AT522840A3 - Verfahren zur Kompensation in einem Messsystem - Google Patents

Verfahren zur Kompensation in einem Messsystem Download PDF

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Publication number
AT522840A3
AT522840A3 ATA50611/2020A AT506112020A AT522840A3 AT 522840 A3 AT522840 A3 AT 522840A3 AT 506112020 A AT506112020 A AT 506112020A AT 522840 A3 AT522840 A3 AT 522840A3
Authority
AT
Austria
Prior art keywords
measuring system
compensation
procedure
compensation algorithm
measurement system
Prior art date
Application number
ATA50611/2020A
Other languages
English (en)
Other versions
AT522840A2 (de
AT522840B1 (de
Inventor
Weber Frank
Krätschmer Thilo
Seichter Felicia
Original Assignee
Endress Hauser Conducta Gmbh Co Kg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Endress Hauser Conducta Gmbh Co Kg filed Critical Endress Hauser Conducta Gmbh Co Kg
Publication of AT522840A2 publication Critical patent/AT522840A2/de
Publication of AT522840A3 publication Critical patent/AT522840A3/de
Application granted granted Critical
Publication of AT522840B1 publication Critical patent/AT522840B1/de

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/427—Dual wavelengths spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/283—Investigating the spectrum computer-interfaced
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan
    • G01J2003/2876—Correcting linearity of signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3196—Correlating located peaks in spectrum with reference data, e.g. fingerprint data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

Die Erfindung offenbart ein Verfahren zur Kompensation unterschiedlicher Sensitivitäten bei verschiedenen Wellenlängen bei einem spektrometrischen Messsystem (10), umfassend die Schritte: Kalibrierung des Messystems (10) in einem Wellenlängenbereich bezüglich eines oder mehreren bekannten Referenzstandards; Erstellen eines wellenlängenabhängigen Kompensationsalgorithmus zur Linearisierung; und Justierung des Messsystems (10) mit dem Kompensationsalgorithmus. Die Erfindung offenbart weiter ein entsprechendes Messsystem (10).
ATA50611/2020A 2019-08-07 2020-07-14 Verfahren zur Kompensation in einem Messsystem AT522840B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102019121304.5A DE102019121304A1 (de) 2019-08-07 2019-08-07 Verfahren zur Kompensation in einem Messsystem

Publications (3)

Publication Number Publication Date
AT522840A2 AT522840A2 (de) 2021-02-15
AT522840A3 true AT522840A3 (de) 2022-11-15
AT522840B1 AT522840B1 (de) 2023-11-15

Family

ID=74188546

Family Applications (1)

Application Number Title Priority Date Filing Date
ATA50611/2020A AT522840B1 (de) 2019-08-07 2020-07-14 Verfahren zur Kompensation in einem Messsystem

Country Status (4)

Country Link
US (1) US11467033B2 (de)
CN (1) CN112345466B (de)
AT (1) AT522840B1 (de)
DE (1) DE102019121304A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021133955A1 (de) * 2021-12-21 2023-06-22 Endress+Hauser Conducta Gmbh+Co. Kg Vorbereitungsverfahren zur Vorbereitung von spektrometrischen Bestimmungen mindestens einer Messgröße in einer Zielanwendung
AT526886B1 (de) * 2023-01-17 2026-02-15 Aschauer Roland Spektrometer mit automatischer Kalibrierung
DE102023135220A1 (de) * 2023-12-14 2025-06-18 Endress+Hauser Conducta Gmbh+Co. Kg Verfahren zur Inbetriebnahme einer Messanordnung, Messanordnung und Datenspeicher

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4231663A (en) * 1979-03-16 1980-11-04 Phillippi Conrad M Device for calibrating the photometric linearity of optical instruments
US20150142364A1 (en) * 2012-04-24 2015-05-21 Westco Scientific Instruments, Inc. Spectrometer reference calibration
US20160334274A1 (en) * 2015-05-13 2016-11-17 Datacolor Holding Ag System and method for compensating light source drift at different wavelengths with a single reference channel in a light measuring device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3504750B2 (ja) * 1993-12-22 2004-03-08 オルソ−クリニカル ダイアグノスティクス，インコーポレイティド 検量関係式の再校正法及び定量試験キット
US7583378B2 (en) * 2006-02-23 2009-09-01 Itt Manufacturing Enterprises, Inc. Spectrograph calibration using known light source and Raman scattering
EP1998155A1 (de) * 2007-05-30 2008-12-03 Roche Diagnostics GmbH Verfahren zur Wellenlängenkalibration eines Spektrometers
CN102944306B (zh) * 2012-11-30 2014-11-05 中国兵器工业第二0五研究所 快速光谱仪短波校准中的弱信号补偿方法
US10551362B2 (en) * 2013-03-26 2020-02-04 Waters Technologies Corporation Method for extending the dynamic range of absorbance detectors

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4231663A (en) * 1979-03-16 1980-11-04 Phillippi Conrad M Device for calibrating the photometric linearity of optical instruments
US20150142364A1 (en) * 2012-04-24 2015-05-21 Westco Scientific Instruments, Inc. Spectrometer reference calibration
US20160334274A1 (en) * 2015-05-13 2016-11-17 Datacolor Holding Ag System and method for compensating light source drift at different wavelengths with a single reference channel in a light measuring device

Also Published As

Publication number Publication date
AT522840A2 (de) 2021-02-15
DE102019121304A1 (de) 2021-02-11
US11467033B2 (en) 2022-10-11
AT522840B1 (de) 2023-11-15
CN112345466B (zh) 2024-09-20
US20210041294A1 (en) 2021-02-11
CN112345466A (zh) 2021-02-09

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