ATE357679T1 - Verbesserungen an oder bezüglich der bilderzeugung - Google Patents

Verbesserungen an oder bezüglich der bilderzeugung

Info

Publication number
ATE357679T1
ATE357679T1 AT03756579T AT03756579T ATE357679T1 AT E357679 T1 ATE357679 T1 AT E357679T1 AT 03756579 T AT03756579 T AT 03756579T AT 03756579 T AT03756579 T AT 03756579T AT E357679 T1 ATE357679 T1 AT E357679T1
Authority
AT
Austria
Prior art keywords
specimen
scanning system
image capture
capture device
light
Prior art date
Application number
AT03756579T
Other languages
English (en)
Inventor
Fedja Bobanovic
John Phillips
Shab Ladha
Patrick Courtney
Original Assignee
Perkinelmer Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkinelmer Singapore Pte Ltd filed Critical Perkinelmer Singapore Pte Ltd
Application granted granted Critical
Publication of ATE357679T1 publication Critical patent/ATE357679T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Glass Compositions (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
AT03756579T 2002-10-16 2003-10-15 Verbesserungen an oder bezüglich der bilderzeugung ATE357679T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0224067.9A GB0224067D0 (en) 2002-10-16 2002-10-16 Improvements in and relating to imaging

Publications (1)

Publication Number Publication Date
ATE357679T1 true ATE357679T1 (de) 2007-04-15

Family

ID=9946015

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03756579T ATE357679T1 (de) 2002-10-16 2003-10-15 Verbesserungen an oder bezüglich der bilderzeugung

Country Status (10)

Country Link
US (1) US8289620B2 (de)
EP (1) EP1552333B1 (de)
JP (1) JP4829499B2 (de)
KR (1) KR101160356B1 (de)
AT (1) ATE357679T1 (de)
AU (1) AU2003301487B2 (de)
CA (1) CA2502701C (de)
DE (1) DE60312717T2 (de)
GB (2) GB0224067D0 (de)
WO (1) WO2004036898A2 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0409411D0 (en) * 2004-04-28 2004-06-02 Perkinelmer Uk Ltd Improvements in and relating to image capture
KR101185127B1 (ko) * 2004-04-28 2012-09-26 퍼킨엘머 싱가포르 피티이 리미티드 영상 포착의 개선
EP1787157B1 (de) * 2004-07-23 2014-09-24 GE Healthcare Niagara Inc. Vorrichtung zur fluoreszenz-konfokalmikroskopie
EP1784633B1 (de) * 2004-09-01 2011-11-09 Perkinelmer Singapore PTE Ltd. Verfahren zur analyse einer probe und vorrichtung dafür
EP1889032A1 (de) * 2005-05-25 2008-02-20 Stiftelsen Universitetsforskning Bergen Mikroskopsystem und screening-verfahren für arzneistoffe, physische therapien und biologische gefahrstoffe
JP2007132794A (ja) * 2005-11-10 2007-05-31 Olympus Corp 多光子励起型観察装置および多光子励起型観察用光源装置
GB0603923D0 (en) 2006-02-28 2006-04-05 Perkinelmer Ltd Apparatus and methods for imaging and modification of biological samples
DE102006025445A1 (de) * 2006-05-31 2007-12-06 Carl Zeiss Microimaging Gmbh Laser-Scanning-Mikroskop mit Hochgeschwindigkeitsdatenverarbeitung
WO2009155499A2 (en) * 2008-06-19 2009-12-23 University Of Florida Research Foundation, Inc. Floating-element shear-stress sensor
WO2011008233A1 (en) * 2009-05-07 2011-01-20 President And Fellows Of Harvard College Methods and apparatus for fluorescence sensing employing fresnel zone plates
EP2550522B1 (de) 2010-03-23 2016-11-02 California Institute of Technology Hochauflösende optofluidische mikroskope für 2d- und 3d-bildgebung
US9643184B2 (en) 2010-10-26 2017-05-09 California Institute Of Technology e-Petri dishes, devices, and systems having a light detector for sampling a sequence of sub-pixel shifted projection images
US9569664B2 (en) 2010-10-26 2017-02-14 California Institute Of Technology Methods for rapid distinction between debris and growing cells
WO2012058233A2 (en) * 2010-10-26 2012-05-03 California Institute Of Technology Scanning projective lensless microscope system
KR20140027113A (ko) 2011-03-03 2014-03-06 캘리포니아 인스티튜트 오브 테크놀로지 도광 픽셀
DE102011007751B4 (de) 2011-04-20 2023-10-19 Carl Zeiss Microscopy Gmbh Weitfeldmikroskop und Verfahren zur Weitfeldmikroskopie
US9127861B2 (en) * 2011-10-31 2015-09-08 Solarreserve Technology, Llc Targets for heliostat health monitoring
JP6157155B2 (ja) * 2012-03-15 2017-07-05 オリンパス株式会社 顕微鏡システム、駆動方法およびプログラム
JP6108908B2 (ja) * 2013-03-29 2017-04-05 オリンパス株式会社 倒立顕微鏡システム
DE102013218795A1 (de) * 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Verfahren zur Korrektur von Abbildungsfehlern insbesondere in der hochauflösenden Scanning-Mikroskopie
FR3028867B1 (fr) * 2014-11-26 2016-12-09 Intelligence Artificielle Applications Procede et dispositif de detection d'ensemencement et installation automatisee d'ensemencement equipee d'un tel dispositif de detection
US10078778B2 (en) * 2015-01-15 2018-09-18 Massachusetts Institute Of Technology Systems, methods, and apparatus for in vitro single-cell identification and recovery
DE102016215177B4 (de) * 2016-08-15 2024-07-04 Carl Zeiss Microscopy Gmbh Verfahren und Anordnung zur Erfassung von Bilddaten
KR20180077781A (ko) * 2016-12-29 2018-07-09 에이치피프린팅코리아 주식회사 화상독취장치 및 화상독취방법
WO2020014783A1 (en) * 2018-07-17 2020-01-23 Dixon A E Scanning microscope using pulsed illumination
WO2024102496A1 (en) * 2022-11-12 2024-05-16 Lumencor, Inc. Confocal microscopy system with free-space optics linkage
CN116828318B (zh) * 2022-12-14 2024-05-24 深圳市中图仪器股份有限公司 基于多次成像的光学测量系统及成像方法
CN117517319B (zh) * 2023-10-31 2025-07-04 哈尔滨工业大学 基于频率失配解调的暗场共焦显微测量装置及方法

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910606A (en) * 1981-12-29 1990-03-20 Canon Kabushiki Kaisha Solid state pick-up having particular exposure and read-out control
US4566029A (en) * 1984-03-23 1986-01-21 Rca Corporation Shuttered CCD camera with low noise
US4972258A (en) * 1989-07-31 1990-11-20 E. I. Du Pont De Nemours And Company Scanning laser microscope system and methods of use
JPH02266674A (ja) * 1989-04-06 1990-10-31 Kyocera Corp 固体撮像装置
US5067805A (en) * 1990-02-27 1991-11-26 Prometrix Corporation Confocal scanning optical microscope
DE539691T1 (de) 1991-10-31 1993-10-14 Yokogawa Electric Corp Nipkowscheibe für konfokalen optischen Scanner.
JP3343276B2 (ja) * 1993-04-15 2002-11-11 興和株式会社 レーザー走査型光学顕微鏡
JPH06317526A (ja) 1993-04-30 1994-11-15 Olympus Optical Co Ltd 多波長測光装置
AU3152795A (en) * 1994-07-28 1996-02-22 Victor B. Kley Scanning probe microscope assembly
JPH0943147A (ja) * 1995-07-28 1997-02-14 Bunshi Bio Photonics Kenkyusho:Kk 暗視野落射蛍光顕微鏡装置
JP3019754B2 (ja) 1995-09-11 2000-03-13 横河電機株式会社 ニポウディスク型光スキャナ装置
JPH09319408A (ja) 1996-05-29 1997-12-12 Keyence Corp 割込信号監視回路及びプログラマブルコントローラ
DE19627568A1 (de) * 1996-07-09 1998-01-15 Zeiss Carl Jena Gmbh Anordnung und Verfahren zur konfokalen Mikroskopie
JP3930929B2 (ja) * 1996-11-28 2007-06-13 オリンパス株式会社 共焦点顕微鏡
US6122396A (en) * 1996-12-16 2000-09-19 Bio-Tech Imaging, Inc. Method of and apparatus for automating detection of microorganisms
JPH10282426A (ja) 1997-04-01 1998-10-23 Nikon Corp レーザ顕微鏡
JP3612946B2 (ja) * 1997-07-15 2005-01-26 ミノルタ株式会社 カラー表示装置の表示特性測定装置
JPH1196334A (ja) 1997-09-17 1999-04-09 Olympus Optical Co Ltd 画像処理装置
JP3670839B2 (ja) * 1998-05-18 2005-07-13 オリンパス株式会社 共焦点顕微鏡
DE19824460A1 (de) * 1998-05-30 1999-12-02 Zeiss Carl Jena Gmbh Anordnung und Verfahren zur mikroskopischen Erzeugung von Objektbildern
JP2000098259A (ja) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd 共焦点顕微鏡用撮影装置
JP2000275534A (ja) 1999-03-23 2000-10-06 Olympus Optical Co Ltd 共焦点顕微鏡
US6426835B1 (en) * 1999-03-23 2002-07-30 Olympus Optical Co., Ltd. Confocal microscope
JP2000275542A (ja) 1999-03-24 2000-10-06 Olympus Optical Co Ltd 共焦点顕微鏡
JP2000275527A (ja) 1999-03-24 2000-10-06 Olympus Optical Co Ltd 像検出装置
JP4397993B2 (ja) 1999-03-24 2010-01-13 オリンパス株式会社 顕微鏡写真撮影装置
US6371370B2 (en) * 1999-05-24 2002-04-16 Agilent Technologies, Inc. Apparatus and method for scanning a surface
JP2001091839A (ja) 1999-09-20 2001-04-06 Olympus Optical Co Ltd 共焦点顕微鏡
JP4418058B2 (ja) 1999-09-22 2010-02-17 オリンパス株式会社 走査型レーザ顕微鏡
CA2330433A1 (en) * 2000-01-21 2001-07-21 Symagery Microsystems Inc. Smart exposure determination for imagers
JP2002090628A (ja) 2000-09-18 2002-03-27 Olympus Optical Co Ltd 共焦点顕微鏡
US6433929B1 (en) 2000-06-12 2002-08-13 Olympus Optical Co., Ltd. Scanning optical microscope and method of acquiring image
EP1164401B1 (de) 2000-06-17 2005-03-09 Leica Microsystems Heidelberg GmbH Verschränkte-Photonen-Mikroskop
DE20122783U1 (de) 2000-06-17 2007-11-15 Leica Microsystems Cms Gmbh Anordnung zum Untersuchen mikroskopischer Präparate mit einem Scanmikroskop und Beleuchtungseinrichtung für ein Scanmikroskop
US7062092B2 (en) 2000-08-22 2006-06-13 Affymetrix, Inc. System, method, and computer software product for gain adjustment in biological microarray scanner
JP2002075815A (ja) * 2000-08-23 2002-03-15 Sony Corp パターン検査装置及びこれを用いた露光装置制御システム
DE10050529B4 (de) 2000-10-11 2016-06-09 Leica Microsystems Cms Gmbh Verfahren zur Strahlsteuerung in einem Scanmikroskop, Anordnung zur Strahlsteuerung in einem Scanmikroskop und Scanmikroskop
JP4932076B2 (ja) * 2000-10-30 2012-05-16 オリンパス株式会社 走査型レーザ顕微鏡
JP4256585B2 (ja) 2000-12-22 2009-04-22 富士フイルム株式会社 双方向走査スキャナにおけるジッターの補正方法およびジッターを補正可能な双方向走査スキャナ

Also Published As

Publication number Publication date
AU2003301487B2 (en) 2009-10-01
EP1552333B1 (de) 2007-03-21
JP2006503283A (ja) 2006-01-26
GB2395265A (en) 2004-05-19
DE60312717D1 (de) 2007-05-03
GB2395265B (en) 2005-08-24
EP1552333A2 (de) 2005-07-13
US8289620B2 (en) 2012-10-16
WO2004036898A2 (en) 2004-04-29
DE60312717T2 (de) 2007-12-06
US20060124870A1 (en) 2006-06-15
CA2502701A1 (en) 2004-04-29
CA2502701C (en) 2012-09-18
GB0324250D0 (en) 2003-11-19
WO2004036898A3 (en) 2004-06-17
AU2003301487A1 (en) 2004-05-04
JP4829499B2 (ja) 2011-12-07
KR20050083776A (ko) 2005-08-26
GB0224067D0 (en) 2002-11-27
KR101160356B1 (ko) 2012-06-26

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