ATE104428T1 - Verfahren fuer das messen der dimensionen eines abstandshalters. - Google Patents

Verfahren fuer das messen der dimensionen eines abstandshalters.

Info

Publication number
ATE104428T1
ATE104428T1 AT90420552T AT90420552T ATE104428T1 AT E104428 T1 ATE104428 T1 AT E104428T1 AT 90420552 T AT90420552 T AT 90420552T AT 90420552 T AT90420552 T AT 90420552T AT E104428 T1 ATE104428 T1 AT E104428T1
Authority
AT
Austria
Prior art keywords
measuring
spacer
dimensions
procedure
array
Prior art date
Application number
AT90420552T
Other languages
English (en)
Inventor
Annie Tissier
Jean Galvier
Original Assignee
France Telecom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by France Telecom filed Critical France Telecom
Application granted granted Critical
Publication of ATE104428T1 publication Critical patent/ATE104428T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT90420552T 1989-12-21 1990-12-18 Verfahren fuer das messen der dimensionen eines abstandshalters. ATE104428T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8917387A FR2656465B1 (fr) 1989-12-21 1989-12-21 Procede de mesure des dimensions d'un espaceur.
EP90420552A EP0446549B1 (de) 1989-12-21 1990-12-18 Verfahren für das Messen der Dimensionen eines Abstandshalters

Publications (1)

Publication Number Publication Date
ATE104428T1 true ATE104428T1 (de) 1994-04-15

Family

ID=9389103

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90420552T ATE104428T1 (de) 1989-12-21 1990-12-18 Verfahren fuer das messen der dimensionen eines abstandshalters.

Country Status (6)

Country Link
US (1) US5103104A (de)
EP (1) EP0446549B1 (de)
JP (1) JP2857495B2 (de)
AT (1) ATE104428T1 (de)
DE (1) DE69008156T2 (de)
FR (1) FR2656465B1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5805290A (en) * 1996-05-02 1998-09-08 International Business Machines Corporation Method of optical metrology of unresolved pattern arrays
US5965309A (en) * 1997-08-28 1999-10-12 International Business Machines Corporation Focus or exposure dose parameter control system using tone reversing patterns
US5976740A (en) * 1997-08-28 1999-11-02 International Business Machines Corporation Process for controlling exposure dose or focus parameters using tone reversing pattern
US5953128A (en) * 1997-08-28 1999-09-14 International Business Machines Corporation Optically measurable serpentine edge tone reversed targets
US5914784A (en) * 1997-09-30 1999-06-22 International Business Machines Corporation Measurement method for linewidth metrology
US6137578A (en) * 1998-07-28 2000-10-24 International Business Machines Corporation Segmented bar-in-bar target
US6128089A (en) * 1998-07-28 2000-10-03 International Business Machines Corporation Combined segmented and nonsegmented bar-in-bar targets
GB2340980A (en) * 1998-08-21 2000-03-01 Ezio Panzeri A coded token
US7400417B2 (en) * 2005-05-23 2008-07-15 Federal Mogul World Wide, Inc. Diffraction method for measuring thickness of a workpart

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56120904A (en) * 1980-02-29 1981-09-22 Chugoku Toryo Kk Measuring method for rate of removal of coating film
JPS60196605A (ja) * 1984-03-19 1985-10-05 Nippon Kogaku Kk <Nikon> 散乱光検出光学装置
US4842411A (en) * 1986-02-06 1989-06-27 Vectron, Inc. Method of automatically measuring the shape of a continuous surface
JPH07122574B2 (ja) * 1986-07-25 1995-12-25 株式会社日立製作所 断面形状測定方法
JPS63147327A (ja) * 1986-12-10 1988-06-20 Dainippon Screen Mfg Co Ltd 表面処理における処理終点検知方法
US4846920A (en) * 1987-12-09 1989-07-11 International Business Machine Corporation Plasma amplified photoelectron process endpoint detection apparatus
JP2542653B2 (ja) * 1987-12-10 1996-10-09 ファナック株式会社 非接触倣い方法
US5024949A (en) * 1989-02-17 1991-06-18 Biotrol, Inc. Aerobic bacterial remediation of aliphatic chlorinated hydrocarbon contamination

Also Published As

Publication number Publication date
DE69008156T2 (de) 1994-12-01
US5103104A (en) 1992-04-07
EP0446549A3 (de) 1991-09-25
DE69008156D1 (de) 1994-05-19
EP0446549B1 (de) 1994-04-13
FR2656465B1 (fr) 1992-05-07
EP0446549A2 (de) 1991-09-18
JP2857495B2 (ja) 1999-02-17
FR2656465A1 (fr) 1991-06-28
JPH06180210A (ja) 1994-06-28

Similar Documents

Publication Publication Date Title
ATE104428T1 (de) Verfahren fuer das messen der dimensionen eines abstandshalters.
DE3587482D1 (de) Fehlerinspektion fuer plattenoberflaechen.
BR8001126A (pt) Processo para produzir etanol pela fermentacao de um substrato
ES527883A0 (es) Procedimiento para la obtencion de una plancha de impresion plana.
IT1093682B (it) Metodo per rivestire un substrato con una composizione di rivestimento induribile mediante radiazioni
BR7805655A (pt) Aperfeicoamento para geracao de sinais de fator de correcao para tubos de raios catodicos
IT1115551B (it) Scambiatore cationico di ioni e procedimento per la sua preparazione
PT74344A (de) Elektrode fuer lichtbogenoefen
IT1112304B (it) Guarnizione metallica per teste di cilindri
ATA547480A (de) Leuchtstoffroehren mit von einem kathodenschirm umgebenen kathoden
AT370772B (de) Verschlussplatte fuer heisswindschieber
DD130968A1 (de) Anordnung zum spektralen zerlegen eines lichtstrahlenbuendels
BR7703740A (pt) Processo para registro de imagens com raios laser
JPS5640831A (en) Projecting image of mask having periodically distributed plural slits onto support and its application to lithographic photography
JPS5612729A (en) ?alignmening device for ic projection exposure equipment
SU1315800A1 (ru) Способ измерени рельефа микрообъектов
JPS5388728A (en) Method of forming pattern
SU1303977A1 (ru) Установка дл маркировки изделий
SU495636A1 (ru) Фотошаблон
DE69113428D1 (de) Verfahren zur Messung der Viskosität eines Materials.
JPS5622902A (en) Measuring method for thickness of transparent plate
SU1672814A1 (ru) Газоанализатор
JPS55158505A (en) Knifed mark inspector
SU638900A1 (ru) Волномер
JPS5774605A (en) Optical inspection head

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties