ATE430952T1 - Verwendung von methanofullerenderivaten als resistmaterialien und verfahren zur bildung einer resistschicht - Google Patents
Verwendung von methanofullerenderivaten als resistmaterialien und verfahren zur bildung einer resistschichtInfo
- Publication number
- ATE430952T1 ATE430952T1 AT05783725T AT05783725T ATE430952T1 AT E430952 T1 ATE430952 T1 AT E430952T1 AT 05783725 T AT05783725 T AT 05783725T AT 05783725 T AT05783725 T AT 05783725T AT E430952 T1 ATE430952 T1 AT E430952T1
- Authority
- AT
- Austria
- Prior art keywords
- methanofullerene
- layer
- forming
- derivatives
- derivative
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000463 material Substances 0.000 title abstract 2
- 239000010410 layer Substances 0.000 abstract 4
- 239000011247 coating layer Substances 0.000 abstract 2
- 125000000962 organic group Chemical group 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical compound C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 abstract 1
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 229910003472 fullerene Inorganic materials 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/115—Cationic or anionic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/126—Halogen compound containing
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Materials For Photolithography (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0420702A GB0420702D0 (en) | 2004-09-17 | 2004-09-17 | Use of methanofullerene derivatives as resist materials and method for forming a resist layer |
| PCT/GB2005/003587 WO2006030234A2 (en) | 2004-09-17 | 2005-09-19 | Use of methanofullerene derivatives as resist materials and method for forming a resist layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE430952T1 true ATE430952T1 (de) | 2009-05-15 |
Family
ID=33306753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05783725T ATE430952T1 (de) | 2004-09-17 | 2005-09-19 | Verwendung von methanofullerenderivaten als resistmaterialien und verfahren zur bildung einer resistschicht |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8034546B2 (de) |
| EP (1) | EP1789849B1 (de) |
| JP (1) | JP4980912B2 (de) |
| AT (1) | ATE430952T1 (de) |
| DE (1) | DE602005014369D1 (de) |
| GB (1) | GB0420702D0 (de) |
| WO (1) | WO2006030234A2 (de) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5035252B2 (ja) * | 2006-11-20 | 2012-09-26 | Jsr株式会社 | レジスト下層膜形成用組成物及びパターン形成方法 |
| TWI366565B (en) * | 2007-06-06 | 2012-06-21 | Otsuka Pharma Co Ltd | Quinolone compound and pharmaceutical composition |
| GB0913919D0 (en) | 2009-08-10 | 2009-09-16 | Univ Birmingham | Method of forming an electrical circuit using fullerene derivatives |
| GB0920231D0 (en) * | 2009-11-18 | 2010-01-06 | Univ Birmingham | Photoresist composition |
| JP5068831B2 (ja) * | 2010-02-05 | 2012-11-07 | 信越化学工業株式会社 | レジスト下層膜材料、レジスト下層膜形成方法、パターン形成方法 |
| JP5757286B2 (ja) * | 2010-03-01 | 2015-07-29 | 日産化学工業株式会社 | フラーレン誘導体を含むレジスト下層膜形成組成物 |
| WO2012036090A1 (ja) | 2010-09-16 | 2012-03-22 | 富士フイルム株式会社 | パターン形成方法、化学増幅型レジスト組成物、及び、レジスト膜 |
| US20150010703A1 (en) * | 2012-02-10 | 2015-01-08 | The University Of Birmingham | Spin on Hard-Mask Material |
| JP5935651B2 (ja) * | 2012-10-18 | 2016-06-15 | 三菱商事株式会社 | 極紫外線光及び電子ビーム露光用レジスト組成物、並びにこれを用いたレジストパターン形成方法 |
| US9256126B2 (en) | 2012-11-14 | 2016-02-09 | Irresistible Materials Ltd | Methanofullerenes |
| US9220432B2 (en) * | 2013-03-02 | 2015-12-29 | C. R. Bard, Inc. | Method and system of utilizing ECG signal for central venous catheter tip positioning |
| US9323149B2 (en) * | 2013-03-05 | 2016-04-26 | Irresistible Materials Ltd | Methanofullerenes |
| US9632409B2 (en) * | 2013-05-22 | 2017-04-25 | Irresistible Materials Ltd | Fullerenes |
| EP3063592B1 (de) | 2013-10-30 | 2021-04-07 | California Institute of Technology | Direkte fotostrukturierung von robusten und unterschiedlichen materialien |
| US9229322B2 (en) * | 2013-10-31 | 2016-01-05 | Alex Phillip Graham Robinson | Composition of matter and molecular resist made therefrom |
| US10095112B2 (en) * | 2017-02-24 | 2018-10-09 | Irresistible Materials Ltd | Multiple trigger photoresist compositions and methods |
| WO2023283189A1 (en) * | 2021-07-04 | 2023-01-12 | Robinson Alex P G | Enhanced euv photoresists and methods of their use |
| JP2025530885A (ja) * | 2022-05-22 | 2025-09-18 | ロビンソン,アレックス,ピー.ジー. | 向上したeuvフォトレジスト及びその使用方法 |
| KR20250113985A (ko) * | 2022-07-07 | 2025-07-28 | 알렉스 필립 그레이엄 로빈손 | 강화된 euv 물질, 포토레지스트 및 이의 사용 방법 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2814165B2 (ja) * | 1992-06-30 | 1998-10-22 | 日本石油株式会社 | 感光材料 |
| JP2860399B2 (ja) * | 1996-01-31 | 1999-02-24 | 工業技術院長 | パターン形成方法 |
| JP3032833B2 (ja) * | 1997-09-22 | 2000-04-17 | ザ ユニバーシティ オブ バーミンガム | 電子線レジスト |
| JP3521710B2 (ja) | 1997-09-30 | 2004-04-19 | Jsr株式会社 | 感放射線性樹脂組成物 |
| JP3026188B2 (ja) | 1998-03-11 | 2000-03-27 | 工業技術院長 | 電子線レジスト、レジストパターンの形成方法及び微細パターンの形成方法 |
| US6800416B2 (en) * | 2002-01-09 | 2004-10-05 | Clariant Finance (Bvi) Ltd. | Negative deep ultraviolet photoresist |
| JP2005053832A (ja) * | 2003-08-04 | 2005-03-03 | Nippon Telegr & Teleph Corp <Ntt> | フラーレン誘導体およびフラーレン複合化レジスト |
| US20070190447A1 (en) * | 2004-02-19 | 2007-08-16 | Tokyo Ohkakogyo Co. Ltd. | Photoresist composition and method of forming resist pattern |
| JP2005266798A (ja) * | 2004-02-19 | 2005-09-29 | Tokyo Ohka Kogyo Co Ltd | フォトレジスト組成物およびレジストパターン形成方法 |
-
2004
- 2004-09-17 GB GB0420702A patent/GB0420702D0/en not_active Ceased
-
2005
- 2005-09-19 DE DE602005014369T patent/DE602005014369D1/de not_active Expired - Lifetime
- 2005-09-19 US US11/662,904 patent/US8034546B2/en not_active Expired - Fee Related
- 2005-09-19 JP JP2007531833A patent/JP4980912B2/ja not_active Expired - Fee Related
- 2005-09-19 AT AT05783725T patent/ATE430952T1/de not_active IP Right Cessation
- 2005-09-19 WO PCT/GB2005/003587 patent/WO2006030234A2/en not_active Ceased
- 2005-09-19 EP EP05783725A patent/EP1789849B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| GB0420702D0 (en) | 2004-10-20 |
| JP2008513820A (ja) | 2008-05-01 |
| EP1789849A2 (de) | 2007-05-30 |
| US8034546B2 (en) | 2011-10-11 |
| WO2006030234A2 (en) | 2006-03-23 |
| US20080118874A1 (en) | 2008-05-22 |
| JP4980912B2 (ja) | 2012-07-18 |
| WO2006030234A3 (en) | 2006-09-14 |
| EP1789849B1 (de) | 2009-05-06 |
| DE602005014369D1 (de) | 2009-06-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |