ATE440383T1 - Schaltungssubstrat und verfahren - Google Patents

Schaltungssubstrat und verfahren

Info

Publication number
ATE440383T1
ATE440383T1 AT03809375T AT03809375T ATE440383T1 AT E440383 T1 ATE440383 T1 AT E440383T1 AT 03809375 T AT03809375 T AT 03809375T AT 03809375 T AT03809375 T AT 03809375T AT E440383 T1 ATE440383 T1 AT E440383T1
Authority
AT
Austria
Prior art keywords
cell
circuit substrate
semiconductor circuit
detector
electrical contact
Prior art date
Application number
AT03809375T
Other languages
English (en)
Inventor
Kimmo Puhakka
Iain Benson
Original Assignee
Ipl Intellectual Property Lice
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0224903A external-priority patent/GB0224903D0/en
Priority claimed from GB0224902A external-priority patent/GB0224902D0/en
Application filed by Ipl Intellectual Property Lice filed Critical Ipl Intellectual Property Lice
Application granted granted Critical
Publication of ATE440383T1 publication Critical patent/ATE440383T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/811—Interconnections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/809—Constructional details of image sensors of hybrid image sensors

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Stereo-Broadcasting Methods (AREA)
  • Vehicle Body Suspensions (AREA)
  • Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
AT03809375T 2002-10-25 2003-10-27 Schaltungssubstrat und verfahren ATE440383T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0224903A GB0224903D0 (en) 2002-10-25 2002-10-25 Circuit substrate and method
GB0224902A GB0224902D0 (en) 2002-10-25 2002-10-25 Circuit substrate and method
PCT/GB2003/004635 WO2004038810A2 (en) 2002-10-25 2003-10-27 Circuit substrate and method

Publications (1)

Publication Number Publication Date
ATE440383T1 true ATE440383T1 (de) 2009-09-15

Family

ID=32178880

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03809375T ATE440383T1 (de) 2002-10-25 2003-10-27 Schaltungssubstrat und verfahren

Country Status (7)

Country Link
US (2) US7872237B2 (de)
EP (1) EP1554760B1 (de)
JP (1) JP2006504258A (de)
AT (1) ATE440383T1 (de)
AU (1) AU2003276401A1 (de)
DE (1) DE60328904D1 (de)
WO (1) WO2004038810A2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1554760B1 (de) * 2002-10-25 2009-08-19 Ipl Intellectual Property Licensing Limited Schaltungssubstrat und verfahren
US7865850B1 (en) 2007-02-28 2011-01-04 Cadence Design Systems, Inc. Method and apparatus for substrate noise aware floor planning for integrated circuit design
US7877713B2 (en) * 2007-06-27 2011-01-25 Cadence Design Systems, Inc. Method and apparatus for substrate noise analysis using substrate tile model and tile grid
US7900166B2 (en) * 2007-06-27 2011-03-01 Cadence Design Systems, Inc. Method to produce an electrical model of an integrated circuit substrate and related system and article of manufacture
KR100882261B1 (ko) * 2007-07-25 2009-02-06 삼성전기주식회사 인쇄회로기판의 제조 방법 및 장치
US9350976B2 (en) 2007-11-26 2016-05-24 First Sensor Mobility Gmbh Imaging unit of a camera for recording the surroundings with optics uncoupled from a circuit board
US7965329B2 (en) 2008-09-09 2011-06-21 Omnivision Technologies, Inc. High gain read circuit for 3D integrated pixel
US8957992B2 (en) * 2010-01-06 2015-02-17 Gary Edwin Sutton Curved sensor camera with moving optical train
US8117741B2 (en) 2009-04-07 2012-02-21 Oy Ajat Ltd Method for manufacturing a radiation imaging panel comprising imaging tiles
US8829453B2 (en) * 2009-06-05 2014-09-09 Rti Electronics Ab X-ray detection device
KR101654140B1 (ko) 2010-03-30 2016-09-09 삼성전자주식회사 산화물 반도체 트랜지스터를 구비한 엑스선 검출기
KR101678671B1 (ko) 2010-04-01 2016-11-22 삼성전자주식회사 이중 포토컨덕터를 구비한 엑스선 검출기
TWI441119B (zh) 2010-04-02 2014-06-11 Arolltech Co Ltd 具內嵌觸控裝置之顯示器
US20120061789A1 (en) * 2010-09-13 2012-03-15 Omnivision Technologies, Inc. Image sensor with improved noise shielding
US8575558B2 (en) * 2010-11-30 2013-11-05 General Electric Company Detector array with a through-via interposer
KR101634252B1 (ko) * 2010-12-10 2016-07-08 삼성전자주식회사 웨이퍼 스케일의 엑스선 검출기 및 제조방법
KR101820843B1 (ko) * 2011-02-18 2018-01-22 삼성전자주식회사 확산방지막을 구비한 엑스선 검출기
KR101761817B1 (ko) 2011-03-04 2017-07-26 삼성전자주식회사 대면적 엑스선 검출기
US8798229B2 (en) * 2011-09-30 2014-08-05 General Electric Company Detector modules and methods of manufacturing
RU2665125C2 (ru) * 2013-10-22 2018-08-28 Конинклейке Филипс Н.В. Рентгеновская система, в частности система томосинтеза, и способ получения изображения объекта
WO2017059573A1 (en) 2015-10-09 2017-04-13 Shenzhen Xpectvision Technology Co., Ltd. Packaging methods of semiconductor x-ray detectors
US9769398B2 (en) 2016-01-06 2017-09-19 Microsoft Technology Licensing, Llc Image sensor with large-area global shutter contact
WO2017145816A1 (ja) * 2016-02-24 2017-08-31 ソニー株式会社 光学測定器、フローサイトメータ、および放射線計数器
US9664802B1 (en) * 2016-06-23 2017-05-30 Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.O.C. Simplified radiation spectrum analyzer
FR3053838B1 (fr) * 2016-07-08 2018-08-17 Thales Procede de fabrication de photodetecteur comprenant un empilement de couches superposees
EP3355082B1 (de) * 2017-01-27 2020-04-15 Detection Technology Oy Strahlungsdetektor-plattenanordnungsstruktur
WO2019144324A1 (en) * 2018-01-24 2019-08-01 Shenzhen Xpectvision Technology Co., Ltd. Packaging of radiation detectors in an image sensor
EP3872533B1 (de) * 2018-10-25 2025-12-17 Kabushiki Kaisha Toshiba Photonenzählender strahlungsdetektor und strahlenuntersuchungsvorrichtung damit
US11277559B2 (en) * 2019-04-26 2022-03-15 Qualcomm Incorporated Image sensor system
CN114126225B (zh) * 2020-08-31 2024-12-17 庆鼎精密电子（淮安）有限公司 电路基板的制造方法、电路板及其制造方法
US12560728B2 (en) * 2022-11-10 2026-02-24 Redlen Technologies, Inc. Radiation detector having improved equalization of pixel response
CN120419317A (zh) * 2022-12-30 2025-08-01 上海联影医疗科技股份有限公司 用于探测辐射射线的光子计数探测器
WO2026035248A1 (en) * 2024-08-05 2026-02-12 Analogic Corporation Detectors for computed tomography scanners and related assemblies and systems

Family Cites Families (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4106046A (en) 1977-01-26 1978-08-08 Westinghouse Electric Corp. Radiant energy sensor
US4188709A (en) 1977-02-07 1980-02-19 Honeywell Inc. Double sided hybrid mosaic focal plane
US4142199A (en) 1977-06-24 1979-02-27 International Business Machines Corporation Bucket brigade device and process
US4239312A (en) 1978-11-29 1980-12-16 Hughes Aircraft Company Parallel interconnect for planar arrays
US4257057A (en) 1979-05-07 1981-03-17 Rockwell International Corporation Self-multiplexed monolithic intrinsic infrared detector
US4369458A (en) 1980-07-01 1983-01-18 Westinghouse Electric Corp. Self-aligned, flip-chip focal plane array configuration
CA1194987A (en) 1981-09-30 1985-10-08 Yasuo Takemura Solid-state color television camera
US5315114A (en) 1981-12-18 1994-05-24 Texas Instruments Incorporated Integrated circuit detector array incorporating bucket brigade devices for time delay and integration
US4602289A (en) 1982-05-31 1986-07-22 Tokyo Shibaura Denki Kabushiki Kaisha Solid state image pick-up device
FR2554955B1 (fr) 1983-11-10 1989-05-26 Thomson Csf Barrette multilineaire a transfert de charge
FR2559957B1 (fr) 1984-02-21 1986-05-30 Thomson Csf Barrette multilineaire a transfert de charge
FR2564674B1 (fr) 1984-05-18 1986-09-19 Thomson Csf Barrette multilineaire a transfert de charge et procede d'analyse
US4817123A (en) 1984-09-21 1989-03-28 Picker International Digital radiography detector resolution improvement
US5043582A (en) 1985-12-11 1991-08-27 General Imagining Corporation X-ray imaging system and solid state detector therefor
US4811371A (en) 1986-05-16 1989-03-07 Rca Corporation Floating-diffusion electrometer with adjustable sensitivity
US4873708A (en) 1987-05-11 1989-10-10 General Electric Company Digital radiographic imaging system and method therefor
FR2625594B1 (fr) 1988-01-05 1990-05-04 Thomson Csf Duplicateur de charges pour dispositif a transfert de charges
JPH0691462B2 (ja) 1988-02-04 1994-11-14 日本電気株式会社 アナログカウンタ回路
FR2627923B1 (fr) 1988-02-26 1990-06-22 Thomson Csf Matrice d'elements photosensibles et detecteur de radiations comportant une telle matrice, notamment detecteur de rayons x a double energie
US4992878A (en) 1988-10-26 1991-02-12 Array Technologies, Inc. Image transducing apparatus using low resolution transducers to achieve high resolution imaging
US4947258A (en) 1988-10-26 1990-08-07 Array Technologies, Inc. Image transducing apparatus
US5012247A (en) 1988-11-21 1991-04-30 Hewlett-Packard Company Switched-capacitor analog-to-digital converter with autocalibration
US4900943A (en) 1989-01-03 1990-02-13 Honeywell Inc. Multiplex time delay integration
JPH0344966A (ja) 1989-07-13 1991-02-26 Sony Corp 固体撮像装置
DE69013104T2 (de) 1989-07-29 1995-03-23 Shimadzu Corp., Kyoto Halbleiterstrahlungsbilddetektor und sein Herstellungsverfahren.
US5315147A (en) 1989-09-25 1994-05-24 Grumman Aerospace Corporation Monolithic focal plane array
FR2656756B1 (fr) 1989-12-29 1994-01-07 Commissariat A Energie Atomique Dispositif pour prises de vues a circuits de balayage integres.
US5182624A (en) 1990-08-08 1993-01-26 Minnesota Mining And Manufacturing Company Solid state electromagnetic radiation detector fet array
US5168528A (en) 1990-08-20 1992-12-01 Itt Corporation Differential electronic imaging system
US5153420A (en) 1990-11-28 1992-10-06 Xerox Corporation Timing independent pixel-scale light sensing apparatus
US5149954A (en) 1991-03-26 1992-09-22 Santa Barbara Research Center Hold capacitor time delay and integration with equilibrating means
US5401952A (en) 1991-10-25 1995-03-28 Canon Kabushiki Kaisha Signal processor having avalanche photodiodes
US5254480A (en) 1992-02-20 1993-10-19 Minnesota Mining And Manufacturing Company Process for producing a large area solid state radiation detector
US5245191A (en) 1992-04-14 1993-09-14 The Board Of Regents Of The University Of Arizona Semiconductor sensor for gamma-ray tomographic imaging system
CA2095366C (en) 1992-05-21 1999-09-14 Timothy C. Collins Hybridized semiconductor pixel detector arrays for use in digital radiography
FR2692423B1 (fr) 1992-06-16 1995-12-01 Thomson Csf Camera d'observation multistandard et systeme de surveillance utilisant une telle camera.
EP0635892B1 (de) 1992-07-21 2002-06-26 Raytheon Company Glühenbeständiger HgCdTe-Photodetektor und Herstellungsverfahren
US5291402A (en) 1992-08-07 1994-03-01 General Electric Company Helical scanning computed tomography apparatus
US5596200A (en) 1992-10-14 1997-01-21 Primex Low dose mammography system
JPH06205767A (ja) 1992-11-25 1994-07-26 Xerox Corp 放射線画像形成システム
US5315411A (en) 1993-01-04 1994-05-24 Eastman Kodak Company Dithering mechanism for a high resolution imaging system
EP0653881B1 (de) 1993-11-17 2001-08-16 Canon Kabushiki Kaisha Festkörperbildaufnahmevorrichtung
US5526394A (en) 1993-11-26 1996-06-11 Fischer Imaging Corporation Digital scan mammography apparatus
FR2714501B1 (fr) 1993-12-23 1996-01-26 Thomson Csf Sommateur de tensions, et mosaïque de sommateurs, pour appareil d'imagerie thermique.
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
US6035013A (en) 1994-06-01 2000-03-07 Simage O.Y. Radiographic imaging devices, systems and methods
US7136452B2 (en) * 1995-05-31 2006-11-14 Goldpower Limited Radiation imaging system, device and method for scan imaging
KR0167889B1 (ko) * 1995-06-09 1999-02-01 김주용 반도체 소자의 비아홀의 형성방법
FR2735632B1 (fr) 1995-06-14 1997-07-11 Commissariat Energie Atomique Dispositif et procede de numerisation pour detecteurs photosensibles et procede de lecture d'une matrice de detecteurs photoniques
GB2307785B (en) 1995-11-29 1998-04-29 Simage Oy Forming contacts on semiconductor substrates for radiation detectors and imaging devices
GB2315157B (en) * 1996-07-11 1998-09-30 Simage Oy Imaging apparatus
FR2751500B1 (fr) 1996-07-16 1998-10-23 Thomson Csf Circuit de lecture de barrettes de photodetecteurs
GB2318411B (en) 1996-10-15 1999-03-10 Simage Oy Imaging device for imaging radiation
SE511425C2 (sv) 1996-12-19 1999-09-27 Ericsson Telefon Ab L M Packningsanordning för integrerade kretsar
US6207944B1 (en) * 1997-02-18 2001-03-27 Simage, O.Y. Semiconductor imaging device
GB2325081B (en) 1997-05-06 2000-01-26 Simage Oy Semiconductor imaging device
US5917881A (en) 1997-05-20 1999-06-29 Fischer Imaging Corporation Digital scan mammography apparatus utilizing velocity adaptive feedback and method
GB2332608B (en) * 1997-12-18 2000-09-06 Simage Oy Modular imaging apparatus
IL137978A0 (en) * 1998-03-06 2001-10-31 Simage Oy Semiconductor imaging device
US6459077B1 (en) 1998-09-15 2002-10-01 Dalsa, Inc. Bucket brigade TDI photodiode sensor
US6563539B1 (en) 1998-09-18 2003-05-13 Nortel Networks Limited Charge transfer circuit for use in imaging systems
US6228673B1 (en) 1999-05-13 2001-05-08 Hughes Electronics Corporation Method of fabricating a surface coupled InGaAs photodetector
US6278181B1 (en) 1999-06-28 2001-08-21 Advanced Micro Devices, Inc. Stacked multi-chip modules using C4 interconnect technology having improved thermal management
US6617681B1 (en) 1999-06-28 2003-09-09 Intel Corporation Interposer and method of making same
US6864484B1 (en) * 1999-07-26 2005-03-08 Edge Medical Devices, Ltd Digital detector for x-ray imaging
JP2001291877A (ja) * 2000-04-05 2001-10-19 Hamamatsu Photonics Kk 固体撮像装置
JP3713418B2 (ja) * 2000-05-30 2005-11-09 光正 小柳 ３次元画像処理装置の製造方法
JP3879816B2 (ja) * 2000-06-02 2007-02-14 セイコーエプソン株式会社 半導体装置及びその製造方法、積層型半導体装置、回路基板並びに電子機器
JP5016746B2 (ja) 2000-07-28 2012-09-05 キヤノン株式会社 撮像装置及びその駆動方法
IL137579A (en) * 2000-07-30 2006-12-31 Orbotech Medical Solutions Ltd Gamma-ray detector for coincidence detection
JP2002139572A (ja) * 2000-11-01 2002-05-17 Canon Inc 放射線検出装置及び放射線撮像システム
FR2820243B1 (fr) 2001-01-31 2003-06-13 Univ Paris Curie Procede et dispositif de fabrication d'un detecteur electronique en gaas pour la detection de rayons x pour l'imagerie
JP4653336B2 (ja) 2001-04-18 2011-03-16 浜松ホトニクス株式会社 エネルギー線検出器及び装置
US7385286B2 (en) * 2001-06-05 2008-06-10 Matsushita Electric Industrial Co., Ltd. Semiconductor module
AU2002333693A1 (en) * 2001-08-24 2003-04-01 Schott Glas Method for producing micro-electromechanical components
US6645787B2 (en) * 2002-01-22 2003-11-11 Technion Research And Development Foundation Ltd. Gamma ray detector
JP4012743B2 (ja) * 2002-02-12 2007-11-21 浜松ホトニクス株式会社 光検出装置
US7189971B2 (en) * 2002-02-15 2007-03-13 Oy Ajat Ltd Radiation imaging device and system
US6952042B2 (en) * 2002-06-17 2005-10-04 Honeywell International, Inc. Microelectromechanical device with integrated conductive shield
US7038288B2 (en) * 2002-09-25 2006-05-02 Microsemi Corporation Front side illuminated photodiode with backside bump
EP1554760B1 (de) * 2002-10-25 2009-08-19 Ipl Intellectual Property Licensing Limited Schaltungssubstrat und verfahren
JP2006073586A (ja) * 2004-08-31 2006-03-16 Renesas Technology Corp 半導体装置の製造方法
TWI353667B (en) * 2007-07-13 2011-12-01 Xintec Inc Image sensor package and fabrication method thereo

Also Published As

Publication number Publication date
US8497483B2 (en) 2013-07-30
AU2003276401A8 (en) 2004-05-13
EP1554760B1 (de) 2009-08-19
US20110156273A1 (en) 2011-06-30
EP1554760A2 (de) 2005-07-20
DE60328904D1 (de) 2009-10-01
JP2006504258A (ja) 2006-02-02
WO2004038810A2 (en) 2004-05-06
US20080093560A1 (en) 2008-04-24
WO2004038810A3 (en) 2004-06-17
AU2003276401A1 (en) 2004-05-13
US7872237B2 (en) 2011-01-18

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