ATE475103T1 - Vorrichtung zum evaluieren einer verzögerung einer eingangs-/ausgangsschaltung - Google Patents

Vorrichtung zum evaluieren einer verzögerung einer eingangs-/ausgangsschaltung

Info

Publication number
ATE475103T1
ATE475103T1 AT06842580T AT06842580T ATE475103T1 AT E475103 T1 ATE475103 T1 AT E475103T1 AT 06842580 T AT06842580 T AT 06842580T AT 06842580 T AT06842580 T AT 06842580T AT E475103 T1 ATE475103 T1 AT E475103T1
Authority
AT
Austria
Prior art keywords
input
output circuit
buffer
inv
electronic device
Prior art date
Application number
AT06842580T
Other languages
English (en)
Inventor
Mukesh Nair
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE475103T1 publication Critical patent/ATE475103T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
    • H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Computing Systems (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Networks Using Active Elements (AREA)
AT06842580T 2005-12-21 2006-12-18 Vorrichtung zum evaluieren einer verzögerung einer eingangs-/ausgangsschaltung ATE475103T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05112655 2005-12-21
PCT/IB2006/054919 WO2007072398A2 (en) 2005-12-21 2006-12-18 Method of evaluating a delay of an input/output circuit and corresponding device

Publications (1)

Publication Number Publication Date
ATE475103T1 true ATE475103T1 (de) 2010-08-15

Family

ID=38110760

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06842580T ATE475103T1 (de) 2005-12-21 2006-12-18 Vorrichtung zum evaluieren einer verzögerung einer eingangs-/ausgangsschaltung

Country Status (7)

Country Link
US (1) US7772875B2 (de)
EP (1) EP1977261B1 (de)
JP (1) JP2009521124A (de)
CN (1) CN101341417A (de)
AT (1) ATE475103T1 (de)
DE (1) DE602006015703D1 (de)
WO (1) WO2007072398A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102169515B (zh) * 2010-02-26 2014-04-16 国际商业机器公司 一种专用集成电路中时钟树延迟时间的估计方法和系统
EP2608411B1 (de) 2011-12-22 2020-03-11 Nxp B.V. Schaltkreis
CN111077438B (zh) * 2018-10-22 2021-11-12 中芯国际集成电路制造(北京)有限公司 I/o接口延迟时间测试电路

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4795964A (en) * 1986-08-01 1989-01-03 Texas Instruments Incorporated Method and apparatus for measuring the capacitance of complementary field-effect transistor devices
JPH01240878A (ja) * 1988-03-23 1989-09-26 Fujitsu Ltd 集積回路の評価装置
US5448181A (en) * 1992-11-06 1995-09-05 Xilinx, Inc. Output buffer circuit having reduced switching noise
US5438278A (en) * 1993-09-28 1995-08-01 Advanced Micro Devices, Inc. High speed CMOS output buffer circuit minimizes propagation delay and crowbar current
JP3311133B2 (ja) * 1994-02-16 2002-08-05 株式会社東芝 出力回路
US6236237B1 (en) * 1998-02-27 2001-05-22 Altera Corporation Output buffer predriver with edge compensation
JP2000183719A (ja) * 1998-12-11 2000-06-30 Nec Corp 入力回路、出力回路及び入出力回路、並びに該入出力回路を備えた信号伝送システム
JP2001091568A (ja) * 1999-09-17 2001-04-06 Advantest Corp 半導体集積回路の試験装置及び試験方法
JP3487281B2 (ja) * 2000-10-18 2004-01-13 セイコーエプソン株式会社 半導体装置及びそのテスト方法

Also Published As

Publication number Publication date
US20080272799A1 (en) 2008-11-06
EP1977261B1 (de) 2010-07-21
CN101341417A (zh) 2009-01-07
DE602006015703D1 (de) 2010-09-02
US7772875B2 (en) 2010-08-10
WO2007072398A3 (en) 2007-10-25
WO2007072398A2 (en) 2007-06-28
JP2009521124A (ja) 2009-05-28
EP1977261A2 (de) 2008-10-08

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties