ATE285578T1 - Mikroelektronischer sensor zur feststellung einer bindungsverschlechterung und zugehöriges herstellungsverfahren - Google Patents

Mikroelektronischer sensor zur feststellung einer bindungsverschlechterung und zugehöriges herstellungsverfahren

Info

Publication number
ATE285578T1
ATE285578T1 AT00914558T AT00914558T ATE285578T1 AT E285578 T1 ATE285578 T1 AT E285578T1 AT 00914558 T AT00914558 T AT 00914558T AT 00914558 T AT00914558 T AT 00914558T AT E285578 T1 ATE285578 T1 AT E285578T1
Authority
AT
Austria
Prior art keywords
sensor
stud
production method
bond degradation
associated production
Prior art date
Application number
AT00914558T
Other languages
English (en)
Inventor
Alan Wilson
Original Assignee
Defence Science & Tech Org
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Defence Science & Tech Org filed Critical Defence Science & Tech Org
Application granted granted Critical
Publication of ATE285578T1 publication Critical patent/ATE285578T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/02—Electrochemical measuring systems for weathering, corrosion or corrosion-protection measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Environmental Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Ecology (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)
AT00914558T 1999-02-08 2000-02-08 Mikroelektronischer sensor zur feststellung einer bindungsverschlechterung und zugehöriges herstellungsverfahren ATE285578T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11916699P 1999-02-08 1999-02-08
PCT/US2000/003308 WO2000046593A2 (en) 1999-02-08 2000-02-08 A micro-electronic bond degradation sensor and method of manufacture

Publications (1)

Publication Number Publication Date
ATE285578T1 true ATE285578T1 (de) 2005-01-15

Family

ID=22382891

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00914558T ATE285578T1 (de) 1999-02-08 2000-02-08 Mikroelektronischer sensor zur feststellung einer bindungsverschlechterung und zugehöriges herstellungsverfahren

Country Status (6)

Country Link
US (2) US6384610B1 (de)
EP (1) EP1151286B1 (de)
AT (1) ATE285578T1 (de)
AU (2) AU770057B2 (de)
DE (1) DE60016896D1 (de)
WO (1) WO2000046593A2 (de)

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US9031734B2 (en) * 2010-09-29 2015-05-12 Aerobotics, Inc. Systems and methods for non-destructive inspection of airplanes
US8928339B2 (en) * 2010-10-29 2015-01-06 The Boeing Company Methods and systems for automated measurement of electrical bonds
US9567104B2 (en) 2011-04-12 2017-02-14 The Boeing Company Utilization of aircraft bondline embedded current sensors in the determination of a lightning damage index
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JP2013108831A (ja) * 2011-11-21 2013-06-06 Seiko Epson Corp センサー装置およびセンサー装置の製造方法
JP2014163900A (ja) * 2013-02-27 2014-09-08 Dainippon Printing Co Ltd 濃度測定センサ、濃度測定センサ用シート及びその製造方法
US9123701B2 (en) * 2013-07-11 2015-09-01 Infineon Technologies Austria Ag Semiconductor die and package with source down and sensing configuration
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US9909974B2 (en) 2014-04-28 2018-03-06 Brigham Young University Data acquisition system with rotating probe members and ground reference electrode
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Also Published As

Publication number Publication date
EP1151286B1 (de) 2004-12-22
US20020190729A1 (en) 2002-12-19
US6693417B2 (en) 2004-02-17
DE60016896D1 (de) 2005-01-27
WO2000046593A3 (en) 2000-12-14
EP1151286A2 (de) 2001-11-07
WO2000046593A2 (en) 2000-08-10
AU2004201996A1 (en) 2004-06-10
AU3593100A (en) 2000-08-25
US6384610B1 (en) 2002-05-07
AU770057B2 (en) 2004-02-12

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