ATE475864T1 - Vorrichtung und verfahren zum automatischen bestimmen der position eines messarms anhand einer anordnung von referenzpunkten - Google Patents

Vorrichtung und verfahren zum automatischen bestimmen der position eines messarms anhand einer anordnung von referenzpunkten

Info

Publication number
ATE475864T1
ATE475864T1 AT02762147T AT02762147T ATE475864T1 AT E475864 T1 ATE475864 T1 AT E475864T1 AT 02762147 T AT02762147 T AT 02762147T AT 02762147 T AT02762147 T AT 02762147T AT E475864 T1 ATE475864 T1 AT E475864T1
Authority
AT
Austria
Prior art keywords
reference points
measuring device
location
measuring arm
rows
Prior art date
Application number
AT02762147T
Other languages
English (en)
Inventor
Homer L Eaton
Original Assignee
Hexagon Metrology Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Ab filed Critical Hexagon Metrology Ab
Application granted granted Critical
Publication of ATE475864T1 publication Critical patent/ATE475864T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Semiconductor Memories (AREA)
  • Magnetic Heads (AREA)
  • Body Structure For Vehicles (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Control Of Position Or Direction (AREA)
AT02762147T 2001-04-17 2002-04-17 Vorrichtung und verfahren zum automatischen bestimmen der position eines messarms anhand einer anordnung von referenzpunkten ATE475864T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/836,954 US6598306B2 (en) 2001-04-17 2001-04-17 Self-loading spatial reference point array
PCT/US2002/012318 WO2002084209A1 (en) 2001-04-17 2002-04-17 Self-loading spatial reference point array

Publications (1)

Publication Number Publication Date
ATE475864T1 true ATE475864T1 (de) 2010-08-15

Family

ID=25273127

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02762147T ATE475864T1 (de) 2001-04-17 2002-04-17 Vorrichtung und verfahren zum automatischen bestimmen der position eines messarms anhand einer anordnung von referenzpunkten

Country Status (7)

Country Link
US (1) US6598306B2 (de)
EP (1) EP1390688B1 (de)
JP (1) JP3943030B2 (de)
CN (1) CN1314939C (de)
AT (1) ATE475864T1 (de)
DE (1) DE60237150D1 (de)
WO (1) WO2002084209A1 (de)

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Also Published As

Publication number Publication date
US6598306B2 (en) 2003-07-29
DE60237150D1 (de) 2010-09-09
CN1554011A (zh) 2004-12-08
US20030066202A1 (en) 2003-04-10
EP1390688B1 (de) 2010-07-28
JP2004527750A (ja) 2004-09-09
WO2002084209A1 (en) 2002-10-24
JP3943030B2 (ja) 2007-07-11
CN1314939C (zh) 2007-05-09
HK1072463A1 (en) 2005-08-26
EP1390688A1 (de) 2004-02-25
EP1390688A4 (de) 2007-07-18

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