ATE287543T1 - Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger - Google Patents

Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Info

Publication number
ATE287543T1
ATE287543T1 AT99942824T AT99942824T ATE287543T1 AT E287543 T1 ATE287543 T1 AT E287543T1 AT 99942824 T AT99942824 T AT 99942824T AT 99942824 T AT99942824 T AT 99942824T AT E287543 T1 ATE287543 T1 AT E287543T1
Authority
AT
Austria
Prior art keywords
module
test device
testing
contactless communication
data carrier
Prior art date
Application number
AT99942824T
Other languages
English (en)
Inventor
Andreas Muehlberger
Johann Vorreiter
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE287543T1 publication Critical patent/ATE287543T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/0095—Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
AT99942824T 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger ATE287543T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP98890248 1998-08-21
PCT/EP1999/005774 WO2000011485A1 (en) 1998-08-21 1999-08-05 Test device for testing a module for a data carrier intended for contactless communication

Publications (1)

Publication Number Publication Date
ATE287543T1 true ATE287543T1 (de) 2005-02-15

Family

ID=8237190

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99942824T ATE287543T1 (de) 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Country Status (6)

Country Link
US (1) US6275043B1 (de)
EP (1) EP1047947B1 (de)
JP (1) JP4306966B2 (de)
AT (1) ATE287543T1 (de)
DE (1) DE69923288T2 (de)
WO (1) WO2000011485A1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
WO2001011540A1 (en) 1999-08-04 2001-02-15 Koninklijke Philips Electronics N.V. Communication device and transponder
ATE447184T1 (de) 2000-05-29 2009-11-15 Nxp Bv Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
JP2005527823A (ja) 2002-05-23 2005-09-15 カスケード マイクロテック インコーポレイテッド デバイスのテスト用プローブ
US6724205B1 (en) * 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7028529B2 (en) * 2003-04-28 2006-04-18 Sonora Medical Systems, Inc. Apparatus and methods for testing acoustic probes and systems
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7164353B2 (en) * 2004-12-22 2007-01-16 Avery Dennison Corporation Method and system for testing RFID devices
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
DE202007018733U1 (de) * 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
CN105592492B (zh) * 2015-12-18 2019-02-26 重庆邮电大学 高层协议栈一致性测试平台及测试方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619066A (en) * 1990-05-15 1997-04-08 Dallas Semiconductor Corporation Memory for an electronic token
AT395224B (de) 1990-08-23 1992-10-27 Mikron Ges Fuer Integrierte Mi Kontaktloses, induktives datenuebertragungssystem
JPH05129994A (ja) * 1991-11-01 1993-05-25 Matsushita Electric Ind Co Ltd 電磁誘導交信試験装置
DE19601511C1 (de) * 1996-01-17 1997-08-21 Pronet Netzwerkloesungen Fuer Verfahren und Vorrichtung zum Parametrieren einer Datenträgerleseeinrichtung
WO1998020363A1 (en) * 1996-11-05 1998-05-14 Philips Electronics N.V. Contactless data transmission and receiving device with a synchronous demodulator
EP0845751B1 (de) 1996-12-02 2004-01-02 Texas Instruments Deutschland Gmbh Transpondersystem
KR100526904B1 (ko) * 1997-01-21 2006-05-03 코닌클리케 필립스 일렉트로닉스 엔.브이. 적어도하나의트랜스폰더와의비접촉식통신을위한트랜스폰더통신장치,및적어도하나의트랜스폰더통신장치와의비접촉식통신을위한트랜스폰더
EP0910899B1 (de) * 1997-01-21 2005-04-20 Koninklijke Philips Electronics N.V. Transponderkommunikationseinrichtung

Also Published As

Publication number Publication date
EP1047947B1 (de) 2005-01-19
EP1047947A1 (de) 2000-11-02
DE69923288T2 (de) 2005-12-01
DE69923288D1 (de) 2005-02-24
WO2000011485A1 (en) 2000-03-02
US6275043B1 (en) 2001-08-14
JP4306966B2 (ja) 2009-08-05
JP2002523940A (ja) 2002-07-30

Similar Documents

Publication Publication Date Title
ATE287543T1 (de) Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger
WO2001023885A8 (en) Test device
EP1391962A4 (de) Spannungsmessschaltung eines batteriepacks
GB1498719A (en) Electrical test system
DE69940129D1 (de) Verfahren zur Datenverwaltung für eine vielzahl von Analyttestvorrichtungen
ATE66738T1 (de) Verfahren und vorrichtung zur ermittlung und auswertung von maschinenzustandsdaten.
DE19781528T1 (de) Testgerät für integrierte Schaltungselemente
MY124258A (en) Method of testing electronic components and testing apparatus for electronic components
ATE253731T1 (de) Prüfstift für eine vorrichtung zum testen von leiterplatten
EP0849743A3 (de) Speicherschaltungen mit eingebautem Selbsttest
KR19980018938A (ko) Ic테스터용 테스트헤드(test head for ic tester)
FR2438301A1 (fr) Circuit de detection de signaux d'un capteur magnetique
US4581577A (en) Continuity detecting apparatus
ATE308136T1 (de) Leiterplattenanordnung
SE9602564D0 (sv) Kretskortstest
ATE377747T1 (de) Vorrichtung des bedeckungszeitpunkt einer testprobe durch flüssigkeitsoberfläche
DE60140289D1 (de) Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten
ATE157776T1 (de) Testvorrichtung sowie -verfahren für einen auf einer platine eingelöteten ic
ATE238602T1 (de) Speichermodulsprüfeinrichtung mit verminderter ausgangstreiberimpendanz
ATE228251T1 (de) Phasenprüfgerät
ATE239919T1 (de) Doppelspitzen-prüftstift zum prüfen von leiterplatten
KR930018426A (ko) 경화선별장치
SE9402155D0 (sv) Adapter för användning vid en apparat för testning av kretskort
JPS5768047A (en) Probe card
ATE295965T1 (de) Einrichtung zum testen der funktionstüchtigkeit einer kontaktbehafteten chipkarte

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties