ATE335206T1 - Verfahren und einrichtung zur ruhestrombestimmung - Google Patents

Verfahren und einrichtung zur ruhestrombestimmung

Info

Publication number
ATE335206T1
ATE335206T1 AT03748376T AT03748376T ATE335206T1 AT E335206 T1 ATE335206 T1 AT E335206T1 AT 03748376 T AT03748376 T AT 03748376T AT 03748376 T AT03748376 T AT 03748376T AT E335206 T1 ATE335206 T1 AT E335206T1
Authority
AT
Austria
Prior art keywords
terminal
circuit
vdd
under test
count period
Prior art date
Application number
AT03748376T
Other languages
English (en)
Inventor
Vazquez Josep Rius
De Gyvez Jose D J Pineda
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE335206T1 publication Critical patent/ATE335206T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Air Bags (AREA)
AT03748376T 2002-09-20 2003-08-08 Verfahren und einrichtung zur ruhestrombestimmung ATE335206T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02078906 2002-09-20

Publications (1)

Publication Number Publication Date
ATE335206T1 true ATE335206T1 (de) 2006-08-15

Family

ID=32011004

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03748376T ATE335206T1 (de) 2002-09-20 2003-08-08 Verfahren und einrichtung zur ruhestrombestimmung

Country Status (9)

Country Link
US (1) US7336088B2 (de)
EP (1) EP1543339B1 (de)
JP (1) JP2006500559A (de)
KR (1) KR20050057517A (de)
AT (1) ATE335206T1 (de)
AU (1) AU2003267684A1 (de)
DE (1) DE60307297T2 (de)
TW (1) TWI280380B (de)
WO (1) WO2004027438A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101177663B1 (ko) * 2004-02-27 2012-09-07 티디비전 코포레이션 에스.에이. 데 씨.브이. 입체적 3ｄ-비디오 이미지 디지털 디코딩 시스템 및 방법
JP2005346815A (ja) * 2004-06-02 2005-12-15 Hitachi Global Storage Technologies Netherlands Bv ディスク装置、そのヘッドの位置決め制御方法、及び信号処理回路
JP4630122B2 (ja) * 2005-05-11 2011-02-09 株式会社アドバンテスト 試験装置、及び試験方法
KR100758222B1 (ko) 2007-04-09 2007-09-12 주식회사 룩센테크놀러지 자체 클럭 발생기를 갖는 정현파 전압 최대값 검출기
US8159255B2 (en) * 2008-02-15 2012-04-17 Qualcomm, Incorporated Methodologies and tool set for IDDQ verification, debugging and failure diagnosis
US8044676B2 (en) * 2008-06-11 2011-10-25 Infineon Technologies Ag IDDQ testing
US8391469B2 (en) * 2008-07-11 2013-03-05 Texas Instruments Incorporated Methods and apparatus to decode dual-tone signals
US8278960B2 (en) * 2009-06-19 2012-10-02 Freescale Semiconductor, Inc. Method and circuit for measuring quiescent current
JP2011027453A (ja) * 2009-07-22 2011-02-10 Renesas Electronics Corp 半導体試験装置及び半導体試験方法
US9007079B2 (en) * 2012-11-02 2015-04-14 Nvidia Corporation System and method for compensating measured IDDQ values
US8816754B1 (en) * 2012-11-02 2014-08-26 Suvolta, Inc. Body bias circuits and methods
US9482706B2 (en) * 2012-12-11 2016-11-01 Dust Company, Inc. Methods and circuits for measuring a high impedance element based on time constant measurements
FR3014266B1 (fr) * 2013-12-03 2017-07-21 Stmicroelectronics Rousset Procede et dispositif de commande d'un echantillonneur bloqueur.
JP6502538B1 (ja) * 2018-01-24 2019-04-17 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置および解析システム
US12072394B2 (en) * 2021-02-12 2024-08-27 Nordic Semiconductor Asa Power leakage testing
CN120977362A (zh) * 2024-05-17 2025-11-18 长江存储科技有限责任公司 存储系统、电子产品及存储系统的操作方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5731700A (en) * 1994-03-14 1998-03-24 Lsi Logic Corporation Quiescent power supply current test method and apparatus for integrated circuits
US5694063A (en) * 1994-08-11 1997-12-02 Ltx Corporation High speed IDDQ monitor circuit
US5917331A (en) * 1995-10-23 1999-06-29 Megatest Corporation Integrated circuit test method and structure
ATE300741T1 (de) * 1996-06-05 2005-08-15 Imec Inter Uni Micro Electr Hochauflösendes stromversorgungsprüfsystem
US5789933A (en) * 1996-10-30 1998-08-04 Hewlett-Packard Co. Method and apparatus for determining IDDQ
US6037796A (en) * 1997-06-25 2000-03-14 Lsi Logic Corp. Current waveform analysis for testing semiconductor devices
US6348806B1 (en) * 1999-03-18 2002-02-19 Motorola, Inc. Method and apparatus for measuring gate leakage current in an integrated circuit
US6535015B1 (en) * 2001-04-30 2003-03-18 Advanced Micro Devices, Inc. Device and method for testing performance of silicon structures
US6845480B2 (en) * 2002-01-28 2005-01-18 Winbond Electronics Corp. Test pattern generator and test pattern generation
CN1682122A (zh) * 2002-09-16 2005-10-12 皇家飞利浦电子股份有限公司 用于iddq测量的设备和方法

Also Published As

Publication number Publication date
TW200413734A (en) 2004-08-01
TWI280380B (en) 2007-05-01
AU2003267684A1 (en) 2004-04-08
US20060250152A1 (en) 2006-11-09
EP1543339A1 (de) 2005-06-22
US7336088B2 (en) 2008-02-26
JP2006500559A (ja) 2006-01-05
EP1543339B1 (de) 2006-08-02
DE60307297T2 (de) 2007-10-18
KR20050057517A (ko) 2005-06-16
DE60307297D1 (de) 2006-09-14
WO2004027438A1 (en) 2004-04-01

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