ATE292783T1 - Antrieb einer resonanzprobe und rasterkraftmikroskop - Google Patents

Antrieb einer resonanzprobe und rasterkraftmikroskop

Info

Publication number
ATE292783T1
ATE292783T1 AT01919671T AT01919671T ATE292783T1 AT E292783 T1 ATE292783 T1 AT E292783T1 AT 01919671 T AT01919671 T AT 01919671T AT 01919671 T AT01919671 T AT 01919671T AT E292783 T1 ATE292783 T1 AT E292783T1
Authority
AT
Austria
Prior art keywords
alastic
driving
force microscope
resonating
probe device
Prior art date
Application number
AT01919671T
Other languages
English (en)
Inventor
De Miguel Javier Tamayo
Andrew David Laver Humpris
Mervyn John Miles
Original Assignee
Univ Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB0009902.8A external-priority patent/GB0009902D0/en
Application filed by Univ Bristol filed Critical Univ Bristol
Application granted granted Critical
Publication of ATE292783T1 publication Critical patent/ATE292783T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process

Landscapes

  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Control Of Stepping Motors (AREA)
  • Control Of Electric Motors In General (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
AT01919671T 2000-04-20 2001-04-12 Antrieb einer resonanzprobe und rasterkraftmikroskop ATE292783T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0009902.8A GB0009902D0 (en) 2000-04-20 2000-04-20 Resonant probe driving arrangement and a scanning probe microscope including such an arrangement
GBGB0107136.4A GB0107136D0 (en) 2000-04-20 2001-03-21 Resonant probe driving arrangement and a scanning probe microscope including such an arrangement
PCT/GB2001/001669 WO2001081857A2 (en) 2000-04-20 2001-04-12 Resonant probe driving arrangement and scanning probe microscope

Publications (1)

Publication Number Publication Date
ATE292783T1 true ATE292783T1 (de) 2005-04-15

Family

ID=26244152

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01919671T ATE292783T1 (de) 2000-04-20 2001-04-12 Antrieb einer resonanzprobe und rasterkraftmikroskop

Country Status (8)

Country Link
US (1) US6906450B2 (de)
EP (1) EP1274966B1 (de)
JP (1) JP2003532060A (de)
AT (1) ATE292783T1 (de)
AU (1) AU4673101A (de)
CA (1) CA2406407A1 (de)
DE (1) DE60109910D1 (de)
WO (1) WO2001081857A2 (de)

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US7330795B2 (en) * 2002-05-07 2008-02-12 California Institute Of Technology Method and apparatus for providing signal analysis of a BioNEMS resonator or transducer
EP1531731B1 (de) * 2002-06-03 2012-08-01 Arizona Board Of Regents Acting for Northern Arizona University Eingebettete piezoelektrische mikroausleger-elektroden
CN100565198C (zh) * 2002-06-03 2009-12-02 北亚利桑那大学董事会 混合微悬臂传感器
US7395693B2 (en) * 2004-12-02 2008-07-08 The Arizona Board of Regents, a body corporate of the state of Arizona acting for Northern Arizona University Embedded piezoelectric microcantilever sensors
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US6763705B1 (en) * 2003-06-16 2004-07-20 Ut-Battelle, Llc High throughput microcantilever detector
US7055378B2 (en) * 2003-08-11 2006-06-06 Veeco Instruments, Inc. System for wide frequency dynamic nanomechanical analysis
CN100567972C (zh) * 2003-10-08 2009-12-09 皇家飞利浦电子股份有限公司 体声波传感器
US20050092907A1 (en) * 2003-11-04 2005-05-05 West Paul E. Oscillating scanning probe microscope
US7157897B2 (en) * 2003-11-25 2007-01-02 Northwestern University Method and system for electronic detection of mechanical perturbations using BIMOS readouts
US7759924B2 (en) * 2003-11-25 2010-07-20 Northwestern University Cascaded MOSFET embedded multi-input microcantilever
DE102004019608B3 (de) * 2004-04-22 2005-10-20 Univ Augsburg Verfahren zum Abtasten einer Oberfläche
EP1746398A1 (de) * 2004-05-14 2007-01-24 Japan Science and Technology Agency Hochempfindliches kraft-/ -massendetektionsverfahren und -einrichtung mit einer phasensynchronisationsschaltung
WO2007078979A2 (en) * 2005-12-28 2007-07-12 Karma Technology, Inc. Probe module with integrated actuator for a probe microscope
CA2637930C (en) * 2006-01-23 2016-09-06 Drexel University Self-exciting, self-sensing piezoelectric cantilever sensor
WO2007133619A1 (en) * 2006-05-10 2007-11-22 Drexel University Molecular control of surface coverage
US7608984B2 (en) * 2006-05-15 2009-10-27 Adaptivenergy, Llc Motion amplification using piezoelectric element
US8256017B2 (en) * 2006-08-31 2012-08-28 Nanoink, Inc. Using optical deflection of cantilevers for alignment
WO2008029562A1 (en) * 2006-09-04 2008-03-13 National University Corporation Kanazawa University Atomic force microscope
JP5224084B2 (ja) * 2006-11-08 2013-07-03 独立行政法人産業技術総合研究所 カンチレバー共振特性評価法
CA2677196A1 (en) * 2007-02-01 2008-09-12 Drexel University A hand-held phase-shift detector for sensor applications
US7694552B2 (en) * 2007-02-12 2010-04-13 The Board Of Trustees Of The Leland Stanford Junior University High quality factor resonators for liquid immersion biological and chemical sensors
US9202495B2 (en) 2007-05-01 2015-12-01 Seagate Technology Llc Method and apparatus for detecting proximity contact between a transducer and a medium
JP5467299B2 (ja) * 2007-11-30 2014-04-09 エフイーアイ カンパニー 走査型プローブ顕微鏡における反復的フィードバック調整
RU2605816C9 (ru) * 2008-10-09 2017-05-10 Ньюкасл Инновейшн Лимитед Система и способ позиционирования
US8650660B2 (en) 2008-11-13 2014-02-11 Bruker Nano, Inc. Method and apparatus of using peak force tapping mode to measure physical properties of a sample
US8955161B2 (en) 2008-11-13 2015-02-10 Bruker Nano, Inc. Peakforce photothermal-based detection of IR nanoabsorption
KR101873936B1 (ko) * 2008-11-13 2018-07-04 브루커 나노, 인코퍼레이션. 탐침형 원자 현미경
DE102009028022A1 (de) * 2009-07-27 2011-02-03 Endress + Hauser Gmbh + Co. Kg Verfahren zur Bestimmung und/oder Überwachung mindestens einer pysikalischen Prozessgröße eines Mediums
MY156153A (en) 2009-12-01 2016-01-15 Bruker Nano Inc Method and apparatus of operating a scanning probe microscope
EP2545643B1 (de) 2010-03-10 2013-12-04 Zurich Instruments AG Vorrichtung und verfahren zum demodulieren eines eingangssignals
US9689891B2 (en) * 2011-05-27 2017-06-27 Keysight Technologies, Inc. Automatic gain tuning in atomic force microscopy
FR2977676B1 (fr) * 2011-07-08 2013-08-02 Thales Sa Micro-systeme vibrant a boucle de controle automatique de gain, a controle integre du facteur de qualite
ES2403555B1 (es) * 2011-10-10 2014-03-28 Universidad Autonoma De Madrid Procedimiento de control de un microscopio de barrido
EP2648005A1 (de) * 2012-04-02 2013-10-09 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Kalibrierung einer mechanischen Eigenschaft von RSM-Federbalken
GB201218350D0 (en) 2012-10-12 2012-11-28 Infinitesima Ltd Multiple probe actuation
US8860505B2 (en) 2013-02-04 2014-10-14 Zurich Instruments Ag Lock-in amplifier with phase-synchronous processing
WO2014123519A1 (en) * 2013-02-06 2014-08-14 Empire Technology Development Llc Devices, systems, and methods for detecting odorants
JP2014190771A (ja) * 2013-03-26 2014-10-06 National Institute Of Advanced Industrial & Technology 質量測定方法及び質量測定装置
US9453857B2 (en) 2014-04-23 2016-09-27 Oxford Instruments Asylum Research, Inc AM/FM measurements using multiple frequency of atomic force microscopy
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KR20190060769A (ko) 2016-08-22 2019-06-03 브루커 나노, 아이엔씨. 피크 포스 탭핑을 이용한 샘플의 적외선 특성
JP2021122770A (ja) * 2020-02-04 2021-08-30 国立研究開発法人産業技術総合研究所 自励発振装置、切削装置、自励発振装置の制御方法及び切削方法
WO2021183986A1 (en) * 2020-03-13 2021-09-16 Alliance For Sustainable Energy, Llc Microelectromechanical oscillators producing unique identifiers
JP7637084B2 (ja) * 2022-02-07 2025-02-27 株式会社東芝 共振周波数検出器及びセンシング装置

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JPH09303477A (ja) * 1996-05-16 1997-11-25 Nissan Motor Co Ltd 能動型騒音振動制御装置
US6038916A (en) * 1997-07-22 2000-03-21 Digital Instruments Method and apparatus for measuring energy dissipation by a probe during operation of an atomic force microscope
US6079254A (en) * 1998-05-04 2000-06-27 International Business Machines Corporation Scanning force microscope with automatic surface engagement and improved amplitude demodulation

Also Published As

Publication number Publication date
JP2003532060A (ja) 2003-10-28
WO2001081857A3 (en) 2002-04-11
US6906450B2 (en) 2005-06-14
CA2406407A1 (en) 2001-11-01
EP1274966A2 (de) 2003-01-15
AU4673101A (en) 2001-11-07
US20030137216A1 (en) 2003-07-24
EP1274966B1 (de) 2005-04-06
WO2001081857A2 (en) 2001-11-01
DE60109910D1 (de) 2005-05-12

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