ATE305131T1 - Optoelektronische formerfassung durch chromatische kodierung mit beleuchtungsebenen - Google Patents

Optoelektronische formerfassung durch chromatische kodierung mit beleuchtungsebenen

Info

Publication number
ATE305131T1
ATE305131T1 AT99923655T AT99923655T ATE305131T1 AT E305131 T1 ATE305131 T1 AT E305131T1 AT 99923655 T AT99923655 T AT 99923655T AT 99923655 T AT99923655 T AT 99923655T AT E305131 T1 ATE305131 T1 AT E305131T1
Authority
AT
Austria
Prior art keywords
illumination levels
form detection
optoelectronic
chromatic coding
chromatic
Prior art date
Application number
AT99923655T
Other languages
English (en)
Inventor
Yves Guern
Original Assignee
Cynovad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cynovad Inc filed Critical Cynovad Inc
Application granted granted Critical
Publication of ATE305131T1 publication Critical patent/ATE305131T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Light Receiving Elements (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
AT99923655T 1998-06-05 1999-06-02 Optoelektronische formerfassung durch chromatische kodierung mit beleuchtungsebenen ATE305131T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9807076A FR2779517B1 (fr) 1998-06-05 1998-06-05 Procede et dispositif d'acquisition opto-electrique de formes par illumination axiale
PCT/FR1999/001299 WO1999064816A1 (fr) 1998-06-05 1999-06-02 Procede et dispositif d'acquisition opto-electrique de formes par illumination axiale

Publications (1)

Publication Number Publication Date
ATE305131T1 true ATE305131T1 (de) 2005-10-15

Family

ID=9527049

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99923655T ATE305131T1 (de) 1998-06-05 1999-06-02 Optoelektronische formerfassung durch chromatische kodierung mit beleuchtungsebenen

Country Status (11)

Country Link
US (1) US6327041B1 (de)
EP (1) EP1084379B1 (de)
JP (1) JP2002517742A (de)
KR (1) KR20010071403A (de)
AT (1) ATE305131T1 (de)
AU (1) AU4044599A (de)
CA (1) CA2334225C (de)
DE (1) DE69927367T2 (de)
FR (1) FR2779517B1 (de)
IL (1) IL139958A0 (de)
WO (1) WO1999064816A1 (de)

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EP1126412B1 (de) 2000-02-16 2013-01-30 FUJIFILM Corporation Bilderfassungsgerät und Abstandsmessverfahren
FR2807830B1 (fr) * 2000-04-14 2002-08-16 Architecture Traitement D Imag Dispositif d'acquisition d'une forme tridimensionnelle par voie optoelectronique
US20050174584A1 (en) * 2000-07-06 2005-08-11 Chalmers Scott A. Method and apparatus for high-speed thickness mapping of patterned thin films
DE102004049541A1 (de) * 2004-10-12 2006-04-20 Precitec Optronik Gmbh Meßsystem zur Vermessung von Oberflächen sowie Kalibrierverfahren hierfür
US8328731B2 (en) * 2006-01-06 2012-12-11 Phonak Ag Method and system for reconstructing the three-dimensional shape of the surface of at least a portion of an ear canal and/or of a concha
DE102006026775B4 (de) * 2006-06-07 2008-04-30 Stiftung Für Lasertechnologien In Der Medizin Und Messtechnik An Der Universität Ulm Verfahren und Vorrichtung zur Charakterisierung bewegter Oberflächen
FI119259B (fi) * 2006-10-18 2008-09-15 Valtion Teknillinen Pinnan ja paksuuden määrittäminen
DE102007044530B4 (de) 2007-09-18 2009-06-10 VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH Anordnung zur Messung der Dicke und des Abstandes transparenter Objekte
DE202007014435U1 (de) 2007-10-16 2009-03-05 Gurny, Eric Optischer Sensor für eine Messvorrichtung
US7990522B2 (en) 2007-11-14 2011-08-02 Mitutoyo Corporation Dynamic compensation of chromatic point sensor intensity profile data selection
GB0809037D0 (en) * 2008-05-19 2008-06-25 Renishaw Plc Video Probe
US7873488B2 (en) * 2008-12-08 2011-01-18 Mitutoyo Corporation On-site calibration method and object for chromatic point sensors
DE102009001086B4 (de) 2009-02-23 2014-03-27 Sirona Dental Systems Gmbh Handgehaltene dentale Kamera und Verfahren zur optischen 3D-Vermessung
EP2403396B1 (de) 2009-03-04 2019-08-14 Elie Meimoun Vorrichtung und verfahren zur überprüfung von wellenfrontanalysen
US7876456B2 (en) * 2009-05-11 2011-01-25 Mitutoyo Corporation Intensity compensation for interchangeable chromatic point sensor components
US8900126B2 (en) 2011-03-23 2014-12-02 United Sciences, Llc Optical scanning device
US8900125B2 (en) 2012-03-12 2014-12-02 United Sciences, Llc Otoscanning with 3D modeling
DE102023120240B4 (de) 2023-07-31 2025-08-07 Jenoptik Optical Systems Gmbh Aufnahmevorrichtung zum Erzeugen einer 3D-Aufnahme eines dreidimensionalen Objekts und Verfahren

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US3843227A (en) * 1969-02-08 1974-10-22 Nippon Kogaku Kk Light dissecting optical system
CH663466A5 (fr) * 1983-09-12 1987-12-15 Battelle Memorial Institute Procede et dispositif pour determiner la position d'un objet par rapport a une reference.
DE3432252A1 (de) * 1984-09-01 1986-03-06 Fa. Carl Zeiss, 7920 Heidenheim Messmikroskop
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JPH07107481B2 (ja) * 1987-05-21 1995-11-15 アンリツ株式会社 変位測定装置
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JPH064611U (ja) * 1992-06-25 1994-01-21 株式会社キーエンス 光学式距離測定装置
KR0170542B1 (ko) * 1993-04-21 1999-05-01 다테이시 요시오 육안 검사 지원장치 및 기판 검사장치와 이것들을 이용한 납땜 검사방법 및 수정방법
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Also Published As

Publication number Publication date
FR2779517B1 (fr) 2000-08-18
KR20010071403A (ko) 2001-07-28
AU4044599A (en) 1999-12-30
DE69927367D1 (de) 2005-10-27
US6327041B1 (en) 2001-12-04
JP2002517742A (ja) 2002-06-18
DE69927367T2 (de) 2006-07-06
EP1084379B1 (de) 2005-09-21
EP1084379A1 (de) 2001-03-21
FR2779517A1 (fr) 1999-12-10
CA2334225A1 (en) 1999-12-16
CA2334225C (en) 2005-05-03
WO1999064816A1 (fr) 1999-12-16
IL139958A0 (en) 2002-02-10

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