ATE287543T1 - Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger - Google Patents

Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Info

Publication number
ATE287543T1
ATE287543T1 AT99942824T AT99942824T ATE287543T1 AT E287543 T1 ATE287543 T1 AT E287543T1 AT 99942824 T AT99942824 T AT 99942824T AT 99942824 T AT99942824 T AT 99942824T AT E287543 T1 ATE287543 T1 AT E287543T1
Authority
AT
Austria
Prior art keywords
module
test device
testing
contactless communication
data carrier
Prior art date
Application number
AT99942824T
Other languages
English (en)
Inventor
Andreas Muehlberger
Johann Vorreiter
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE287543T1 publication Critical patent/ATE287543T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/0095—Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT99942824T 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger ATE287543T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP98890248 1998-08-21
PCT/EP1999/005774 WO2000011485A1 (en) 1998-08-21 1999-08-05 Test device for testing a module for a data carrier intended for contactless communication

Publications (1)

Publication Number Publication Date
ATE287543T1 true ATE287543T1 (de) 2005-02-15

Family

ID=8237190

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99942824T ATE287543T1 (de) 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Country Status (6)

Country Link
US (1) US6275043B1 (de)
EP (1) EP1047947B1 (de)
JP (1) JP4306966B2 (de)
AT (1) ATE287543T1 (de)
DE (1) DE69923288T2 (de)
WO (1) WO2000011485A1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
KR100810787B1 (ko) 1999-08-04 2008-03-06 엔엑스피 비 브이 통신 장치와 트랜스폰더 사이의 통신에 관한 특성값을 결정하는 방법, 통신 장치, 트랜스폰더 및 트랜스폰더용 회로
WO2001092902A1 (en) * 2000-05-29 2001-12-06 Koninklijke Philips Electronics N.V. Data carrier module having indication means for indicating the result of a test operation
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
JP2005527823A (ja) 2002-05-23 2005-09-15 カスケード マイクロテック インコーポレイテッド デバイスのテスト用プローブ
US6724205B1 (en) * 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7028529B2 (en) * 2003-04-28 2006-04-18 Sonora Medical Systems, Inc. Apparatus and methods for testing acoustic probes and systems
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
JP2008512680A (ja) 2004-09-13 2008-04-24 カスケード マイクロテック インコーポレイテッド 両面プロービング構造体
US7164353B2 (en) * 2004-12-22 2007-01-16 Avery Dennison Corporation Method and system for testing RFID devices
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
EP1932003A2 (de) 2005-06-13 2008-06-18 Cascade Microtech, Inc. Breitbandige aktiv-passiv-differenzsignalsonde
US7609077B2 (en) * 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
CN105592492B (zh) * 2015-12-18 2019-02-26 重庆邮电大学 高层协议栈一致性测试平台及测试方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT395224B (de) 1990-08-23 1992-10-27 Mikron Ges Fuer Integrierte Mi Kontaktloses, induktives datenuebertragungssystem
US5517015A (en) * 1990-11-19 1996-05-14 Dallas Semiconductor Corporation Communication module
JPH05129994A (ja) * 1991-11-01 1993-05-25 Matsushita Electric Ind Co Ltd 電磁誘導交信試験装置
DE19601511C1 (de) * 1996-01-17 1997-08-21 Pronet Netzwerkloesungen Fuer Verfahren und Vorrichtung zum Parametrieren einer Datenträgerleseeinrichtung
KR100489716B1 (ko) * 1996-11-05 2005-09-12 코닌클리케 필립스 일렉트로닉스 엔.브이. 동기식복조기를갖는비접촉식데이터송수신장치
EP0845751B1 (de) 1996-12-02 2004-01-02 Texas Instruments Deutschland Gmbh Transpondersystem
WO1998032237A2 (en) * 1997-01-21 1998-07-23 Koninklijke Philips Electronics N.V. Transponder communication device
EP0898815B1 (de) * 1997-01-21 2005-09-28 Koninklijke Philips Electronics N.V. Transpondernachrichtenübertragungsgerät

Also Published As

Publication number Publication date
WO2000011485A1 (en) 2000-03-02
EP1047947B1 (de) 2005-01-19
JP2002523940A (ja) 2002-07-30
US6275043B1 (en) 2001-08-14
EP1047947A1 (de) 2000-11-02
JP4306966B2 (ja) 2009-08-05
DE69923288D1 (de) 2005-02-24
DE69923288T2 (de) 2005-12-01

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