ATE430320T1 - Adaptive speicherkalibration unter verwendung von bins - Google Patents

Adaptive speicherkalibration unter verwendung von bins

Info

Publication number
ATE430320T1
ATE430320T1 AT05817276T AT05817276T ATE430320T1 AT E430320 T1 ATE430320 T1 AT E430320T1 AT 05817276 T AT05817276 T AT 05817276T AT 05817276 T AT05817276 T AT 05817276T AT E430320 T1 ATE430320 T1 AT E430320T1
Authority
AT
Austria
Prior art keywords
bins
adaptive memory
integrated circuit
external clock
electronic component
Prior art date
Application number
AT05817276T
Other languages
English (en)
Inventor
Jagrut Viliskumar Patel
Gregory Bullard
Sanat Kapoor
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE430320T1 publication Critical patent/ATE430320T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2254—Calibration
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Read Only Memory (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
AT05817276T 2004-11-05 2005-11-07 Adaptive speicherkalibration unter verwendung von bins ATE430320T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US62522904P 2004-11-05 2004-11-05
PCT/US2005/040363 WO2006052929A1 (en) 2004-11-05 2005-11-07 Adaptive memory calibration using bins

Publications (1)

Publication Number Publication Date
ATE430320T1 true ATE430320T1 (de) 2009-05-15

Family

ID=35985747

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05817276T ATE430320T1 (de) 2004-11-05 2005-11-07 Adaptive speicherkalibration unter verwendung von bins

Country Status (11)

Country Link
US (1) US8816742B2 (de)
EP (1) EP1812804B1 (de)
JP (1) JP4842958B2 (de)
CN (1) CN101095060B (de)
AT (1) ATE430320T1 (de)
CA (1) CA2586537A1 (de)
DE (1) DE602005014264D1 (de)
ES (1) ES2326903T3 (de)
MX (1) MX2007005484A (de)
RU (1) RU2363059C2 (de)
WO (1) WO2006052929A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8386829B2 (en) * 2009-06-17 2013-02-26 Macronix International Co., Ltd. Automatic internal trimming calibration method to compensate process variation
WO2013066774A1 (en) 2011-11-01 2013-05-10 Rambus Inc. Data transmission using delayed timing signals
US9825638B2 (en) 2014-03-05 2017-11-21 Sandisk Technologies Llc Virtual critical path (VCP) system and associated methods
JP6334831B2 (ja) * 2016-03-28 2018-05-30 中▲車▼青▲島▼四方▲車▼▲輛▼研究所有限公司Ｃｒｒｃ Ｑｉｎｇｄａｏ Ｓｉｆａｎｇ Ｒｏｌｌｉｎｇ Ｓｔｏｃｋ Ｒｅｓｅａｒｃｈ Ｉｎｓｔｉｔｕｔｅ Ｃｏ．，Ｌｔｄ． Ｔｉｇｅｒｓｈａｒｃ ｄｓｐブート管理チップおよび方法
US11935613B2 (en) * 2020-08-05 2024-03-19 Texas Instruments Incorporated Method for tuning an external memory interface
CN115862707B (zh) * 2022-11-25 2024-03-12 湖南兴芯微电子科技有限公司 一种psram相位校准方法及控制器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1529220A1 (ru) 1986-07-15 1989-12-15 Предприятие П/Я А-3162 Устройство дл автоматического контрол больших интегральных схем
SU1471156A1 (ru) 1987-01-27 1989-04-07 Предприятие П/Я Р-6668 Устройство дл контрол параметров электронных блоков
US5268639A (en) 1992-06-05 1993-12-07 Rambus, Inc. Testing timing parameters of high speed integrated circuit devices
JP3904244B2 (ja) 1993-09-17 2007-04-11 株式会社ルネサステクノロジ シングル・チップ・データ処理装置
US5920216A (en) * 1997-04-03 1999-07-06 Advanced Micro Devices, Inc. Method and system for generating digital clock signals of programmable frequency employing programmable delay lines
US6175928B1 (en) * 1997-12-31 2001-01-16 Intel Corporation Reducing timing variance of signals from an electronic device
JP2000235517A (ja) 1999-02-12 2000-08-29 Nec Corp 半導体集積回路及びクロック遅延調整方法
US6204694B1 (en) * 1999-05-21 2001-03-20 Logicvision, Inc. Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signals
JP2001154907A (ja) 1999-11-29 2001-06-08 Nec Kofu Ltd 遅延調整回路及び情報処理装置
JP4301680B2 (ja) * 2000-02-29 2009-07-22 株式会社ルネサステクノロジ 半導体集積回路装置
US6564335B1 (en) * 2000-03-31 2003-05-13 Intel Corporation Cross chip transfer mechanism for a memory repeater chip in a Dram memory system
DE10035169A1 (de) 2000-07-19 2002-02-07 Infineon Technologies Ag Verfahren und Vorrichtung zum Testen von Setup-Zeit und Hold-Zeit von Signalen einer Schaltung mit getakteter Datenübertragung
US6850107B2 (en) * 2001-08-29 2005-02-01 Micron Technology, Inc. Variable delay circuit and method, and delay locked loop, memory device and computer system using same
US7290186B1 (en) 2003-09-16 2007-10-30 Virage Logic Corporation Method and apparatus for a command based bist for testing memories
US7646835B1 (en) * 2003-11-17 2010-01-12 Rozas Guillermo J Method and system for automatically calibrating intra-cycle timing relationships for sampling signals for an integrated circuit device

Also Published As

Publication number Publication date
US20080123444A1 (en) 2008-05-29
CA2586537A1 (en) 2006-05-18
EP1812804A1 (de) 2007-08-01
ES2326903T3 (es) 2009-10-21
JP4842958B2 (ja) 2011-12-21
CN101095060A (zh) 2007-12-26
RU2363059C2 (ru) 2009-07-27
DE602005014264D1 (de) 2009-06-10
RU2007120819A (ru) 2008-12-10
MX2007005484A (es) 2007-07-16
JP2008519457A (ja) 2008-06-05
US8816742B2 (en) 2014-08-26
EP1812804B1 (de) 2009-04-29
CN101095060B (zh) 2011-03-30
WO2006052929A1 (en) 2006-05-18

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