|
US7367345B1
(en)
*
|
2002-09-30 |
2008-05-06 |
Lam Research Corporation |
Apparatus and method for providing a confined liquid for immersion lithography
|
|
SG121819A1
(en)
|
2002-11-12 |
2006-05-26 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US7372541B2
(en)
|
2002-11-12 |
2008-05-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US10503084B2
(en)
|
2002-11-12 |
2019-12-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US9482966B2
(en)
|
2002-11-12 |
2016-11-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR100585476B1
(ko)
|
2002-11-12 |
2006-06-07 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치 및 디바이스 제조방법
|
|
CN101382738B
(zh)
|
2002-11-12 |
2011-01-12 |
Asml荷兰有限公司 |
光刻投射装置
|
|
DE60335595D1
(de)
|
2002-11-12 |
2011-02-17 |
Asml Netherlands Bv |
Lithographischer Apparat mit Immersion und Verfahren zur Herstellung einer Vorrichtung
|
|
SG121822A1
(en)
|
2002-11-12 |
2006-05-26 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US7110081B2
(en)
|
2002-11-12 |
2006-09-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
SG131766A1
(en)
|
2002-11-18 |
2007-05-28 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
TWI255971B
(en)
|
2002-11-29 |
2006-06-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
JP4352874B2
(ja)
|
2002-12-10 |
2009-10-28 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
EP1571695A4
(de)
|
2002-12-10 |
2008-10-15 |
Nikon Corp |
Belichtungsvorrichtung und verfahren zur herstellung der vorrichtung
|
|
US7242455B2
(en)
|
2002-12-10 |
2007-07-10 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
AU2003289271A1
(en)
|
2002-12-10 |
2004-06-30 |
Nikon Corporation |
Exposure apparatus, exposure method and method for manufacturing device
|
|
CN101872135B
(zh)
*
|
2002-12-10 |
2013-07-31 |
株式会社尼康 |
曝光设备和器件制造法
|
|
US7948604B2
(en)
|
2002-12-10 |
2011-05-24 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
SG171468A1
(en)
|
2002-12-10 |
2011-06-29 |
Nikon Corp |
Exposure apparatus and method for producing device
|
|
USRE48515E1
(en)
|
2002-12-19 |
2021-04-13 |
Asml Netherlands B.V. |
Method and device for irradiating spots on a layer
|
|
DE10261775A1
(de)
|
2002-12-20 |
2004-07-01 |
Carl Zeiss Smt Ag |
Vorrichtung zur optischen Vermessung eines Abbildungssystems
|
|
EP2466621B1
(de)
|
2003-02-26 |
2015-04-01 |
Nikon Corporation |
Belichtungsvorrichtung, Belichtungsverfahren und Verfahren zur Herstellung des Geräts
|
|
JP4604452B2
(ja)
*
|
2003-02-26 |
2011-01-05 |
株式会社ニコン |
露光装置、露光方法、及びデバイス製造方法
|
|
KR101181688B1
(ko)
|
2003-03-25 |
2012-09-19 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
JP4902201B2
(ja)
|
2003-04-07 |
2012-03-21 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
WO2004093159A2
(en)
*
|
2003-04-09 |
2004-10-28 |
Nikon Corporation |
Immersion lithography fluid control system
|
|
KR101177330B1
(ko)
|
2003-04-10 |
2012-08-30 |
가부시키가이샤 니콘 |
액침 리소그래피 장치
|
|
EP2921905B1
(de)
|
2003-04-10 |
2017-12-27 |
Nikon Corporation |
Ablaufweg zum sammeln von flüssigkeiten für eine immersionslithografievorrichtung
|
|
WO2004090634A2
(en)
|
2003-04-10 |
2004-10-21 |
Nikon Corporation |
Environmental system including vaccum scavange for an immersion lithography apparatus
|
|
WO2004092830A2
(en)
|
2003-04-11 |
2004-10-28 |
Nikon Corporation |
Liquid jet and recovery system for immersion lithography
|
|
KR20170016014A
(ko)
|
2003-04-11 |
2017-02-10 |
가부시키가이샤 니콘 |
액침 리소그래피에 의한 광학기기의 세정방법
|
|
KR101159564B1
(ko)
|
2003-04-11 |
2012-06-25 |
가부시키가이샤 니콘 |
액침 리소그래피 머신에서 웨이퍼 교환동안 투영 렌즈 아래의 갭에서 액침액체를 유지하는 장치 및 방법
|
|
ATE542167T1
(de)
|
2003-04-17 |
2012-02-15 |
Nikon Corp |
Lithographisches immersionsgerät
|
|
TWI295414B
(en)
|
2003-05-13 |
2008-04-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
CN100437358C
(zh)
|
2003-05-15 |
2008-11-26 |
株式会社尼康 |
曝光装置及器件制造方法
|
|
TWI424470B
(zh)
|
2003-05-23 |
2014-01-21 |
尼康股份有限公司 |
A method of manufacturing an exposure apparatus and an element
|
|
TWI421911B
(zh)
|
2003-05-23 |
2014-01-01 |
尼康股份有限公司 |
An exposure method, an exposure apparatus, and an element manufacturing method
|
|
CN100541717C
(zh)
|
2003-05-28 |
2009-09-16 |
株式会社尼康 |
曝光方法、曝光装置以及器件制造方法
|
|
TWI347741B
(en)
|
2003-05-30 |
2011-08-21 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US7213963B2
(en)
|
2003-06-09 |
2007-05-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP2261742A3
(de)
|
2003-06-11 |
2011-05-25 |
ASML Netherlands BV |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
US7317504B2
(en)
|
2004-04-08 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101520591B1
(ko)
|
2003-06-13 |
2015-05-14 |
가부시키가이샤 니콘 |
노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법
|
|
TWI515770B
(zh)
|
2003-06-19 |
2016-01-01 |
尼康股份有限公司 |
An exposure apparatus, an exposure method, and an element manufacturing method
|
|
US6867844B2
(en)
|
2003-06-19 |
2005-03-15 |
Asml Holding N.V. |
Immersion photolithography system and method using microchannel nozzles
|
|
EP1491956B1
(de)
|
2003-06-27 |
2006-09-06 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
|
|
EP1498778A1
(de)
|
2003-06-27 |
2005-01-19 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
US6809794B1
(en)
|
2003-06-27 |
2004-10-26 |
Asml Holding N.V. |
Immersion photolithography system and method using inverted wafer-projection optics interface
|
|
EP1975721A1
(de)
|
2003-06-30 |
2008-10-01 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
|
|
EP1494074A1
(de)
|
2003-06-30 |
2005-01-05 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
WO2005006026A2
(en)
|
2003-07-01 |
2005-01-20 |
Nikon Corporation |
Using isotopically specified fluids as optical elements
|
|
EP2466382B1
(de)
|
2003-07-08 |
2014-11-26 |
Nikon Corporation |
Wafertisch für die Immersionslithografie
|
|
ATE513309T1
(de)
|
2003-07-09 |
2011-07-15 |
Nikon Corp |
Belichtungsvorrichtung und verfahren zur bauelementeherstellung
|
|
WO2005006418A1
(ja)
|
2003-07-09 |
2005-01-20 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
WO2005006416A1
(ja)
|
2003-07-09 |
2005-01-20 |
Nikon Corporation |
結合装置、露光装置、及びデバイス製造方法
|
|
SG109000A1
(en)
|
2003-07-16 |
2005-02-28 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
EP1500982A1
(de)
|
2003-07-24 |
2005-01-26 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
|
|
EP1650787A4
(de)
|
2003-07-25 |
2007-09-19 |
Nikon Corp |
Untersuchungsverfahren und untersuchungseinrichtung für ein optisches projektionssystem und herstellungsverfahren für ein optisches projektionssystem
|
|
US7175968B2
(en)
|
2003-07-28 |
2007-02-13 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and a substrate
|
|
US7326522B2
(en)
|
2004-02-11 |
2008-02-05 |
Asml Netherlands B.V. |
Device manufacturing method and a substrate
|
|
EP1503244A1
(de)
|
2003-07-28 |
2005-02-02 |
ASML Netherlands B.V. |
Lithographischer Projektionsapparat und Verfahren zur Herstellung einer Vorrichtung
|
|
CN102043350B
(zh)
|
2003-07-28 |
2014-01-29 |
株式会社尼康 |
曝光装置、器件制造方法、及曝光装置的控制方法
|
|
US7779781B2
(en)
|
2003-07-31 |
2010-08-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101381563B1
(ko)
|
2003-08-21 |
2014-04-04 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
US8149381B2
(en)
|
2003-08-26 |
2012-04-03 |
Nikon Corporation |
Optical element and exposure apparatus
|
|
EP2278402B1
(de)
|
2003-08-26 |
2013-03-06 |
Nikon Corporation |
Belichtungsvorrichtung
|
|
CN100407371C
(zh)
|
2003-08-29 |
2008-07-30 |
株式会社尼康 |
曝光装置和器件加工方法
|
|
US6954256B2
(en)
|
2003-08-29 |
2005-10-11 |
Asml Netherlands B.V. |
Gradient immersion lithography
|
|
EP2261740B1
(de)
|
2003-08-29 |
2014-07-09 |
ASML Netherlands BV |
Lithographischer Apparat
|
|
TWI263859B
(en)
|
2003-08-29 |
2006-10-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
TWI245163B
(en)
|
2003-08-29 |
2005-12-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
KR101523180B1
(ko)
*
|
2003-09-03 |
2015-05-26 |
가부시키가이샤 니콘 |
액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
|
|
WO2005029559A1
(ja)
|
2003-09-19 |
2005-03-31 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
EP1519230A1
(de)
|
2003-09-29 |
2005-03-30 |
ASML Netherlands B.V. |
Lithographischer Apparat und Methode zur Herstellung einer Vorrichtung
|
|
KR101664642B1
(ko)
|
2003-09-29 |
2016-10-11 |
가부시키가이샤 니콘 |
노광장치, 노광방법 및 디바이스 제조방법
|
|
US7158211B2
(en)
|
2003-09-29 |
2007-01-02 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE60302897T2
(de)
|
2003-09-29 |
2006-08-03 |
Asml Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
EP1672682A4
(de)
|
2003-10-08 |
2008-10-15 |
Zao Nikon Co Ltd |
Substrat-transport-vorrichtung und -verfahren, belichtungs-vorrichtung und -verfahren und bauelementherstellungsverfahren
|
|
JP2005136364A
(ja)
|
2003-10-08 |
2005-05-26 |
Zao Nikon Co Ltd |
基板搬送装置、露光装置、並びにデバイス製造方法
|
|
WO2005036621A1
(ja)
|
2003-10-08 |
2005-04-21 |
Zao Nikon Co., Ltd. |
基板搬送装置及び基板搬送方法、露光装置及び露光方法、デバイス製造方法
|
|
TWI598934B
(zh)
|
2003-10-09 |
2017-09-11 |
尼康股份有限公司 |
Exposure apparatus, exposure method, and device manufacturing method
|
|
EP1524558A1
(de)
|
2003-10-15 |
2005-04-20 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
EP1524557A1
(de)
|
2003-10-15 |
2005-04-20 |
ASML Netherlands B.V. |
Lithographischer Apparat und Methode zur Herstellung einer Vorrichtung
|
|
DE602004030365D1
(de)
|
2003-10-22 |
2011-01-13 |
Nippon Kogaku Kk |
Belichtungsvorrichtung, belichtungsverfahren und verfahren zur bauelementeherstellung
|
|
EP2267536B1
(de)
*
|
2003-10-28 |
2017-04-19 |
ASML Netherlands B.V. |
Lithographischer Apparat
|
|
US7352433B2
(en)
|
2003-10-28 |
2008-04-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1528432B1
(de)
|
2003-10-28 |
2010-03-10 |
ASML Netherlands B.V. |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
|
EP1679738A4
(de)
|
2003-10-28 |
2008-08-06 |
Nikon Corp |
Belichtungsvorrichtung, belichtungsverfahren und bauelementeherstellungsverfahren
|
|
US7411653B2
(en)
|
2003-10-28 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7528929B2
(en)
|
2003-11-14 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7545481B2
(en)
|
2003-11-24 |
2009-06-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP2717295B1
(de)
|
2003-12-03 |
2018-07-18 |
Nikon Corporation |
Belichtungsvorrichtung, Belichtungsverfahren, und Verfahren zur Herstellung einer Vorrichtung
|
|
DE602004030481D1
(de)
|
2003-12-15 |
2011-01-20 |
Nippon Kogaku Kk |
Bühnensystem, belichtungsvorrichtung und belichtungsverfahren
|
|
US7460206B2
(en)
|
2003-12-19 |
2008-12-02 |
Carl Zeiss Smt Ag |
Projection objective for immersion lithography
|
|
US7589818B2
(en)
|
2003-12-23 |
2009-09-15 |
Asml Netherlands B.V. |
Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus
|
|
US7394521B2
(en)
|
2003-12-23 |
2008-07-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP3376523A1
(de)
|
2004-01-05 |
2018-09-19 |
Nikon Corporation |
Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung einer vorrichtung
|
|
CN1938646B
(zh)
|
2004-01-20 |
2010-12-15 |
卡尔蔡司Smt股份公司 |
曝光装置和用于投影透镜的测量装置
|
|
US7589822B2
(en)
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
EP1713114B1
(de)
|
2004-02-03 |
2018-09-19 |
Nikon Corporation |
Belichtungsvorrichtung und verfahren zur herstellung einer vorrichtung
|
|
EP1713115B1
(de)
|
2004-02-04 |
2016-05-04 |
Nikon Corporation |
Belichtungsvorrichtung, belichtungsverfahren und bauelementeherstellungsverfahren
|
|
US7050146B2
(en)
|
2004-02-09 |
2006-05-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE102004013886A1
(de)
|
2004-03-16 |
2005-10-06 |
Carl Zeiss Smt Ag |
Verfahren zur Mehrfachbelichtung, Mikrolithografie-Projektionsbelichtungsanlage und Projektionssystem
|
|
KR101851511B1
(ko)
|
2004-03-25 |
2018-04-23 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US7227619B2
(en)
|
2004-04-01 |
2007-06-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7034917B2
(en)
|
2004-04-01 |
2006-04-25 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
|
US7295283B2
(en)
|
2004-04-02 |
2007-11-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7898642B2
(en)
|
2004-04-14 |
2011-03-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1753016B1
(de)
|
2004-04-19 |
2012-06-20 |
Nikon Corporation |
Belichtungsvorrichtung und bauelemente-herstellungsverfahren
|
|
US7379159B2
(en)
|
2004-05-03 |
2008-05-27 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1747499A2
(de)
|
2004-05-04 |
2007-01-31 |
Nikon Corporation |
Vorrichtung und verfahren zur bereitstellung eines fluids für die immersionslithographie
|
|
US7616383B2
(en)
*
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7486381B2
(en)
|
2004-05-21 |
2009-02-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1774405B1
(de)
|
2004-06-04 |
2014-08-06 |
Carl Zeiss SMT GmbH |
System zur messung der bildqualität eines optischen bildgebungssystems
|
|
WO2005122218A1
(ja)
|
2004-06-09 |
2005-12-22 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
KR20070026603A
(ko)
|
2004-06-10 |
2007-03-08 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법, 및 디바이스 제조 방법
|
|
KR20180072867A
(ko)
|
2004-06-10 |
2018-06-29 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
US8373843B2
(en)
|
2004-06-10 |
2013-02-12 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
US8717533B2
(en)
|
2004-06-10 |
2014-05-06 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
US8508713B2
(en)
|
2004-06-10 |
2013-08-13 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
US7481867B2
(en)
|
2004-06-16 |
2009-01-27 |
Edwards Limited |
Vacuum system for immersion photolithography
|
|
EP3098835B1
(de)
*
|
2004-06-21 |
2017-07-26 |
Nikon Corporation |
Belichtungsvorrichtung, belichtungsverfahren und vorrichtungsherstellungsverfahren
|
|
WO2006007111A2
(en)
|
2004-07-01 |
2006-01-19 |
Nikon Corporation |
A dynamic fluid control system for immersion lithography
|
|
JP4809638B2
(ja)
*
|
2004-07-01 |
2011-11-09 |
アイメック |
液浸リソグラフィの方法および装置
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101433491B1
(ko)
|
2004-07-12 |
2014-08-22 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US7161663B2
(en)
|
2004-07-22 |
2007-01-09 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7304715B2
(en)
|
2004-08-13 |
2007-12-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR20070048164A
(ko)
|
2004-08-18 |
2007-05-08 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US7701550B2
(en)
*
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101700547B1
(ko)
*
|
2004-09-17 |
2017-01-26 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
US7133114B2
(en)
|
2004-09-20 |
2006-11-07 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7522261B2
(en)
|
2004-09-24 |
2009-04-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7355674B2
(en)
|
2004-09-28 |
2008-04-08 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and computer program product
|
|
US7894040B2
(en)
|
2004-10-05 |
2011-02-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7209213B2
(en)
|
2004-10-07 |
2007-04-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2006190971A
(ja)
*
|
2004-10-13 |
2006-07-20 |
Nikon Corp |
露光装置、露光方法及びデバイス製造方法
|
|
US7852456B2
(en)
|
2004-10-13 |
2010-12-14 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
EP2426700B1
(de)
|
2004-10-15 |
2018-01-10 |
Nikon Corporation |
Belichtungsvorrichtung und bauelementeherstellungsverfahren
|
|
US7119876B2
(en)
|
2004-10-18 |
2006-10-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7379155B2
(en)
|
2004-10-18 |
2008-05-27 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TWI436403B
(zh)
|
2004-10-26 |
2014-05-01 |
尼康股份有限公司 |
A cleaning method, a substrate processing method, an exposure apparatus, and an element manufacturing method
|
|
US7251013B2
(en)
|
2004-11-12 |
2007-07-31 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7583357B2
(en)
|
2004-11-12 |
2009-09-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7414699B2
(en)
*
|
2004-11-12 |
2008-08-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7423720B2
(en)
|
2004-11-12 |
2008-09-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7411657B2
(en)
|
2004-11-17 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7145630B2
(en)
|
2004-11-23 |
2006-12-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7161654B2
(en)
|
2004-12-02 |
2007-01-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7446850B2
(en)
|
2004-12-03 |
2008-11-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7196770B2
(en)
|
2004-12-07 |
2007-03-27 |
Asml Netherlands B.V. |
Prewetting of substrate before immersion exposure
|
|
US7397533B2
(en)
|
2004-12-07 |
2008-07-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7248334B2
(en)
|
2004-12-07 |
2007-07-24 |
Asml Netherlands B.V. |
Sensor shield
|
|
US7365827B2
(en)
|
2004-12-08 |
2008-04-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4752473B2
(ja)
|
2004-12-09 |
2011-08-17 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
US7352440B2
(en)
|
2004-12-10 |
2008-04-01 |
Asml Netherlands B.V. |
Substrate placement in immersion lithography
|
|
US7403261B2
(en)
|
2004-12-15 |
2008-07-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7528931B2
(en)
|
2004-12-20 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7880860B2
(en)
*
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7405805B2
(en)
|
2004-12-28 |
2008-07-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7491661B2
(en)
|
2004-12-28 |
2009-02-17 |
Asml Netherlands B.V. |
Device manufacturing method, top coat material and substrate
|
|
US20060147821A1
(en)
|
2004-12-30 |
2006-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1681597B1
(de)
*
|
2005-01-14 |
2010-03-10 |
ASML Netherlands B.V. |
Lithografische Vorrichtung und Herstellungsverfahren
|
|
SG124351A1
(en)
|
2005-01-14 |
2006-08-30 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US8692973B2
(en)
|
2005-01-31 |
2014-04-08 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
WO2006080516A1
(ja)
*
|
2005-01-31 |
2006-08-03 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
JP5005226B2
(ja)
*
|
2005-01-31 |
2012-08-22 |
株式会社ニコン |
露光装置及びデバイス製造方法、液体保持方法
|
|
JP2011258999A
(ja)
*
|
2005-01-31 |
2011-12-22 |
Nikon Corp |
露光装置及びデバイス製造方法
|
|
CN102360170B
(zh)
|
2005-02-10 |
2014-03-12 |
Asml荷兰有限公司 |
浸没液体、曝光装置及曝光方法
|
|
US7378025B2
(en)
|
2005-02-22 |
2008-05-27 |
Asml Netherlands B.V. |
Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method
|
|
US8018573B2
(en)
|
2005-02-22 |
2011-09-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7224431B2
(en)
|
2005-02-22 |
2007-05-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7282701B2
(en)
|
2005-02-28 |
2007-10-16 |
Asml Netherlands B.V. |
Sensor for use in a lithographic apparatus
|
|
US7428038B2
(en)
|
2005-02-28 |
2008-09-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and apparatus for de-gassing a liquid
|
|
US7324185B2
(en)
|
2005-03-04 |
2008-01-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7684010B2
(en)
|
2005-03-09 |
2010-03-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing
|
|
WO2006101024A1
(ja)
|
2005-03-18 |
2006-09-28 |
Nikon Corporation |
露光方法及び露光装置、デバイス製造方法、並びに露光装置の評価方法
|
|
TWI424260B
(zh)
|
2005-03-18 |
2014-01-21 |
尼康股份有限公司 |
A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method
|
|
US7330238B2
(en)
|
2005-03-28 |
2008-02-12 |
Asml Netherlands, B.V. |
Lithographic apparatus, immersion projection apparatus and device manufacturing method
|
|
US9239524B2
(en)
|
2005-03-30 |
2016-01-19 |
Nikon Corporation |
Exposure condition determination method, exposure method, exposure apparatus, and device manufacturing method involving detection of the situation of a liquid immersion region
|
|
JP2007019463A
(ja)
*
|
2005-03-31 |
2007-01-25 |
Nikon Corp |
露光装置、露光方法、及びデバイス製造方法
|
|
CN100530540C
(zh)
*
|
2005-03-31 |
2009-08-19 |
株式会社尼康 |
曝光装置、曝光方法以及器件制造方法
|
|
KR20070115857A
(ko)
*
|
2005-03-31 |
2007-12-06 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
US7411654B2
(en)
|
2005-04-05 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7291850B2
(en)
|
2005-04-08 |
2007-11-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
USRE43576E1
(en)
|
2005-04-08 |
2012-08-14 |
Asml Netherlands B.V. |
Dual stage lithographic apparatus and device manufacturing method
|
|
EP1873816A4
(de)
|
2005-04-18 |
2010-11-24 |
Nikon Corp |
Belichtungseinrichtung, belichtungsverfahren und bauelemente-herstellungsverfahren
|
|
US20060232753A1
(en)
|
2005-04-19 |
2006-10-19 |
Asml Holding N.V. |
Liquid immersion lithography system with tilted liquid flow
|
|
US8236467B2
(en)
|
2005-04-28 |
2012-08-07 |
Nikon Corporation |
Exposure method, exposure apparatus, and device manufacturing method
|
|
US7317507B2
(en)
|
2005-05-03 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8248577B2
(en)
|
2005-05-03 |
2012-08-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7433016B2
(en)
|
2005-05-03 |
2008-10-07 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE102005024163A1
(de)
*
|
2005-05-23 |
2006-11-30 |
Carl Zeiss Smt Ag |
Optisches System einer mikrolithographischen Projektionsbelichtungsanlage
|
|
KR20080018158A
(ko)
|
2005-06-21 |
2008-02-27 |
가부시키가이샤 니콘 |
노광 장치 및 노광 방법, 메인터넌스 방법과 디바이스 제조방법
|
|
US7652746B2
(en)
|
2005-06-21 |
2010-01-26 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7751027B2
(en)
|
2005-06-21 |
2010-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7834974B2
(en)
|
2005-06-28 |
2010-11-16 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7474379B2
(en)
|
2005-06-28 |
2009-01-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7468779B2
(en)
|
2005-06-28 |
2008-12-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8179517B2
(en)
|
2005-06-30 |
2012-05-15 |
Nikon Corporation |
Exposure apparatus and method, maintenance method for exposure apparatus, and device manufacturing method
|
|
US7535644B2
(en)
*
|
2005-08-12 |
2009-05-19 |
Asml Netherlands B.V. |
Lens element, lithographic apparatus, device manufacturing method, and device manufactured thereby
|
|
US8054445B2
(en)
|
2005-08-16 |
2011-11-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101449055B1
(ko)
|
2005-08-23 |
2014-10-08 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법, 및 디바이스 제조 방법
|
|
US7580112B2
(en)
|
2005-08-25 |
2009-08-25 |
Nikon Corporation |
Containment system for immersion fluid in an immersion lithography apparatus
|
|
EP1936665A4
(de)
*
|
2005-09-21 |
2010-03-31 |
Nikon Corp |
Belichtungseinrichtung, belichtungsverfahren und bauelement-herstellungsverfahren
|
|
JP2007088339A
(ja)
*
|
2005-09-26 |
2007-04-05 |
Nikon Corp |
露光装置、及びデバイス製造方法
|
|
US7411658B2
(en)
|
2005-10-06 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2007142366A
(ja)
|
2005-10-18 |
2007-06-07 |
Canon Inc |
露光装置及びデバイス製造方法
|
|
US20070127135A1
(en)
*
|
2005-11-01 |
2007-06-07 |
Nikon Corporation |
Exposure apparatus, exposure method and device manufacturing method
|
|
EP1950795A4
(de)
*
|
2005-11-01 |
2010-06-02 |
Nikon Corp |
Belichtungsvorrichtung, belichtungsverfahren und bauelemente-herstellungsverfahren
|
|
JPWO2007055199A1
(ja)
|
2005-11-09 |
2009-04-30 |
株式会社ニコン |
露光装置及び方法、並びにデバイス製造方法
|
|
WO2007058188A1
(ja)
|
2005-11-15 |
2007-05-24 |
Nikon Corporation |
露光装置及び露光方法、並びにデバイス製造方法
|
|
US7804577B2
(en)
|
2005-11-16 |
2010-09-28 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
KR20080068820A
(ko)
|
2005-11-16 |
2008-07-24 |
가부시키가이샤 니콘 |
기판 처리 방법, 포토마스크의 제조 방법 및 포토마스크,그리고 디바이스 제조 방법
|
|
US7864292B2
(en)
|
2005-11-16 |
2011-01-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7656501B2
(en)
|
2005-11-16 |
2010-02-02 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7803516B2
(en)
|
2005-11-21 |
2010-09-28 |
Nikon Corporation |
Exposure method, device manufacturing method using the same, exposure apparatus, and substrate processing method and apparatus
|
|
JP2007165869A
(ja)
|
2005-11-21 |
2007-06-28 |
Nikon Corp |
露光方法及びそれを用いたデバイス製造方法、露光装置、並びに基板処理方法及び装置
|
|
US7633073B2
(en)
|
2005-11-23 |
2009-12-15 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7773195B2
(en)
|
2005-11-29 |
2010-08-10 |
Asml Holding N.V. |
System and method to increase surface tension and contact angle in immersion lithography
|
|
US7782442B2
(en)
|
2005-12-06 |
2010-08-24 |
Nikon Corporation |
Exposure apparatus, exposure method, projection optical system and device producing method
|
|
KR20080071555A
(ko)
|
2005-12-06 |
2008-08-04 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법, 투영 광학계 및 디바이스 제조방법
|
|
KR20080071552A
(ko)
|
2005-12-06 |
2008-08-04 |
가부시키가이샤 니콘 |
노광 방법, 노광 장치 및 디바이스 제조 방법
|
|
US7420194B2
(en)
|
2005-12-27 |
2008-09-02 |
Asml Netherlands B.V. |
Lithographic apparatus and substrate edge seal
|
|
US8411271B2
(en)
|
2005-12-28 |
2013-04-02 |
Nikon Corporation |
Pattern forming method, pattern forming apparatus, and device manufacturing method
|
|
TWI457977B
(zh)
|
2005-12-28 |
2014-10-21 |
尼康股份有限公司 |
A pattern forming method and a pattern forming apparatus, and an element manufacturing method
|
|
US7839483B2
(en)
|
2005-12-28 |
2010-11-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and a control system
|
|
WO2007077875A1
(ja)
|
2005-12-28 |
2007-07-12 |
Nikon Corporation |
露光装置及び露光方法、並びにデバイス製造方法
|
|
US8953148B2
(en)
|
2005-12-28 |
2015-02-10 |
Nikon Corporation |
Exposure apparatus and making method thereof
|
|
TWI409598B
(zh)
|
2005-12-28 |
2013-09-21 |
尼康股份有限公司 |
Pattern forming method and pattern forming apparatus, exposure method and exposure apparatus, and component manufacturing method
|
|
US7649611B2
(en)
|
2005-12-30 |
2010-01-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101323565B1
(ko)
|
2006-01-19 |
2013-10-29 |
가부시키가이샤 니콘 |
이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법및 패턴 형성 장치, 노광 방법 및 노광 장치, 그리고디바이스 제조 방법
|
|
KR20080102192A
(ko)
|
2006-02-16 |
2008-11-24 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
TW200801833A
(en)
|
2006-02-16 |
2008-01-01 |
Nikon Corp |
Exposure apparatus, exposure method and device manufacturing method
|
|
KR20080103564A
(ko)
|
2006-02-16 |
2008-11-27 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
KR20080101865A
(ko)
|
2006-02-16 |
2008-11-21 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
CN101385120B
(zh)
|
2006-02-21 |
2012-09-05 |
株式会社尼康 |
测定装置及方法、处理装置及方法、图案形成装置及方法、曝光装置及方法、以及元件制造方法
|
|
EP3267258A1
(de)
|
2006-02-21 |
2018-01-10 |
Nikon Corporation |
Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung einer vorrichtung
|
|
CN101980084B
(zh)
|
2006-02-21 |
2013-01-23 |
株式会社尼康 |
曝光装置、曝光方法及组件制造方法
|
|
WO2007102484A1
(ja)
|
2006-03-07 |
2007-09-13 |
Nikon Corporation |
デバイス製造方法、デバイス製造システム及び測定検査装置
|
|
EP1995768A4
(de)
|
2006-03-13 |
2013-02-06 |
Nikon Corp |
Belichtungsvorrichtung, wartungsverfahren, belichtungsverfahren sowie herstellungsverfahren für die vorrichtung
|
|
US8045134B2
(en)
|
2006-03-13 |
2011-10-25 |
Asml Netherlands B.V. |
Lithographic apparatus, control system and device manufacturing method
|
|
US9477158B2
(en)
|
2006-04-14 |
2016-10-25 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE102006021797A1
(de)
|
2006-05-09 |
2007-11-15 |
Carl Zeiss Smt Ag |
Optische Abbildungseinrichtung mit thermischer Dämpfung
|
|
EP2037486A4
(de)
|
2006-05-18 |
2012-01-11 |
Nikon Corp |
Belichtungsverfahren und- vorrichtung, wartungsverfahren und bauelementeherstellungsverfahren
|
|
US8144305B2
(en)
|
2006-05-18 |
2012-03-27 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TW200818256A
(en)
|
2006-05-22 |
2008-04-16 |
Nikon Corp |
Exposure method and apparatus, maintenance method, and device manufacturing method
|
|
US7969548B2
(en)
|
2006-05-22 |
2011-06-28 |
Asml Netherlands B.V. |
Lithographic apparatus and lithographic apparatus cleaning method
|
|
EP2034515A4
(de)
|
2006-05-23 |
2012-01-18 |
Nikon Corp |
Wartungsverfahren, belichtungsverfahren und vorrichtung und bauelementeherstellungsverfahren
|
|
KR20090023545A
(ko)
|
2006-05-31 |
2009-03-05 |
가부시키가이샤 니콘 |
노광 장치 및 노광 방법
|
|
EP2037488A4
(de)
|
2006-06-09 |
2011-11-23 |
Nikon Corp |
Strukturformungsverfahren, strukturformungsvorrichtung, belichtungsverfahren, belichtungsvorrichtung und herstellungsverfahren dafür
|
|
WO2008001871A1
(en)
|
2006-06-30 |
2008-01-03 |
Nikon Corporation |
Maintenance method, exposure method and apparatus and device manufacturing method
|
|
US8045135B2
(en)
|
2006-11-22 |
2011-10-25 |
Asml Netherlands B.V. |
Lithographic apparatus with a fluid combining unit and related device manufacturing method
|
|
US9632425B2
(en)
|
2006-12-07 |
2017-04-25 |
Asml Holding N.V. |
Lithographic apparatus, a dryer and a method of removing liquid from a surface
|
|
US8634053B2
(en)
|
2006-12-07 |
2014-01-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7791709B2
(en)
|
2006-12-08 |
2010-09-07 |
Asml Netherlands B.V. |
Substrate support and lithographic process
|
|
US8237911B2
(en)
|
2007-03-15 |
2012-08-07 |
Nikon Corporation |
Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
|
|
KR20100014357A
(ko)
|
2007-04-12 |
2010-02-10 |
가부시키가이샤 니콘 |
계측 방법, 노광 방법 및 디바이스 제조 방법
|
|
US8947629B2
(en)
|
2007-05-04 |
2015-02-03 |
Asml Netherlands B.V. |
Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
|
|
US7900641B2
(en)
|
2007-05-04 |
2011-03-08 |
Asml Netherlands B.V. |
Cleaning device and a lithographic apparatus cleaning method
|
|
US7866330B2
(en)
|
2007-05-04 |
2011-01-11 |
Asml Netherlands B.V. |
Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
|
|
KR20100031694A
(ko)
|
2007-05-28 |
2010-03-24 |
가부시키가이샤 니콘 |
노광 장치, 디바이스 제조 방법, 세정 장치, 및 클리닝 방법 그리고 노광 방법
|
|
US8164736B2
(en)
|
2007-05-29 |
2012-04-24 |
Nikon Corporation |
Exposure method, exposure apparatus, and method for producing device
|
|
US8194232B2
(en)
|
2007-07-24 |
2012-06-05 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, position control method and position control system, and device manufacturing method
|
|
JP5177449B2
(ja)
|
2007-07-24 |
2013-04-03 |
株式会社ニコン |
移動体駆動方法及び移動体駆動システム、パターン形成方法及び装置、露光方法及び装置、並びにデバイス製造方法
|
|
US8547527B2
(en)
|
2007-07-24 |
2013-10-01 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and pattern formation apparatus, and device manufacturing method
|
|
US8218129B2
(en)
|
2007-08-24 |
2012-07-10 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, measuring method, and position measurement system
|
|
US9304412B2
(en)
|
2007-08-24 |
2016-04-05 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, and measuring method
|
|
US8023106B2
(en)
|
2007-08-24 |
2011-09-20 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method
|
|
US8867022B2
(en)
|
2007-08-24 |
2014-10-21 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, and device manufacturing method
|
|
US8237919B2
(en)
|
2007-08-24 |
2012-08-07 |
Nikon Corporation |
Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method for continuous position measurement of movable body before and after switching between sensor heads
|
|
JP4533416B2
(ja)
*
|
2007-09-25 |
2010-09-01 |
キヤノン株式会社 |
露光装置およびデバイス製造方法
|
|
CN101680746B
(zh)
|
2007-12-11 |
2013-11-20 |
株式会社尼康 |
移动体装置、曝光装置及图案形成装置、以及器件制造方法
|
|
KR101477833B1
(ko)
|
2007-12-28 |
2014-12-30 |
가부시키가이샤 니콘 |
노광 장치, 이동체 구동 시스템, 패턴 형성 장치 및 노광 방법, 그리고 디바이스 제조 방법
|
|
US8269945B2
(en)
|
2007-12-28 |
2012-09-18 |
Nikon Corporation |
Movable body drive method and apparatus, exposure method and apparatus, pattern formation method and apparatus, and device manufacturing method
|
|
WO2009098891A1
(ja)
|
2008-02-08 |
2009-08-13 |
Nikon Corporation |
位置計測システム及び位置計測方法、移動体装置、移動体駆動方法、露光装置及び露光方法、パターン形成装置、並びにデバイス製造方法
|
|
US9176393B2
(en)
|
2008-05-28 |
2015-11-03 |
Asml Netherlands B.V. |
Lithographic apparatus and a method of operating the apparatus
|
|
US8384875B2
(en)
|
2008-09-29 |
2013-02-26 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
US8619231B2
(en)
|
2009-05-21 |
2013-12-31 |
Nikon Corporation |
Cleaning method, exposure method, and device manufacturing method
|
|
JP5618261B2
(ja)
|
2009-08-07 |
2014-11-05 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
TWI512405B
(zh)
|
2009-08-07 |
2015-12-11 |
尼康股份有限公司 |
A moving body device, an exposure apparatus, and an element manufacturing method
|
|
NL2005207A
(en)
|
2009-09-28 |
2011-03-29 |
Asml Netherlands Bv |
Heat pipe, lithographic apparatus and device manufacturing method.
|
|
US8488106B2
(en)
|
2009-12-28 |
2013-07-16 |
Nikon Corporation |
Movable body drive method, movable body apparatus, exposure method, exposure apparatus, and device manufacturing method
|
|
US8841065B2
(en)
|
2010-02-12 |
2014-09-23 |
Nikon Corporation |
Manufacturing method of exposure apparatus and device manufacturing method
|
|
NL2005974A
(en)
|
2010-02-12 |
2011-08-15 |
Asml Netherlands Bv |
Lithographic apparatus and a device manufacturing method.
|
|
WO2011102109A1
(ja)
|
2010-02-20 |
2011-08-25 |
株式会社ニコン |
光源最適化方法、露光方法、デバイス製造方法、プログラム、露光装置、リソグラフィシステム、及び光源評価方法、並びに光源変調方法
|
|
EP2381310B1
(de)
|
2010-04-22 |
2015-05-06 |
ASML Netherlands BV |
Flüssigkeitshandhabungsstruktur und lithographischer Apparat
|
|
JP2012004465A
(ja)
|
2010-06-19 |
2012-01-05 |
Nikon Corp |
照明光学系、露光装置、およびデバイス製造方法
|
|
US8638059B2
(en)
|
2010-08-11 |
2014-01-28 |
Dayton-Phoenix Group, Inc. |
Control for multi-phase induction motor
|
|
TWI587002B
(zh)
|
2011-06-13 |
2017-06-11 |
尼康股份有限公司 |
照明方法
|
|
JP6122252B2
(ja)
*
|
2012-05-01 |
2017-04-26 |
キヤノン株式会社 |
露光装置及びデバイスの製造方法
|
|
EP3866184B1
(de)
|
2012-11-30 |
2024-10-09 |
Nikon Corporation |
Trägersystem, belichtungsvorrichtung und zuführungsverfahren
|
|
KR102746062B1
(ko)
|
2013-10-30 |
2024-12-23 |
가부시키가이샤 니콘 |
기판 유지 장치, 노광 장치 및 디바이스 제조 방법
|
|
JP6380412B2
(ja)
|
2014-01-16 |
2018-08-29 |
株式会社ニコン |
露光装置及び露光方法、並びにデバイス製造方法
|
|
KR102552792B1
(ko)
|
2015-02-23 |
2023-07-06 |
가부시키가이샤 니콘 |
계측 장치, 리소그래피 시스템 및 노광 장치, 그리고 디바이스 제조 방법
|
|
CN111948912A
(zh)
|
2015-02-23 |
2020-11-17 |
株式会社尼康 |
基板处理系统及基板处理方法、以及组件制造方法
|
|
CN111176083B
(zh)
|
2015-02-23 |
2023-07-28 |
株式会社尼康 |
测量装置、光刻系统、曝光装置、测量方法以及曝光方法
|
|
TWI703402B
(zh)
|
2015-03-25 |
2020-09-01 |
日商尼康股份有限公司 |
布局方法、標記檢測方法、曝光方法、測量裝置、曝光裝置、以及元件製造方法
|
|
CN119414655A
(zh)
|
2016-08-24 |
2025-02-11 |
株式会社 尼康 |
基板处理系统、以及元件制造方法
|
|
KR102556130B1
(ko)
|
2016-09-27 |
2023-07-14 |
가부시키가이샤 니콘 |
결정 방법 및 장치, 프로그램, 정보 기록 매체, 노광 장치, 레이아웃 정보 제공 방법, 레이아웃 방법, 마크 검출 방법, 노광 방법, 그리고 디바이스 제조 방법
|
|
KR102625369B1
(ko)
|
2016-09-30 |
2024-01-15 |
가부시키가이샤 니콘 |
계측 시스템 및 기판 처리 시스템, 그리고 디바이스 제조 방법
|
|
EP3598236A4
(de)
|
2017-03-16 |
2021-01-20 |
Nikon Corporation |
Steuerungsvorrichtung und steuerungsverfahren, belichtungsvorrichtung und belichtungsverfahren, vorrichtungsherstellungsverfahren, datenerzeugungsverfahren und programm
|