ATE443913T1 - Magnetisches speicherzellenfeld mit benachbarter gekoppelter weichmagnetischer schicht - Google Patents
Magnetisches speicherzellenfeld mit benachbarter gekoppelter weichmagnetischer schichtInfo
- Publication number
- ATE443913T1 ATE443913T1 AT05392008T AT05392008T ATE443913T1 AT E443913 T1 ATE443913 T1 AT E443913T1 AT 05392008 T AT05392008 T AT 05392008T AT 05392008 T AT05392008 T AT 05392008T AT E443913 T1 ATE443913 T1 AT E443913T1
- Authority
- AT
- Austria
- Prior art keywords
- layer
- soft magnetic
- memory cell
- magnetic layer
- free layer
- Prior art date
Links
- 230000008878 coupling Effects 0.000 abstract 2
- 238000010168 coupling process Methods 0.000 abstract 2
- 238000005859 coupling reaction Methods 0.000 abstract 2
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 239000002131 composite material Substances 0.000 abstract 1
- 239000012141 concentrate Substances 0.000 abstract 1
- 230000001939 inductive effect Effects 0.000 abstract 1
- 230000005415 magnetization Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1655—Bit-line or column circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1657—Word-line or row circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
- Thin Magnetic Films (AREA)
- Magnetic Heads (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/872,915 US6979586B2 (en) | 2000-10-06 | 2004-06-21 | Magnetic random access memory array with coupled soft adjacent magnetic layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE443913T1 true ATE443913T1 (de) | 2009-10-15 |
Family
ID=34942847
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05392008T ATE443913T1 (de) | 2004-06-21 | 2005-06-14 | Magnetisches speicherzellenfeld mit benachbarter gekoppelter weichmagnetischer schicht |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6979586B2 (de) |
| EP (1) | EP1610341B1 (de) |
| JP (1) | JP5068939B2 (de) |
| KR (1) | KR100741303B1 (de) |
| AT (1) | ATE443913T1 (de) |
| DE (1) | DE602005016749D1 (de) |
| TW (1) | TWI291696B (de) |
Families Citing this family (79)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7105372B2 (en) * | 2004-01-20 | 2006-09-12 | Headway Technologies, Inc. | Magnetic tunneling junction film structure with process determined in-plane magnetic anisotropy |
| US7211874B2 (en) * | 2004-04-06 | 2007-05-01 | Headway Technologies, Inc. | Magnetic random access memory array with free layer locking mechanism |
| US7132707B2 (en) * | 2004-08-03 | 2006-11-07 | Headway Technologies, Inc. | Magnetic random access memory array with proximate read and write lines cladded with magnetic material |
| US7576956B2 (en) * | 2004-07-26 | 2009-08-18 | Grandis Inc. | Magnetic tunnel junction having diffusion stop layer |
| US7224601B2 (en) | 2005-08-25 | 2007-05-29 | Grandis Inc. | Oscillating-field assisted spin torque switching of a magnetic tunnel junction memory element |
| US7859034B2 (en) * | 2005-09-20 | 2010-12-28 | Grandis Inc. | Magnetic devices having oxide antiferromagnetic layer next to free ferromagnetic layer |
| US7777261B2 (en) | 2005-09-20 | 2010-08-17 | Grandis Inc. | Magnetic device having stabilized free ferromagnetic layer |
| US7973349B2 (en) | 2005-09-20 | 2011-07-05 | Grandis Inc. | Magnetic device having multilayered free ferromagnetic layer |
| US8582252B2 (en) * | 2005-11-02 | 2013-11-12 | Seagate Technology Llc | Magnetic layer with grain refining agent |
| US7430135B2 (en) * | 2005-12-23 | 2008-09-30 | Grandis Inc. | Current-switched spin-transfer magnetic devices with reduced spin-transfer switching current density |
| JP2007194327A (ja) * | 2006-01-18 | 2007-08-02 | Alps Electric Co Ltd | トンネル型磁気検出素子 |
| US20070246787A1 (en) * | 2006-03-29 | 2007-10-25 | Lien-Chang Wang | On-plug magnetic tunnel junction devices based on spin torque transfer switching |
| EP1863034B1 (de) * | 2006-05-04 | 2011-01-05 | Hitachi, Ltd. | Magnetspeichervorrichtung |
| US7486550B2 (en) * | 2006-06-06 | 2009-02-03 | Micron Technology, Inc. | Semiconductor magnetic memory integrating a magnetic tunneling junction above a floating-gate memory cell |
| US7456029B2 (en) * | 2006-06-28 | 2008-11-25 | Magic Technologies, Inc. | Planar flux concentrator for MRAM devices |
| US7502249B1 (en) | 2006-07-17 | 2009-03-10 | Grandis, Inc. | Method and system for using a pulsed field to assist spin transfer induced switching of magnetic memory elements |
| US7532505B1 (en) | 2006-07-17 | 2009-05-12 | Grandis, Inc. | Method and system for using a pulsed field to assist spin transfer induced switching of magnetic memory elements |
| US7851840B2 (en) * | 2006-09-13 | 2010-12-14 | Grandis Inc. | Devices and circuits based on magnetic tunnel junctions utilizing a multilayer barrier |
| TWI330366B (en) * | 2007-02-07 | 2010-09-11 | Ind Tech Res Inst | Magnetic memory device |
| US7957179B2 (en) | 2007-06-27 | 2011-06-07 | Grandis Inc. | Magnetic shielding in magnetic multilayer structures |
| US7982275B2 (en) * | 2007-08-22 | 2011-07-19 | Grandis Inc. | Magnetic element having low saturation magnetization |
| US8659852B2 (en) | 2008-04-21 | 2014-02-25 | Seagate Technology Llc | Write-once magentic junction memory array |
| US7852663B2 (en) | 2008-05-23 | 2010-12-14 | Seagate Technology Llc | Nonvolatile programmable logic gates and adders |
| US7855911B2 (en) | 2008-05-23 | 2010-12-21 | Seagate Technology Llc | Reconfigurable magnetic logic device using spin torque |
| US8223532B2 (en) | 2008-08-07 | 2012-07-17 | Seagate Technology Llc | Magnetic field assisted STRAM cells |
| US7881098B2 (en) | 2008-08-26 | 2011-02-01 | Seagate Technology Llc | Memory with separate read and write paths |
| US7894248B2 (en) | 2008-09-12 | 2011-02-22 | Grandis Inc. | Programmable and redundant circuitry based on magnetic tunnel junction (MTJ) |
| US7985994B2 (en) | 2008-09-29 | 2011-07-26 | Seagate Technology Llc | Flux-closed STRAM with electronically reflective insulative spacer |
| US7746687B2 (en) | 2008-09-30 | 2010-06-29 | Seagate Technology, Llc | Thermally assisted multi-bit MRAM |
| US8169810B2 (en) | 2008-10-08 | 2012-05-01 | Seagate Technology Llc | Magnetic memory with asymmetric energy barrier |
| US8487390B2 (en) * | 2008-10-08 | 2013-07-16 | Seagate Technology Llc | Memory cell with stress-induced anisotropy |
| US8089132B2 (en) | 2008-10-09 | 2012-01-03 | Seagate Technology Llc | Magnetic memory with phonon glass electron crystal material |
| US8039913B2 (en) | 2008-10-09 | 2011-10-18 | Seagate Technology Llc | Magnetic stack with laminated layer |
| US7880209B2 (en) * | 2008-10-09 | 2011-02-01 | Seagate Technology Llc | MRAM cells including coupled free ferromagnetic layers for stabilization |
| US8045366B2 (en) | 2008-11-05 | 2011-10-25 | Seagate Technology Llc | STRAM with composite free magnetic element |
| US8043732B2 (en) | 2008-11-11 | 2011-10-25 | Seagate Technology Llc | Memory cell with radial barrier |
| KR20100052597A (ko) * | 2008-11-11 | 2010-05-20 | 삼성전자주식회사 | 수직형 반도체 장치 |
| US7826181B2 (en) | 2008-11-12 | 2010-11-02 | Seagate Technology Llc | Magnetic memory with porous non-conductive current confinement layer |
| US8289756B2 (en) | 2008-11-25 | 2012-10-16 | Seagate Technology Llc | Non volatile memory including stabilizing structures |
| US7826259B2 (en) | 2009-01-29 | 2010-11-02 | Seagate Technology Llc | Staggered STRAM cell |
| US9368716B2 (en) | 2009-02-02 | 2016-06-14 | Qualcomm Incorporated | Magnetic tunnel junction (MTJ) storage element and spin transfer torque magnetoresistive random access memory (STT-MRAM) cells having an MTJ |
| US8053255B2 (en) | 2009-03-03 | 2011-11-08 | Seagate Technology Llc | STRAM with compensation element and method of making the same |
| US8363459B2 (en) * | 2009-06-11 | 2013-01-29 | Qualcomm Incorporated | Magnetic tunnel junction device and fabrication |
| US7999338B2 (en) | 2009-07-13 | 2011-08-16 | Seagate Technology Llc | Magnetic stack having reference layers with orthogonal magnetization orientation directions |
| JP5655391B2 (ja) * | 2010-06-23 | 2015-01-21 | ソニー株式会社 | 記憶素子及び記憶装置 |
| US9006704B2 (en) | 2011-02-11 | 2015-04-14 | Headway Technologies, Inc. | Magnetic element with improved out-of-plane anisotropy for spintronic applications |
| US20120241878A1 (en) * | 2011-03-24 | 2012-09-27 | International Business Machines Corporation | Magnetic tunnel junction with iron dusting layer between free layer and tunnel barrier |
| US8592927B2 (en) | 2011-05-04 | 2013-11-26 | Magic Technologies, Inc. | Multilayers having reduced perpendicular demagnetizing field using moment dilution for spintronic applications |
| US9007818B2 (en) | 2012-03-22 | 2015-04-14 | Micron Technology, Inc. | Memory cells, semiconductor device structures, systems including such cells, and methods of fabrication |
| US9054030B2 (en) | 2012-06-19 | 2015-06-09 | Micron Technology, Inc. | Memory cells, semiconductor device structures, memory systems, and methods of fabrication |
| US8923038B2 (en) | 2012-06-19 | 2014-12-30 | Micron Technology, Inc. | Memory cells, semiconductor device structures, memory systems, and methods of fabrication |
| JP2013016820A (ja) * | 2012-08-20 | 2013-01-24 | Hitachi Ltd | トンネル磁気抵抗効果素子、それを用いた磁気メモリセル及びランダムアクセスメモリ |
| US9379315B2 (en) | 2013-03-12 | 2016-06-28 | Micron Technology, Inc. | Memory cells, methods of fabrication, semiconductor device structures, and memory systems |
| US9368714B2 (en) | 2013-07-01 | 2016-06-14 | Micron Technology, Inc. | Memory cells, methods of operation and fabrication, semiconductor device structures, and memory systems |
| US9466787B2 (en) | 2013-07-23 | 2016-10-11 | Micron Technology, Inc. | Memory cells, methods of fabrication, semiconductor device structures, memory systems, and electronic systems |
| US9461242B2 (en) | 2013-09-13 | 2016-10-04 | Micron Technology, Inc. | Magnetic memory cells, methods of fabrication, semiconductor devices, memory systems, and electronic systems |
| US9608197B2 (en) | 2013-09-18 | 2017-03-28 | Micron Technology, Inc. | Memory cells, methods of fabrication, and semiconductor devices |
| US10454024B2 (en) | 2014-02-28 | 2019-10-22 | Micron Technology, Inc. | Memory cells, methods of fabrication, and memory devices |
| US9281466B2 (en) | 2014-04-09 | 2016-03-08 | Micron Technology, Inc. | Memory cells, semiconductor structures, semiconductor devices, and methods of fabrication |
| US9269888B2 (en) | 2014-04-18 | 2016-02-23 | Micron Technology, Inc. | Memory cells, methods of fabrication, and semiconductor devices |
| US9349945B2 (en) | 2014-10-16 | 2016-05-24 | Micron Technology, Inc. | Memory cells, semiconductor devices, and methods of fabrication |
| US9768377B2 (en) | 2014-12-02 | 2017-09-19 | Micron Technology, Inc. | Magnetic cell structures, and methods of fabrication |
| US10439131B2 (en) | 2015-01-15 | 2019-10-08 | Micron Technology, Inc. | Methods of forming semiconductor devices including tunnel barrier materials |
| KR102465539B1 (ko) | 2015-09-18 | 2022-11-11 | 삼성전자주식회사 | 자기 터널 접합 구조체를 포함하는 반도체 소자 및 그의 형성 방법 |
| US9966529B1 (en) | 2017-03-17 | 2018-05-08 | Headway Technologies, Inc. | MgO insertion into free layer for magnetic memory applications |
| US10276784B1 (en) * | 2017-10-30 | 2019-04-30 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor structure and associated operating and fabricating method |
| US10325639B2 (en) | 2017-11-20 | 2019-06-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Initialization process for magnetic random access memory (MRAM) production |
| US10522745B2 (en) | 2017-12-14 | 2019-12-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Low resistance MgO capping layer for perpendicularly magnetized magnetic tunnel junctions |
| US10665773B2 (en) | 2018-01-26 | 2020-05-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Nitride capping layer for spin torque transfer (STT)-magnetoresistive random access memory (MRAM) |
| CN109244233B (zh) * | 2018-07-26 | 2021-02-19 | 西安交通大学 | 基于人工反铁磁固定层的磁性隧道结器件及随机存储装置 |
| US10522746B1 (en) | 2018-08-07 | 2019-12-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Dual magnetic tunnel junction devices for magnetic random access memory (MRAM) |
| US10797225B2 (en) | 2018-09-18 | 2020-10-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Dual magnetic tunnel junction (DMTJ) stack design |
| US10950782B2 (en) | 2019-02-14 | 2021-03-16 | Headway Technologies, Inc. | Nitride diffusion barrier structure for spintronic applications |
| US11264566B2 (en) | 2019-06-21 | 2022-03-01 | Headway Technologies, Inc. | Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio |
| US11264560B2 (en) | 2019-06-21 | 2022-03-01 | Headway Technologies, Inc. | Minimal thickness, low switching voltage magnetic free layers using an oxidation control layer and magnetic moment tuning layer for spintronic applications |
| CN115691596A (zh) * | 2021-07-27 | 2023-02-03 | 浙江驰拓科技有限公司 | 磁性存储单元及磁性存储器 |
| CN113744777B (zh) * | 2021-09-08 | 2024-01-02 | 北京航空航天大学 | 磁性随机存储器的存储单元及数据多态存储控制方法 |
| US11823724B2 (en) | 2021-10-26 | 2023-11-21 | International Business Machines Corporation | Magneto-electric low power analogue magnetic tunnel junction memory |
| KR20230093928A (ko) * | 2021-12-20 | 2023-06-27 | 에스케이하이닉스 주식회사 | 전자 장치 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
| US5966323A (en) * | 1997-12-18 | 1999-10-12 | Motorola, Inc. | Low switching field magnetoresistive tunneling junction for high density arrays |
| US5969978A (en) * | 1998-09-30 | 1999-10-19 | The United States Of America As Represented By The Secretary Of The Navy | Read/write memory architecture employing closed ring elements |
| US6005800A (en) * | 1998-11-23 | 1999-12-21 | International Business Machines Corporation | Magnetic memory array with paired asymmetric memory cells for improved write margin |
| US6872993B1 (en) * | 1999-05-25 | 2005-03-29 | Micron Technology, Inc. | Thin film memory device having local and external magnetic shielding |
| US6166948A (en) * | 1999-09-03 | 2000-12-26 | International Business Machines Corporation | Magnetic memory array with magnetic tunnel junction memory cells having flux-closed free layers |
| US6611405B1 (en) * | 1999-09-16 | 2003-08-26 | Kabushiki Kaisha Toshiba | Magnetoresistive element and magnetic memory device |
| US6211090B1 (en) * | 2000-03-21 | 2001-04-03 | Motorola, Inc. | Method of fabricating flux concentrating layer for use with magnetoresistive random access memories |
| US6936903B2 (en) * | 2001-09-25 | 2005-08-30 | Hewlett-Packard Development Company, L.P. | Magnetic memory cell having a soft reference layer |
| US6531723B1 (en) * | 2001-10-16 | 2003-03-11 | Motorola, Inc. | Magnetoresistance random access memory for improved scalability |
| US6740947B1 (en) * | 2002-11-13 | 2004-05-25 | Hewlett-Packard Development Company, L.P. | MRAM with asymmetric cladded conductor |
| JP2004273969A (ja) * | 2003-03-12 | 2004-09-30 | Sony Corp | 磁気記憶装置の製造方法 |
| US7211874B2 (en) | 2004-04-06 | 2007-05-01 | Headway Technologies, Inc. | Magnetic random access memory array with free layer locking mechanism |
-
2004
- 2004-06-21 US US10/872,915 patent/US6979586B2/en not_active Expired - Lifetime
-
2005
- 2005-06-14 AT AT05392008T patent/ATE443913T1/de not_active IP Right Cessation
- 2005-06-14 DE DE602005016749T patent/DE602005016749D1/de not_active Expired - Lifetime
- 2005-06-14 EP EP05392008A patent/EP1610341B1/de not_active Expired - Lifetime
- 2005-06-21 TW TW094120561A patent/TWI291696B/zh not_active IP Right Cessation
- 2005-06-21 JP JP2005180553A patent/JP5068939B2/ja not_active Expired - Fee Related
- 2005-06-21 KR KR1020050053650A patent/KR100741303B1/ko not_active Expired - Lifetime
- 2005-08-25 US US11/210,637 patent/US7335961B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006013498A (ja) | 2006-01-12 |
| EP1610341A3 (de) | 2006-06-14 |
| US20050280960A1 (en) | 2005-12-22 |
| JP5068939B2 (ja) | 2012-11-07 |
| TWI291696B (en) | 2007-12-21 |
| EP1610341A2 (de) | 2005-12-28 |
| KR20060046496A (ko) | 2006-05-17 |
| KR100741303B1 (ko) | 2007-07-23 |
| TW200617953A (en) | 2006-06-01 |
| DE602005016749D1 (de) | 2009-11-05 |
| US7335961B2 (en) | 2008-02-26 |
| US20040233760A1 (en) | 2004-11-25 |
| US6979586B2 (en) | 2005-12-27 |
| EP1610341B1 (de) | 2009-09-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |