ATE149683T1 - Gaszelle mit konstantem druck - Google Patents
Gaszelle mit konstantem druckInfo
- Publication number
- ATE149683T1 ATE149683T1 AT93918413T AT93918413T ATE149683T1 AT E149683 T1 ATE149683 T1 AT E149683T1 AT 93918413 T AT93918413 T AT 93918413T AT 93918413 T AT93918413 T AT 93918413T AT E149683 T1 ATE149683 T1 AT E149683T1
- Authority
- AT
- Austria
- Prior art keywords
- gas
- gas cell
- pressure
- constant pressure
- pressure gas
- Prior art date
Links
- 238000004868 gas analysis Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/151—Gas blown
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/391—Intracavity sample
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/651—Cuvettes therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
- G01N2021/8578—Gaseous flow
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/121—Correction signals
- G01N2201/1218—Correction signals for pressure variations
Landscapes
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/922,874 US5245405A (en) | 1990-05-11 | 1992-07-31 | Constant pressure gas cell |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE149683T1 true ATE149683T1 (de) | 1997-03-15 |
Family
ID=25447691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT93918413T ATE149683T1 (de) | 1992-07-31 | 1993-07-27 | Gaszelle mit konstantem druck |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5245405A (de) |
| EP (1) | EP0653057B1 (de) |
| JP (1) | JPH08500180A (de) |
| AT (1) | ATE149683T1 (de) |
| CA (1) | CA2140534A1 (de) |
| DE (1) | DE69308566T2 (de) |
| WO (1) | WO1994003794A1 (de) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5452084A (en) * | 1993-03-29 | 1995-09-19 | Albion Instruments, Inc. | Method and apparatus for zero-calibration of a raman spectroscopy system |
| US5533512A (en) * | 1994-03-18 | 1996-07-09 | Ohmeda Inc. | Method and apparatus for detection of venous air emboli |
| US5521703A (en) * | 1994-10-17 | 1996-05-28 | Albion Instruments, Inc. | Diode laser pumped Raman gas analysis system with reflective hollow tube gas cell |
| US5596404A (en) * | 1994-12-30 | 1997-01-21 | Albion Instruments, Inc. | Raman gas analysis system with flexible web and differential thread for precision optical alignment |
| US5650856A (en) * | 1995-06-16 | 1997-07-22 | Brown University Research Foundation | Fiber laser intra-cavity spectroscope |
| US5703683A (en) * | 1996-05-28 | 1997-12-30 | Ohmeda Inc. | Extruded wobble plate optical alignment device |
| US5929981A (en) * | 1996-06-18 | 1999-07-27 | Ohmeda Inc. | System for monitoring contamination of optical elements in a Raman gas analyzer |
| US5673109A (en) * | 1996-07-10 | 1997-09-30 | Ohmeda Inc. | System and method for increasing the efficiency of a raman gas analysis system |
| US6222860B1 (en) | 1999-01-07 | 2001-04-24 | Hewlett-Packard Company | Laser system tolerating disturbances using multiple modes |
| US6646386B1 (en) * | 1999-07-20 | 2003-11-11 | Tokyo Electron Limited | Stabilized oscillator circuit for plasma density measurement |
| US6741944B1 (en) * | 1999-07-20 | 2004-05-25 | Tokyo Electron Limited | Electron density measurement and plasma process control system using a microwave oscillator locked to an open resonator containing the plasma |
| US6861844B1 (en) | 1999-07-21 | 2005-03-01 | Tokyo Electron Limited | Electron density measurement and plasma process control system using changes in the resonant frequency of an open resonator containing the plasma |
| US6516656B1 (en) | 1999-12-28 | 2003-02-11 | Honda Giken Kogyo Kabushiki Kaisha | System for vehicle emission sampling and measurement |
| US6346142B1 (en) | 1999-12-28 | 2002-02-12 | Honda Giken Kogyo Kabushiki Kaisha | System for removing water from a gaseous sample |
| US8994947B2 (en) * | 2001-03-19 | 2015-03-31 | Pranalytica, Inc. | Diagnostic method for high sensitivity detection of component concentrations in human gas emissions |
| US20040142484A1 (en) | 2002-09-30 | 2004-07-22 | Intel Corporation | Spectroscopic analysis system and method |
| US7749446B2 (en) * | 2004-10-02 | 2010-07-06 | Peterman Jr John William | Optimized gas cell |
| US7333197B2 (en) * | 2004-11-17 | 2008-02-19 | Honeywell International Inc. | Raman detection based flow cytometer |
| DE102005040661B3 (de) * | 2005-08-26 | 2006-12-28 | Leica Microsystems Semiconductor Gmbh | Koordinatenmessvorrichtung |
| JP5008103B2 (ja) * | 2007-07-02 | 2012-08-22 | テルモ ビーシーティー バイオテクノロジーズ,エルエルシー | 測定手段を用いて血液中および血液生成物中の汚染物質を光還元するための装置 |
| US8794049B1 (en) | 2011-01-26 | 2014-08-05 | Marci Norkin | Real-time monitor for wine fermentation |
| GB2465173B (en) * | 2008-11-06 | 2011-06-29 | Nviro Cleantech Ltd | Fluid decontamination apparatus and method |
| WO2011055373A1 (en) * | 2009-11-03 | 2011-05-12 | The Secretary, Department Of Atomic Energy,Govt.Of India. | Niobium based superconducting radio frequency (scrf) cavities comprising niobium components joined by laser welding; method and apparatus for manufacturing such cavities |
| WO2013154732A1 (en) * | 2012-04-11 | 2013-10-17 | President And Fellows Of Harvard College | Buffer gas cooling and mixture analysis |
| JP2014228276A (ja) * | 2013-05-17 | 2014-12-08 | アズビル株式会社 | 粒子検出装置及び粒子の検出方法 |
| WO2018193666A1 (ja) * | 2017-04-21 | 2018-10-25 | 株式会社島津製作所 | フローセル及びそのフローセルを備えた検出器 |
| WO2019201449A1 (en) * | 2018-04-20 | 2019-10-24 | Flo2R Aps | Gas analyser system |
| WO2020006633A1 (en) * | 2018-07-03 | 2020-01-09 | Global Analyzer Systems Limited | Self-aligned high finesse optical sensor cell |
| US12228510B2 (en) * | 2019-05-28 | 2025-02-18 | Si-Ware Systems | Integrated device for fluid analysis |
| DE102019131328B3 (de) * | 2019-11-20 | 2021-04-15 | Lavision Gmbh | Verfahren zum Detektieren von Primärgasströmungen in Strömungsräumen |
| CN115184100B (zh) * | 2022-09-08 | 2022-11-25 | 江苏永信医疗科技有限公司 | 一种低紊流手术室空气质量监测取样装置及其使用方法 |
Family Cites Families (45)
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|---|---|---|---|---|
| US3519356A (en) * | 1967-04-07 | 1970-07-07 | Sperry Rand Corp | Ring laser flow meter with means to compensate for changes of refractive index of the flowing medium |
| US3515482A (en) * | 1967-06-27 | 1970-06-02 | Us Navy | Aerosol photometer with improved electronic circuitry |
| NL7013121A (de) * | 1969-09-17 | 1971-03-19 | ||
| US3833305A (en) * | 1969-09-17 | 1974-09-03 | Commercial Electronics Inc | Gas analyzing apparatus |
| US3826577A (en) * | 1972-12-07 | 1974-07-30 | Commercial Electronics Inc | Gas analyzing apparatus |
| US3998557A (en) * | 1974-06-03 | 1976-12-21 | Massachusetts Institute Of Technology | Gas detector |
| US4071298A (en) * | 1974-06-27 | 1978-01-31 | Stanford Research Institute | Laser Raman/fluorescent device for analyzing airborne particles |
| US4068125A (en) * | 1975-02-18 | 1978-01-10 | Diax Corporation | Laser absorption spectroscopy employing varying absorption conditions |
| US4044257A (en) * | 1975-02-20 | 1977-08-23 | Diax Corporation | Retention time chromatograph employing an IR absorption spectrographic detector |
| US4113386A (en) * | 1976-09-20 | 1978-09-12 | Climet Instruments Company | Photometer |
| US4225243A (en) * | 1978-06-26 | 1980-09-30 | Measurex Corporation | Gas measuring apparatus with standardization means, and method therefor |
| US4277131A (en) * | 1980-01-29 | 1981-07-07 | The United States Of America As Represented By The Administrator Of The United States Environmental Protection Agency | Antifouling window assembly |
| US4302206A (en) * | 1980-10-31 | 1981-11-24 | Olin Corporation | Apparatus and process for analysis of gaseous nitrogen trichloride |
| US4413911A (en) * | 1981-04-24 | 1983-11-08 | Measurex Corporation | Gas analyzer with fluid curtain |
| US4515274A (en) * | 1981-12-02 | 1985-05-07 | Coulter Corporation | Particle analyzing and sorting apparatus |
| US4443072A (en) * | 1982-04-05 | 1984-04-17 | The United States Of America As Represented By The United States Department Of Energy | Purged window apparatus utilizing heated purge gas |
| US4544273A (en) * | 1983-07-29 | 1985-10-01 | Particulate Instruments | Smoke opacity meter |
| GB2148487B (en) * | 1983-10-13 | 1987-01-14 | Perkins Engines Group | Apparatus for measuring smoke density |
| US4594715A (en) * | 1983-11-17 | 1986-06-10 | Particle Measuring Systems, Inc. | Laser with stabilized external passive cavity |
| JPS60233536A (ja) * | 1984-05-04 | 1985-11-20 | Nippon Soken Inc | 光透過式黒煙濃度測定器 |
| US4924097A (en) * | 1984-06-22 | 1990-05-08 | Georgia Tech Rss. Corp | Monodisperse aerosol generator for use with infrared spectrometry |
| JPS6162739A (ja) * | 1984-09-03 | 1986-03-31 | Sanki Eng Co Ltd | クリ−ントンネル |
| DE3513501A1 (de) * | 1985-04-16 | 1986-10-16 | Rofin-Sinar Laser GmbH, 2000 Hamburg | Laserschweissgeraet |
| SU1376011A1 (ru) * | 1985-06-25 | 1988-02-23 | Всесоюзный научно-исследовательский геологоразведочный нефтяной институт | Безокошечна кювета дл спектрального газохроматографического детектировани |
| DE3526458A1 (de) * | 1985-07-24 | 1987-01-29 | Grundig Emv | Einrichtung zur optischen truebungsmessung von gasen |
| US4648714A (en) * | 1985-09-11 | 1987-03-10 | University Of Utah | Molecular gas analysis by Raman scattering in intracavity laser configuration |
| US4676639A (en) * | 1986-01-22 | 1987-06-30 | Biomaterials International, Inc. | Gas cell for raman scattering analysis by laser means |
| US4786188A (en) * | 1986-02-27 | 1988-11-22 | Rosemont Inc. | Purge air system for a combustion instrument |
| US4654226A (en) * | 1986-03-03 | 1987-03-31 | The University Of Delaware | Apparatus and method for photochemical vapor deposition |
| US4701096A (en) * | 1986-03-05 | 1987-10-20 | Btu Engineering Corporation | Wafer handling station |
| NL8600998A (nl) * | 1986-04-19 | 1987-11-16 | Nederlandse Gasunie Nv | Werkwijze voor het bepalen van een fysische eigenschap van een medium. |
| US4746215A (en) * | 1986-04-24 | 1988-05-24 | Pacific Scientific Company | Particle counter air inlet assembly |
| US4672620A (en) * | 1986-05-14 | 1987-06-09 | Spectra-Physics, Inc. | Fast axial flow carbon dioxide laser |
| US4784491A (en) * | 1986-06-03 | 1988-11-15 | General Electric Company | System to protect optics against dirty environments |
| JPS6396541A (ja) * | 1986-10-14 | 1988-04-27 | Sanyo Electric Co Ltd | ガス濃度測定装置 |
| DE3851458T2 (de) * | 1987-04-08 | 1995-02-09 | Hitachi Ltd | Vorrichtung mit einer scheideförmigen Durchflusszelle. |
| US4787750A (en) * | 1987-04-08 | 1988-11-29 | Westinghouse Electric Corp. | Gas spectrometer construction having an improved alignment feature |
| US4845426A (en) * | 1987-05-20 | 1989-07-04 | Signatone Corporation | Temperature conditioner for tests of unpackaged semiconductors |
| US4846102A (en) * | 1987-06-24 | 1989-07-11 | Epsilon Technology, Inc. | Reaction chambers for CVD systems |
| US4840226A (en) * | 1987-08-10 | 1989-06-20 | The United States Of America As Represented By The United States Department Of Energy | Corrosive resistant heat exchanger |
| US4784486A (en) * | 1987-10-06 | 1988-11-15 | Albion Instruments | Multi-channel molecular gas analysis by laser-activated Raman light scattering |
| US4837443A (en) * | 1987-10-15 | 1989-06-06 | The Perkin-Elmer Corporation | Guard ring for a differentially pumped seal apparatus |
| JPH01109243A (ja) * | 1987-10-21 | 1989-04-26 | Ishikawajima Harima Heavy Ind Co Ltd | ガス分析測定装置 |
| US4940327A (en) * | 1988-10-25 | 1990-07-10 | Trc Companies Inc. | Method and apparatus for real time asbestos aerosol monitoring |
| US5011286A (en) * | 1989-08-03 | 1991-04-30 | Met One, Inc. | Multisensor particle counter utilizing a single energy source |
-
1992
- 1992-07-31 US US07/922,874 patent/US5245405A/en not_active Expired - Lifetime
-
1993
- 1993-07-27 AT AT93918413T patent/ATE149683T1/de active
- 1993-07-27 EP EP93918413A patent/EP0653057B1/de not_active Expired - Lifetime
- 1993-07-27 CA CA002140534A patent/CA2140534A1/en not_active Abandoned
- 1993-07-27 DE DE69308566T patent/DE69308566T2/de not_active Expired - Fee Related
- 1993-07-27 WO PCT/US1993/007042 patent/WO1994003794A1/en not_active Ceased
- 1993-07-27 JP JP6505386A patent/JPH08500180A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0653057A1 (de) | 1995-05-17 |
| EP0653057B1 (de) | 1997-03-05 |
| WO1994003794A1 (en) | 1994-02-17 |
| DE69308566D1 (de) | 1997-04-10 |
| US5245405A (en) | 1993-09-14 |
| JPH08500180A (ja) | 1996-01-09 |
| DE69308566T2 (de) | 1997-06-12 |
| CA2140534A1 (en) | 1994-02-17 |
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