ATE374961T1 - Zoomvorrichtung, insbesondere zoomvorrichtung für eine beleuchtungsvorrichtung einer mikrolithographie-projektionsvorrichtung - Google Patents
Zoomvorrichtung, insbesondere zoomvorrichtung für eine beleuchtungsvorrichtung einer mikrolithographie-projektionsvorrichtungInfo
- Publication number
- ATE374961T1 ATE374961T1 AT02758488T AT02758488T ATE374961T1 AT E374961 T1 ATE374961 T1 AT E374961T1 AT 02758488 T AT02758488 T AT 02758488T AT 02758488 T AT02758488 T AT 02758488T AT E374961 T1 ATE374961 T1 AT E374961T1
- Authority
- AT
- Austria
- Prior art keywords
- plane
- zoom
- image plane
- image
- illumination
- Prior art date
Links
- 238000005286 illumination Methods 0.000 title abstract 2
- 238000001393 microlithography Methods 0.000 title 1
- 230000001179 pupillary effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70183—Zoom systems for adjusting beam diameter
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B15/00—Optical objectives with means for varying the magnification
- G02B15/14—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective
- G02B15/144—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective having four groups only
- G02B15/1441—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective having four groups only the first group being positive
- G02B15/144113—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective having four groups only the first group being positive arranged +-++
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B15/00—Optical objectives with means for varying the magnification
- G02B15/14—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective
- G02B15/16—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective with interdependent non-linearly related movements between one lens or lens group, and another lens or lens group
- G02B15/163—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective with interdependent non-linearly related movements between one lens or lens group, and another lens or lens group having a first movable lens or lens group and a second movable lens or lens group, both in front of a fixed lens or lens group
- G02B15/167—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective with interdependent non-linearly related movements between one lens or lens group, and another lens or lens group having a first movable lens or lens group and a second movable lens or lens group, both in front of a fixed lens or lens group having an additional fixed front lens or group of lenses
- G02B15/173—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective with interdependent non-linearly related movements between one lens or lens group, and another lens or lens group having a first movable lens or lens group and a second movable lens or lens group, both in front of a fixed lens or lens group having an additional fixed front lens or group of lenses arranged +-+
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/22—Telecentric objectives or lens systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Nonlinear Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Lenses (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10144244A DE10144244A1 (de) | 2001-09-05 | 2001-09-05 | Zoom-System, insbesondere für eine Beleuchtungseinrichtung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE374961T1 true ATE374961T1 (de) | 2007-10-15 |
Family
ID=7698294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02758488T ATE374961T1 (de) | 2001-09-05 | 2002-08-30 | Zoomvorrichtung, insbesondere zoomvorrichtung für eine beleuchtungsvorrichtung einer mikrolithographie-projektionsvorrichtung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6900946B2 (de) |
| EP (1) | EP1423758B1 (de) |
| JP (1) | JP2005503011A (de) |
| KR (1) | KR20040044540A (de) |
| AT (1) | ATE374961T1 (de) |
| DE (2) | DE10144244A1 (de) |
| WO (1) | WO2003023521A1 (de) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060268251A1 (en) * | 2003-07-16 | 2006-11-30 | Markus Deguenther | Illumination system for a microlithographic projection exposure apparatus |
| JP2005301054A (ja) * | 2004-04-14 | 2005-10-27 | Canon Inc | 照明光学系及びそれを用いた露光装置 |
| US7283209B2 (en) * | 2004-07-09 | 2007-10-16 | Carl Zeiss Smt Ag | Illumination system for microlithography |
| US20080192224A1 (en) * | 2005-02-12 | 2008-08-14 | Carl Zeiss Smt Ag | Microlithographic Projection Exposure Apparatus |
| US7835076B2 (en) * | 2005-10-27 | 2010-11-16 | Yale University | Optical system for illumination of an evanescent field |
| US7352789B2 (en) * | 2006-01-12 | 2008-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Laser light irradiation apparatus and laser light irradiation method |
| JP5100127B2 (ja) * | 2006-01-12 | 2012-12-19 | 株式会社半導体エネルギー研究所 | レ−ザー光照射装置 |
| US7508514B2 (en) * | 2006-06-23 | 2009-03-24 | Asml Holding N.V. | Correction of off-axis translation of optical elements in an optical zoom assembly |
| US7706078B2 (en) | 2006-09-14 | 2010-04-27 | Semiconductor Energy Laboratory Co., Ltd. | Laser light irradiation apparatus and laser light irradiation method |
| JP5210574B2 (ja) * | 2006-09-14 | 2013-06-12 | 株式会社半導体エネルギー研究所 | レーザ照射装置 |
| KR100946248B1 (ko) * | 2008-01-09 | 2010-03-09 | 주식회사 프로텍 | 회절광학소자에 의해 형성된 다중 빔을 이용하여 다중노광을 수행하는 다중 노광시스템 |
| DE102009037366A1 (de) * | 2009-08-13 | 2011-02-17 | Carl Zeiss Microlmaging Gmbh | Mikroskop, insbesondere zur Messung von Totalreflexions-Fluoreszenz, und Betriebsverfahren für ein solches |
| JP5165099B2 (ja) * | 2010-12-10 | 2013-03-21 | キヤノン株式会社 | 撮像装置及びレンズユニット |
| US9551914B2 (en) * | 2011-03-07 | 2017-01-24 | Microsoft Technology Licensing, Llc | Illuminator with refractive optical element |
| JP5971965B2 (ja) * | 2012-02-07 | 2016-08-17 | キヤノン株式会社 | 面形状計測方法、面形状計測装置、プログラム、および、光学素子の製造方法 |
| US9479686B2 (en) | 2014-02-19 | 2016-10-25 | Melvyn H Kreitzer | Zoom lens optical system |
| KR101913654B1 (ko) * | 2017-05-30 | 2018-12-28 | 학교법인 한동대학교 | 주밍기구가 포함된 빔 균질기 |
| CN109884801B (zh) * | 2018-12-31 | 2024-10-18 | 苏州大学 | 连续变焦激光整形系统 |
| CN110850599A (zh) * | 2019-08-19 | 2020-02-28 | 上海鲲游光电科技有限公司 | 红外泛光照明组件 |
| US12162093B2 (en) | 2020-08-25 | 2024-12-10 | Ii-Vi Delaware, Inc. | High leverage beam wobbling |
| US12275084B2 (en) | 2020-08-25 | 2025-04-15 | Ii-Vi Delaware, Inc. | Dynamic beam deflection and shaping for laser process |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3360686B2 (ja) * | 1990-12-27 | 2002-12-24 | 株式会社ニコン | 照明光学装置および投影露光装置並びに露光方法および素子製造方法 |
| JPH04369209A (ja) * | 1991-06-17 | 1992-12-22 | Nikon Corp | 露光用照明装置 |
| DE4124311A1 (de) | 1991-07-23 | 1993-01-28 | Zeiss Carl Fa | Anordnung zur kohaerenzreduktion und strahlformung eines laserstrahls |
| DE19520563A1 (de) * | 1995-06-06 | 1996-12-12 | Zeiss Carl Fa | Beleuchtungseinrichtung für ein Projektions-Mikrolithographie-Gerät |
| US6285443B1 (en) * | 1993-12-13 | 2001-09-04 | Carl-Zeiss-Stiftung | Illuminating arrangement for a projection microlithographic apparatus |
| DE4421053A1 (de) * | 1994-06-17 | 1995-12-21 | Zeiss Carl Fa | Beleuchtungseinrichtung |
| EP0687956B2 (de) | 1994-06-17 | 2005-11-23 | Carl Zeiss SMT AG | Beleuchtungseinrichtung |
| US5724122A (en) * | 1995-05-24 | 1998-03-03 | Svg Lithography Systems, Inc. | Illumination system having spatially separate vertical and horizontal image planes for use in photolithography |
| JPH10209028A (ja) * | 1997-01-16 | 1998-08-07 | Nikon Corp | 照明光学装置及び半導体素子の製造方法 |
| EP1014196A3 (de) * | 1998-12-17 | 2002-05-29 | Nikon Corporation | Beleuchtungsverfahren und -System für einen optischen Projektionsapparat |
| US6563567B1 (en) * | 1998-12-17 | 2003-05-13 | Nikon Corporation | Method and apparatus for illuminating a surface using a projection imaging apparatus |
| EP1256033B1 (de) * | 2000-02-16 | 2007-07-25 | ASML Holding N.V. | Zoom-beleuchtungssystem zur verwendung in der photolithographie |
-
2001
- 2001-09-05 DE DE10144244A patent/DE10144244A1/de not_active Withdrawn
-
2002
- 2002-08-30 WO PCT/EP2002/009665 patent/WO2003023521A1/en not_active Ceased
- 2002-08-30 JP JP2003527518A patent/JP2005503011A/ja active Pending
- 2002-08-30 AT AT02758488T patent/ATE374961T1/de not_active IP Right Cessation
- 2002-08-30 DE DE60222786T patent/DE60222786T2/de not_active Expired - Fee Related
- 2002-08-30 EP EP02758488A patent/EP1423758B1/de not_active Expired - Lifetime
- 2002-08-30 KR KR10-2004-7003262A patent/KR20040044540A/ko not_active Ceased
-
2004
- 2004-03-05 US US10/793,247 patent/US6900946B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE10144244A1 (de) | 2003-03-20 |
| DE60222786T2 (de) | 2008-07-17 |
| EP1423758A1 (de) | 2004-06-02 |
| KR20040044540A (ko) | 2004-05-28 |
| US20040257669A1 (en) | 2004-12-23 |
| EP1423758B1 (de) | 2007-10-03 |
| WO2003023521A1 (en) | 2003-03-20 |
| JP2005503011A (ja) | 2005-01-27 |
| DE60222786D1 (de) | 2007-11-15 |
| US6900946B2 (en) | 2005-05-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE374961T1 (de) | Zoomvorrichtung, insbesondere zoomvorrichtung für eine beleuchtungsvorrichtung einer mikrolithographie-projektionsvorrichtung | |
| JP5529698B2 (ja) | マイクロリソグラフィーシステム及び基板を露光する方法 | |
| EP1681710A4 (de) | Optische beleuchtungseinrichtung und projektions-ausrichtungsvorrichtung | |
| KR960042908A (ko) | 공간적으로 분리된 수직 및 수평 이미지 평면을 지니며 포토리도그래피 기법에서 사용하는 조명 장치 | |
| KR980005334A (ko) | 노광 방법 및 노광 장치 | |
| KR960042228A (ko) | 포토리도그래피 기법에서 사용하는 혼성(hybrid) 조명 장치 | |
| KR970048690A (ko) | 마이크로리소그래피-투사노즐 장치 및 이를 위한 rema-대물렌즈 | |
| ATE511668T1 (de) | Beleuchtungssystem für eine mikrolithographische projektionsbelichtungsvorrichtung | |
| WO2002099533A3 (en) | Alternating phase-shift mask inspection method and apparatus | |
| WO2005017620A3 (de) | Beleuchtungseinrichtung sowie polarisator für eine mikrolithographische projektionsbelichtungsanlage | |
| KR960024506A (ko) | 반사굴절 광학계 | |
| DE69021418D1 (de) | Polarisierender Strahlteiler und System für die Bildprojekion durch Lichtventile. | |
| JP2005236088A5 (de) | ||
| EP0940722A3 (de) | Beleuchtungssystem und REMA- (Retikel-Maskierungs-) Objektiv mit Linsenverschiebung und Betriebsverfahren dafür | |
| KR950024024A (ko) | 투영노광장치 및 이를 이용한 디바이스 제조방법 | |
| KR980005336A (ko) | 조명장치, 노광장치 및 디바이스제조방법 | |
| WO2011039261A3 (en) | Illumination system for microlithography | |
| US20090091735A1 (en) | Illumination optical system and exposure apparatus having the same | |
| KR970049095A (ko) | 리소그라피 장비의 오프 엑시스 정렬 시스템 | |
| TW200615577A (en) | Apochromatic unit-magnification projection optical system | |
| EP1319983A3 (de) | Fortgeschrittenes Beleuchtungssystem für die Mikrolithographie | |
| EP1298494A3 (de) | Projektionssystem mit hoher numerischer Apertur für die Mikrolithographie | |
| WO2005015310A3 (en) | Illumination system for a microlithographic projection exposure apparatus | |
| KR950015638A (ko) | 개량된 해상도 특성을 갖는 스텝 앤드 리피트 노출 시스템 | |
| TW200500819A (en) | Relay lens used in an illumination system of a lithography system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |