ATE456805T1 - Ic-testverfahren und vorrichtung - Google Patents

Ic-testverfahren und vorrichtung

Info

Publication number
ATE456805T1
ATE456805T1 AT06809582T AT06809582T ATE456805T1 AT E456805 T1 ATE456805 T1 AT E456805T1 AT 06809582 T AT06809582 T AT 06809582T AT 06809582 T AT06809582 T AT 06809582T AT E456805 T1 ATE456805 T1 AT E456805T1
Authority
AT
Austria
Prior art keywords
shift register
core
circuit
testing
bypassed
Prior art date
Application number
AT06809582T
Other languages
English (en)
Inventor
Tom Waayers
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE456805T1 publication Critical patent/ATE456805T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT06809582T 2005-10-24 2006-10-12 Ic-testverfahren und vorrichtung ATE456805T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05109893 2005-10-24
PCT/IB2006/053755 WO2007049172A1 (en) 2005-10-24 2006-10-12 Ic testing methods and apparatus

Publications (1)

Publication Number Publication Date
ATE456805T1 true ATE456805T1 (de) 2010-02-15

Family

ID=37824600

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06809582T ATE456805T1 (de) 2005-10-24 2006-10-12 Ic-testverfahren und vorrichtung

Country Status (8)

Country Link
US (1) US7941717B2 (de)
EP (1) EP1943532B1 (de)
JP (1) JP2009512873A (de)
CN (1) CN101292171B (de)
AT (1) ATE456805T1 (de)
DE (1) DE602006012082D1 (de)
TW (1) TW200734671A (de)
WO (1) WO2007049172A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7657790B2 (en) 2006-04-05 2010-02-02 Texas Instruments Incorporated Scan frame based test access mechanisms
US7941719B2 (en) 2005-10-24 2011-05-10 Nxp B.V. IC testing methods and apparatus
US7519884B2 (en) 2006-06-16 2009-04-14 Texas Instruments Incorporated TAM controller for plural test access mechanisms
US8856601B2 (en) * 2009-08-25 2014-10-07 Texas Instruments Incorporated Scan compression architecture with bypassable scan chains for low test mode power
US8566656B2 (en) * 2009-12-22 2013-10-22 Nxp B.V. Testing circuit and method
KR20110132073A (ko) * 2010-06-01 2011-12-07 삼성전자주식회사 칩 및 칩 테스트 시스템
CN101976216B (zh) * 2010-10-26 2012-09-05 哈尔滨工业大学 基于ieee 1500标准的ip核测试结构及测试方法
US8627159B2 (en) * 2010-11-11 2014-01-07 Qualcomm Incorporated Feedback scan isolation and scan bypass architecture
US8738978B2 (en) * 2011-06-30 2014-05-27 Lsi Corporation Efficient wrapper cell design for scan testing of integrated
CN103295646B (zh) * 2012-02-27 2015-10-14 晨星软件研发(深圳)有限公司 运用于高速输出入端上的内建自测试电路
KR102038414B1 (ko) * 2013-06-20 2019-11-26 에스케이하이닉스 주식회사 테스트 장치 및 그의 동작 방법
US10069497B2 (en) * 2016-06-23 2018-09-04 Xilinx, Inc. Circuit for and method of implementing a scan chain in programmable resources of an integrated circuit
CN107729191B (zh) * 2016-08-10 2020-06-30 中国科学院微电子研究所 测试图形翻译方法及芯核测试壳装置
US11047909B2 (en) * 2018-10-30 2021-06-29 Maxlinear, Inc. Inter-domain power element testing using scan
US11342914B2 (en) * 2020-06-19 2022-05-24 Juniper Networks, Inc. Integrated circuit having state machine-driven flops in wrapper chains for device testing
US11320485B1 (en) * 2020-12-31 2022-05-03 Nxp Usa, Inc. Scan wrapper architecture for system-on-chip
US11959965B2 (en) * 2021-11-12 2024-04-16 Samsung Electronics Co., Ltd. Test circuit using clock gating scheme to hold capture procedure and bypass mode, and integrated circuit including the same

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01263739A (ja) * 1988-04-14 1989-10-20 Nec Corp 情報処理装置
US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置
JP3333036B2 (ja) * 1994-03-17 2002-10-07 富士通株式会社 試験装置、試験装置を備えたシステムおよび試験方法
US6560734B1 (en) * 1998-06-19 2003-05-06 Texas Instruments Incorporated IC with addressable test port
US6877122B2 (en) * 2001-12-21 2005-04-05 Texas Instruments Incorporated Link instruction register providing test control signals to core wrappers
CN100342241C (zh) * 2001-09-20 2007-10-10 Nxp股份有限公司 电子装置
US6925583B1 (en) * 2002-01-09 2005-08-02 Xilinx, Inc. Structure and method for writing from a JTAG device with microcontroller to a non-JTAG device
US7103814B2 (en) * 2002-10-25 2006-09-05 International Business Machines Corporation Testing logic and embedded memory in parallel
JP4274806B2 (ja) * 2003-01-28 2009-06-10 株式会社リコー 半導体集積回路およびスキャンテスト法
DE602004003475T2 (de) * 2003-02-10 2007-09-20 Koninklijke Philips Electronics N.V. Testen von integrierten schaltungen
US7620866B2 (en) * 2004-01-19 2009-11-17 Nxp B.V. Test access architecture and method of testing a module in an electronic circuit
JP2007524947A (ja) * 2004-02-17 2007-08-30 アンスティテュ ナシオナル ポリテクニーク ド グレノーブル 集積回路のｉｐコアのテスト手段のリモート制御を行うことができる通信手段を備える集積回路チップ
TWI263058B (en) * 2004-12-29 2006-10-01 Ind Tech Res Inst Wrapper testing circuits and method thereof for system-on-a-chip
ATE462980T1 (de) 2005-10-24 2010-04-15 Nxp Bv Ic-testverfahren und vorrichtung
US7941719B2 (en) 2005-10-24 2011-05-10 Nxp B.V. IC testing methods and apparatus

Also Published As

Publication number Publication date
WO2007049172A1 (en) 2007-05-03
JP2009512873A (ja) 2009-03-26
TW200734671A (en) 2007-09-16
CN101292171B (zh) 2012-04-18
US20080265906A1 (en) 2008-10-30
US7941717B2 (en) 2011-05-10
CN101292171A (zh) 2008-10-22
EP1943532A1 (de) 2008-07-16
EP1943532B1 (de) 2010-01-27
DE602006012082D1 (de) 2010-03-18

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