JPS559146A - Tablet testing device - Google Patents

Tablet testing device

Info

Publication number
JPS559146A
JPS559146A JP8222578A JP8222578A JPS559146A JP S559146 A JPS559146 A JP S559146A JP 8222578 A JP8222578 A JP 8222578A JP 8222578 A JP8222578 A JP 8222578A JP S559146 A JPS559146 A JP S559146A
Authority
JP
Japan
Prior art keywords
signal
line
tablet
display
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8222578A
Other languages
Japanese (ja)
Inventor
Masaki Saka
Kimio Muto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pentel Co Ltd
Original Assignee
Pentel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pentel Co Ltd filed Critical Pentel Co Ltd
Priority to JP8222578A priority Critical patent/JPS559146A/en
Publication of JPS559146A publication Critical patent/JPS559146A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE: To make it possible to test a tablet in a short time with high precision, by connecting a drive circuit to the Y-line of a light-coupled tablet and connecting a detector circuit to its X-line, in information processing.
CONSTITUTION: Fixed drive signals are impressed successively from demultiplexer 2 on the signal line Y of a light-coupled tablet, which is provided with LED-D between the signal lines X and Y arranged in a matrix form. The signal line X is switched successively by multiplexer 3, and the fixed signal is detected. This detected signal is compared with the reference signal from generator 8 by comparator 5, and a display signal corresponding to a line-cut in each signal line is output. This display signal is fed to display 6, and thus tablet testing is operated.
COPYRIGHT: (C)1980,JPO&Japio
JP8222578A 1978-07-06 1978-07-06 Tablet testing device Pending JPS559146A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8222578A JPS559146A (en) 1978-07-06 1978-07-06 Tablet testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8222578A JPS559146A (en) 1978-07-06 1978-07-06 Tablet testing device

Publications (1)

Publication Number Publication Date
JPS559146A true JPS559146A (en) 1980-01-23

Family

ID=13768457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8222578A Pending JPS559146A (en) 1978-07-06 1978-07-06 Tablet testing device

Country Status (1)

Country Link
JP (1) JPS559146A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001053842A1 (en) * 2000-01-18 2001-07-26 Oht Inc. Method of inspecting passive-matrix liquid crystal panel and apparatus for inspecting the same, and method of inspecting plasma display panel and apparatus for inspecting the same
WO2002056038A1 (en) * 2000-12-27 2002-07-18 Oht Inc. Method for detecting short-circuit in circuit board, detecting jig used in the method, circuit board to be inspected, apparatus for detecting short-circuit in circuit board, and coil sensor for the inspection
US6459272B1 (en) 1999-05-24 2002-10-01 Nidec-Read Corporation Apparatus and method for inspecting wiring on board
JP2006071519A (en) * 2004-09-03 2006-03-16 Hioki Ee Corp Circuit board inspection method and circuit board inspection apparatus
KR100642000B1 (en) 2004-07-07 2006-11-06 엘지전자 주식회사 Light emitting device defect detection device
JP2012116349A (en) * 2010-12-01 2012-06-21 Ihi Corp Space floating object detector
JP2014238318A (en) * 2013-06-07 2014-12-18 日本電産リード株式会社 Inspection apparatus, inspection apparatus calibration method, and inspection method
JP2015152530A (en) * 2014-02-18 2015-08-24 日本電産リード株式会社 Inspecting apparatus and inspecting method for single-layer inspection object
JP2018160664A (en) * 2017-03-21 2018-10-11 聚積科技股▲ふん▼有限公司 Failure detection device, failure detection system, and failure detection method
JP2022520010A (en) * 2019-01-21 2022-03-28 エルジー イノテック カンパニー リミテッド Failure detector and its method

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6459272B1 (en) 1999-05-24 2002-10-01 Nidec-Read Corporation Apparatus and method for inspecting wiring on board
WO2001053842A1 (en) * 2000-01-18 2001-07-26 Oht Inc. Method of inspecting passive-matrix liquid crystal panel and apparatus for inspecting the same, and method of inspecting plasma display panel and apparatus for inspecting the same
WO2002056038A1 (en) * 2000-12-27 2002-07-18 Oht Inc. Method for detecting short-circuit in circuit board, detecting jig used in the method, circuit board to be inspected, apparatus for detecting short-circuit in circuit board, and coil sensor for the inspection
KR100642000B1 (en) 2004-07-07 2006-11-06 엘지전자 주식회사 Light emitting device defect detection device
JP2006071519A (en) * 2004-09-03 2006-03-16 Hioki Ee Corp Circuit board inspection method and circuit board inspection apparatus
JP2012116349A (en) * 2010-12-01 2012-06-21 Ihi Corp Space floating object detector
JP2014238318A (en) * 2013-06-07 2014-12-18 日本電産リード株式会社 Inspection apparatus, inspection apparatus calibration method, and inspection method
JP2015152530A (en) * 2014-02-18 2015-08-24 日本電産リード株式会社 Inspecting apparatus and inspecting method for single-layer inspection object
KR20150097417A (en) * 2014-02-18 2015-08-26 니혼덴산리드가부시키가이샤 Apparatus and method of inspecting object of single layer type
TWI681199B (en) * 2014-02-18 2020-01-01 日商日本電產理德股份有限公司 Inspection device and inspection method of single-layer inspection object
JP2018160664A (en) * 2017-03-21 2018-10-11 聚積科技股▲ふん▼有限公司 Failure detection device, failure detection system, and failure detection method
JP2022520010A (en) * 2019-01-21 2022-03-28 エルジー イノテック カンパニー リミテッド Failure detector and its method
JP2023100717A (en) * 2019-01-21 2023-07-19 エルジー イノテック カンパニー リミテッド FAILURE DETECTION DEVICE AND METHOD THEREOF
US12077063B2 (en) 2019-01-21 2024-09-03 Lg Innotek Co., Ltd. Apparatus for detecting malfunction and method therefor

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