ATE258308T1 - Verfahren zur kontrolle der oberfläche einer laufenden materialbahn mit vorklassifikation von ermittelten unregelmässigkeiten - Google Patents

Verfahren zur kontrolle der oberfläche einer laufenden materialbahn mit vorklassifikation von ermittelten unregelmässigkeiten

Info

Publication number
ATE258308T1
ATE258308T1 AT98917232T AT98917232T ATE258308T1 AT E258308 T1 ATE258308 T1 AT E258308T1 AT 98917232 T AT98917232 T AT 98917232T AT 98917232 T AT98917232 T AT 98917232T AT E258308 T1 ATE258308 T1 AT E258308T1
Authority
AT
Austria
Prior art keywords
irregularities
digital
digital picture
classification
picture
Prior art date
Application number
AT98917232T
Other languages
English (en)
Inventor
Patrick Alexandre
Original Assignee
Lorraine Laminage
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lorraine Laminage filed Critical Lorraine Laminage
Application granted granted Critical
Publication of ATE258308T1 publication Critical patent/ATE258308T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Machines For Laying And Maintaining Railways (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT98917232T 1997-03-28 1998-03-25 Verfahren zur kontrolle der oberfläche einer laufenden materialbahn mit vorklassifikation von ermittelten unregelmässigkeiten ATE258308T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9703897A FR2761476B1 (fr) 1997-03-28 1997-03-28 Procede d'inspection de surface d'une bande en defilement par classification prealable d'irregularite de surface detectee
PCT/FR1998/000603 WO1998044337A1 (fr) 1997-03-28 1998-03-25 Procede d'inspection de surface d'une bande en defilement par classification prealable d'irregularite de surface detectee

Publications (1)

Publication Number Publication Date
ATE258308T1 true ATE258308T1 (de) 2004-02-15

Family

ID=9505348

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98917232T ATE258308T1 (de) 1997-03-28 1998-03-25 Verfahren zur kontrolle der oberfläche einer laufenden materialbahn mit vorklassifikation von ermittelten unregelmässigkeiten

Country Status (11)

Country Link
US (1) US6697516B1 (de)
EP (1) EP0970368B1 (de)
JP (1) JP2001516457A (de)
AT (1) ATE258308T1 (de)
AU (1) AU7051098A (de)
BR (1) BR9808097B1 (de)
CA (1) CA2284894C (de)
DE (1) DE69821225T2 (de)
ES (1) ES2213896T3 (de)
FR (1) FR2761476B1 (de)
WO (1) WO1998044337A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001230289A (ja) * 2000-02-15 2001-08-24 Hitachi Ltd 欠陥解析方法および欠陥解析システム
US20030099379A1 (en) * 2001-11-26 2003-05-29 Monk Bruce C. Validation and verification apparatus and method
US20070165243A1 (en) * 2004-02-09 2007-07-19 Cheol-Gwon Kang Device for measuring 3d shape using irregular pattern and method for the same
JP4516884B2 (ja) * 2005-04-28 2010-08-04 新日本製鐵株式会社 周期性欠陥検査方法及び装置
US20100020164A1 (en) * 2005-11-04 2010-01-28 Ronald Perrault Surface Analysis Method and System
US8014973B1 (en) * 2007-09-07 2011-09-06 Kla-Tencor Corporation Distance histogram for nearest neighbor defect classification
US8811136B2 (en) * 2012-11-19 2014-08-19 Lsi Corporation Harmonic ratio based defect classifier
CN111213045B (zh) 2017-06-14 2022-07-01 康特科技公司 自动缺陷分类
JP2019111570A (ja) * 2017-12-26 2019-07-11 Ｊｆｅスチール株式会社 ステンレス冷延鋼板の処理の決定方法および処理方法
CN109035219B (zh) * 2018-07-10 2022-03-29 华南理工大学 基于bp神经网络的fics金手指缺陷检测系统及检测方法
WO2020049338A1 (en) 2018-09-06 2020-03-12 Arcelormittal Method and electronic device for monitoring a manufacturing of a metal product, related computer program and installation
EP3899677B1 (de) 2018-12-18 2022-07-20 ArcelorMittal Verfahren und elektronische vorrichtung zur steuerung der herstellung einer gruppe von metallendprodukten aus einer gruppe von metallzwischenprodukten, zugehöriges computerprogramm, herstellungsverfahren und anlage
CN111062919B (zh) * 2019-12-12 2023-11-03 苏州韦士肯检测科技有限公司 一种轴承套圈外观缺陷检测方法
CN118616703B (zh) * 2024-08-12 2024-10-29 四川金钱柜文化传播有限公司 一种基于贵金属工艺品铸造的控制方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
US4958307A (en) * 1987-11-20 1990-09-18 Kabushiki Kaisha Toshiba Roll mark inspection apparatus
AU627658B2 (en) * 1990-06-13 1992-08-27 Aluminium Company Of America Video inspection system
US5991699A (en) * 1995-05-04 1999-11-23 Kla Instruments Corporation Detecting groups of defects in semiconductor feature space
DE19528519A1 (de) * 1995-08-03 1997-02-06 Tzn Forschung & Entwicklung Vorrichtung zur Detektion streifenförmiger Oberflächenfehler

Also Published As

Publication number Publication date
US6697516B1 (en) 2004-02-24
CA2284894C (fr) 2008-07-22
FR2761476A1 (fr) 1998-10-02
WO1998044337A1 (fr) 1998-10-08
FR2761476B1 (fr) 1999-06-11
ES2213896T3 (es) 2004-09-01
DE69821225T2 (de) 2004-11-11
DE69821225D1 (de) 2004-02-26
CA2284894A1 (fr) 1998-10-08
AU7051098A (en) 1998-10-22
BR9808097A (pt) 2000-03-08
BR9808097B1 (pt) 2010-08-24
EP0970368A1 (de) 2000-01-12
EP0970368B1 (de) 2004-01-21
JP2001516457A (ja) 2001-09-25

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