成像系统进行说明。图7是示出安装有探测器的多排探测器臂架与靶点不共面的射线成像系统的示意图。图8是从X轴方向观察图7所示的射线成像系统的侧视图。
射线成像系统包括射线源和与该射线源不共面的、位于不同平面的多排探测器臂架，每排探测器臂架包含主探测器臂架与非主探测器臂架。射线源发出的射线可以是垂直入射到探测器，也可以是倾斜入射到探测器。
图9是本公开实施例2所示的射线成像系统的图像处理装置的结构图。根据本实施例2的图像处理装置20，包括采样点确定部201，选择多排探测器中一排探测器，获取一排探测器的从主探测器臂架与非主探测器臂架的交点延伸的延长线上的多个采样点；交点获取部202，分别获取射线源位置与多个采样点的连线同非主探测器臂架构成的平面的交点；采样点像素值获取部203，根据各非主探测器臂架构成的平面中各探测器像素的位置及其检测值求出多个交点的检测值，来作为多个采样点的检测值；以及图像获取部204，根据多个采样点的检测值与第一探测器臂架上的探测器的检测值形成校正后的图像。
下面参照图7和图8进行详细说明。图7的射线成像系统包括射线源S1和多排探测器臂架。多排探测器臂架的每排探测器臂架分别包括主探测器臂架LB和非主探测器臂架LA。非主探测器臂架LA构成非主探测器平面Pa。
采样点确定部201首先从多排探测器臂架中选择一排探测器臂架，这里选择了最外侧的探测器臂架，并获取该一排探测器的从主探测器臂架L B与非主探测器臂架LA的交点延伸的延长线LB’上的多个采样点X，其坐标为(xi,yi,zi)，i＝1、2、3、……。这里，假设多个采样点X为等间隔的，但是也可以为不等间隔的。
交点获取部202分别获取射线源S1与采样点X的连线而经过平面Pa 时的交点，该平面Pa是多排非主探测器臂架所在的平面。即，根据射线源的靶点S1的坐标(sx,sy,sz)、采样点坐标(xi,yi,zi)以及多排非主探测器臂架所在的平面Pa，确定标记x射线与平面Pa交点(xc,yc,zc)。
采样点像素值获取部203根据平面Pa中各探测器像素的位置及其检测值求出多个交点(xc,yc,zc)的检测值，来作为多个采样点的检测值。这里，依据平面Pa内各个探测器像素的检测值以及相应的坐标，插值求出交点(xc,yc,zc)位置处的检测值，该检测值就作为交点(xc,yc,zc)的投影点的读数，即采样点X的检测值。这里，插值法可以为最邻近插值法、线性插值法、二次插值法中的一种。
图像获取部204根据多个采样点的检测值与主探测器臂架LB上的探测器的检测值形成被检测物的图像。
由此，由于将不同平面的检测数据投影到相同主探测器臂架及其延长线上，因此所获取的数据准确度高，所生成的图像更加清晰。
在探测器臂架的选择上，每一排探测器臂架的检测值都可以得到一幅被检测物图像，探测器臂架距离射线源靶点越远，被检测物图像成像范围越大。探测器臂架距离射线源靶点最近的那一排，被检测物成像范围最小。因此，可以根据需要选择适当的探测器臂架。
通过上述选择，在具有多排探测器的情况下，也能够获取校正后的准确的被检测物的图像。
下面参照图10对本实施例2涉及的射线成像系统的图像处理方法进行说明。图10是本公开实施例2的射线成像系统的图像处理方法的流程图。在步骤S21中，选择多排探测器中一排探测器，获取该一排探测器的从主探测器臂架与非主探测器臂架的交点延伸的延长线上的多个采样点。在步骤S22中，分别获取射线源的靶点与多个采样点的连线同非主探测器臂架构成的平面的交点。在步骤S23中，根据非主探测器构成的平面中各探测器像素的位置及其检测值求出多个上述交点的检测值，来作为多个采样点的检测值。在步骤S24中，根据多个采样点的检测值与主探测器臂架上的探测器的检测值形成被检测物的图像。关于图像处理方法的细节可参考上述对图像处理装置的说明。
实施例3
实施例3的摄像成像系统的结构与实施例2相同，不同点仅在于图像处理装置的处理。在上述实施例2中，直接获取主探测器臂架上的采样点，并将作为投影点而获取其对应的检测值。图11是本公开实施例3所示的图像处理装置的结构图。在图像处理装置30中，代替实施例2中的采样点确定部而具有投影点确定部301。投影点确定部301选择多排探测器中一排探测器，在射线源的靶点与所选择的一排探测器的主探测器臂架构成的投影平面中，获取处于相对于平面Pa而位于与主探测器臂架LB相反侧的投影平面中的、且与平面Pa存在交点的任意一点，作为投影点。
交点获取部302与采样点像素值获取部303与实施例2中的交点获取部202、采样点像素值获取部203所进行的动作相同，这里不再进行赘述。
最后，校正图像获取部305对投影点的检测值进行校正，并根据校正后的检测值与该一排探测器的主探测器臂架上的探测器的检测值生成校正后的被检测物的图像。由于在上述投影中，非主探测器臂架上被投影到投影平面中，即投影到靶点与主探测器臂架所构成的平面中，根据实施例1可知，该操作能够消除检测数据在时间上的偏差。还需要对检测数据进一步进行空间偏差校正，这与实施例1提及的方法相同，这里不再赘述。
图12是对实施例3所示的图像处理装置的图像处理方法的流程图。在步骤S31中，选择多排探测器中的一排探测器，在靶点与该一排探测器的主探测器臂架构成的投影平面中，获取处于相对于非主探测器臂架构成的第二平面而位于与主探测器臂架相反侧的投影平面中的、且该第二平面存在交点的任意一点，作为投影点。在步骤S32中，获取射线源与投影点的连线同非主探测器臂架构成的平面的交点。在步骤S33中，根据非主探测器臂架构成的平面中各探测器像素的位置及其检测值求出上交点的检测值，作为投影点的检测值。在步骤S34中，对投影点的检测值进行校正，将该投影点再次投影到与主探测器臂架相同的直线上，根据校正后的检测值与该一排探测器的主探测器臂架上的探测器的检测值生成校正后的被检测物的图像。
以上对射线成像系统中的图像处理装置进行了详细说明。但是本公开 明并不限于此。
在上述实施例中说明的探测器臂架以折线形探测器臂架为例进行了说明，但是并不限于此，也可以是圆弧形状。主探测器臂架的选择并没有被限定，可以是任意的。在主探测器臂架确定之后，其他的探测器臂架均为非主探测器臂架。针对圆弧形状的探测器臂架，主探测器臂架的选取则由其中的一个直线排布的探测器模块或者一个像素确定。上述探测器以不封闭的排布为例进行了说明，但是也可以以封闭的排布。
在上述实施例中，以单个光源多个探测器臂架的不共面分布为例进行了说明，但是也可以是多个光源单个探测器臂架的结构，还可以是多个光源对应多个探测器臂架的结构。在上述实施例中，以射线靶点源为例进行了说明，但射线源也可以有多个，例如分布式射线源、传统光机。这样的排布有利于减小空间，提高光源和探测器的利用率。
上面参考根据本公开的实施例的方法、装置(系统)和计算机程序产品的流程图和/或框图描述了本公开的各方面。应当理解，流程图和/或框图中的每个方框以及流程图和/或框图中各方框的组合可以由计算机程序指令实现。这些计算机程序指令可被提供给通用计算机、专用计算机、或其它可编程数据处理装置的处理器，以产生一种机器，使得经由计算机或其它可编程数据处理装置的处理器执行的这些指令使能对流程图和/或框图的一个或多个方框中指定的功能/动作的实现。这种处理器可以是但不限于是通用处理器、专用处理器、特殊应用处理器或者现场可编程逻辑电路。还可理解，框图和/或流程图中的每个方框以及框图和/或流程图中的方框的组合，也可以由执行指定的功能或动作的专用硬件来实现，或可由专用硬件和计算机指令的组合来实现。
以上，虽然结合附图描述了本公开的实施方式和具体实施例，但是本领域技术人员可以在不脱离本公开的精神和范围的情况下做出各种修改和变形，这样的修改和变形均落入由权利要求所限定的范围之内。

Claims (23)

  1. 一种射线成像系统，包括：
    探测器，所述探测器安装于探测器臂架上，所述探测器臂架形成在第一平面内；以及
    射线源，所述射线源与所述第一平面不共面。
  2. 如权利要求1所述的射线成像系统，其中，
    所述探测器臂架包括安装探测器的第一探测器臂架和至少一个第二探测器臂架。
  3. 如权利要求2所述的射线成像系统，其中，
    还包括图像处理装置，所述图像处理装置根据所述射线源的靶点、所述第一探测器臂架和所述第二探测器臂架的位置、被检测物的移动速度以及所述第一探测器臂架和所述第二探测器臂架的检测值获取校正后的检测图像。
  4. 如权利要求3所述的射线成像系统，其中，
    所述图像处理装置包括：
    投影获取部，其获取所述靶点、所述第二探测器臂架在与所述第一平面和第二平面垂直的平面上的投影，所述第二平面是所述靶点与所述第一探测器臂架构成的平面；
    时间偏差校正部，利用与所述第一平面和第二平面垂直的平面上的投影获取所述第一平面与所述第二平面的夹角，并根据所述夹角来校正检测数据由于所述被检测物在传送方向上从所述第一平面到所述第二平面的距离而产生的时间偏差；以及
    空间偏差校正部，对所述第二探测器臂架上各像素在所述第二平面的所述投影的检测值进行空间偏差的校正，并基于校正后的检测值与所述第一探测器臂架的检测值生成最终的被检测物的图像。
  5. 如权利要求4所述的射线成像系统，其中，
    所述时间偏差校正部包括：
    夹角计算部，利用所述垂直平面计算所述第二探测器臂架与投影探测器臂架之间的所述夹角，所述投影探测器臂架是在所述被检测物的运送方 向上所述第二探测器臂架在第二平面上的投影；
    偏差比例计算部，根据所述夹角、预先设定的被检测物的等效高度、被检测物的移动速度，计算在所述被检测物的运送方向上所述第二探测器臂架的探测器与其投影相差的偏差距离相对于所述等效高度的所述第二探测器臂架的探测器与其投影相差的参考偏差距离的比例；以及
    检测数据校正部，针对所述第二探测器臂架中的所述探测器采集的检测数据的时间序列，根据所述比例以及探测源的时间采样周期对获取的所述检测数据的时间序列的时间偏差进行校正，从而得到校正后的时间偏差校正数据。
  6. 如权利要求5所述的射线成像系统，其中，
    所述空间偏差校正部再次将所述投影第二探测器臂架投影到与所述第一探测器臂架相同的直线上，获取所述最终的所述被检测物的图像。
  7. 如权利要求5或6所述的射线成像系统，其中，
    通过插值法获取采样时间以外的时间点的所述检测数据。
  8. 如权利要求7所述的射线成像系统，其中，
    所述插值法为最邻近插值法、线性插值法、二次插值法中的一种。
  9. 如权利要求2所述的射线成像系统，其中，
    包含位于不同平面的多排所述探测器，
    多个所述第二探测器臂架位于第二平面内。
  10. 如权利要求9所述的射线成像系统，其中，
    所述图像处理装置包括：
    采样点确定部，选择多排探测器中一排探测器，获取所述一排探测器的从所述第一探测器臂架与所述第二探测器臂架的交点延伸的延长线上的多个采样点；
    交点获取部，分别获取所述射线源的靶点与所述多个采样点的连线同所述第二平面的交点；
    采样点像素值获取部，根据所述第二平面中各探测器像素的位置及其检测值求出多个所述交点的检测值，作为多个所述采样点的检测值；以及
    图像获取部，根据多个所述采样点的检测值与所述第一探测器臂架上 的探测器的检测值生成所述被检测物的图像。
  11. 如权利要求9所述的射线成像系统，其中，
    所述图像处理装置包括：
    投影点确定部，选择多排探测器中的一排探测器，在所述射线源的靶点与所述一排探测器的所述第一探测器臂架构成的投影平面中，获取处于相对于所述第二平面而位于与所述第一探测器臂架相反侧的所述投影平面中的、且与所述第二平面存在交点的任意一点，作为所述投影点；
    交点获取部，获取所述靶点与所述投影点的连线同所述第二平面的交点；
    投影点像素值获取部，根据所述第二平面中各探测器像素的位置及其检测值求出所述交点的检测值，作为所述投影点的检测值；以及
    校正图像获取部，将所述投影点再次投影到与所述主探测器臂架相同的直线上，并根据校正后的检测值与所述一排探测器的所述第一探测器臂架上的探测器的检测值生成校正后的被检测物的图像。
  12. 如权利要求10或11所述的射线成像系统，其中，
    通过插值法获取所述交点的所述检测值。
  13. 如权利要求12所述的射线成像系统，其中，
    所述插值法为最邻近插值法、线性插值法、二次插值法中的一种。
  14. 如权利要求10或11所述的射线成像系统，其中，
    所选择的一排探测器距离所述射线源越远，所述被检测物的图像的成像范围越大。
  15. 如权利要求10所述的摄像成像系统，其中，
    所述采样点是等间隔的或者是任意间隔的。
  16. 如权利要求10或11所述的射线成像系统，其中，
    所述多排探测器的之间具有相等的间隔或不相等的间隔。
  17. 如权利要求1所述的射线成像系统，其中，
    所述探测器为直线状排布或呈弧状排布。
  18. 如权利要求17所述的射线成像系统，其中，
    在所述探测器呈弧状排布时，所述第一探测器臂架是安装有单个探测 器的部分或者是安装有呈直线的多个探测器的单个模块。
  19. 一种射线成像方法，用于权利要求3所述的射线成像系统，包括：
    投影获取步骤，其获取所述靶点与所述第二探测器臂架在垂直于所述第一平面和第二平面的垂直平面上的投影，所述第二平面是所述靶点与所述第一探测器臂架构成的平面；
    时间偏差校正步骤，利用所述垂直平面上的投影获取所述第一平面与所述第二平面的夹角，并根据所述夹角来校正检测数据由于所述被检测物在传送方向上从所述第一平面到所述第二平面的距离而产生的时间偏差；以及
    空间偏差校正步骤，对所述第二探测器臂架上各像素在所述第二平面的所述投影的检测值进行空间偏差的校正，并基于校正后的检测值与所述第一探测器臂架的检测值生成最终的被检测物的图像。
  20. 如权利要求19所述的射线成像方法，其中，
    所述时间偏差校正步骤包括：
    夹角计算步骤，利用所述垂直平面计算所述第二探测器臂架与投影探测器臂架之间的所述夹角，所述投影探测器臂架是在所述被检测物的运送方向上所述第二探测器臂架在第二平面上的投影；
    偏差比例计算步骤，根据所述夹角、预先设定的被检测物的等效高度、被检测物的移动速度，计算在所述被检测物的传送方向上所述第二探测器臂架的探测器与其投影相差的偏差距离相对于所述等效高度的所述第二探测器臂架的探测器与其投影相差的参考偏差距离的比例；以及
    检测数据校正步骤，针对所述第二探测器臂架中的所述探测器采集的检测数据的时间序列，根据所述比例以及射线源的时间采样周期对获取的所述检测数据的时间序列的时间偏差进行校正，从而得到校正后的时间偏差校正数据。
  21. 权利要求20所述的射线成像方法，其中，
    在所述空间偏差校正步骤中，再次将所述投影第二探测器臂架投影到与所述第一探测器臂架相同的直线上，获取所述最终的所述被检测物的图像。
  22. 一种射线成像方法，用于权利要求9所述的射线成像系统，包括：
    采样点确定步骤，选择多排探测器中一排探测器，获取所述一排探测器的从所述第一探测器臂架与所述第二探测器臂架的交点延伸的延长线上的多个采样点；
    交点获取步骤，分别获取所述射线源的靶点与所述多个采样点的连线同所述第二平面的交点；
    采样点像素值获取步骤，根据所述第二平面中各探测器像素的位置及其检测值求出多个所述交点的检测值，作为多个所述采样点的检测值；
    图像获取步骤，根据多个所述采样点的检测值与所述第一探测器臂架上的探测器的检测值生成所述被检测物的图像。
  23. 一种射线成像方法，用于权利要求9所述的射线成像系统，包括：
    投影点投影确定步骤，选择多排探测器中的一排探测器，在所述射线源的靶点与所述一排探测器的所述第一探测器臂架构成的投影平面中，获取处于相对于所述第二平面而位于与所述第一探测器臂架相反侧的所述投影平面中的、且与所述第二平面存在交点的任意一点，作为所述投影点；
    交点获取步骤，获取所述靶点与所述投影点的连线同所述第二平面的交点；
    投影点像素值获取步骤，根据所述第二平面中各探测器像素的位置及其检测值求出所述交点的检测值，作为所述投影点的检测值；以及
    校正图像获取步骤，将所述投影点再次投影到与所述主探测器臂架相同的直线上，并根据校正后的检测值与所述一排探测器的所述第一探测器臂架上的探测器的检测值生成校正后的被检测物的图像。
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