ATE364184T1 - Presselement und vorrichtung für ein elektronisches bauelement - Google Patents

Presselement und vorrichtung für ein elektronisches bauelement

Info

Publication number
ATE364184T1
ATE364184T1 AT02783760T AT02783760T ATE364184T1 AT E364184 T1 ATE364184 T1 AT E364184T1 AT 02783760 T AT02783760 T AT 02783760T AT 02783760 T AT02783760 T AT 02783760T AT E364184 T1 ATE364184 T1 AT E364184T1
Authority
AT
Austria
Prior art keywords
pusher
electronic component
pressing element
pressing
biases
Prior art date
Application number
AT02783760T
Other languages
English (en)
Inventor
Tsuyoshi Yamashita
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of ATE364184T1 publication Critical patent/ATE364184T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Manipulator (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
AT02783760T 2002-12-04 2002-12-04 Presselement und vorrichtung für ein elektronisches bauelement ATE364184T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2002/012687 WO2004051292A1 (ja) 2002-12-04 2002-12-04 押圧部材および電子部品ハンドリング装置

Publications (1)

Publication Number Publication Date
ATE364184T1 true ATE364184T1 (de) 2007-06-15

Family

ID=32448996

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02783760T ATE364184T1 (de) 2002-12-04 2002-12-04 Presselement und vorrichtung für ein elektronisches bauelement

Country Status (10)

Country Link
US (2) US7309981B2 (de)
EP (1) EP1574865B1 (de)
JP (1) JP4146839B2 (de)
CN (1) CN100403043C (de)
AT (1) ATE364184T1 (de)
AU (1) AU2002349395A1 (de)
DE (1) DE60220553T2 (de)
MY (1) MY135539A (de)
TW (1) TWI277745B (de)
WO (1) WO2004051292A1 (de)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4146839B2 (ja) * 2002-12-04 2008-09-10 株式会社アドバンテスト 押圧部材および電子部品ハンドリング装置
JP2006237295A (ja) * 2005-02-25 2006-09-07 Arufakusu Kk 半導体レーザの特性検査方法及びその装置
SG131792A1 (en) * 2005-10-21 2007-05-28 Daytona Control Co Ltd Pusher of ic chip handler
US7214072B1 (en) 2005-10-31 2007-05-08 Daytona Control Co., Ltd. Pusher of IC chip handler
WO2007055004A1 (ja) * 2005-11-09 2007-05-18 Advantest Corporation 電子部品試験装置、及び、電子部品試験装置のコンタクトアームの最適押付条件設定方法
DE112006000019T5 (de) * 2006-02-13 2008-07-24 Advantest Corp. Kontaktstößel, Kontaktarm und Prüfgerät für elektronische Bauelemente
JP2008014847A (ja) * 2006-07-07 2008-01-24 Matsushita Electric Ind Co Ltd ハンドラとこのハンドラを使用した半導体デバイスの検査方法
MY148803A (en) 2007-02-23 2013-05-31 Advantest Corp Electronic component pressing device and electronic component test apparatus
US7965091B2 (en) * 2007-04-30 2011-06-21 Electro Scientific Industries, Inc. Test plate for electronic handler
WO2009101706A1 (ja) * 2008-02-15 2009-08-20 Advantest Corporation マッチプレートベース部および本体部、電子部品ハンドリング装置、ならびにマッチプレート本体部およびテスト部ユニットの交換治具および交換方法
DE102009045291A1 (de) * 2009-10-02 2011-04-07 Ers Electronic Gmbh Vorrichtung zur Konditionierung von Halbleiterchips und Testverfahren unter Verwendung der Vorrichtung
DE202010006062U1 (de) * 2010-04-23 2010-07-22 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messsonde zur zerstörungsfreien Messung der Dicke dünner Schichten
TW201423899A (zh) * 2012-12-14 2014-06-16 Hon Tech Inc 電子元件壓取機構及其應用之測試設備
US10281518B2 (en) * 2014-02-25 2019-05-07 Formfactor Beaverton, Inc. Systems and methods for on-wafer dynamic testing of electronic devices
JP5796104B1 (ja) * 2014-05-07 2015-10-21 株式会社 Ｓｙｎａｘ 電子部品測定用のコンタクトモジュール
KR102200697B1 (ko) * 2015-01-12 2021-01-12 (주)테크윙 테스트핸들러용 가압장치
TWI551873B (zh) * 2015-03-13 2016-10-01 Hon Tech Inc Electronic components operating equipment
TW201715241A (zh) * 2015-10-23 2017-05-01 Hon Tech Inc 電子元件作業裝置及其應用之測試分類設備
TWI580979B (zh) * 2016-06-24 2017-05-01 Electronic components crimping device and its application test classification equipment
TWI588501B (zh) * 2016-06-24 2017-06-21 Temperature control device of electronic components testing and classification machine and its application temperature control method
TWI593980B (zh) * 2016-07-29 2017-08-01 Electronic components operating device and its application test classification equipment
USD834075S1 (en) 2016-08-05 2018-11-20 Ebara Corporation Pressing member for substrate polishing apparatus
TWI623754B (zh) * 2017-01-26 2018-05-11 Electronic component testing device and test classification device thereof
TWI628446B (zh) * 2017-07-07 2018-07-01 鴻勁精密股份有限公司 Electronic component test picking and sorting equipment
JP2019113471A (ja) * 2017-12-26 2019-07-11 セイコーエプソン株式会社 電子部品搬送装置及び電子部品検査装置
JP7281250B2 (ja) 2018-05-11 2023-05-25 株式会社アドバンテスト 試験用キャリア
JP7316798B2 (ja) 2019-01-30 2023-07-28 株式会社アドバンテスト 電子部品ハンドリング装置及び電子部品試験装置
CN110794277B (zh) * 2018-07-26 2022-06-03 株式会社爱德万测试 电子部件处理装置及电子部件测试装置
TWI708952B (zh) * 2019-05-06 2020-11-01 美商第一檢測有限公司 檢測設備
TWI709520B (zh) * 2019-12-12 2020-11-11 鴻勁精密股份有限公司 輸送裝置之貼接機構及其應用之測試設備
US11143699B2 (en) * 2020-02-19 2021-10-12 UI Green Micro & Nano Technologies Co Ltd Integrated circuit testing apparatus and method
TWI744840B (zh) * 2020-03-25 2021-11-01 鴻勁精密股份有限公司 預冷器以及其應用之測試分類設備
TW202141662A (zh) * 2020-04-16 2021-11-01 力成科技股份有限公司 拾取及接觸裝置
TWI741693B (zh) * 2020-07-24 2021-10-01 鴻勁精密股份有限公司 接合機構及其應用之作業設備
TWI769664B (zh) * 2021-01-15 2022-07-01 鴻勁精密股份有限公司 測試裝置及其應用之測試設備
KR102463826B1 (ko) * 2021-03-18 2022-11-04 ㈜킴스옵텍 접촉 특성 개선 구조의 반도체 패키지 검사 지그
CN114264929A (zh) * 2021-11-17 2022-04-01 杭州长川科技股份有限公司 Ic测试装置
JP2023116053A (ja) * 2022-02-09 2023-08-22 株式会社アドバンテスト 電子部品ハンドリング装置、及び、電子部品試験装置
TWI815469B (zh) * 2022-05-23 2023-09-11 鴻勁精密股份有限公司 接合治具、接合機構及作業機
TWI891317B (zh) * 2024-04-03 2025-07-21 鴻勁精密股份有限公司 壓接機構、測試裝置及測試設備
CN118877502B (zh) * 2024-09-29 2024-11-29 合肥巨阙电子有限公司 老化炉料件载具的传递装置
TWI909881B (zh) * 2024-12-18 2025-12-21 鴻勁精密股份有限公司 壓接機構、測試裝置及作業機

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19756900A1 (de) * 1996-12-26 1998-07-02 Advantest Corp Testvorrichtung für Halbleiterbauelemente
US6069483A (en) * 1997-12-16 2000-05-30 Intel Corporation Pickup chuck for multichip modules
US6057700A (en) * 1998-05-06 2000-05-02 Lucent Technologies, Inc. Pressure controlled alignment fixture
JPH11329646A (ja) * 1998-05-15 1999-11-30 Jsr Corp 検査装置
JPH11329648A (ja) * 1998-05-19 1999-11-30 Molex Inc Ｉｃデバイスソケット
JP4299383B2 (ja) * 1998-06-25 2009-07-22 株式会社アドバンテスト Ｉｃ試験装置
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
JP4327335B2 (ja) * 2000-06-23 2009-09-09 株式会社アドバンテスト コンタクトアームおよびこれを用いた電子部品試験装置
JP4480253B2 (ja) * 2000-10-27 2010-06-16 株式会社アドバンテスト 電子部品試験用押圧装置、電子部品試験装置およびその制御方法
JP4146839B2 (ja) * 2002-12-04 2008-09-10 株式会社アドバンテスト 押圧部材および電子部品ハンドリング装置

Also Published As

Publication number Publication date
TWI277745B (en) 2007-04-01
CN100403043C (zh) 2008-07-16
MY135539A (en) 2008-05-30
EP1574865A4 (de) 2006-02-15
EP1574865A1 (de) 2005-09-14
WO2004051292A1 (ja) 2004-06-17
DE60220553T2 (de) 2008-01-31
JP4146839B2 (ja) 2008-09-10
JPWO2004051292A1 (ja) 2006-04-06
US20050275398A1 (en) 2005-12-15
US7511473B2 (en) 2009-03-31
EP1574865B1 (de) 2007-06-06
TW200409925A (en) 2004-06-16
US7309981B2 (en) 2007-12-18
AU2002349395A1 (en) 2004-06-23
CN1720460A (zh) 2006-01-11
US20080122433A1 (en) 2008-05-29
DE60220553D1 (de) 2007-07-19

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Legal Events

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