ATE360811T1 - Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren - Google Patents

Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren

Info

Publication number
ATE360811T1
ATE360811T1 AT02752385T AT02752385T ATE360811T1 AT E360811 T1 ATE360811 T1 AT E360811T1 AT 02752385 T AT02752385 T AT 02752385T AT 02752385 T AT02752385 T AT 02752385T AT E360811 T1 ATE360811 T1 AT E360811T1
Authority
AT
Austria
Prior art keywords
mirror
gloss
collimator
window
reflection device
Prior art date
Application number
AT02752385T
Other languages
English (en)
Inventor
Edward Belotserkovasky
Original Assignee
Honeywell Int Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Int Inc filed Critical Honeywell Int Inc
Application granted granted Critical
Publication of ATE360811T1 publication Critical patent/ATE360811T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT02752385T 2001-07-16 2002-07-16 Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren ATE360811T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/906,516 US6507403B1 (en) 2001-07-16 2001-07-16 Gloss sensor having dirt buildup compensation apparatus and method

Publications (1)

Publication Number Publication Date
ATE360811T1 true ATE360811T1 (de) 2007-05-15

Family

ID=25422578

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02752385T ATE360811T1 (de) 2001-07-16 2002-07-16 Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren

Country Status (7)

Country Link
US (1) US6507403B1 (de)
EP (1) EP1407249B1 (de)
JP (1) JP3908222B2 (de)
AT (1) ATE360811T1 (de)
CA (1) CA2454202C (de)
DE (1) DE60219792T2 (de)
WO (1) WO2003008947A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7423758B1 (en) * 2007-07-27 2008-09-09 Voith Patent Gmbh Gloss sensor for a paper machine
US7619740B2 (en) 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
DE102010017211B4 (de) 2010-06-02 2024-12-19 Vorwerk & Co. Interholding Gmbh Basisstation für ein selbsttätig verfahrbares Bodenreinigungsgerät sowie Verfahren zur Reinigung eines Bodens mittels eines solchen Bodenreinigungsgerätes
CN103983614A (zh) * 2014-05-28 2014-08-13 爱彼思（苏州）自动化科技有限公司 一种检测角度可调的光泽度检测装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636361A (en) * 1970-05-28 1972-01-18 Kenneth Bowers Radiation-sensitive glossmeter with means to compensate for environmental contaminants
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
DE2853458C3 (de) * 1978-09-29 1981-04-02 Gebrüder Bühler AG, 9240 Uzwil Verfahren und Vorrichtung zur Messung der relativen Helligkeit einer Probe
JPH0420845A (ja) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd 光沢むらの測定方法
US6233053B1 (en) * 1997-07-29 2001-05-15 Honeywell International Inc Dual standard gloss sensor
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
JP4166340B2 (ja) * 1997-09-24 2008-10-15 オリンパス株式会社 基板検査装置
US5978441A (en) * 1997-12-01 1999-11-02 Advanced Micro Devices, Inc. Extreme ultraviolet lithography mask blank and manufacturing method therefor
US6380529B1 (en) * 1999-09-29 2002-04-30 Hewlett-Packard Company Position sensing device having a movable photosensing element

Also Published As

Publication number Publication date
CA2454202C (en) 2011-06-21
JP2004536305A (ja) 2004-12-02
WO2003008947A1 (en) 2003-01-30
US20030011785A1 (en) 2003-01-16
JP3908222B2 (ja) 2007-04-25
EP1407249A1 (de) 2004-04-14
DE60219792D1 (de) 2007-06-06
EP1407249B1 (de) 2007-04-25
CA2454202A1 (en) 2003-01-30
US6507403B1 (en) 2003-01-14
DE60219792T2 (de) 2008-01-17

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Legal Events

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