ATE237122T1 - Verfahren und vorrichtungen zur prüfung von beschichtungen - Google Patents

Verfahren und vorrichtungen zur prüfung von beschichtungen

Info

Publication number
ATE237122T1
ATE237122T1 AT96917648T AT96917648T ATE237122T1 AT E237122 T1 ATE237122 T1 AT E237122T1 AT 96917648 T AT96917648 T AT 96917648T AT 96917648 T AT96917648 T AT 96917648T AT E237122 T1 ATE237122 T1 AT E237122T1
Authority
AT
Austria
Prior art keywords
container
coating
degradation
image
image signal
Prior art date
Application number
AT96917648T
Other languages
English (en)
Inventor
Junjirou Imaizumi
Tsutomu Amano
Yoshimoto Take
Yoshito Amino
Original Assignee
Kirin Brewery
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP14775295A external-priority patent/JPH08338815A/ja
Priority claimed from JP20601395A external-priority patent/JP3304239B2/ja
Application filed by Kirin Brewery filed Critical Kirin Brewery
Application granted granted Critical
Publication of ATE237122T1 publication Critical patent/ATE237122T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Paints Or Removers (AREA)
AT96917648T 1995-06-14 1996-06-12 Verfahren und vorrichtungen zur prüfung von beschichtungen ATE237122T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP14775295A JPH08338815A (ja) 1995-06-14 1995-06-14 びん検査装置及びびん検査方法
JP20601395A JP3304239B2 (ja) 1995-08-11 1995-08-11 びんのコーティング膜厚測定装置及びコーティング膜厚測定方法
PCT/JP1996/001586 WO1997000423A1 (fr) 1995-06-14 1996-06-12 Appareil et methode pour le controle d'une pellicule de revetement

Publications (1)

Publication Number Publication Date
ATE237122T1 true ATE237122T1 (de) 2003-04-15

Family

ID=26478206

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96917648T ATE237122T1 (de) 1995-06-14 1996-06-12 Verfahren und vorrichtungen zur prüfung von beschichtungen

Country Status (7)

Country Link
US (1) US5991018A (de)
EP (1) EP0833126B1 (de)
KR (1) KR100418069B1 (de)
AT (1) ATE237122T1 (de)
AU (1) AU6014996A (de)
DE (1) DE69627328T2 (de)
WO (1) WO1997000423A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
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US5896195A (en) * 1997-05-15 1999-04-20 Owens-Brockway Glass Container Inc. Container sealing surface area inspection
US6190432B1 (en) 1999-02-26 2001-02-20 Donaldson Company, Inc. Filter arrangement; sealing system; and methods
US6256095B1 (en) 2000-01-21 2001-07-03 Owens-Brockway Glass Container Inc. Container sealing surface area inspection
NL1018427C2 (nl) * 2001-06-29 2003-01-07 Fountain Tech Bv Werkwijze en inrichting voor het controleren van producten met labels.
US6998147B2 (en) * 2002-07-08 2006-02-14 Dimension Bond Corporation Method for simultaneously coating and measuring parts
US6995377B2 (en) * 2002-08-02 2006-02-07 Plastipak Packaging, Inc. Process and apparatus for testing bottles
FR2849180A1 (fr) * 2002-12-20 2004-06-25 Atofina Procede et appareil pour la mesure sans contact de l'epaisseur d'un revetement sur un substrat
DE102004037555B4 (de) * 2004-08-03 2012-09-06 Erlus Aktiengesellschaft Verfahren zur berührungslosen und/oder zerstörungsfreien Prüfung einer photokatalytischen Oberflächenbeschichtung
US20070110280A1 (en) * 2005-10-28 2007-05-17 Weldon Lisa M Methods for Determining Coating Thickness of a Prosthesis
KR100912220B1 (ko) * 2007-08-30 2009-08-14 재단법인서울대학교산학협력재단 코팅 스트레스 측정장치
KR100891934B1 (ko) * 2007-09-03 2009-04-08 한국도로공사 영상처리 기법을 이용한 강교의 도막검사 시스템의 처리방법
KR101387840B1 (ko) * 2009-01-15 2014-04-22 도요타지도샤가부시키가이샤 도포 시공막의 폭의 검사 방법 및 상기 검사 방법에 사용하는 검사 장치
MX2012001478A (es) * 2009-08-05 2012-02-29 Sidel Spa Sistema para orientacion y deteccion angular de recipientes en maquinas etiquetadoras.
GB0919059D0 (en) * 2009-10-30 2009-12-16 Sencon Europ Ltd Application and inspection system
GB2491151B (en) * 2011-05-24 2017-11-15 Qioptiq Ltd Methods and apparatuses for inferring or predicting the thickness distribution of a layer of coating material deposited or to be deposited on a curved surface
US9074874B2 (en) * 2012-02-24 2015-07-07 Litesentry Corporation Coating detection on transparent sheet material
KR101191828B1 (ko) * 2012-06-14 2012-10-16 김만수 전자제품 케이스용 지그 재활용을 위한 도료 제거장치와 이를 이용한 제거방법
US10247679B2 (en) * 2015-10-16 2019-04-02 ZebraSci, Inc Calibration and detection of silicone oil in syringe barrels
CN108474732B (zh) * 2016-01-07 2022-04-15 阿科玛股份有限公司 测量高速移动的弯曲物体上沉积涂层厚度的不依赖于物体位置的方法
US11125549B2 (en) 2016-01-07 2021-09-21 Arkema Inc. Optical intensity method to measure the thickness of coatings deposited on substrates
CN108474739B (zh) * 2016-01-07 2021-10-01 阿科玛股份有限公司 测量基材上沉积的涂层的厚度的光学方法
FR3053791A1 (fr) * 2016-07-05 2018-01-12 Sidel Participations Procede de controle par colorimetrie de la qualite d'un recipient pourvu d'une couche barriere interne
RU2718483C2 (ru) 2016-09-23 2020-04-08 Общество с ограниченной ответственностью "Гардиан Стекло Сервиз" Система и/или способ распознавания покрытия для стекла
US10422755B2 (en) * 2016-12-07 2019-09-24 Applied Vision Corporation Identifying defects in transparent containers
EP3531067B1 (de) * 2018-02-21 2025-04-02 Schneider GmbH & Co. KG Vorrichtung und verfahren zum vermessen mindestens eines optisch wirksamen gegenstands
JP7445994B2 (ja) 2019-01-14 2024-03-08 エイジーアール インターナショナル，インコーポレイテッド 液体充填中空透明物品を検査するための方法および装置
CN111208136B (zh) * 2020-01-16 2023-04-07 东莞维科电池有限公司 一种在线检查涂层隔膜朝向的方法及装置
CN117388994B (zh) * 2023-10-20 2025-08-05 江苏华脉新材料有限公司 一种抗扭转蝶形引入光缆及其制作方法

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US3749923A (en) * 1971-09-30 1973-07-31 Acurex Corp Optical label inspecting apparatus
US4017194A (en) * 1975-09-22 1977-04-12 Anchor Hocking Corporation Apparatus and method for differentiating between polymer coated glass containers and uncoated containers
JPS608726B2 (ja) * 1978-10-09 1985-03-05 石塚硝子株式会社 ガラス等の表面に施された金属あるいは酸化金属被膜の厚さ測定装置
US4693376A (en) * 1981-05-26 1987-09-15 National Can Corporation Apparatus for inspecting containers
JPS58178206A (ja) * 1982-04-13 1983-10-19 Canon Inc 薄膜下引層の膜厚検査法
JPS58184537A (ja) * 1982-04-22 1983-10-28 Meidensha Electric Mfg Co Ltd 硝子ビンのきず検出装置
DE3278861D1 (en) * 1982-05-27 1988-09-08 I2S Automatic container testing process and device comparing transparency
JPS61155941A (ja) * 1984-12-28 1986-07-15 Suntory Ltd 容器の検査装置
JPS6242006A (ja) * 1985-08-19 1987-02-24 Nippon Soken Inc 光学薄膜の膜厚測定装置
JPS62135707A (ja) * 1985-12-09 1987-06-18 Nisshin Steel Co Ltd クロメ−ト処理鋼板のクロメ−ト皮膜付着量測定方法
US4791287A (en) * 1987-11-27 1988-12-13 American Glass Research, Inc. Apparatus and an associated method for detecting haze or pearlescence in containers
JPH01145555A (ja) * 1987-12-01 1989-06-07 Nippon Taisanbin Kogyo Kk 光学的検査装置
US5139406A (en) * 1987-12-16 1992-08-18 Dai Nippon Insatsu Kabushiki Kaisha Apparatus and system for inspecting wall thickness of synthetic resin containers
US4859863A (en) * 1988-01-11 1989-08-22 Sonoco Products Company Label inspection apparatus sensing reflectivity values
JPH0663968B2 (ja) * 1988-11-16 1994-08-22 日本真空技術株式会社 光学モニタ装置
JPH02310405A (ja) * 1989-05-25 1990-12-26 Nippon Steel Corp 薄膜厚み分布測定方法
JP2672391B2 (ja) * 1989-07-26 1997-11-05 麒麟麦酒 株式会社 ガラス壜とその製造法
NL8902916A (nl) * 1989-11-24 1991-06-17 Heuft Qualiplus Bv Inspectie-inrichting op basis van donkerveld-belichting.
US5755335A (en) * 1995-07-26 1998-05-26 Steinmetz Machine Works, Inc. Apparatus and method for centralized indexed inspection and rejection of products

Also Published As

Publication number Publication date
KR100418069B1 (ko) 2004-07-01
EP0833126B1 (de) 2003-04-09
KR19990022912A (ko) 1999-03-25
AU6014996A (en) 1997-01-15
DE69627328D1 (de) 2003-05-15
WO1997000423A1 (fr) 1997-01-03
DE69627328T2 (de) 2004-02-12
EP0833126A4 (de) 1998-09-30
EP0833126A1 (de) 1998-04-01
US5991018A (en) 1999-11-23

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Legal Events

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