ATE423341T1 - System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses - Google Patents

System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses

Info

Publication number
ATE423341T1
ATE423341T1 AT04745016T AT04745016T ATE423341T1 AT E423341 T1 ATE423341 T1 AT E423341T1 AT 04745016 T AT04745016 T AT 04745016T AT 04745016 T AT04745016 T AT 04745016T AT E423341 T1 ATE423341 T1 AT E423341T1
Authority
AT
Austria
Prior art keywords
items
inspected
measured
materials
output
Prior art date
Application number
AT04745016T
Other languages
English (en)
Inventor
Dan Albeck
Yishai Galatzer
Original Assignee
Cognitens Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34103016&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE423341(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Cognitens Ltd filed Critical Cognitens Ltd
Application granted granted Critical
Publication of ATE423341T1 publication Critical patent/ATE423341T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/35—Nc in input of data, input till input file format
    • G05B2219/35489—Discriminate, different colour, highlight between two states
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/35—Nc in input of data, input till input file format
    • G05B2219/35497—Use colour tone, hue to indicate amount of processed quantity
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Manufacturing & Machinery (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • General Factory Administration (AREA)
  • Image Processing (AREA)
AT04745016T 2003-07-24 2004-07-25 System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses ATE423341T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US49132903P 2003-07-24 2003-07-24

Publications (1)

Publication Number Publication Date
ATE423341T1 true ATE423341T1 (de) 2009-03-15

Family

ID=34103016

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04745016T ATE423341T1 (de) 2003-07-24 2004-07-25 System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses

Country Status (7)

Country Link
US (2) US7672500B2 (de)
EP (1) EP1649333B2 (de)
JP (1) JP2006528808A (de)
AT (1) ATE423341T1 (de)
CA (1) CA2525594C (de)
DE (1) DE602004019537D1 (de)
WO (1) WO2005010627A2 (de)

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US7634152B2 (en) * 2005-03-07 2009-12-15 Hewlett-Packard Development Company, L.P. System and method for correcting image vignetting
CN1956650A (zh) * 2005-10-28 2007-05-02 鸿富锦精密工业（深圳）有限公司 贴片机供料器校正系统及方法
US7565216B2 (en) 2006-09-11 2009-07-21 Innovmetric Logiciels Inc. Clearance measurement of manufactured parts
US9378274B2 (en) * 2013-06-10 2016-06-28 Cisco Technology, Inc. Object filtering in a computing network
US10197394B2 (en) 2013-11-06 2019-02-05 Hexagon Metrology (Israel) Ltd. Method and system for analyzing spatial measuring data
EP2913148B8 (de) * 2014-02-28 2020-03-25 Hexagon Metrology (Israel) Ltd. Verfahren und System zur Analyse von Verfahrensüberwachungsdaten
FR3018618B1 (fr) * 2014-03-11 2017-09-22 Univ Nantes Procede et systeme de controle d'un poncage orbital
US10836110B2 (en) * 2014-10-31 2020-11-17 Desprez, Llc Method and system for ordering expedited production or supply of designed products
US10073439B1 (en) * 2014-10-31 2018-09-11 Desprez, Llc Methods, systems, and software for processing expedited production or supply of designed products
EP3045992B1 (de) 2015-01-14 2020-10-14 Hexagon Technology Center GmbH Kompensation von Fehlern in einem Herstellungsprozess
US9817402B1 (en) * 2016-07-12 2017-11-14 The Boeing Company Application of factory automation for an airline assembly and build process
EP3339801B1 (de) 2016-12-20 2021-11-24 Hexagon Technology Center GmbH Selbstüberwachendes herstellungssystem, produktionsüberwachungseinheit und verwendung der produktionsüberwachungseinheit
EP3364374A1 (de) 2017-02-20 2018-08-22 My Virtual Reality Software AS Verfahren zur visualisierung von dreidimensionalen daten
IL257256A (en) 2018-01-30 2018-03-29 HYATT Yonatan System and method for establishing production line tests
IL259143B2 (en) 2018-05-03 2024-07-01 Inspekto A M V Ltd System and method for visual production line inspection of various production items
IL259285B2 (en) 2018-05-10 2023-07-01 Inspekto A M V Ltd A system and method for detecting defects on objects in an image
DE102018208782A1 (de) * 2018-06-05 2019-12-05 Volkswagen Aktiengesellschaft Verfahren zur Qualitätssicherung bei der Produktion eines Produktes sowie Recheneinrichtung und Computerprogramm
IL261733B (en) 2018-09-13 2022-09-01 Inspekto A M V Ltd Streamlining an automatic visual inspection process
IL263097B2 (en) 2018-11-18 2024-01-01 Inspekto A M V Ltd Optimizing a set-up stage in an automatic visual inspection process
IL263399B (en) 2018-11-29 2022-09-01 Inspekto A M V Ltd Centralized analyzes of multiple devices for visual inspection of a production line
US11682113B2 (en) 2018-11-29 2023-06-20 Inspekto A.M.V. Ltd. Multi-camera visual inspection appliance and method of use
IL267563A (en) * 2019-06-20 2019-11-28 HYATT Yonatan Establishing a process for visual inspection
IL268612A (en) 2019-08-08 2021-03-01 HYATT Yonatan Using an HDR image in a visual inspection process
JP7181849B2 (ja) * 2019-10-31 2022-12-01 横河電機株式会社 装置、方法およびプログラム
JP2023521529A (ja) 2020-02-06 2023-05-25 インスペクト，エー．エム．ブイ リミテッド 反射する物体を撮像するためのシステムおよび方法
US11816827B2 (en) 2020-02-13 2023-11-14 Inspekto A.M.V. Ltd. User interface device for autonomous machine vision inspection
CN111832433B (zh) * 2020-06-24 2023-12-29 奇点微(上海)光电科技有限公司 一种由图像提取物体特性的装置及其工作方法
CN111861149B (zh) * 2020-06-29 2023-04-07 北京航空航天大学 一种基于三维模型的检测过程驱动方法和系统
EP4137780B1 (de) 2021-08-16 2025-06-04 Hexagon Technology Center GmbH Autonomes messrobotersystem

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Also Published As

Publication number Publication date
WO2005010627A3 (en) 2005-03-31
US20100215246A1 (en) 2010-08-26
CA2525594A1 (en) 2005-02-03
US7672500B2 (en) 2010-03-02
WO2005010627A2 (en) 2005-02-03
JP2006528808A (ja) 2006-12-21
EP1649333A2 (de) 2006-04-26
EP1649333B2 (de) 2016-06-15
EP1649333B1 (de) 2009-02-18
DE602004019537D1 (de) 2009-04-02
US20070031024A1 (en) 2007-02-08
CA2525594C (en) 2011-01-04

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