ATE172796T1 - Sonde für hohe auflösung nmr mit wiederorientierung der muster - Google Patents

Sonde für hohe auflösung nmr mit wiederorientierung der muster

Info

Publication number
ATE172796T1
ATE172796T1 AT89908760T AT89908760T ATE172796T1 AT E172796 T1 ATE172796 T1 AT E172796T1 AT 89908760 T AT89908760 T AT 89908760T AT 89908760 T AT89908760 T AT 89908760T AT E172796 T1 ATE172796 T1 AT E172796T1
Authority
AT
Austria
Prior art keywords
nmr probe
high resolution
resolution nmr
reorientation
pattern
Prior art date
Application number
AT89908760T
Other languages
English (en)
Inventor
Alexander Pines
Ago Samoson
Original Assignee
Univ California
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/227,729 external-priority patent/US4899111A/en
Priority claimed from US07/371,977 external-priority patent/US4968939A/en
Application filed by Univ California filed Critical Univ California
Application granted granted Critical
Publication of ATE172796T1 publication Critical patent/ATE172796T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/30—Sample handling arrangements, e.g. sample cells, spinning mechanisms
    • G01R33/307—Sample handling arrangements, e.g. sample cells, spinning mechanisms specially adapted for moving the sample relative to the MR system, e.g. spinning mechanisms, flow cells or means for positioning the sample inside a spectrometer

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Measuring Magnetic Variables (AREA)
AT89908760T 1988-08-03 1989-08-01 Sonde für hohe auflösung nmr mit wiederorientierung der muster ATE172796T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US07/227,729 US4899111A (en) 1988-08-03 1988-08-03 Probe for high resolution NMR with sample reorientation
US07/371,916 US4968938A (en) 1988-08-03 1989-06-27 Method and sample spinning apparatus for measuring the NMR spectrum of an orientationally disordered sample
US07/371,977 US4968939A (en) 1988-08-03 1989-06-27 Method and apparatus for measuring the NMR spectrum of an orientationally disordered sample

Publications (1)

Publication Number Publication Date
ATE172796T1 true ATE172796T1 (de) 1998-11-15

Family

ID=27397757

Family Applications (1)

Application Number Title Priority Date Filing Date
AT89908760T ATE172796T1 (de) 1988-08-03 1989-08-01 Sonde für hohe auflösung nmr mit wiederorientierung der muster

Country Status (5)

Country Link
EP (1) EP0427759B1 (de)
JP (1) JPH0816656B2 (de)
AT (1) ATE172796T1 (de)
DE (1) DE68928842T2 (de)
WO (1) WO1990001705A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5736122A (en) * 1991-02-08 1998-04-07 Diatide, Inc. Technetium-99m labeled peptides for thrombus imaging
DE69230525T2 (de) * 1991-02-08 2000-06-21 Diatide, Inc. Technetium-99m markierte Polypeptide zur Bildformung
US5325059A (en) * 1992-03-26 1994-06-28 Doty Scientific Inc. DOR NMR sample spinner
US5508020A (en) 1992-06-05 1996-04-16 Diatech, Inc. Technetium-99M labeled peptides for imaging
DE4442742C1 (de) * 1994-12-01 1996-05-23 Bruker Analytische Messtechnik Probenkopf für die Kernresonanz-Spektroskopie
WO2007003218A1 (en) 2005-07-05 2007-01-11 Commissariat A L'energie Atomique Apparatus for high-resolution nmr spectroscopy and/or imaging with an improved filling factor and rf field amplitude
JP2020034481A (ja) * 2018-08-31 2020-03-05 国立大学法人京都大学 核磁気共鳴装置、及び微結晶構造解析方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4301410A (en) * 1979-09-28 1981-11-17 International Business Machines Corporation Spin imaging in solids using synchronously rotating field gradients and samples
US4352066A (en) * 1980-10-31 1982-09-28 International Business Machines Corporation Method for adjusting the magic angle in NMR experiments
US4511841A (en) * 1982-06-17 1985-04-16 Chemagnetics, Inc. Method and apparatus for high speed magic angle spinning
US4710714A (en) * 1984-04-10 1987-12-01 The Regents Of The University Of California Method and apparatus for measuring nuclear magnetic properties

Also Published As

Publication number Publication date
JPH04500117A (ja) 1992-01-09
EP0427759B1 (de) 1998-10-28
JPH0816656B2 (ja) 1996-02-21
DE68928842T2 (de) 1999-04-29
WO1990001705A1 (en) 1990-02-22
EP0427759A4 (en) 1991-10-23
EP0427759A1 (de) 1991-05-22
DE68928842D1 (de) 1998-12-03

Similar Documents

Publication Publication Date Title
KR100242532B1 (en) Probe apparatus having burn-in test function
DE68924744D1 (de) Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung.
GB8823795D0 (en) Testing device & method of determining uncertainty of measurement of coordinate-measuring instruments
FR2614105B1 (fr) Appareil et sonde pour le test de cartes de circuit imprime
DE68912396D1 (de) Sonde für ein Ultraschall-Operationsinstrument.
EP0426275A3 (en) Electrical test probe
DE69110437D1 (de) Vorrichtung zur zerstörungsfreien Prüfung von länglichen Elementen mit annähernd konstantem Querschnitt.
DZ1185A1 (fr) Sonde de diagraphie équipée de patins de mesure à large champ d'observation angulaire.
EP0432870A3 (en) Electrical test probe
FR2647551B1 (fr) Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application
ATE98773T1 (de) Verfahren zur optischen analyse.
DE68924633D1 (de) Sonde für einen optischen Sensor.
EP0616239A3 (de) Verfahren zur Positionierung einer elektronischen Sonde einer Spannungsmesseinrichtung.
DE69032110D1 (de) Ellipsometrische Vorrichtung mit hohem Auflösungsvermögen
FR2503872B1 (fr) Sonde active de tension pour instruments electroniques de mesure
ATE172796T1 (de) Sonde für hohe auflösung nmr mit wiederorientierung der muster
DE69000071D1 (de) Vorrichtung zur dynamischen torsionspruefung einer probe.
GB8804844D0 (en) Device for hardness measuring instrument
ITMI912345A0 (it) Procedimento per la realizzazione di strutture metrologiche particolarmente per l'analisi dell'accuratezza di strumenti di misura di allineamento su substrati processati.
FR2615955B1 (fr) Sonde pour tester des composants electroniques
GB8802256D0 (en) Device for hardness measuring instrument
SU1682765A1 (ru) Способ измерени линейных параметров детали на микроинтерферометре
SU1421974A1 (ru) Способ измерени размеров детали
GB9023373D0 (en) Device for measuring the thermomechanical characteristics of a test sample
GB9718522D0 (en) Method and test probe for the non-destructive testing of the surfaces of electrically conductive materials

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties