ATE408845T1 - Integrierter cdma-schaltungsdemodulator mit eingebauter testmustererzeugung - Google Patents

Integrierter cdma-schaltungsdemodulator mit eingebauter testmustererzeugung

Info

Publication number
ATE408845T1
ATE408845T1 AT04815324T AT04815324T ATE408845T1 AT E408845 T1 ATE408845 T1 AT E408845T1 AT 04815324 T AT04815324 T AT 04815324T AT 04815324 T AT04815324 T AT 04815324T AT E408845 T1 ATE408845 T1 AT E408845T1
Authority
AT
Austria
Prior art keywords
test data
built
codes
test pattern
pattern generation
Prior art date
Application number
AT04815324T
Other languages
English (en)
Inventor
Tao Li
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE408845T1 publication Critical patent/ATE408845T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/69—Spread spectrum techniques
    • H04B1/707—Spread spectrum techniques using direct sequence modulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Amplifiers (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Tests Of Electronic Circuits (AREA)
AT04815324T 2003-12-30 2004-12-21 Integrierter cdma-schaltungsdemodulator mit eingebauter testmustererzeugung ATE408845T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/749,526 US7461313B2 (en) 2003-12-30 2003-12-30 Test pattern generation

Publications (1)

Publication Number Publication Date
ATE408845T1 true ATE408845T1 (de) 2008-10-15

Family

ID=34701063

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04815324T ATE408845T1 (de) 2003-12-30 2004-12-21 Integrierter cdma-schaltungsdemodulator mit eingebauter testmustererzeugung

Country Status (9)

Country Link
US (1) US7461313B2 (de)
EP (1) EP1718982B1 (de)
JP (1) JP4625022B2 (de)
AT (1) ATE408845T1 (de)
CA (1) CA2551565C (de)
DE (1) DE602004016689D1 (de)
RU (1) RU2323447C1 (de)
TW (1) TW200533100A (de)
WO (1) WO2005066647A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7461313B2 (en) * 2003-12-30 2008-12-02 Qualcomm Incorporated Test pattern generation
CN100391171C (zh) * 2005-08-17 2008-05-28 大唐移动通信设备有限公司 第三代移动通信系统中基带协议数据测试装置及系统
US8402317B1 (en) * 2005-12-22 2013-03-19 The Math Works, Inc. Viewing multi-dimensional metric data from multiple test cases
US8279204B1 (en) 2005-12-22 2012-10-02 The Mathworks, Inc. Viewer for multi-dimensional data from a test environment
GB201803150D0 (en) * 2018-02-27 2018-04-11 Secr Defence Method and apparatus for testing code division multiple access receivers
RU2725333C1 (ru) * 2019-09-23 2020-07-02 Акционерное общество Научно-производственный центр "Электронные вычислительно-информационные системы" (АО НПЦ "ЭЛВИС") Тестовый блок кольцевых генераторов на комплементарных метал-окисел-полупроводник транзисторах

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1725222A1 (ru) * 1990-02-16 1992-04-07 Кишиневский Научно-Исследовательский Институт "Квант" Устройство дл стохастического контрол микропроцессорных цифровых блоков
US5151919A (en) * 1990-12-17 1992-09-29 Ericsson-Ge Mobile Communications Holding Inc. Cdma subtractive demodulation
JP2677191B2 (ja) * 1994-03-15 1997-11-17 日本電気株式会社 Ｃｄｍａ通信方式
JP3647139B2 (ja) * 1996-05-24 2005-05-11 株式会社ソキア スペクトラム拡散受信機
JP3022788B2 (ja) * 1996-11-26 2000-03-21 アンリツ株式会社 試験信号発生装置及びこれを用いた試験方法
JPH10190523A (ja) * 1996-12-20 1998-07-21 Fujitsu General Ltd エネルギー拡散装置
US6061391A (en) * 1997-02-28 2000-05-09 Fujitsu Limited Error indicator, and data modulator-demodulator and indicating method of light emitter therein
US6269075B1 (en) * 1998-01-26 2001-07-31 Nokia Mobile Phones Limited Finger assignment in a CDMA rake receiver
US5974080A (en) * 1998-06-09 1999-10-26 Texas Instruments Incorporated Hierarchical-serial acquisition method for CDMA systems using pilot PN codes
US7376105B2 (en) * 1998-08-21 2008-05-20 Massachusetts Institute Of Technology Source coding for interference reduction
US6611512B1 (en) * 1998-10-14 2003-08-26 Agere Systems Inc. Apparatus and method for scheduling correlation operations of a DS-CDMA shared correlator
US6470000B1 (en) * 1998-10-14 2002-10-22 Agere Systems Guardian Corp. Shared correlator system and method for direct-sequence CDMA demodulation
JP2000165291A (ja) * 1998-11-27 2000-06-16 Anritsu Corp Ｃｄｍａ試験信号発生装置
US6308065B1 (en) * 1998-12-07 2001-10-23 Agilent Technologies, Inc. Apparatus for testing cellular base stations
US6802033B1 (en) * 1999-04-06 2004-10-05 International Business Machines Corporation Low-power critical error rate communications controller
JP2001154880A (ja) * 1999-11-29 2001-06-08 Ricoh Co Ltd 組込型ファームウェア評価システム
KR20010063686A (ko) * 1999-12-24 2001-07-09 서평원 시디엠에이 채널 엘리먼트의 로컬테스트 제어장치
JP2001223670A (ja) * 2000-02-09 2001-08-17 Nec Corp 拡散符号生成器及びそれを用いるｃｄｍａ通信装置並びにそれらに用いる拡散符号生成方法
JP2003152591A (ja) * 2000-11-10 2003-05-23 Sony Electronics Singapore Pte Ltd マルチユーザｃｄｍａ無線通信方式
TW532016B (en) * 2000-12-18 2003-05-11 Asulab Sa Correlation and demodulation circuit for a receiver for signals modulated by a specific code
EP1231608A1 (de) * 2001-02-07 2002-08-14 STMicroelectronics Limited Eingebaute Testschaltung und -verfahren in einer integrierten Schaltung
JP2002271428A (ja) * 2001-03-08 2002-09-20 Sony Corp 通信装置および通信方法、並びにプログラムおよび記録媒体
US7151944B2 (en) * 2001-09-27 2006-12-19 Nortel Networks Limited Method and apparatus for using synchronous CDMA in a mobile environment
US20030081538A1 (en) * 2001-10-18 2003-05-01 Walton Jay R. Multiple-access hybrid OFDM-CDMA system
FI20021554A7 (fi) * 2001-12-28 2003-06-29 Nokia Corp Menetelmä kanavan estimoimiseksi ja radiojärjestelmä
US7167507B2 (en) * 2002-07-01 2007-01-23 Lucent Technologies Inc. Equalizer and method for performing equalization in a wireless communications system
US7123590B2 (en) * 2003-03-18 2006-10-17 Qualcomm Incorporated Method and apparatus for testing a wireless link using configurable channels and rates
US7461313B2 (en) * 2003-12-30 2008-12-02 Qualcomm Incorporated Test pattern generation

Also Published As

Publication number Publication date
US20050144547A1 (en) 2005-06-30
JP4625022B2 (ja) 2011-02-02
US7461313B2 (en) 2008-12-02
EP1718982B1 (de) 2008-09-17
DE602004016689D1 (de) 2008-10-30
RU2323447C1 (ru) 2008-04-27
HK1097910A1 (en) 2007-07-06
CA2551565C (en) 2011-01-04
JP2007522700A (ja) 2007-08-09
EP1718982A1 (de) 2006-11-08
WO2005066647A1 (en) 2005-07-21
CA2551565A1 (en) 2005-07-21
TW200533100A (en) 2005-10-01

Similar Documents

Publication Publication Date Title
ATE484107T1 (de) Verfahren und vorrichtung zur ausgewählte demodulierung und decodierung von nachrichtenübertragungssignalen
ATE507524T1 (de) Durchführung von prüfungen an der betriebsmittelbenutzung von computerprogrammen
EP1812878A4 (de) Setzungs-erzeugungssystem, programm dafür, schaltungsverifikationssystem und setzungs-erzeugungsverfahren
TW200627183A (en) Method for configuring computing devices using reference groups
DE60306008D1 (de) Einrichtungen und Verfahren für die Hochgeschwindigkeitsprüfung von Schaltungen mit hoher Pinzahl und mehreren Gigabit
TW200620017A (en) Computer automated design method, computer automated design system, and method of manufacturing integrated circuit
EP2382804A4 (de) Erzeugung persönlicher identifikationsnummern (pin) zwischen zwei geräten in einem netzwerk
ATE477667T1 (de) Verfahren und vorrichtung zum erweitern der fuktionalität einer mobilplattform durch verwendung von plug-in-software
EP1758020A4 (de) Zufallszahlen-erzeugungseinrichtung, erzeugungsverfahren, generator-bewertungsverfahren und benutzungsverfahren für zufallszahlen
ATE408845T1 (de) Integrierter cdma-schaltungsdemodulator mit eingebauter testmustererzeugung
ATE318169T1 (de) Übungsgerät
EP1729448A3 (de) Verfahren und Vorrichtung zur Testmustererzeugung
NO20053897L (no) Sustem og fremgangsmate for automatisert plattformgenerering
GB2464037A (en) Cryptographic random number generator using finite field operations
TW200724949A (en) Test sequence optimization method and design tool
DE602004016483D1 (de) Elektronische Schaltungsanordnung, Vorrichtung mit solcher Anordnung und Herstellungsverfahren
DE60227945D1 (de) Verfahren und einrichtung zur simulation eines funkkanals
TW200629284A (en) Semiconductor memory device and method of testing the same
DE60100747D1 (de) Elektromechanische vorrichtung zum testen von ic-chips, die für die erste und die zweite aneinander gepresste substratgruppe benutzt werden
ATE365996T1 (de) Vorrichtung und verfahren in einer halbleiterschaltung
DE60127502D1 (de) Leistungsschaltung, Leistungsversorgungsverfahren und elektronische Vorrichtung
WO2008109481A3 (en) Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design
WO2008001243A3 (en) Device and method for generating a random number and random element for use in the same
TWI263121B (en) Grating patch arrangement and testing method thereof and lithographic apparatus
Mikata Orthogonality condition for a multi-span beam, and its application to transient vibration of a two-span beam

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties
REN Ceased due to non-payment of the annual fee