ATE434189T1 - V/i-quelle und testsystem damit - Google Patents

V/i-quelle und testsystem damit

Info

Publication number
ATE434189T1
ATE434189T1 AT06004879T AT06004879T ATE434189T1 AT E434189 T1 ATE434189 T1 AT E434189T1 AT 06004879 T AT06004879 T AT 06004879T AT 06004879 T AT06004879 T AT 06004879T AT E434189 T1 ATE434189 T1 AT E434189T1
Authority
AT
Austria
Prior art keywords
node
source
diode quad
test system
opposite
Prior art date
Application number
AT06004879T
Other languages
English (en)
Inventor
Christian Balke
Costa Cristo Da
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of ATE434189T1 publication Critical patent/ATE434189T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Hardware Redundancy (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
AT06004879T 2006-03-09 2006-03-09 V/i-quelle und testsystem damit ATE434189T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06004879A EP1832888B1 (de) 2006-03-09 2006-03-09 V/I-Quelle und Testsystem damit

Publications (1)

Publication Number Publication Date
ATE434189T1 true ATE434189T1 (de) 2009-07-15

Family

ID=36637844

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06004879T ATE434189T1 (de) 2006-03-09 2006-03-09 V/i-quelle und testsystem damit

Country Status (6)

Country Link
US (1) US7489146B2 (de)
EP (1) EP1832888B1 (de)
AT (1) ATE434189T1 (de)
DE (1) DE602006007307D1 (de)
TW (1) TWI409484B (de)
WO (1) WO2007102856A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016044849A1 (en) * 2014-09-19 2016-03-24 Elevate Semiconductor, Inc. Parametric pin measurement unit high voltage extension
US9742379B2 (en) 2014-11-21 2017-08-22 Keithley Instruments, Llc Voltage clamp
US9813050B1 (en) * 2016-04-13 2017-11-07 Analog Devices, Inc. Comparator circuit with input attenuator
US10972063B2 (en) 2018-10-17 2021-04-06 Analog Devices Global Unlimited Company Amplifier systems for measuring a wide range of current
CN110082602B (zh) * 2019-05-30 2020-11-03 中国科学院计算技术研究所 一种全阻抗测量电路和测量装置
CN112763835B (zh) * 2021-01-07 2022-01-04 临沂合力电子有限公司 一种晶体管pn结正向电阻检测装置
CN116558380A (zh) * 2023-05-23 2023-08-08 上海赞芯电子科技有限公司 一种电子雷管起爆器的输出电压调节方法
CN116859223B (zh) * 2023-09-05 2023-12-08 西安赛英特科技有限公司 针对vi源的在线自检方法、电路及vi源

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4437096A (en) * 1981-12-30 1984-03-13 Stromberg-Carlson Corp. Concentrator circuit incorporating solid state bilateral bridge arrangement
JPS6144371A (ja) * 1984-08-06 1986-03-04 Mitsubishi Electric Corp 半導体試験装置
US5010297A (en) * 1989-12-01 1991-04-23 Analog Devices, Incorporated Automatic test equipment with active load having high-speed inhibit mode switching
US5493519A (en) * 1993-08-16 1996-02-20 Altera Corporation High voltage driver circuit with fast current limiting for testing of integrated circuits
US5952821A (en) * 1997-08-29 1999-09-14 Credence Systems Corporation Load circuit for integrated circuit tester
US6211723B1 (en) * 1999-01-20 2001-04-03 Ltx Corporation Programmable load circuit for use in automatic test equipment
JP4119060B2 (ja) * 1999-10-01 2008-07-16 株式会社アドバンテスト 試験装置
EP1172661B1 (de) * 2001-03-10 2003-02-19 Agilent Technologies, Inc. (a Delaware corporation) Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss
DE10207676A1 (de) * 2002-02-22 2003-09-04 Philips Intellectual Property Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich
ATE495458T1 (de) * 2002-11-29 2011-01-15 Yamaha Corp Magnetsensor und verfahren zur kompensation temperaturabhängiger eigenschaften desselben
DE60323070D1 (de) * 2003-06-27 2008-10-02 Verigy Pte Ltd Singapore Abtastungsschaltung mit aktiver Last
US20050146320A1 (en) * 2003-12-31 2005-07-07 Gohel Tushar K. Differential active load
GB2428098A (en) * 2005-07-07 2007-01-17 Agilent Technologies Inc Base current compensation for a root mean square detector
JP2007097361A (ja) * 2005-09-30 2007-04-12 Matsushita Electric Ind Co Ltd 昇降圧コンバータ

Also Published As

Publication number Publication date
TW200817706A (en) 2008-04-16
WO2007102856A1 (en) 2007-09-13
EP1832888A1 (de) 2007-09-12
US7489146B2 (en) 2009-02-10
DE602006007307D1 (de) 2009-07-30
EP1832888B1 (de) 2009-06-17
TWI409484B (zh) 2013-09-21
US20070210810A1 (en) 2007-09-13

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Legal Events

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