ATA243073A - Verfahren zur messung der absolutintensitat - Google Patents

Verfahren zur messung der absolutintensitat

Info

Publication number
ATA243073A
ATA243073A AT243073A AT243073A ATA243073A AT A243073 A ATA243073 A AT A243073A AT 243073 A AT243073 A AT 243073A AT 243073 A AT243073 A AT 243073A AT A243073 A ATA243073 A AT A243073A
Authority
AT
Austria
Prior art keywords
absolute intensity
measuring absolute
measuring
intensity
absolute
Prior art date
Application number
AT243073A
Other languages
English (en)
Other versions
AT331060B (de
Inventor
Otto Dipl Ing Dr Dr E H Kratky
Christoph Dipl Chem Kratky
Original Assignee
Kratky Otto Dr Dr E H
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kratky Otto Dr Dr E H filed Critical Kratky Otto Dr Dr E H
Priority to AT243073A priority Critical patent/AT331060B/de
Publication of ATA243073A publication Critical patent/ATA243073A/de
Application granted granted Critical
Publication of AT331060B publication Critical patent/AT331060B/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT243073A 1973-03-19 1973-03-19 Verfahren zur messung der absolutintensitat AT331060B (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT243073A AT331060B (de) 1973-03-19 1973-03-19 Verfahren zur messung der absolutintensitat

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT243073A AT331060B (de) 1973-03-19 1973-03-19 Verfahren zur messung der absolutintensitat

Publications (2)

Publication Number Publication Date
ATA243073A true ATA243073A (de) 1975-10-15
AT331060B AT331060B (de) 1976-08-10

Family

ID=3534207

Family Applications (1)

Application Number Title Priority Date Filing Date
AT243073A AT331060B (de) 1973-03-19 1973-03-19 Verfahren zur messung der absolutintensitat

Country Status (1)

Country Link
AT (1) AT331060B (de)

Also Published As

Publication number Publication date
AT331060B (de) 1976-08-10

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Legal Events

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