ATE260484T1 - Systeminitialisierung eines mikrocode-basierten eingebauten speicher-selbsttests - Google Patents

Systeminitialisierung eines mikrocode-basierten eingebauten speicher-selbsttests

Info

Publication number
ATE260484T1
ATE260484T1 AT01943709T AT01943709T ATE260484T1 AT E260484 T1 ATE260484 T1 AT E260484T1 AT 01943709 T AT01943709 T AT 01943709T AT 01943709 T AT01943709 T AT 01943709T AT E260484 T1 ATE260484 T1 AT E260484T1
Authority
AT
Austria
Prior art keywords
test
bist
arrangement
system initialization
testing
Prior art date
Application number
AT01943709T
Other languages
English (en)
Inventor
Robert Dean Adams
Thomas Eckenrode
Steven Gregor
Kamran Zarrineh
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE260484T1 publication Critical patent/ATE260484T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
AT01943709T 2000-07-26 2001-07-05 Systeminitialisierung eines mikrocode-basierten eingebauten speicher-selbsttests ATE260484T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/625,996 US6874111B1 (en) 2000-07-26 2000-07-26 System initialization of microcode-based memory built-in self-test
PCT/GB2001/002984 WO2002008904A2 (en) 2000-07-26 2001-07-05 System initialization of microcode-based memory built-in self-test

Publications (1)

Publication Number Publication Date
ATE260484T1 true ATE260484T1 (de) 2004-03-15

Family

ID=24508516

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01943709T ATE260484T1 (de) 2000-07-26 2001-07-05 Systeminitialisierung eines mikrocode-basierten eingebauten speicher-selbsttests

Country Status (9)

Country Link
US (1) US6874111B1 (de)
EP (1) EP1303815B1 (de)
JP (1) JP3823087B2 (de)
KR (1) KR100536393B1 (de)
AT (1) ATE260484T1 (de)
AU (1) AU2001266240A1 (de)
DE (1) DE60102164T2 (de)
TW (1) TWI226644B (de)
WO (1) WO2002008904A2 (de)

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EP1343174B1 (de) * 2002-03-04 2011-05-04 Synopsys, Inc. Programmierbarer Speichertest
US7096393B2 (en) * 2002-12-20 2006-08-22 Sun Microsystems, Inc. Built-in self-test (BIST) of memory interconnect
US7062694B2 (en) * 2003-02-07 2006-06-13 Sun Microsystems, Inc. Concurrently programmable dynamic memory built-in self-test (BIST)
US7184915B2 (en) * 2003-03-20 2007-02-27 Qualcomm, Incorporated Tiered built-in self-test (BIST) architecture for testing distributed memory modules
US7392442B2 (en) 2003-03-20 2008-06-24 Qualcomm Incorporated Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol
DE10334801B3 (de) * 2003-07-30 2005-01-27 Infineon Technologies Ag Halbleiterschaltung und Verfahren zum Testen, Überwachen und applikationsnahen Einstellen einer Halbleiterschaltung
US20050149786A1 (en) * 2003-12-19 2005-07-07 Hassan Mohamed A. Apparatus and method for determining threshold voltages in a flash memory unit
US20050149785A1 (en) * 2003-12-19 2005-07-07 Hassan Mohamed A. Apparatus and method for testing a flash memory unit using stress voltages
US20050138497A1 (en) * 2003-12-19 2005-06-23 Hassan Mohamed A. Apparatus and method for testing a flash memory unit
US7533309B2 (en) 2004-02-26 2009-05-12 Nilanjan Mukherjee Testing memories using algorithm selection
EP1825479A4 (de) * 2004-11-18 2008-04-16 Mentor Graphics Corp Verfahren und vorrichtung für einen integrierten programmierbaren speicher-selbsttest (mbist)
FR2879337A1 (fr) * 2004-12-15 2006-06-16 St Microelectronics Sa Circuit memoire, tel que dram, comportant un mecanisme correcteur d'erreur
US7716542B2 (en) * 2007-11-13 2010-05-11 Faraday Technology Corp. Programmable memory built-in self-test circuit and clock switching circuit thereof
US8570077B2 (en) * 2010-12-17 2013-10-29 Qualcomm Incorporated Methods and implementation of low-power power-on control circuits
CN102736013B (zh) * 2011-04-12 2015-08-05 安凯(广州)微电子技术有限公司 一种SoC芯片的空闲状态测试方法、系统及测试装置
US8677196B1 (en) 2011-06-20 2014-03-18 Cadence Design Systems, Inc. Low cost production testing for memory
JP6072437B2 (ja) 2012-06-06 2017-02-01 ルネサスエレクトロニクス株式会社 半導体集積回路及びその設計方法
US9310426B2 (en) 2012-09-25 2016-04-12 Globalfoundries Inc. On-going reliability monitoring of integrated circuit chips in the field
US9009550B2 (en) * 2012-12-10 2015-04-14 Texas Instruments Incorporated pBIST engine with distributed data logging
US20140258780A1 (en) * 2013-03-05 2014-09-11 Micron Technology, Inc. Memory controllers including test mode engines and methods for repair of memory over busses used during normal operation of the memory
US10022544B2 (en) 2013-07-22 2018-07-17 National Ict Australia Limited Vision enhancement apparatus for a vision impaired user
CN103454575B (zh) * 2013-09-06 2016-03-09 福州瑞芯微电子股份有限公司 用于实现pcba板测试的系统、pcba板及方法
WO2015081307A1 (en) * 2013-11-26 2015-06-04 Anunta Technology Management Services Ltd. Management of cloud-based application delivery
CN103744824B (zh) * 2013-12-18 2016-09-07 乐视致新电子科技（天津）有限公司 一种出厂测试方法和测试系统
US9946620B2 (en) 2015-02-03 2018-04-17 Invecas, Inc. Memory built-in self test system
US10509074B2 (en) 2018-02-22 2019-12-17 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical testing apparatus for spintronics devices
WO2020077107A1 (en) 2018-10-10 2020-04-16 Nvidia Corporation Test systems for executing self-testing in deployed automotive platforms
US11373726B2 (en) * 2019-04-03 2022-06-28 Texas Instruments Incorporated Management of multiple memory in-field self-repair options

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US5155819A (en) 1987-11-03 1992-10-13 Lsi Logic Corporation Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions
US5633812A (en) * 1992-09-29 1997-05-27 International Business Machines Corporation Fault simulation of testing for board circuit failures
US5617531A (en) * 1993-11-02 1997-04-01 Motorola, Inc. Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
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US6070252A (en) * 1994-09-30 2000-05-30 Intel Corporation Method and apparatus for interactive built-in-self-testing with user-programmable test patterns
US5615335A (en) * 1994-11-10 1997-03-25 Emc Corporation Storage system self-test apparatus and method
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US5745500A (en) 1996-10-22 1998-04-28 The United States Of America As Represented By The Secretary Of The Army Built-in self testing for the identification of faulty integrated circuit chips in a multichip module
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Also Published As

Publication number Publication date
DE60102164D1 (de) 2004-04-01
EP1303815A2 (de) 2003-04-23
US6874111B1 (en) 2005-03-29
JP3823087B2 (ja) 2006-09-20
WO2002008904A3 (en) 2002-05-02
AU2001266240A1 (en) 2002-02-05
DE60102164T2 (de) 2004-09-30
KR20030019589A (ko) 2003-03-06
KR100536393B1 (ko) 2005-12-12
EP1303815B1 (de) 2004-02-25
WO2002008904A2 (en) 2002-01-31
JP2004505395A (ja) 2004-02-19
TWI226644B (en) 2005-01-11

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