ATE339695T1 - Testschaltung - Google Patents

Testschaltung

Info

Publication number
ATE339695T1
ATE339695T1 AT02730604T AT02730604T ATE339695T1 AT E339695 T1 ATE339695 T1 AT E339695T1 AT 02730604 T AT02730604 T AT 02730604T AT 02730604 T AT02730604 T AT 02730604T AT E339695 T1 ATE339695 T1 AT E339695T1
Authority
AT
Austria
Prior art keywords
power supply
subset
current drawing
drawing circuits
activation
Prior art date
Application number
AT02730604T
Other languages
English (en)
Inventor
Jong Franciscus G M De
Rodger F Schuttert
Wilde Johannes De
Besten Gerrit W Den
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE339695T1 publication Critical patent/ATE339695T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Air Bags (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Glass Compositions (AREA)
AT02730604T 2001-05-23 2002-05-21 Testschaltung ATE339695T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01201973 2001-05-23

Publications (1)

Publication Number Publication Date
ATE339695T1 true ATE339695T1 (de) 2006-10-15

Family

ID=8180369

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02730604T ATE339695T1 (de) 2001-05-23 2002-05-21 Testschaltung

Country Status (6)

Country Link
EP (1) EP1435004B1 (de)
JP (1) JP4090891B2 (de)
KR (1) KR100860214B1 (de)
AT (1) ATE339695T1 (de)
DE (1) DE60214746T2 (de)
WO (1) WO2002095430A2 (de)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0306656A1 (de) * 1987-08-20 1989-03-15 Siemens Aktiengesellschaft Einrichtung zur Prüfung von IC-Bausteinen
DE69518973T2 (de) * 1995-05-19 2001-02-22 Stmicroelectronics S.R.L., Agrate Brianza Elektronische Schaltung mit mehreren Banddrähten, Herstellungsmethode und Testverfahren des Banddrahtzusammenhangs
KR0172347B1 (ko) * 1995-12-23 1999-03-30 김광호 반도체 메모리장치의 병렬테스트 회로
JPH11237441A (ja) * 1998-02-20 1999-08-31 Nec Corp 半導体集積回路装置、半導体集積回路装置の製造方法、及び半導体集積回路装置の検査方法
JP2003524190A (ja) * 2000-02-23 2003-08-12 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ テスト・インターフェースを備えた集積回路

Also Published As

Publication number Publication date
EP1435004B1 (de) 2006-09-13
WO2002095430A3 (en) 2004-04-22
WO2002095430A2 (en) 2002-11-28
JP2004531728A (ja) 2004-10-14
KR100860214B1 (ko) 2008-09-24
DE60214746T2 (de) 2007-12-06
JP4090891B2 (ja) 2008-05-28
EP1435004A2 (de) 2004-07-07
DE60214746D1 (de) 2006-10-26
KR20030020941A (ko) 2003-03-10

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties