ATE308038T1 - Fluorimeter für immunoassay - Google Patents
Fluorimeter für immunoassayInfo
- Publication number
- ATE308038T1 ATE308038T1 AT98963919T AT98963919T ATE308038T1 AT E308038 T1 ATE308038 T1 AT E308038T1 AT 98963919 T AT98963919 T AT 98963919T AT 98963919 T AT98963919 T AT 98963919T AT E308038 T1 ATE308038 T1 AT E308038T1
- Authority
- AT
- Austria
- Prior art keywords
- sample
- test
- fluorometer
- rom
- tested
- Prior art date
Links
- 238000003018 immunoassay Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
- Y10T436/112499—Automated chemical analysis with sample on test slide
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
- Y10T436/115831—Condition or time responsive
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Steroid Compounds (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/003,090 US6830731B1 (en) | 1998-01-05 | 1998-01-05 | Immunoassay fluorometer |
| PCT/US1998/026576 WO1999035486A1 (en) | 1998-01-05 | 1998-12-15 | Immunoassay fluorometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE308038T1 true ATE308038T1 (de) | 2005-11-15 |
Family
ID=21704093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT98963919T ATE308038T1 (de) | 1998-01-05 | 1998-12-15 | Fluorimeter für immunoassay |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US6830731B1 (de) |
| EP (2) | EP1657543A1 (de) |
| JP (2) | JP2002501171A (de) |
| AT (1) | ATE308038T1 (de) |
| AU (1) | AU1914799A (de) |
| CA (1) | CA2314995C (de) |
| DE (1) | DE69832098T2 (de) |
| ES (1) | ES2251791T3 (de) |
| WO (1) | WO1999035486A1 (de) |
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| US6654183B2 (en) * | 1999-12-15 | 2003-11-25 | International Business Machines Corporation | System for converting optical beams to collimated flat-top beams |
| DE10330005B4 (de) * | 2003-07-03 | 2006-12-21 | Leica Microsystems Semiconductor Gmbh | Vorrichtung zur Inspektion eines Wafers |
-
1998
- 1998-01-05 US US09/003,090 patent/US6830731B1/en not_active Expired - Lifetime
- 1998-12-15 AT AT98963919T patent/ATE308038T1/de active
- 1998-12-15 EP EP05076963A patent/EP1657543A1/de not_active Withdrawn
- 1998-12-15 AU AU19147/99A patent/AU1914799A/en not_active Abandoned
- 1998-12-15 DE DE69832098T patent/DE69832098T2/de not_active Expired - Lifetime
- 1998-12-15 CA CA002314995A patent/CA2314995C/en not_active Expired - Lifetime
- 1998-12-15 JP JP2000527819A patent/JP2002501171A/ja active Pending
- 1998-12-15 ES ES98963919T patent/ES2251791T3/es not_active Expired - Lifetime
- 1998-12-15 WO PCT/US1998/026576 patent/WO1999035486A1/en not_active Ceased
- 1998-12-15 EP EP98963919A patent/EP1046028B1/de not_active Expired - Lifetime
-
2002
- 2002-10-08 US US10/267,232 patent/US7416700B2/en not_active Expired - Lifetime
-
2004
- 2004-05-07 US US10/841,274 patent/US20040241047A1/en not_active Abandoned
-
2005
- 2005-12-20 JP JP2005367239A patent/JP2006153888A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP1657543A1 (de) | 2006-05-17 |
| US6830731B1 (en) | 2004-12-14 |
| US20040241047A1 (en) | 2004-12-02 |
| CA2314995C (en) | 2009-04-07 |
| US7416700B2 (en) | 2008-08-26 |
| JP2002501171A (ja) | 2002-01-15 |
| WO1999035486A1 (en) | 1999-07-15 |
| DE69832098T2 (de) | 2006-06-01 |
| ES2251791T3 (es) | 2006-05-01 |
| EP1046028B1 (de) | 2005-10-26 |
| CA2314995A1 (en) | 1999-07-15 |
| JP2006153888A (ja) | 2006-06-15 |
| EP1046028A1 (de) | 2000-10-25 |
| AU1914799A (en) | 1999-07-26 |
| US20030049175A1 (en) | 2003-03-13 |
| DE69832098D1 (de) | 2005-12-01 |
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