ATE425522T1 - Sensorvorrichtung für die erfassung eines physikalischen parameters - Google Patents

Sensorvorrichtung für die erfassung eines physikalischen parameters

Info

Publication number
ATE425522T1
ATE425522T1 AT04739077T AT04739077T ATE425522T1 AT E425522 T1 ATE425522 T1 AT E425522T1 AT 04739077 T AT04739077 T AT 04739077T AT 04739077 T AT04739077 T AT 04739077T AT E425522 T1 ATE425522 T1 AT E425522T1
Authority
AT
Austria
Prior art keywords
analogue
physical parameter
detecting
sensor device
output signal
Prior art date
Application number
AT04739077T
Other languages
English (en)
Inventor
Artur Suntken
Original Assignee
Microsystems On Silicon Pty Lt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microsystems On Silicon Pty Lt filed Critical Microsystems On Silicon Pty Lt
Application granted granted Critical
Publication of ATE425522T1 publication Critical patent/ATE425522T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K2219/00—Thermometers with dedicated analog to digital converters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
AT04739077T 2003-04-07 2004-04-06 Sensorvorrichtung für die erfassung eines physikalischen parameters ATE425522T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ZA200302684 2003-04-07

Publications (1)

Publication Number Publication Date
ATE425522T1 true ATE425522T1 (de) 2009-03-15

Family

ID=33160175

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04739077T ATE425522T1 (de) 2003-04-07 2004-04-06 Sensorvorrichtung für die erfassung eines physikalischen parameters

Country Status (6)

Country Link
US (1) US7348561B2 (de)
EP (1) EP1611558B1 (de)
AT (1) ATE425522T1 (de)
DE (1) DE602004019898D1 (de)
ES (1) ES2322811T3 (de)
WO (1) WO2004090570A2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005038875A1 (de) * 2005-05-25 2006-11-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kapazitätsmessschaltung
US20090302859A1 (en) * 2005-11-16 2009-12-10 Microsystems On Silicon (Pty) Ltd. Method for testing a passive infrared sensor
US7924155B2 (en) * 2008-01-07 2011-04-12 Leviton Manufacturing Co., Inc. Digital occupancy sensor light control
US8981299B2 (en) * 2008-01-07 2015-03-17 Leviton Manufacturing Company, Inc. Digital occupancy sensor light control
WO2012002496A1 (ja) * 2010-07-01 2012-01-05 パナソニック電工株式会社 対象物検出装置
US9146172B2 (en) * 2011-01-03 2015-09-29 Sentinel Hydrosolutions, Llc Non-invasive thermal dispersion flow meter with chronometric monitor for fluid leak detection
US9626335B2 (en) 2013-01-17 2017-04-18 Honeywell International Inc. Field device including a software configurable analog to digital converter system
DE102013022547B4 (de) * 2013-09-05 2025-07-10 Elmos Semiconductor Se Vorrichtung zum Betreiben passiver Infrarotsensoren
DE102013022378B3 (de) 2013-09-05 2018-04-05 Elmos Semiconductor Aktiengesellschaft Vorrichtung zum Betreiben passiver Infrarotsensoren
DE102013014810B4 (de) * 2013-09-05 2019-03-14 Elmos Semiconductor Aktiengesellschaft Vorrichtung zum Betreiben passiver Infrarotsensoren
DE102013022763B4 (de) * 2013-09-05 2025-07-17 Elmos Semiconductor Se Vorrichtung zum Betreiben passiver Infrarotsensoren

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2054997B (en) 1979-05-23 1984-01-18 Suwa Seikosha Kk Temperature detecting circuit
DE3537316C1 (de) 1985-10-19 1987-03-12 Hirschmann Radiotechnik Schaltungsanordnung fuer einen Infrarot-Raumueberwachungsdetektor
US5461425A (en) 1994-02-15 1995-10-24 Stanford University CMOS image sensor with pixel level A/D conversion
US5764146A (en) * 1995-03-29 1998-06-09 Hubbell Incorporated Multifunction occupancy sensor
US5811808A (en) 1996-09-12 1998-09-22 Amber Engineering, Inc. Infrared imaging system employing on-focal plane nonuniformity correction

Also Published As

Publication number Publication date
EP1611558B1 (de) 2009-03-11
US20070035314A1 (en) 2007-02-15
US7348561B2 (en) 2008-03-25
WO2004090570A3 (en) 2005-01-06
EP1611558A2 (de) 2006-01-04
DE602004019898D1 (de) 2009-04-23
WO2004090570A2 (en) 2004-10-21
ES2322811T3 (es) 2009-06-29

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Legal Events

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