ATE474692T1 - Ultraschallschweissverfahren zur herstellung eines polierkissens mit einem optisch transmissiven bereich - Google Patents
Ultraschallschweissverfahren zur herstellung eines polierkissens mit einem optisch transmissiven bereichInfo
- Publication number
- ATE474692T1 ATE474692T1 AT04753997T AT04753997T ATE474692T1 AT E474692 T1 ATE474692 T1 AT E474692T1 AT 04753997 T AT04753997 T AT 04753997T AT 04753997 T AT04753997 T AT 04753997T AT E474692 T1 ATE474692 T1 AT E474692T1
- Authority
- AT
- Austria
- Prior art keywords
- polishing pad
- optically transmissive
- ultrasonic welding
- producing
- welding process
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- 238000000034 method Methods 0.000 title abstract 2
- 238000003466 welding Methods 0.000 title abstract 2
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/12—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with apertures for inspecting the surface to be abraded
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/463,721 US6997777B2 (en) | 2003-06-17 | 2003-06-17 | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
| PCT/US2004/017289 WO2005000528A1 (en) | 2003-06-17 | 2004-06-03 | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE474692T1 true ATE474692T1 (de) | 2010-08-15 |
Family
ID=33517134
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT04753997T ATE474692T1 (de) | 2003-06-17 | 2004-06-03 | Ultraschallschweissverfahren zur herstellung eines polierkissens mit einem optisch transmissiven bereich |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US6997777B2 (de) |
| EP (1) | EP1638735B1 (de) |
| JP (2) | JP4908207B2 (de) |
| KR (1) | KR100913282B1 (de) |
| CN (1) | CN100467228C (de) |
| AT (1) | ATE474692T1 (de) |
| DE (1) | DE602004028245D1 (de) |
| MY (1) | MY132430A (de) |
| TW (1) | TWI286957B (de) |
| WO (1) | WO2005000528A1 (de) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD559064S1 (en) * | 2004-03-17 | 2008-01-08 | Jsr Corporation | Polishing pad |
| USD560457S1 (en) * | 2004-10-05 | 2008-01-29 | Jsr Corporation | Polishing pad |
| TWD111897S1 (zh) * | 2004-10-05 | 2006-07-11 | 股份有限公司 | 研磨用墊片 |
| USD559648S1 (en) * | 2004-10-05 | 2008-01-15 | Jsr Corporation | Polishing pad |
| USD559066S1 (en) | 2004-10-26 | 2008-01-08 | Jsr Corporation | Polishing pad |
| JP4620501B2 (ja) * | 2005-03-04 | 2011-01-26 | ニッタ・ハース株式会社 | 研磨パッド |
| JP2007118106A (ja) * | 2005-10-26 | 2007-05-17 | Toyo Tire & Rubber Co Ltd | 研磨パッド及びその製造方法 |
| US7942724B2 (en) * | 2006-07-03 | 2011-05-17 | Applied Materials, Inc. | Polishing pad with window having multiple portions |
| EP2244642A4 (de) * | 2008-02-20 | 2011-07-20 | Mayo Foundation | Systeme, vorrichtungen und verfahren für den zugang zu körpergewebe |
| CA2715895A1 (en) * | 2008-02-20 | 2009-08-27 | Mayo Foundation For Medical Education And Research | Ultrasound guided systems and methods |
| JP5133830B2 (ja) * | 2008-09-19 | 2013-01-30 | イビデン株式会社 | 基材の被覆方法 |
| DE102008059044B4 (de) * | 2008-11-26 | 2013-08-22 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe mit einer verspannt-relaxierten Si1-xGex-Schicht |
| JP5366606B2 (ja) * | 2009-03-25 | 2013-12-11 | シチズンホールディングス株式会社 | 時計用指針の製造方法 |
| US8129220B2 (en) | 2009-08-24 | 2012-03-06 | Hong Kong Polytechnic University | Method and system for bonding electrical devices using an electrically conductive adhesive |
| US9795404B2 (en) | 2009-12-31 | 2017-10-24 | Tenex Health, Inc. | System and method for minimally invasive ultrasonic musculoskeletal tissue treatment |
| US9017140B2 (en) | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
| KR101942100B1 (ko) * | 2010-07-07 | 2019-01-24 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 | 저결함성 창을 갖는 화학 기계 연마 패드 |
| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| CN101957491A (zh) * | 2010-08-24 | 2011-01-26 | 亚泰影像科技股份有限公司 | 透镜组的固定方法 |
| US8876983B2 (en) * | 2011-09-01 | 2014-11-04 | Ford Global Technologies, Llc | In-line cleaning method for ultrasonic welding tools |
| US9156125B2 (en) | 2012-04-11 | 2015-10-13 | Cabot Microelectronics Corporation | Polishing pad with light-stable light-transmitting region |
| US11406415B2 (en) | 2012-06-11 | 2022-08-09 | Tenex Health, Inc. | Systems and methods for tissue treatment |
| US9149291B2 (en) | 2012-06-11 | 2015-10-06 | Tenex Health, Inc. | Systems and methods for tissue treatment |
| US9962181B2 (en) | 2014-09-02 | 2018-05-08 | Tenex Health, Inc. | Subcutaneous wound debridement |
| US9763689B2 (en) | 2015-05-12 | 2017-09-19 | Tenex Health, Inc. | Elongated needles for ultrasonic applications |
| US9868185B2 (en) * | 2015-11-03 | 2018-01-16 | Cabot Microelectronics Corporation | Polishing pad with foundation layer and window attached thereto |
| KR101945878B1 (ko) | 2017-07-11 | 2019-02-11 | 에스케이씨 주식회사 | 연마층과 유사 경도를 갖는 윈도우를 포함하는 연마패드 |
| DE102017214778A1 (de) * | 2017-08-23 | 2019-02-28 | Sgl Carbon Se | Alternatives Fügeverfahren |
| JP7844617B2 (ja) * | 2021-07-06 | 2026-04-13 | アプライド マテリアルズ インコーポレイテッド | 化学機械研磨のための音響窓を含む研磨パッド |
| CN114196327A (zh) * | 2022-01-28 | 2022-03-18 | 淄博海泰新光光学技术有限公司 | 一种用于光学零件抛光的复合材料及制备方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5658408A (en) | 1992-04-21 | 1997-08-19 | Branson Ultrasonics Corporation | Method for processing workpieces by ultrasonic energy |
| US5855706A (en) | 1992-04-21 | 1999-01-05 | Branson Ultrasonics Corporation | Simultaneous amplitude and force profiling during ultrasonic welding of thermoplastic workpieces |
| US6106754A (en) * | 1994-11-23 | 2000-08-22 | Rodel Holdings, Inc. | Method of making polishing pads |
| US5893796A (en) | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US5605760A (en) | 1995-08-21 | 1997-02-25 | Rodel, Inc. | Polishing pads |
| WO1998010896A1 (en) | 1996-09-11 | 1998-03-19 | Minnesota Mining And Manufacturing Company | Abrasive article and method of making |
| JP3011113B2 (ja) * | 1996-11-15 | 2000-02-21 | 日本電気株式会社 | 基板の研磨方法及び研磨装置 |
| US6120352A (en) | 1997-03-06 | 2000-09-19 | Keltech Engineering | Lapping apparatus and lapping method using abrasive sheets |
| US6068539A (en) * | 1998-03-10 | 2000-05-30 | Lam Research Corporation | Wafer polishing device with movable window |
| US6179950B1 (en) * | 1999-02-18 | 2001-01-30 | Memc Electronic Materials, Inc. | Polishing pad and process for forming same |
| WO2000060650A1 (en) * | 1999-03-31 | 2000-10-12 | Nikon Corporation | Polishing body, polisher, method for adjusting polisher, method for measuring thickness of polished film or end point of polishing, method for producing semiconductor device |
| JP3367496B2 (ja) * | 2000-01-20 | 2003-01-14 | 株式会社ニコン | 研磨体、平坦化装置、半導体デバイス製造方法、および半導体デバイス |
| US6171181B1 (en) | 1999-08-17 | 2001-01-09 | Rodel Holdings, Inc. | Molded polishing pad having integral window |
| US6524164B1 (en) * | 1999-09-14 | 2003-02-25 | Applied Materials, Inc. | Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus |
| JP3259225B2 (ja) | 1999-12-27 | 2002-02-25 | 株式会社ニコン | 研磨状況モニタ方法及びその装置、研磨装置、プロセスウエハ、半導体デバイス製造方法、並びに半導体デバイス |
| US6569004B1 (en) * | 1999-12-30 | 2003-05-27 | Lam Research | Polishing pad and method of manufacture |
| US6685537B1 (en) * | 2000-06-05 | 2004-02-03 | Speedfam-Ipec Corporation | Polishing pad window for a chemical mechanical polishing tool |
| US6641471B1 (en) * | 2000-09-19 | 2003-11-04 | Rodel Holdings, Inc | Polishing pad having an advantageous micro-texture and methods relating thereto |
| GB0024070D0 (en) | 2000-10-02 | 2000-11-15 | Innavisions Ltd | Mpulding apparatus and method |
| JP2002170799A (ja) * | 2000-11-30 | 2002-06-14 | Nikon Corp | 測定装置、研磨状況モニタ装置、研磨装置、半導体デバイス製造方法、並びに半導体デバイス |
| US6612917B2 (en) * | 2001-02-07 | 2003-09-02 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
| US6632129B2 (en) * | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| JP4131632B2 (ja) * | 2001-06-15 | 2008-08-13 | 株式会社荏原製作所 | ポリッシング装置及び研磨パッド |
| JP2003133270A (ja) * | 2001-10-26 | 2003-05-09 | Jsr Corp | 化学機械研磨用窓材及び研磨パッド |
| JP2003163191A (ja) * | 2001-11-28 | 2003-06-06 | Tokyo Seimitsu Co Ltd | 機械化学的研磨装置用の研磨パッド |
| US6935922B2 (en) * | 2002-02-04 | 2005-08-30 | Kla-Tencor Technologies Corp. | Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing |
| DE10302320A1 (de) * | 2003-01-20 | 2004-07-29 | Wipak Walsrode Gmbh & Co.Kg | Wiederverschließbare Verpackung |
| JP2004327974A (ja) * | 2003-04-09 | 2004-11-18 | Jsr Corp | 研磨パッド、その製造法と製造用金型および半導体ウエハの研磨方法 |
-
2003
- 2003-06-17 US US10/463,721 patent/US6997777B2/en not_active Expired - Lifetime
-
2004
- 2004-06-03 DE DE602004028245T patent/DE602004028245D1/de not_active Expired - Lifetime
- 2004-06-03 CN CNB2004800167080A patent/CN100467228C/zh not_active Expired - Lifetime
- 2004-06-03 EP EP04753997A patent/EP1638735B1/de not_active Expired - Lifetime
- 2004-06-03 AT AT04753997T patent/ATE474692T1/de not_active IP Right Cessation
- 2004-06-03 WO PCT/US2004/017289 patent/WO2005000528A1/en not_active Ceased
- 2004-06-03 KR KR1020057024180A patent/KR100913282B1/ko not_active Expired - Lifetime
- 2004-06-03 JP JP2006517168A patent/JP4908207B2/ja not_active Expired - Fee Related
- 2004-06-04 TW TW093116248A patent/TWI286957B/zh not_active IP Right Cessation
- 2004-06-15 MY MYPI20042301A patent/MY132430A/en unknown
-
2010
- 2010-10-08 JP JP2010229045A patent/JP2011031392A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006527664A (ja) | 2006-12-07 |
| JP4908207B2 (ja) | 2012-04-04 |
| CN1805828A (zh) | 2006-07-19 |
| TWI286957B (en) | 2007-09-21 |
| EP1638735B1 (de) | 2010-07-21 |
| JP2011031392A (ja) | 2011-02-17 |
| US20040259483A1 (en) | 2004-12-23 |
| DE602004028245D1 (de) | 2010-09-02 |
| WO2005000528A1 (en) | 2005-01-06 |
| CN100467228C (zh) | 2009-03-11 |
| US6997777B2 (en) | 2006-02-14 |
| KR20060010843A (ko) | 2006-02-02 |
| TW200526355A (en) | 2005-08-16 |
| KR100913282B1 (ko) | 2009-08-21 |
| MY132430A (en) | 2007-10-31 |
| EP1638735A1 (de) | 2006-03-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |