ATE233900T1 - Verfahren zur kontrolle von leiterplatten - Google Patents

Verfahren zur kontrolle von leiterplatten

Info

Publication number
ATE233900T1
ATE233900T1 AT96912210T AT96912210T ATE233900T1 AT E233900 T1 ATE233900 T1 AT E233900T1 AT 96912210 T AT96912210 T AT 96912210T AT 96912210 T AT96912210 T AT 96912210T AT E233900 T1 ATE233900 T1 AT E233900T1
Authority
AT
Austria
Prior art keywords
circuit boards
checking circuit
needles
needle
board
Prior art date
Application number
AT96912210T
Other languages
English (en)
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System Srl filed Critical New System Srl
Application granted granted Critical
Publication of ATE233900T1 publication Critical patent/ATE233900T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Selective Calling Equipment (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Facsimiles In General (AREA)
  • Sewing Machines And Sewing (AREA)
  • Preliminary Treatment Of Fibers (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Dc-Dc Converters (AREA)
  • Video Image Reproduction Devices For Color Tv Systems (AREA)
  • Knitting Machines (AREA)
  • Telephonic Communication Services (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Detection And Correction Of Errors (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Control Of Electric Motors In General (AREA)
AT96912210T 1995-09-22 1996-05-03 Verfahren zur kontrolle von leiterplatten ATE233900T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000181A IT1282827B1 (it) 1995-09-22 1995-09-22 Macchina per il controllo contrapposto dei circuiti stampati
PCT/IT1996/000090 WO1997011377A1 (en) 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits

Publications (1)

Publication Number Publication Date
ATE233900T1 true ATE233900T1 (de) 2003-03-15

Family

ID=11421917

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96912210T ATE233900T1 (de) 1995-09-22 1996-05-03 Verfahren zur kontrolle von leiterplatten

Country Status (25)

Country Link
US (1) US6218851B1 (de)
EP (1) EP0852014B1 (de)
JP (1) JPH11512530A (de)
KR (1) KR100407068B1 (de)
CN (1) CN1100268C (de)
AT (1) ATE233900T1 (de)
AU (1) AU710084B2 (de)
BR (1) BR9610589A (de)
CA (1) CA2231865A1 (de)
CZ (1) CZ294961B6 (de)
DE (1) DE69626527T2 (de)
DK (1) DK0852014T3 (de)
ES (1) ES2194098T3 (de)
HU (1) HUP9900003A3 (de)
IT (1) IT1282827B1 (de)
MX (1) MX9802287A (de)
NO (1) NO316412B1 (de)
NZ (1) NZ306552A (de)
PL (1) PL190321B1 (de)
PT (1) PT852014E (de)
RO (1) RO119658B1 (de)
RU (1) RU2182748C2 (de)
SI (1) SI9620113B (de)
TR (1) TR199800516T1 (de)
WO (1) WO1997011377A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10219618A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Vorrichtung zum Testen von Leiterplatten
KR100835182B1 (ko) * 2007-02-12 2008-06-04 주식회사 백승 인쇄회로기판 검사용 지그
DE102007025458A1 (de) * 2007-05-30 2008-12-04 Siemens Ag Codierung, insbesondere für eine Einschubanordnung eines elektrischen Schaltfeldes
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
US8269505B2 (en) * 2009-12-15 2012-09-18 International Business Machines Corporation Locating short circuits in printed circuit boards
DE102016114144A1 (de) * 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Prüfung von elektrischen Verbindungen von Bauteilen mit einer Leiterplatte

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
SU1531234A1 (ru) * 1987-07-10 1989-12-23 Научно-производственное объединение "Ротор" Устройство дл контрол печатных блоков
FR2653422B1 (fr) * 1989-10-19 1992-01-03 Elf Aquitaine Procede pour ameliorer le rendement en soufre d'un ensemble de production de soufre a partir d'un gaz acide renfermant h2s, ledit ensemble comportant une usine a soufre, puis une unite d'oxydation et d'hydrolyse suivie d'une unite d'epuration.
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
RU2019923C1 (ru) * 1991-05-15 1994-09-15 Научно-исследовательский центр электронной вычислительной техники Устройство для контроля печатных плат
EP0547251A1 (de) * 1991-12-14 1993-06-23 International Business Machines Corporation Methode zum Testen eines Mikroschaltkreises
NZ315085A (en) 1995-12-22 2007-12-21 New System Srl Testing printed circuit boards, two coplanar boards containing test needles movable with respect to each other
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester

Also Published As

Publication number Publication date
DE69626527D1 (de) 2003-04-10
ES2194098T3 (es) 2003-11-16
PT852014E (pt) 2003-07-31
DK0852014T3 (da) 2003-06-23
MX9802287A (es) 1998-08-30
ITUD950181A1 (it) 1997-03-22
DE69626527T2 (de) 2003-12-24
RU2182748C2 (ru) 2002-05-20
HUP9900003A2 (hu) 1999-04-28
AU710084B2 (en) 1999-09-16
WO1997011377A1 (en) 1997-03-27
CZ74598A3 (cs) 1998-07-15
TR199800516T1 (xx) 1998-05-21
IT1282827B1 (it) 1998-03-31
US6218851B1 (en) 2001-04-17
HUP9900003A3 (en) 1999-11-29
NO981179D0 (no) 1998-03-17
NO981179L (no) 1998-04-23
NZ306552A (en) 2000-01-28
CN1100268C (zh) 2003-01-29
CA2231865A1 (en) 1997-03-27
ITUD950181A0 (de) 1995-09-22
CZ294961B6 (cs) 2005-04-13
BR9610589A (pt) 1999-07-06
NO316412B1 (no) 2004-01-19
EP0852014A1 (de) 1998-07-08
JPH11512530A (ja) 1999-10-26
SI9620113B (en) 2005-08-31
PL190321B1 (pl) 2005-11-30
RO119658B1 (ro) 2005-01-28
CN1196794A (zh) 1998-10-21
EP0852014B1 (de) 2003-03-05
KR100407068B1 (ko) 2004-01-24
PL325827A1 (en) 1998-08-03
KR19990063615A (ko) 1999-07-26
AU5513496A (en) 1997-04-09
SI9620113A (sl) 1998-08-31

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