ATE252273T1 - Massenspektrometerionenquelle und reinigungsverfahren dafür - Google Patents

Massenspektrometerionenquelle und reinigungsverfahren dafür

Info

Publication number
ATE252273T1
ATE252273T1 AT98937676T AT98937676T ATE252273T1 AT E252273 T1 ATE252273 T1 AT E252273T1 AT 98937676 T AT98937676 T AT 98937676T AT 98937676 T AT98937676 T AT 98937676T AT E252273 T1 ATE252273 T1 AT E252273T1
Authority
AT
Austria
Prior art keywords
sample
mass spectrometer
ion source
orifice
inlet orifice
Prior art date
Application number
AT98937676T
Other languages
English (en)
Inventor
Stevan Bajic
Original Assignee
Thermo Finnigan Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Finnigan Llc filed Critical Thermo Finnigan Llc
Application granted granted Critical
Publication of ATE252273T1 publication Critical patent/ATE252273T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT98937676T 1997-08-06 1998-08-06 Massenspektrometerionenquelle und reinigungsverfahren dafür ATE252273T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9716666A GB2328074B (en) 1997-08-06 1997-08-06 Ion source for a mass analyser and method of cleaning an ion source
PCT/GB1998/002359 WO1999008309A1 (en) 1997-08-06 1998-08-06 Ion source for a mass analyser and method of cleaning an ion source

Publications (1)

Publication Number Publication Date
ATE252273T1 true ATE252273T1 (de) 2003-11-15

Family

ID=10817103

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98937676T ATE252273T1 (de) 1997-08-06 1998-08-06 Massenspektrometerionenquelle und reinigungsverfahren dafür

Country Status (8)

Country Link
US (1) US6380538B1 (de)
EP (1) EP0935813B1 (de)
JP (1) JP4205767B2 (de)
AT (1) ATE252273T1 (de)
CA (1) CA2266708C (de)
DE (1) DE69818966T2 (de)
GB (1) GB2328074B (de)
WO (1) WO1999008309A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2346730B (en) * 1999-02-11 2003-04-23 Masslab Ltd Ion source for mass analyser
US6690004B2 (en) 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
JP4576774B2 (ja) * 2001-08-28 2010-11-10 株式会社島津製作所 液体クロマトグラフ質量分析装置
US7015466B2 (en) * 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
JP4258318B2 (ja) * 2003-08-22 2009-04-30 株式会社島津製作所 液体クロマトグラフ質量分析装置
US20060208186A1 (en) * 2005-03-15 2006-09-21 Goodley Paul C Nanospray ion source with multiple spray emitters
JP5362586B2 (ja) 2007-02-01 2013-12-11 サイオネックス コーポレイション 質量分光計のための微分移動度分光計プレフィルタ
JP5722125B2 (ja) * 2011-06-03 2015-05-20 株式会社日立ハイテクノロジーズ 質量分析装置
US8378293B1 (en) 2011-09-09 2013-02-19 Agilent Technologies, Inc. In-situ conditioning in mass spectrometer systems
JP5802566B2 (ja) * 2012-01-23 2015-10-28 株式会社日立ハイテクノロジーズ 質量分析装置
US10103014B2 (en) * 2016-09-05 2018-10-16 Agilent Technologies, Inc. Ion transfer device for mass spectrometry
US10304667B1 (en) 2017-12-14 2019-05-28 Thermo Finnigan Llc Apparatus and method for cleaning an inlet of a mass spectrometer
US10388501B1 (en) 2018-04-23 2019-08-20 Agilent Technologies, Inc. Ion transfer device for mass spectrometry with selectable bores

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components
JPH077660B2 (ja) 1984-05-16 1995-01-30 株式会社日立製作所 大気圧イオン化質量分析計
JPS6195244A (ja) * 1984-10-17 1986-05-14 Hitachi Ltd 液体クロマトグラフ質量分析計結合装置
JP2834136B2 (ja) 1988-04-27 1998-12-09 株式会社日立製作所 質量分析計
US5229605A (en) * 1990-01-05 1993-07-20 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Process for the elementary analysis of a specimen by high frequency inductively coupled plasma mass spectrometry and apparatus for carrying out this process
US5171990A (en) 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
JPH06310090A (ja) * 1993-04-23 1994-11-04 Hitachi Ltd 液体クロマトグラフ質量分析計
US5432343A (en) * 1993-06-03 1995-07-11 Gulcicek; Erol E. Ion focusing lensing system for a mass spectrometer interfaced to an atmospheric pressure ion source
JP3367719B2 (ja) 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
EP0749350B1 (de) 1994-03-08 2004-11-10 Analytica Of Branford, Inc. Verbesserung der chemischen sprühionisationsquellen bei atmosphärendruck
GB9525507D0 (en) 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
AU4338997A (en) 1996-09-10 1998-04-02 Analytica Of Branford, Inc. Improvements to atmospheric pressure ion sources

Also Published As

Publication number Publication date
WO1999008309A1 (en) 1999-02-18
JP4205767B2 (ja) 2009-01-07
EP0935813A1 (de) 1999-08-18
GB2328074B (en) 2001-11-07
CA2266708A1 (en) 1999-02-18
GB9716666D0 (en) 1997-10-15
GB2328074A (en) 1999-02-10
JP2001502114A (ja) 2001-02-13
EP0935813B1 (de) 2003-10-15
US6380538B1 (en) 2002-04-30
DE69818966D1 (de) 2003-11-20
DE69818966T2 (de) 2004-07-29
CA2266708C (en) 2006-02-21

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Legal Events

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