ATE409756T1 - Verfahren zum verhindern von rissbildung in silica-beschichtungen von optischer qualität - Google Patents

Verfahren zum verhindern von rissbildung in silica-beschichtungen von optischer qualität

Info

Publication number
ATE409756T1
ATE409756T1 AT03100161T AT03100161T ATE409756T1 AT E409756 T1 ATE409756 T1 AT E409756T1 AT 03100161 T AT03100161 T AT 03100161T AT 03100161 T AT03100161 T AT 03100161T AT E409756 T1 ATE409756 T1 AT E409756T1
Authority
AT
Austria
Prior art keywords
optical quality
preventing cracking
silica coatings
quality silica
wafer
Prior art date
Application number
AT03100161T
Other languages
English (en)
Inventor
Luc Quellet
Jonathan Lachance
Sylvie Archambault
Original Assignee
Dalsa Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dalsa Semiconductor Inc filed Critical Dalsa Semiconductor Inc
Application granted granted Critical
Publication of ATE409756T1 publication Critical patent/ATE409756T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/13—Integrated optical circuits characterised by the manufacturing method
    • G02B6/132—Integrated optical circuits characterised by the manufacturing method by deposition of thin films
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C23C16/401—Oxides containing silicon
    • C23C16/402—Silicon dioxide
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/56—After-treatment
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B2006/12166—Manufacturing methods
    • G02B2006/12169—Annealing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optical Integrated Circuits (AREA)
  • Formation Of Insulating Films (AREA)
  • Glass Compositions (AREA)
  • Silicon Compounds (AREA)
AT03100161T 2002-01-31 2003-01-28 Verfahren zum verhindern von rissbildung in silica-beschichtungen von optischer qualität ATE409756T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/059,117 US6749893B2 (en) 2002-01-31 2002-01-31 Method of preventing cracking in optical quality silica layers

Publications (1)

Publication Number Publication Date
ATE409756T1 true ATE409756T1 (de) 2008-10-15

Family

ID=27609751

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03100161T ATE409756T1 (de) 2002-01-31 2003-01-28 Verfahren zum verhindern von rissbildung in silica-beschichtungen von optischer qualität

Country Status (4)

Country Link
US (1) US6749893B2 (de)
EP (1) EP1352991B1 (de)
AT (1) ATE409756T1 (de)
DE (1) DE60323779D1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7169685B2 (en) * 2002-02-25 2007-01-30 Micron Technology, Inc. Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive
US7668416B2 (en) * 2006-06-05 2010-02-23 Bing Li Single mode photonic circuit architecture and a new optical splitter design based on parallel waveguide mode conversion
US8538223B2 (en) * 2007-11-30 2013-09-17 3M Innovative Properties Company Method for making optical waveguides
CN102566090B (zh) 2010-12-22 2014-12-10 李冰 一种光波导开关
US9178085B2 (en) 2010-12-22 2015-11-03 Bing Li Waveguide photodetector and forming method thereof
CN102565932B (zh) 2011-01-14 2014-10-08 李冰 色散校正的阵列波导光栅
US9111730B2 (en) * 2013-06-28 2015-08-18 Payam Rabiei Method for production of optical waveguides and coupling and devices made from the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3001406B2 (ja) 1995-11-09 2000-01-24 日本電気株式会社 光導波路の製造方法
US6028977A (en) * 1995-11-13 2000-02-22 Moriah Technologies, Inc. All-optical, flat-panel display system
GB2314346A (en) * 1996-06-22 1997-12-24 Northern Telecom Ltd Rapid thermal annealing
US5857048A (en) * 1996-09-11 1999-01-05 Lucent Technologies, Inc. Fourier-plane photonics package
US5761350A (en) * 1997-01-22 1998-06-02 Koh; Seungug Method and apparatus for providing a seamless electrical/optical multi-layer micro-opto-electro-mechanical system assembly
US20030070451A1 (en) 2001-10-11 2003-04-17 Luc Ouellet Method of reducing stress-induced mechanical problems in optical components
US6558047B1 (en) * 2001-11-14 2003-05-06 Northrop Grumman Corporation Cold welding process for fiber optic/ferrule attachment

Also Published As

Publication number Publication date
DE60323779D1 (de) 2008-11-13
US20030143334A1 (en) 2003-07-31
EP1352991A1 (de) 2003-10-15
EP1352991B1 (de) 2008-10-01
US6749893B2 (en) 2004-06-15

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