ATE472119T1 - Mikroskop für infrarotabbildung - Google Patents

Mikroskop für infrarotabbildung

Info

Publication number
ATE472119T1
ATE472119T1 AT00307372T AT00307372T ATE472119T1 AT E472119 T1 ATE472119 T1 AT E472119T1 AT 00307372 T AT00307372 T AT 00307372T AT 00307372 T AT00307372 T AT 00307372T AT E472119 T1 ATE472119 T1 AT E472119T1
Authority
AT
Austria
Prior art keywords
detector
detector elements
multiplexing
small
infrared imaging
Prior art date
Application number
AT00307372T
Other languages
English (en)
Inventor
Andrew James Turner
Robert Alan Hoult
Original Assignee
Perkinelmer Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkinelmer Singapore Pte Ltd filed Critical Perkinelmer Singapore Pte Ltd
Application granted granted Critical
Publication of ATE472119T1 publication Critical patent/ATE472119T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Light Receiving Elements (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
AT00307372T 2000-08-29 2000-08-29 Mikroskop für infrarotabbildung ATE472119T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00307372A EP1184703B1 (de) 2000-08-29 2000-08-29 Mikroskop für Infrarotabbildung

Publications (1)

Publication Number Publication Date
ATE472119T1 true ATE472119T1 (de) 2010-07-15

Family

ID=8173225

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00307372T ATE472119T1 (de) 2000-08-29 2000-08-29 Mikroskop für infrarotabbildung

Country Status (5)

Country Link
US (2) US7378657B2 (de)
EP (1) EP1184703B1 (de)
JP (1) JP2002188958A (de)
AT (1) ATE472119T1 (de)
DE (1) DE60044580D1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11054365B2 (en) 2016-02-23 2021-07-06 Shimadzu Corporation Microscopic analysis device

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* Cited by examiner, † Cited by third party
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GB0120170D0 (en) 2001-08-17 2001-10-10 Perkin Elmer Int Cv Scanning IR microscope
US7078696B2 (en) * 2004-02-13 2006-07-18 Thermo Electron Scientific Instruments Corporation Microspectrometer system with selectable aperturing
JP4585839B2 (ja) * 2004-12-06 2010-11-24 日本分光株式会社 顕微鏡
DE102006037524A1 (de) * 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
WO2008027930A2 (en) * 2006-08-28 2008-03-06 Thermo Electron Scientific Instruments Llc Spectroscope with spatial resolution control
JP6000546B2 (ja) 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置
JP2016102875A (ja) * 2014-11-27 2016-06-02 株式会社 清原光学 非球面レンズ、非球面レンズの光軸合わせ装置、非球面ミラー及びカセグレン望遠鏡
JP6020849B2 (ja) * 2014-12-18 2016-11-02 株式会社 清原光学 非球面ミラーの光軸合わせ装置
JP6863578B2 (ja) 2017-04-19 2021-04-21 日本分光株式会社 赤外顕微鏡
US10641659B2 (en) * 2018-08-14 2020-05-05 Shimadzu Corporation Infrared microscope with adjustable connection optical system
US11067787B2 (en) * 2018-10-23 2021-07-20 Microsanj, LLC Microscope mounted infrared digital thermal image system
DE102019203560B4 (de) 2019-03-15 2025-03-20 Bruker Optics Gmbh & Co. Kg IR-Mikroskop
KR20220083702A (ko) 2019-10-14 2022-06-20 라이카 바이오시스템즈 이미징 인크. 서브픽셀 라인 스캐닝
CN111103592B (zh) * 2019-11-19 2022-04-12 北京空间机电研究所 一种高灵敏度的点元化阵列关联检测激光测深系统

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FR1602591A (de) * 1968-12-27 1970-12-28
US4845552A (en) * 1987-08-20 1989-07-04 Bruno Jaggi Quantitative light microscope using a solid state detector in the primary image plane
EP1245987B1 (de) * 1988-07-13 2008-01-23 Optiscan Pty Ltd Konfokales Rastermikroskop
JP2691226B2 (ja) * 1989-07-10 1997-12-17 株式会社ニコン 赤外線撮像光学装置
US5864146A (en) * 1996-11-13 1999-01-26 University Of Massachusetts Medical Center System for quantitative radiographic imaging
US5091646A (en) * 1990-05-29 1992-02-25 Kollmorgen Corporation Integrated thermal imaging system
JPH078735U (ja) * 1993-07-09 1995-02-07 株式会社村田製作所 赤外線センサ装置
IL107763A0 (en) * 1993-11-26 1994-02-27 State Of Isreal Ministery Of D Infrared microscope
CA2135676A1 (en) * 1994-11-14 1996-05-15 Jean Dumas Device to enhance imaging resolution
US5602391A (en) * 1995-02-23 1997-02-11 Hughes Electronics Quincunx sampling grid for staring array
EP0731371B1 (de) * 1995-03-06 2003-04-16 Perkin-Elmer Limited Kontrolle eines Mikroskopprobenträgers
JPH08313640A (ja) * 1995-05-17 1996-11-29 Hitachi Ltd 二次元放射線画像検出器
US5751830A (en) * 1995-05-24 1998-05-12 Lockheed Martin Energy Systems, Inc. Method and apparatus for coherent imaging of infrared energy
EP0993736B1 (de) * 1997-07-07 2001-06-20 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Vorrichtung und verfahren zum erfassen eines optischen signals
US6274871B1 (en) * 1998-10-22 2001-08-14 Vysis, Inc. Method and system for performing infrared study on a biological sample
JP3436164B2 (ja) * 1999-01-07 2003-08-11 日産自動車株式会社 赤外線ラインセンサ
US6084727A (en) * 1999-04-28 2000-07-04 Raytheon Company All-reflective field-switching optical imaging system
US6483327B1 (en) * 1999-09-30 2002-11-19 Advanced Micro Devices, Inc. Quadrant avalanche photodiode time-resolved detection
US6784428B2 (en) * 2001-10-01 2004-08-31 Ud Technology Corporation Apparatus and method for real time IR spectroscopy

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11054365B2 (en) 2016-02-23 2021-07-06 Shimadzu Corporation Microscopic analysis device

Also Published As

Publication number Publication date
US20080135763A1 (en) 2008-06-12
EP1184703A1 (de) 2002-03-06
US20020033452A1 (en) 2002-03-21
US7378657B2 (en) 2008-05-27
JP2002188958A (ja) 2002-07-05
DE60044580D1 (de) 2010-08-05
EP1184703B1 (de) 2010-06-23

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Legal Events

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