ATE209819T1 - Fortgeschrittene programmierverifikation für flash-speicher mit seitenmodus - Google Patents

Fortgeschrittene programmierverifikation für flash-speicher mit seitenmodus

Info

Publication number
ATE209819T1
ATE209819T1 AT95908432T AT95908432T ATE209819T1 AT E209819 T1 ATE209819 T1 AT E209819T1 AT 95908432 T AT95908432 T AT 95908432T AT 95908432 T AT95908432 T AT 95908432T AT E209819 T1 ATE209819 T1 AT E209819T1
Authority
AT
Austria
Prior art keywords
flash eeprom
programming
eeprom cells
columns
coupled
Prior art date
Application number
AT95908432T
Other languages
English (en)
Inventor
Tien-Ler Lin
Chun-Hsiung Hung
Kota Soejima
Jun Takahashi
Kong-Mou Liou
Ray-Lin Wan
Original Assignee
Macronix Int Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Macronix Int Co Ltd filed Critical Macronix Int Co Ltd
Application granted granted Critical
Publication of ATE209819T1 publication Critical patent/ATE209819T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0491—Virtual ground arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/14—Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
AT95908432T 1995-01-05 1995-01-05 Fortgeschrittene programmierverifikation für flash-speicher mit seitenmodus ATE209819T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1995/000077 WO1996021227A1 (en) 1995-01-05 1995-01-05 Advanced program verify for page mode flash memory

Publications (1)

Publication Number Publication Date
ATE209819T1 true ATE209819T1 (de) 2001-12-15

Family

ID=22248452

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95908432T ATE209819T1 (de) 1995-01-05 1995-01-05 Fortgeschrittene programmierverifikation für flash-speicher mit seitenmodus

Country Status (5)

Country Link
EP (1) EP0801795B1 (de)
JP (1) JPH10511798A (de)
AT (1) ATE209819T1 (de)
DE (1) DE69524257T2 (de)
WO (1) WO1996021227A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5787039A (en) * 1997-03-06 1998-07-28 Macronix International Co., Ltd. Low current floating gate programming with bit-by-bit verification
US5999451A (en) * 1998-07-13 1999-12-07 Macronix International Co., Ltd. Byte-wide write scheme for a page flash device
US6147910A (en) * 1999-08-31 2000-11-14 Macronix International Co., Ltd. Parallel read and verify for floating gate memory device
AU2108701A (en) * 1999-12-17 2001-06-25 Qualcomm Incorporated Mobile communication device having flash memory system with word line buffer
EP1381057B1 (de) * 2002-07-10 2008-12-03 STMicroelectronics S.r.l. Zeilenauswahlschaltung für Speicherzellenarray
DE102004063641B4 (de) * 2004-12-27 2011-12-08 Infineon Technologies Ag Nichtflüchtige Speichereinrichtung zum Speichern von Daten und Verfahren zum Löschen oder Programmieren derselben

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63271679A (ja) * 1987-04-30 1988-11-09 Toshiba Corp デ−タ書込み方式
US5053990A (en) * 1988-02-17 1991-10-01 Intel Corporation Program/erase selection for flash memory
US5126808A (en) * 1989-10-23 1992-06-30 Advanced Micro Devices, Inc. Flash EEPROM array with paged erase architecture
US5363330A (en) * 1991-01-28 1994-11-08 Mitsubishi Denki Kabushiki Kaisha Non-volatile semiconductor memory device incorporating data latch and address counter for page mode programming
KR960002004B1 (ko) * 1991-02-19 1996-02-09 가부시키가이샤 도시바 기록검증 제어회로를 갖춘 전기적으로 소거 및 프로그램가능한 독출전용 기억장치
KR950000273B1 (ko) * 1992-02-21 1995-01-12 삼성전자 주식회사 불휘발성 반도체 메모리장치 및 그 최적화 기입방법
US5778440A (en) * 1994-10-26 1998-07-07 Macronix International Co., Ltd. Floating gate memory device and method for terminating a program load cycle upon detecting a predetermined address/data pattern

Also Published As

Publication number Publication date
JPH10511798A (ja) 1998-11-10
EP0801795A4 (de) 1999-05-19
EP0801795A1 (de) 1997-10-22
DE69524257D1 (de) 2002-01-10
WO1996021227A1 (en) 1996-07-11
DE69524257T2 (de) 2002-12-12
EP0801795B1 (de) 2001-11-28

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Legal Events

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