ATE145315T1 - Verfahren und vorrichtung zur messung elektromagnetischer strahlung, die von einer schaltungs-platine empfangen oder abgestrahlt wird - Google Patents

Verfahren und vorrichtung zur messung elektromagnetischer strahlung, die von einer schaltungs-platine empfangen oder abgestrahlt wird

Info

Publication number
ATE145315T1
ATE145315T1 AT93924259T AT93924259T ATE145315T1 AT E145315 T1 ATE145315 T1 AT E145315T1 AT 93924259 T AT93924259 T AT 93924259T AT 93924259 T AT93924259 T AT 93924259T AT E145315 T1 ATE145315 T1 AT E145315T1
Authority
AT
Austria
Prior art keywords
circuit board
radiation
pct
considered
backplane
Prior art date
Application number
AT93924259T
Other languages
English (en)
Inventor
Fredrik Kjebon
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Application granted granted Critical
Publication of ATE145315T1 publication Critical patent/ATE145315T1/de

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00—Screening of apparatus or components against electric or magnetic fields
    • H05K9/0069—Methods for measuring the shielding efficiency; Apparatus therefor; Isolation container for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/14—Mounting supporting structure in casing or on frame or rack
    • H05K7/1438—Back panels or connecting means therefor; Terminals; Coding means to avoid wrong insertion
    • H05K7/1439—Back panel mother boards
    • H05K7/1445—Back panel mother boards with double-sided connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Measurement Of Radiation (AREA)
  • Power Sources (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT93924259T 1992-10-27 1993-10-26 Verfahren und vorrichtung zur messung elektromagnetischer strahlung, die von einer schaltungs-platine empfangen oder abgestrahlt wird ATE145315T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9203145A SE500305C2 (sv) 1992-10-27 1992-10-27 Sätt och anordning för att mäta elektromagnetisk utstrålning från eller mottagning av utifrån kommande elektromagnetisk strålning i ett kretskort

Publications (1)

Publication Number Publication Date
ATE145315T1 true ATE145315T1 (de) 1996-11-15

Family

ID=20387578

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93924259T ATE145315T1 (de) 1992-10-27 1993-10-26 Verfahren und vorrichtung zur messung elektromagnetischer strahlung, die von einer schaltungs-platine empfangen oder abgestrahlt wird

Country Status (9)

Country Link
US (1) US5498968A (de)
EP (1) EP0619936B1 (de)
AT (1) ATE145315T1 (de)
AU (1) AU673559B2 (de)
DE (1) DE69305975T2 (de)
DK (1) DK0619936T3 (de)
ES (1) ES2093988T3 (de)
SE (1) SE500305C2 (de)
WO (1) WO1994010825A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920984A (en) * 1993-12-10 1999-07-13 Ericsson Ge Mobile Communications Inc. Method for the suppression of electromagnetic interference in an electronic system
US6160517A (en) * 1998-01-20 2000-12-12 Dell Usa, Llp Method and apparatus for testing electronic systems using electromagnetic emissions profiles
US6411102B1 (en) * 2000-01-07 2002-06-25 International Business Machines Corporation Apparatus for testing various structural parameters of an electro-magnetic radiation barrier
CN100392414C (zh) * 2005-04-15 2008-06-04 中兴通讯股份有限公司 一种电子设备内电磁辐射源的测量方法和装置
US11378608B2 (en) * 2019-07-19 2022-07-05 Dell Products L.P. System and method for device state determination
US11399450B2 (en) 2019-07-19 2022-07-26 Dell Products L.P. System and method for managing electromagnetic interference
US11644425B2 (en) 2019-07-19 2023-05-09 Dell Products L.P. System and method for optical state determination
US12004336B2 (en) 2019-07-19 2024-06-04 Dell Products L.P. System and method for thermal management and electromagnetic interference management

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2509045A (en) * 1947-11-26 1950-05-23 Collins Radio Co Ultra high frequency radiation indicating system
FR2513769A1 (fr) * 1981-09-29 1983-04-01 Aerospatiale Procede pour determiner le seuil de resistance d'un equipement electrique ou electronique a une agression electromagnetique exterieure et dispositifs pour sa mise en oeuvre
SU1045430A1 (ru) * 1982-06-04 1983-09-30 Предприятие П/Я В-8231 Устройство дл контрол печатных плат
JPS61187672A (ja) * 1985-02-15 1986-08-21 Nec Corp 密着型イメ−ジセンサの欠陥検査方法および欠陥検査装置
CA1286724C (en) * 1986-03-27 1991-07-23 Richard Ralph Goulette Method and apparatus for monitoring electromagnetic emission levels
US4939446A (en) * 1988-03-30 1990-07-03 Rogers Wesley A Voltage transmission link for testing EMI susceptibility of a device or circuits

Also Published As

Publication number Publication date
SE9203145L (sv) 1994-04-28
DK0619936T3 (da) 1997-04-07
AU673559B2 (en) 1996-11-14
EP0619936B1 (de) 1996-11-13
DE69305975T2 (de) 1997-04-03
US5498968A (en) 1996-03-12
DE69305975D1 (de) 1996-12-19
EP0619936A1 (de) 1994-10-19
SE9203145D0 (sv) 1992-10-27
WO1994010825A1 (en) 1994-05-11
ES2093988T3 (es) 1997-01-01
AU5400594A (en) 1994-05-24
SE500305C2 (sv) 1994-05-30

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee