ATE272732T1 - Vorrichtung zur anodischen oxidation und mit ihr verbundener apparat und verfahren - Google Patents
Vorrichtung zur anodischen oxidation und mit ihr verbundener apparat und verfahrenInfo
- Publication number
- ATE272732T1 ATE272732T1 AT97120886T AT97120886T ATE272732T1 AT E272732 T1 ATE272732 T1 AT E272732T1 AT 97120886 T AT97120886 T AT 97120886T AT 97120886 T AT97120886 T AT 97120886T AT E272732 T1 ATE272732 T1 AT E272732T1
- Authority
- AT
- Austria
- Prior art keywords
- suction
- silicon substrate
- holder
- hold
- suction pad
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/005—Apparatus specially adapted for electrolytic conversion coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0418—Apparatus for fluid treatment for etching
- H10P72/0422—Apparatus for fluid treatment for etching for wet etching
- H10P72/0426—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/02—Anodisation
- C25D11/32—Anodisation of semiconducting materials
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/06—Suspending or supporting devices for articles to be coated
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6304—Formation by oxidation, e.g. oxidation of the substrate
- H10P14/6306—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
- H10P14/6308—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors
- H10P14/6309—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors of silicon in uncombined form, i.e. pure silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6322—Formation by thermal treatments
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Engineering & Computer Science (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
- Processing Of Meat And Fish (AREA)
- Formation Of Insulating Films (AREA)
- Forklifts And Lifting Vehicles (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31784196 | 1996-11-28 | ||
| JP2081497 | 1997-02-03 | ||
| JP29012597A JP3376258B2 (ja) | 1996-11-28 | 1997-10-22 | 陽極化成装置及びそれに関連する装置及び方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE272732T1 true ATE272732T1 (de) | 2004-08-15 |
Family
ID=27283177
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT97120886T ATE272732T1 (de) | 1996-11-28 | 1997-11-27 | Vorrichtung zur anodischen oxidation und mit ihr verbundener apparat und verfahren |
Country Status (11)
| Country | Link |
|---|---|
| US (3) | US5951833A (de) |
| EP (1) | EP0846790B1 (de) |
| JP (1) | JP3376258B2 (de) |
| KR (2) | KR100339107B1 (de) |
| CN (1) | CN1124369C (de) |
| AT (1) | ATE272732T1 (de) |
| AU (1) | AU725410B2 (de) |
| CA (1) | CA2222343A1 (de) |
| DE (1) | DE69730102T2 (de) |
| SG (1) | SG71065A1 (de) |
| TW (1) | TW363219B (de) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3413090B2 (ja) | 1997-12-26 | 2003-06-03 | キヤノン株式会社 | 陽極化成装置及び陽極化成処理方法 |
| JP3501642B2 (ja) | 1997-12-26 | 2004-03-02 | キヤノン株式会社 | 基板処理方法 |
| US6417069B1 (en) * | 1999-03-25 | 2002-07-09 | Canon Kabushiki Kaisha | Substrate processing method and manufacturing method, and anodizing apparatus |
| JP2000277478A (ja) | 1999-03-25 | 2000-10-06 | Canon Inc | 陽極化成装置、陽極化成システム、基板の処理装置及び処理方法、並びに基板の製造方法 |
| JP4108941B2 (ja) * | 2000-10-31 | 2008-06-25 | 株式会社荏原製作所 | 基板の把持装置、処理装置、及び把持方法 |
| JP4821067B2 (ja) * | 2001-08-01 | 2011-11-24 | ソニー株式会社 | 陽極化成装置およびこれを用いた多孔質層の形成方法、ならびに半導体薄膜の製造方法 |
| US7601248B2 (en) | 2002-06-21 | 2009-10-13 | Ebara Corporation | Substrate holder and plating apparatus |
| JP4162440B2 (ja) * | 2002-07-22 | 2008-10-08 | 株式会社荏原製作所 | 基板ホルダ及びめっき装置 |
| US9593430B2 (en) | 2002-07-22 | 2017-03-14 | Ebara Corporation | Electrochemical deposition method |
| US20040124088A1 (en) * | 2002-12-26 | 2004-07-01 | Canon Kabushiki Kaisha | Processing apparatus |
| US7267726B2 (en) * | 2003-04-22 | 2007-09-11 | Texas Instruments Incorporated | Method and apparatus for removing polymer residue from semiconductor wafer edge and back side |
| US8076244B2 (en) * | 2006-02-10 | 2011-12-13 | Micron Technology, Inc. | Methods for causing fluid to flow through or into via holes, vents and other openings or recesses that communicate with surfaces of substrates of semiconductor device components |
| JP4747882B2 (ja) * | 2006-02-27 | 2011-08-17 | セイコーエプソン株式会社 | 表面処理方法、液滴吐出ヘッドの製造方法及び液滴吐出装置の製造方法 |
| JP2007297657A (ja) | 2006-04-28 | 2007-11-15 | Canon Inc | 吸着パット及び基板処理装置 |
| NL1032069C2 (nl) * | 2006-06-28 | 2008-01-02 | Meco Equip Eng | Inrichting voor het in een bad behandelen van een plaatvormig substraat. |
| JP2008147591A (ja) * | 2006-12-13 | 2008-06-26 | Nec Electronics Corp | 半導体製造装置及び半導体製造方法 |
| JP2009111024A (ja) * | 2007-10-26 | 2009-05-21 | Applied Materials Inc | 化学機械研磨装置の基板支持部材、および化学機械研磨装置 |
| EP2269230A4 (de) * | 2008-03-08 | 2016-03-30 | Crystal Solar Inc | Integriertes verfahren und system zur herstellung von monolithischen panels aus kristallinen solarzellen |
| JP4941368B2 (ja) * | 2008-03-14 | 2012-05-30 | 株式会社デンソー | 半導体ウエハのエッチング装置 |
| US9076642B2 (en) * | 2009-01-15 | 2015-07-07 | Solexel, Inc. | High-Throughput batch porous silicon manufacturing equipment design and processing methods |
| WO2010083422A1 (en) * | 2009-01-15 | 2010-07-22 | Solexel, Inc. | Porous silicon electro-etching system and method |
| US8906218B2 (en) | 2010-05-05 | 2014-12-09 | Solexel, Inc. | Apparatus and methods for uniformly forming porous semiconductor on a substrate |
| WO2010129719A1 (en) * | 2009-05-05 | 2010-11-11 | Solexel, Inc. | High-productivity porous semiconductor manufacturing equipment |
| US12070224B2 (en) | 2009-12-22 | 2024-08-27 | Cook Medical Technologies Llc | Medical devices with detachable pivotable jaws |
| EP2534700A4 (de) | 2010-02-12 | 2015-04-29 | Solexel Inc | Doppelseitige wiederverwendbare vorlage zur herstellung von halbleitersubstraten für photovoltaikzellen und mikroelektronische geräte |
| CN102859663B (zh) * | 2010-04-26 | 2015-06-10 | 三菱电机株式会社 | 湿式蚀刻用夹具 |
| JP5676772B2 (ja) | 2010-10-11 | 2015-02-25 | クック メディカル テクノロジーズ エルエルシーCook Medical Technologies Llc | 取り外し可能かつ回動可能なジョーを備える医療装置 |
| US9293356B2 (en) * | 2011-06-03 | 2016-03-22 | Tel Nexx, Inc. | Parallel single substrate processing system |
| US9464362B2 (en) * | 2012-07-18 | 2016-10-11 | Deca Technologies Inc. | Magnetically sealed wafer plating jig system and method |
| JP2013055360A (ja) * | 2012-12-17 | 2013-03-21 | Lintec Corp | 支持装置及び支持方法 |
| KR101575129B1 (ko) * | 2014-01-13 | 2015-12-08 | 피에스케이 주식회사 | 기판 이송 장치 및 방법, 그리고 기판 처리 장치 |
| CN106796963A (zh) * | 2014-09-04 | 2017-05-31 | 应用材料公司 | 用于形成多孔硅层的方法和装置 |
| US20170317225A1 (en) * | 2014-12-10 | 2017-11-02 | Applied Materials, Inc. | System and method for all wrap around porous silicon formation |
| US9799541B1 (en) | 2014-12-18 | 2017-10-24 | Trutag Technologies, Inc. | Multiple wafer single bath etcher |
| CN105543927B (zh) * | 2015-12-23 | 2018-05-04 | 广东长盈精密技术有限公司 | 阳极氧化系统 |
| CN106435682A (zh) * | 2016-11-11 | 2017-02-22 | 苏州胜禹材料科技股份有限公司 | 铝板阳极氧化设备及着色工艺 |
| JP6847691B2 (ja) * | 2017-02-08 | 2021-03-24 | 株式会社荏原製作所 | めっき装置およびめっき装置とともに使用される基板ホルダ |
| JP6723660B2 (ja) * | 2017-03-24 | 2020-07-15 | 住友重機械イオンテクノロジー株式会社 | ウェハ保持装置及びウェハ着脱方法 |
| CN107379302A (zh) * | 2017-09-01 | 2017-11-24 | 北京亦盛精密半导体有限公司 | 一种数控加工时使用的真空吸附固定装置 |
| CN107363595A (zh) * | 2017-09-01 | 2017-11-21 | 北京亦盛精密半导体有限公司 | 一种脆性材料真空吸附盘 |
| CN107644828B (zh) * | 2017-09-14 | 2024-03-22 | 中国科学院宁波材料技术与工程研究所 | 一种多孔硅薄膜的制备装置及其制备多孔硅薄膜的方法 |
| KR20200102612A (ko) * | 2019-02-21 | 2020-09-01 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| WO2023044585A1 (en) * | 2021-09-27 | 2023-03-30 | Socpra Sciences Et Genie S.E.C. | Wafer receiver, electrochemical porosification apparatus and method using same |
| DE102022122634B3 (de) * | 2022-09-06 | 2023-09-28 | Christian-Albrechts-Universität zu Kiel, Körperschaft des öffentlichen Rechts | Wafer-halterung zur elektrischen kontaktierung spröder halbleiter-wafer sowie verwendung |
| GB2626126A (en) * | 2022-12-12 | 2024-07-17 | Iqe Plc | Systems and methods for porous tool |
| CN119673819B (zh) * | 2024-12-03 | 2025-06-13 | 苏州冠礼科技有限公司 | 一种基于半导体加工的蚀刻设备 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL105600C (de) * | 1956-06-16 | |||
| NL247276A (de) * | 1959-01-12 | |||
| CH613880A5 (de) * | 1975-09-29 | 1979-10-31 | Emile Steiger | |
| US4043894A (en) | 1976-05-20 | 1977-08-23 | Burroughs Corporation | Electrochemical anodization fixture for semiconductor wafers |
| US4131267A (en) * | 1978-06-02 | 1978-12-26 | Disco Kabushiki Kaisha | Apparatus for holding workpiece by suction |
| US4428815A (en) * | 1983-04-28 | 1984-01-31 | Western Electric Co., Inc. | Vacuum-type article holder and methods of supportively retaining articles |
| DE3606493A1 (de) | 1986-02-28 | 1987-09-03 | Schering Ag | Anordnung fuer das bringen von zu galvanisierenden teilen in ein bzw. aus einem haengegestell |
| JPS63169286A (ja) | 1987-01-07 | 1988-07-13 | カ−ル事務器株式会社 | 紙の裁断器 |
| FR2615036B1 (fr) * | 1987-05-05 | 1989-08-18 | France Etat | Machine pour la fabrication de silicium poreux |
| NL8701603A (nl) * | 1987-07-08 | 1989-02-01 | Philips & Du Pont Optical | Vacuuminrichting voor het vastzuigen van werkstukken. |
| US4891103A (en) * | 1988-08-23 | 1990-01-02 | Texas Instruments Incorporated | Anadization system with remote voltage sensing and active feedback control capabilities |
| JPH03202488A (ja) | 1989-12-29 | 1991-09-04 | Nec Corp | メッキ装置 |
| EP0463853B1 (de) * | 1990-06-29 | 1998-11-04 | Canon Kabushiki Kaisha | Platte zum Arbeiten unter Vakuum |
| JP3143915B2 (ja) | 1990-09-20 | 2001-03-07 | 日産自動車株式会社 | 電解エッチングされる半導体基板 |
| JPH04186818A (ja) | 1990-11-21 | 1992-07-03 | Canon Inc | X線露光装置用の基板把持装置 |
| JPH04372129A (ja) | 1991-06-21 | 1992-12-25 | Nec Corp | 半導体基板の処理装置 |
| JPH0521584A (ja) * | 1991-07-16 | 1993-01-29 | Nikon Corp | 保持装置 |
| JP3535876B2 (ja) | 1991-11-22 | 2004-06-07 | 財団法人国際科学振興財団 | 半導体装置及びその製造方法 |
| JPH05198556A (ja) * | 1992-01-23 | 1993-08-06 | Canon Inc | 陽極化成装置 |
| JP3157030B2 (ja) | 1992-01-31 | 2001-04-16 | キヤノン株式会社 | 半導体基体とその作製方法 |
| JPH05243236A (ja) * | 1992-03-03 | 1993-09-21 | Fujitsu Ltd | 電気メッキ装置 |
| JPH0613366A (ja) * | 1992-04-03 | 1994-01-21 | Internatl Business Mach Corp <Ibm> | 多孔性シリコン膜およびデバイスを作成するための浸漬走査方法およびシステム |
| JPH05295597A (ja) * | 1992-04-24 | 1993-11-09 | Fujitsu Ltd | めっき装置 |
| JP3110218B2 (ja) * | 1992-09-25 | 2000-11-20 | 三菱電機株式会社 | 半導体洗浄装置及び方法、ウエハカセット、専用グローブ並びにウエハ受け治具 |
| JPH06120204A (ja) | 1992-10-07 | 1994-04-28 | Toppan Printing Co Ltd | バックエッチング装置 |
| JP3201875B2 (ja) * | 1993-04-27 | 2001-08-27 | キヤノン株式会社 | 陽極化成装置及び陽極化成法 |
| DE69312636T2 (de) * | 1992-11-09 | 1998-02-05 | Canon Kk | Anodisierungsapparat mit einer Trägervorrichtung für das zu behandelnde Substrat |
| US5342495A (en) * | 1993-02-03 | 1994-08-30 | Vlsi Technology, Inc. | Structure for holding integrated circuit dies to be electroplated |
| JPH07176507A (ja) | 1993-12-20 | 1995-07-14 | Hitachi Ltd | ウエット処理装置およびウエット処理方法 |
| US5743685A (en) * | 1994-06-02 | 1998-04-28 | Quickmill, Inc. | Clamping device for a workpiece processing machine |
| JPH0837173A (ja) * | 1994-07-22 | 1996-02-06 | Canon Inc | 化成装置 |
| US5660699A (en) | 1995-02-20 | 1997-08-26 | Kao Corporation | Electroplating apparatus |
| JP2977461B2 (ja) * | 1995-02-20 | 1999-11-15 | 花王株式会社 | 電鋳装置 |
| US5522975A (en) * | 1995-05-16 | 1996-06-04 | International Business Machines Corporation | Electroplating workpiece fixture |
| JP3328481B2 (ja) * | 1995-10-13 | 2002-09-24 | 東京エレクトロン株式会社 | 処理方法および装置 |
-
1997
- 1997-10-22 JP JP29012597A patent/JP3376258B2/ja not_active Expired - Fee Related
- 1997-11-20 TW TW086117391A patent/TW363219B/zh not_active IP Right Cessation
- 1997-11-26 US US08/979,602 patent/US5951833A/en not_active Expired - Lifetime
- 1997-11-26 SG SG1997004152A patent/SG71065A1/en unknown
- 1997-11-26 CA CA002222343A patent/CA2222343A1/en not_active Abandoned
- 1997-11-27 AU AU46756/97A patent/AU725410B2/en not_active Ceased
- 1997-11-27 AT AT97120886T patent/ATE272732T1/de not_active IP Right Cessation
- 1997-11-27 DE DE69730102T patent/DE69730102T2/de not_active Expired - Fee Related
- 1997-11-27 EP EP97120886A patent/EP0846790B1/de not_active Expired - Lifetime
- 1997-11-27 CN CN97123026A patent/CN1124369C/zh not_active Expired - Fee Related
- 1997-11-28 KR KR1019970063897A patent/KR100339107B1/ko not_active Expired - Fee Related
-
1999
- 1999-03-31 US US09/282,970 patent/US6202655B1/en not_active Expired - Lifetime
-
2000
- 2000-06-20 US US09/597,849 patent/US6517697B1/en not_active Expired - Lifetime
- 2000-08-30 KR KR1020000050930A patent/KR100287502B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| AU4675697A (en) | 1998-06-04 |
| CN1188820A (zh) | 1998-07-29 |
| JP3376258B2 (ja) | 2003-02-10 |
| TW363219B (en) | 1999-07-01 |
| US6202655B1 (en) | 2001-03-20 |
| DE69730102T2 (de) | 2005-08-11 |
| EP0846790B1 (de) | 2004-08-04 |
| CA2222343A1 (en) | 1998-05-28 |
| CN1124369C (zh) | 2003-10-15 |
| DE69730102D1 (de) | 2004-09-09 |
| US5951833A (en) | 1999-09-14 |
| KR19980042897A (ko) | 1998-08-17 |
| JPH10275798A (ja) | 1998-10-13 |
| KR100339107B1 (ko) | 2002-11-13 |
| KR100287502B1 (ko) | 2001-04-16 |
| AU725410B2 (en) | 2000-10-12 |
| SG71065A1 (en) | 2000-03-21 |
| EP0846790A2 (de) | 1998-06-10 |
| EP0846790A3 (de) | 1999-12-29 |
| US6517697B1 (en) | 2003-02-11 |
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