ATE376177T1 - Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen - Google Patents
Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungenInfo
- Publication number
- ATE376177T1 ATE376177T1 AT00947584T AT00947584T ATE376177T1 AT E376177 T1 ATE376177 T1 AT E376177T1 AT 00947584 T AT00947584 T AT 00947584T AT 00947584 T AT00947584 T AT 00947584T AT E376177 T1 ATE376177 T1 AT E376177T1
- Authority
- AT
- Austria
- Prior art keywords
- background
- light emission
- nitrogen
- microwave
- continuous monitoring
- Prior art date
Links
- 229910052751 metal Inorganic materials 0.000 title abstract 3
- 239000002184 metal Substances 0.000 title abstract 2
- 150000002739 metals Chemical class 0.000 title abstract 2
- 238000012544 monitoring process Methods 0.000 title 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 4
- 239000007789 gas Substances 0.000 abstract 3
- 229910052757 nitrogen Inorganic materials 0.000 abstract 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 abstract 1
- 229910052785 arsenic Inorganic materials 0.000 abstract 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 abstract 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 abstract 1
- 229910052753 mercury Inorganic materials 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 229910052760 oxygen Inorganic materials 0.000 abstract 1
- 239000001301 oxygen Substances 0.000 abstract 1
- 238000010791 quenching Methods 0.000 abstract 1
- 230000000171 quenching effect Effects 0.000 abstract 1
- 229910052711 selenium Inorganic materials 0.000 abstract 1
- 239000011669 selenium Substances 0.000 abstract 1
- 239000012808 vapor phase Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/10—Devices for withdrawing samples in the liquid or fluent state
- G01N1/14—Suction devices, e.g. pumps; Ejector devices
- G01N1/1409—Suction devices, e.g. pumps; Ejector devices adapted for sampling molten metals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N1/2205—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/714—Sample nebulisers for flame burners or plasma burners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/74—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/24—Suction devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/44—Sample treatment involving radiation, e.g. heat
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N2001/222—Other features
- G01N2001/2223—Other features aerosol sampling devices
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Geology (AREA)
- Hydrology & Water Resources (AREA)
- Biomedical Technology (AREA)
- Molecular Biology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Measuring Oxygen Concentration In Cells (AREA)
- Fire-Detection Mechanisms (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14534199P | 1999-07-23 | 1999-07-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE376177T1 true ATE376177T1 (de) | 2007-11-15 |
Family
ID=22512652
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT00947584T ATE376177T1 (de) | 1999-07-23 | 2000-07-21 | Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6577390B1 (de) |
| EP (1) | EP1196764B1 (de) |
| AT (1) | ATE376177T1 (de) |
| AU (1) | AU6116400A (de) |
| CA (1) | CA2380478A1 (de) |
| DE (1) | DE60036801T2 (de) |
| WO (1) | WO2001007897A1 (de) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6774993B2 (en) * | 2001-04-03 | 2004-08-10 | Agilent Technologies, Inc. | Method and apparatus for atomic emission spectroscopy |
| US7123361B1 (en) | 2003-03-05 | 2006-10-17 | Verionix Incorporated | Microplasma emission spectrometer |
| US7309842B1 (en) | 2004-03-19 | 2007-12-18 | Verionix Incorporated | Shielded monolithic microplasma source for prevention of continuous thin film formation |
| WO2008011477A2 (en) * | 2006-07-20 | 2008-01-24 | Albemarle Corporation | Process technology for recovering brominated styrenic polymers from reaction mixtures in which they are formed and/or converting such mixtures into pellets or into granules or pastilles |
| JP2010539443A (ja) * | 2007-08-07 | 2010-12-16 | ピヴォタル システムズ コーポレーション | ガスの化学組成を同定するための方法および装置 |
| CN103278553A (zh) * | 2013-04-27 | 2013-09-04 | 天津大学 | 一种测定燃煤产物中易挥发元素汞的方法 |
| FI20155549L (fi) * | 2015-07-10 | 2017-01-11 | Outotec Finland Oy | Menetelmä ja laite fludien optista säteilyspektroskooppiaa varten |
| FI129477B (fi) * | 2019-05-17 | 2022-03-15 | Andritz Oy | Soodakattilan reduktioasteen määritys |
| CN113340669B (zh) * | 2021-07-05 | 2023-01-24 | 国能神皖能源有限责任公司 | 用于libs煤质在线分析的全自动粉管采样装置及方法 |
| KR102686910B1 (ko) | 2021-08-09 | 2024-07-19 | 삼성전자주식회사 | 반도체 소자의 제조 장치 및 반도체 소자의 제조 방법 |
| US20250035566A1 (en) * | 2023-07-25 | 2025-01-30 | Aramco Services Company | Apparatus for gas identification using high frequency microwave cavities |
| CN119643772B (zh) * | 2024-12-05 | 2025-10-10 | 西北工业大学 | 一种微波等离子体辅助金属与水反应的实验平台 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3843257A (en) * | 1971-11-30 | 1974-10-22 | Monsanto Res Corp | Microwave-excited emission detector |
| CA1098809A (en) * | 1976-07-20 | 1981-04-07 | Dennis J. C. Macourt | Particle coating analysis and mineral prospecting |
| US4833322A (en) * | 1986-05-02 | 1989-05-23 | Shell Oil Company | Method and apparatus for analysis of material |
| JP2607675B2 (ja) * | 1989-03-31 | 1997-05-07 | 株式会社日立製作所 | 原子吸光分析装置 |
| US5242143A (en) | 1992-03-12 | 1993-09-07 | Tachi-S Co. Ltd. | Cover for slide rail of automotive seat |
| US5479254A (en) | 1993-10-22 | 1995-12-26 | Woskov; Paul P. | Continuous, real time microwave plasma element sensor |
| US5671045A (en) | 1993-10-22 | 1997-09-23 | Masachusetts Institute Of Technology | Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams |
| US5596405A (en) * | 1995-10-03 | 1997-01-21 | The United States Of America As Represented By The Secretary Of The Navy | Method of and apparatus for the continuous emissions monitoring of toxic airborne metals |
| US5825485A (en) | 1995-11-03 | 1998-10-20 | Cohn; Daniel R. | Compact trace element sensor which utilizes microwave generated plasma and which is portable by an individual |
| US5986757A (en) * | 1997-09-17 | 1999-11-16 | The United States Of America As Represented By The Secretary Of The Navy | Correction of spectral interferences arising from CN emission in continuous air monitoring using inductively coupled plasma atomic emission spectroscopy |
| US5854431A (en) | 1997-12-10 | 1998-12-29 | Sandia Corporation | Particle preconcentrator |
| US5909277A (en) | 1998-02-13 | 1999-06-01 | Massachusetts Institute Of Technology | Microwave plasma element sensor |
-
2000
- 2000-07-21 US US10/031,527 patent/US6577390B1/en not_active Expired - Fee Related
- 2000-07-21 AT AT00947584T patent/ATE376177T1/de not_active IP Right Cessation
- 2000-07-21 EP EP00947584A patent/EP1196764B1/de not_active Expired - Lifetime
- 2000-07-21 WO PCT/US2000/019930 patent/WO2001007897A1/en not_active Ceased
- 2000-07-21 AU AU61164/00A patent/AU6116400A/en not_active Abandoned
- 2000-07-21 DE DE60036801T patent/DE60036801T2/de not_active Expired - Fee Related
- 2000-07-21 CA CA002380478A patent/CA2380478A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP1196764A1 (de) | 2002-04-17 |
| US6577390B1 (en) | 2003-06-10 |
| DE60036801D1 (de) | 2007-11-29 |
| EP1196764B1 (de) | 2007-10-17 |
| CA2380478A1 (en) | 2001-02-01 |
| EP1196764A4 (de) | 2005-11-16 |
| DE60036801T2 (de) | 2008-07-24 |
| WO2001007897A1 (en) | 2001-02-01 |
| AU6116400A (en) | 2001-02-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |