ATE233903T1 - Verfahren zum prüfen von elektronischen komponenten - Google Patents

Verfahren zum prüfen von elektronischen komponenten

Info

Publication number
ATE233903T1
ATE233903T1 AT00401863T AT00401863T ATE233903T1 AT E233903 T1 ATE233903 T1 AT E233903T1 AT 00401863 T AT00401863 T AT 00401863T AT 00401863 T AT00401863 T AT 00401863T AT E233903 T1 ATE233903 T1 AT E233903T1
Authority
AT
Austria
Prior art keywords
date
measurement
component
electronic components
population
Prior art date
Application number
AT00401863T
Other languages
English (en)
Inventor
Philippe Lejeune
Original Assignee
Softlink
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Softlink filed Critical Softlink
Application granted granted Critical
Publication of ATE233903T1 publication Critical patent/ATE233903T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Ceramic Capacitors (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
AT00401863T 1999-07-05 2000-06-29 Verfahren zum prüfen von elektronischen komponenten ATE233903T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9909055A FR2796157B1 (fr) 1999-07-05 1999-07-05 Procede de tests de composants electroniques

Publications (1)

Publication Number Publication Date
ATE233903T1 true ATE233903T1 (de) 2003-03-15

Family

ID=9548036

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00401863T ATE233903T1 (de) 1999-07-05 2000-06-29 Verfahren zum prüfen von elektronischen komponenten

Country Status (9)

Country Link
US (1) US6426643B1 (de)
EP (1) EP1067392B1 (de)
JP (1) JP2001085490A (de)
CN (1) CN1281991A (de)
AT (1) ATE233903T1 (de)
CA (1) CA2313346A1 (de)
DE (1) DE60001520T2 (de)
FR (1) FR2796157B1 (de)
SG (1) SG90733A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6442499B1 (en) 2000-03-29 2002-08-27 Test Advantage, Inc. Methods and apparatus for statistical process control of test
FR2812401B1 (fr) * 2000-07-28 2002-10-11 Bealach Bo No Finne Teo Ta Gal Procede de test de composants electroniques tenant compte de la derive de la moyenne
US7167811B2 (en) 2001-05-24 2007-01-23 Test Advantage, Inc. Methods and apparatus for data analysis
US7225107B2 (en) 2001-05-24 2007-05-29 Test Advantage, Inc. Methods and apparatus for data analysis
US7395170B2 (en) 2001-05-24 2008-07-01 Test Advantage, Inc. Methods and apparatus for data analysis
US6782297B2 (en) 2001-05-24 2004-08-24 Eric Paul Tabor Methods and apparatus for data smoothing
KR20060103961A (ko) * 2001-07-17 2006-10-04 주식회사 아도반테스토 입출력 회로, 및 시험 장치
US7904279B2 (en) 2004-04-02 2011-03-08 Test Advantage, Inc. Methods and apparatus for data analysis

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686628A (en) * 1984-07-19 1987-08-11 Fairchild Camera & Instrument Corp. Electric device or circuit testing method and apparatus
US5703382A (en) * 1995-11-20 1997-12-30 Xerox Corporation Array having multiple channel structures with continuously doped interchannel regions
FR2749396B1 (fr) * 1996-05-29 1998-08-07 Softlink Outil d'aide pour appareil de test de composants electroniques
US6083272A (en) * 1997-06-13 2000-07-04 Advanced Micro Devices, Inc. Method of adjusting currents on a semiconductor device having transistors of varying density
US6049220A (en) * 1998-06-10 2000-04-11 Boxer Cross Incorporated Apparatus and method for evaluating a wafer of semiconductor material

Also Published As

Publication number Publication date
EP1067392B1 (de) 2003-03-05
DE60001520T2 (de) 2003-11-13
SG90733A1 (en) 2002-08-20
US6426643B1 (en) 2002-07-30
FR2796157A1 (fr) 2001-01-12
JP2001085490A (ja) 2001-03-30
EP1067392A3 (de) 2001-11-21
EP1067392A2 (de) 2001-01-10
DE60001520D1 (de) 2003-04-10
CA2313346A1 (en) 2001-01-05
FR2796157B1 (fr) 2002-05-31
CN1281991A (zh) 2001-01-31

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Legal Events

Date Code Title Description
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