ATE112050T1 - Verfahren und vorrichtung zum messen des querprofils der dicke eines metallischen bandes, vorzugsweise aus stahl. - Google Patents

Verfahren und vorrichtung zum messen des querprofils der dicke eines metallischen bandes, vorzugsweise aus stahl.

Info

Publication number: ATE112050T1
Authority: AT; Austria
Prior art keywords: strip; band; measuring; cross; thickness profile
Prior art date: 1990-09-05

Application number

AT91470023T

Other languages

English (en)

Inventor

Pierre Gauje

Original Assignee

Lorraine Laminage

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-09-05

Filing date

1991-08-26

Publication date

1994-10-15

1991-08-26 Application filed by Lorraine Laminage filed Critical Lorraine Laminage

1994-10-15 Application granted granted Critical

1994-10-15 Publication of ATE112050T1 publication Critical patent/ATE112050T1/de

Links

229910000831 Steel Inorganic materials 0.000 title 1
239000010959 steel Substances 0.000 title 1
238000005259 measurement Methods 0.000 abstract 2
230000005855 radiation Effects 0.000 abstract 2

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
- G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Electromagnetism (AREA)
Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Length Measuring Devices With Unspecified Measuring Means (AREA)
Length Measuring Devices By Optical Means (AREA)

AT91470023T 1990-09-05 1991-08-26 Verfahren und vorrichtung zum messen des querprofils der dicke eines metallischen bandes, vorzugsweise aus stahl. ATE112050T1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
FR9011037A FR2666409B1 (fr)	1990-09-05	1990-09-05	Procede et dispositif de mesure de profil transversal d'epaisseur d'une bande metallique notamment en acier.

Publications (1)

Publication Number	Publication Date
ATE112050T1 true ATE112050T1 (de)	1994-10-15

Family

ID=9400103

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AT91470023T ATE112050T1 (de)	1990-09-05	1991-08-26	Verfahren und vorrichtung zum messen des querprofils der dicke eines metallischen bandes, vorzugsweise aus stahl.

Country Status (11)

Country	Link
US (1)	US5202909A (de)
EP (1)	EP0477120B1 (de)
JP (1)	JP2596905B2 (de)
KR (1)	KR0169488B1 (de)
AT (1)	ATE112050T1 (de)
AU (1)	AU643555B2 (de)
CA (1)	CA2049763C (de)
DE (1)	DE69104164T2 (de)
DK (1)	DK0477120T3 (de)
ES (1)	ES2062733T3 (de)
FR (1)	FR2666409B1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE19950254C2 (de)	1999-10-18	2003-06-26	Ims Messsysteme Gmbh	Verfahren zur Bestimmung eines Dickenquerprofils und des Dickenlängsprofils eines laufenden Materialbandes
JP2002296021A (ja) *	2001-04-03	2002-10-09	Futec Inc	厚さ測定装置
DE102005020297A1 (de) *	2005-04-30	2006-11-09	Fagus-Grecon Greten Gmbh & Co Kg	Vorrichtung zum Prüfen eines Plattenmaterials und Verfahren zum Prüfen eines Plattenmaterials mit Hilfe der vorgenannten Vorrichtung
CN102240681B (zh) *	2011-05-19	2013-06-19	清华大学	一种凸度仪x光机的安装与调节机构

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4874865A (de) *	1971-12-29	1973-10-09
DE3113440A1 (de) *	1981-04-03	1982-11-11	Philips Patentverwaltung Gmbh, 2000 Hamburg	"verfahren zur ueberpruefung von gleichartigen objekten auf fehler"
US4574387A (en) *	1981-09-18	1986-03-04	Data Measurement Corporation	Apparatus and method for measuring thickness
US4891833A (en) *	1987-11-19	1990-01-02	Bio-Imaging Research, Inc.	Blinder for cat scanner
US4954719A (en) *	1988-09-07	1990-09-04	Harrel, Inc.	Sheet thickness gauging method and system with auto calibration

1990
- 1990-09-05 FR FR9011037A patent/FR2666409B1/fr not_active Expired - Lifetime
1991
- 1991-08-23 CA CA002049763A patent/CA2049763C/fr not_active Expired - Fee Related
- 1991-08-26 EP EP91470023A patent/EP0477120B1/de not_active Expired - Lifetime
- 1991-08-26 ES ES91470023T patent/ES2062733T3/es not_active Expired - Lifetime
- 1991-08-26 DK DK91470023.2T patent/DK0477120T3/da active
- 1991-08-26 DE DE69104164T patent/DE69104164T2/de not_active Expired - Fee Related
- 1991-08-26 AT AT91470023T patent/ATE112050T1/de not_active IP Right Cessation
- 1991-08-28 AU AU83437/91A patent/AU643555B2/en not_active Ceased
- 1991-08-29 US US07/752,057 patent/US5202909A/en not_active Expired - Fee Related
- 1991-09-02 KR KR1019910015294A patent/KR0169488B1/ko not_active Expired - Fee Related
- 1991-09-05 JP JP3254653A patent/JP2596905B2/ja not_active Expired - Fee Related

Also Published As

Publication number	Publication date
CA2049763A1 (fr)	1992-03-06
JP2596905B2 (ja)	1997-04-02
US5202909A (en)	1993-04-13
EP0477120B1 (de)	1994-09-21
DK0477120T3 (da)	1995-02-06
JPH04264209A (ja)	1992-09-21
KR920006721A (ko)	1992-04-28
CA2049763C (fr)	2000-08-15
EP0477120A1 (de)	1992-03-25
DE69104164T2 (de)	1995-04-13
FR2666409A1 (fr)	1992-03-06
KR0169488B1 (ko)	1999-05-01
ES2062733T3 (es)	1994-12-16
AU8343791A (en)	1992-03-12
DE69104164D1 (de)	1994-10-27
FR2666409B1 (fr)	1992-12-11
AU643555B2 (en)	1993-11-18

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Legal Events

Date	Code	Title	Description
1995-05-15	UEP	Publication of translation of european patent specification
2005-05-15	REN	Ceased due to non-payment of the annual fee