ATE476088T1 - Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten - Google Patents

Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten

Info

Publication number
ATE476088T1
ATE476088T1 AT02798480T AT02798480T ATE476088T1 AT E476088 T1 ATE476088 T1 AT E476088T1 AT 02798480 T AT02798480 T AT 02798480T AT 02798480 T AT02798480 T AT 02798480T AT E476088 T1 ATE476088 T1 AT E476088T1
Authority
AT
Austria
Prior art keywords
ray
ray source
analysis
ray tube
application
Prior art date
Application number
AT02798480T
Other languages
English (en)
Inventor
Ian Radley
Thomas Bievenue
John Burdett
Brian Gallagher
Stuart Shakshober
Zewu Chen
Michael Moore
Original Assignee
X Ray Optical Sys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/206,531 external-priority patent/US6781060B2/en
Application filed by X Ray Optical Sys Inc filed Critical X Ray Optical Sys Inc
Application granted granted Critical
Publication of ATE476088T1 publication Critical patent/ATE476088T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/12—Cooling
    • H01J2235/1225—Cooling characterised by method
    • H01J2235/1291—Thermal conductivity
    • H01J2235/1295—Contact between conducting bodies

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Luminescent Compositions (AREA)
AT02798480T 2001-12-04 2002-12-04 Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten ATE476088T1 (de)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US33658401P 2001-12-04 2001-12-04
US38399002P 2002-05-29 2002-05-29
US39896602P 2002-07-26 2002-07-26
US39896802P 2002-07-26 2002-07-26
US39896502P 2002-07-26 2002-07-26
US10/206,531 US6781060B2 (en) 2002-07-26 2002-07-26 Electrical connector, a cable sleeve, and a method for fabricating an electrical connection
PCT/US2002/038493 WO2003049510A2 (en) 2001-12-04 2002-12-04 X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof

Publications (1)

Publication Number Publication Date
ATE476088T1 true ATE476088T1 (de) 2010-08-15

Family

ID=27558986

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02798480T ATE476088T1 (de) 2001-12-04 2002-12-04 Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten

Country Status (8)

Country Link
US (3) US7072439B2 (de)
EP (1) EP1454513B1 (de)
JP (2) JP4999256B2 (de)
CN (2) CN100336422C (de)
AT (1) ATE476088T1 (de)
AU (3) AU2002357069A1 (de)
DE (1) DE60237168D1 (de)
WO (3) WO2003049138A2 (de)

Families Citing this family (133)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE476088T1 (de) * 2001-12-04 2010-08-15 X Ray Optical Sys Inc Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten
KR20040098687A (ko) * 2003-05-15 2004-11-26 삼성전자주식회사 접합 공정의 실시간 모니터링 시스템 및 그 방법
JP2007501503A (ja) * 2003-08-04 2007-01-25 エックス−レイ オプティカル システムズ インコーポレーテッド 管電力調節および遠隔較正を使用して出力安定性が向上したｘ線源アセンブリ
FI20031753L (fi) 2003-12-01 2005-06-02 Metorex Internat Oy Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten
US7286644B2 (en) * 2004-04-28 2007-10-23 Varian Medical Systems Technologies, Inc. Systems, methods and devices for x-ray device focal spot control
DE102004025119B4 (de) * 2004-05-21 2012-08-02 Siemens Ag Röntgenstrahler
FR2882886B1 (fr) * 2005-03-02 2007-11-23 Commissariat Energie Atomique Source monochromatique de rayons x et microscope a rayons x mettant en oeuvre une telle source
US20060228238A1 (en) * 2005-04-06 2006-10-12 Andrews Gregory C Coolant pump for x-ray device
WO2007016484A2 (en) 2005-08-01 2007-02-08 The Research Foundation Of State University Of New York X-ray imaging systems employing point-focusing, curved monochromating optics
DE602005012824D1 (de) * 2005-08-22 2009-04-02 Unisantis Fze Vorrichtung und Verfahren zum Positionieren einer Röntgenlinse und Röntgengerät mit einer solchen Vorrichtung
JP4954525B2 (ja) * 2005-10-07 2012-06-20 浜松ホトニクス株式会社 Ｘ線管
US20100189222A1 (en) * 2006-02-16 2010-07-29 Steller Micro Devices Panoramic irradiation system using flat panel x-ray sources
US20070189459A1 (en) * 2006-02-16 2007-08-16 Stellar Micro Devices, Inc. Compact radiation source
US9324535B2 (en) * 2006-02-16 2016-04-26 Stellarray, Incorporaated Self contained irradiation system using flat panel X-ray sources
US20100189223A1 (en) * 2006-02-16 2010-07-29 Steller Micro Devices Digitally addressed flat panel x-ray sources
JP4559377B2 (ja) * 2006-03-23 2010-10-06 株式会社ジョブ Ｘ線発生装置
US7599469B2 (en) * 2006-04-28 2009-10-06 Cameron International Corporation Non-intrusive pressure gage
US7409037B2 (en) * 2006-05-05 2008-08-05 Oxford Instruments Analytical Oy X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
JP5102549B2 (ja) * 2006-07-14 2012-12-19 独立行政法人科学技術振興機構 Ｘ線分析装置及びｘ線分析方法
US20080037706A1 (en) * 2006-08-08 2008-02-14 Panalytical B.V. Device and method for performing X-ray analysis
DE102006062452B4 (de) * 2006-12-28 2008-11-06 Comet Gmbh Röntgenröhre und Verfahren zur Prüfung eines Targets einer Röntgenröhre
SE532723C2 (sv) * 2007-05-03 2010-03-23 Lars Lantto Anordning för alstring av röntgenstrålning med stort reellt fokus och behovsanpassat virtuellt fokus
JP5196872B2 (ja) * 2007-05-28 2013-05-15 株式会社東芝 Ｘ線管用高電圧コネクタ
US7629593B2 (en) * 2007-06-28 2009-12-08 Asml Netherlands B.V. Lithographic apparatus, radiation system, device manufacturing method, and radiation generating method
FR2918501B1 (fr) 2007-07-02 2009-11-06 Xenocs Soc Par Actions Simplif Dispositif de delivrance d'un faisceau de rayons x a haute energie
US9305735B2 (en) 2007-09-28 2016-04-05 Brigham Young University Reinforced polymer x-ray window
JP5414167B2 (ja) * 2007-11-02 2014-02-12 株式会社東芝 Ｘ線管装置
US7742566B2 (en) * 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
FR2926924B1 (fr) * 2008-01-25 2012-10-12 Thales Sa Source radiogene comprenant au moins une source d'electrons associee a un dispositif photoelectrique de commande
WO2009108628A2 (en) * 2008-02-25 2009-09-03 X-Ray Optical Systems, Inc. Sample module with sample stream spaced from window, for x-ray analysis system
CA2753990C (en) * 2008-03-05 2017-11-21 X-Ray Optical Systems, Inc. Xrf system having multiple excitation energy bands in highly aligned package
WO2009126868A1 (en) * 2008-04-11 2009-10-15 Rigaku Innovative Technologies, Inc. X-ray generator with polycapillary optic
JP5678250B2 (ja) * 2008-05-09 2015-02-25 コーニンクレッカ フィリップス エヌ ヴェ アノードの焦点スポットを放射する少なくとも一つのｘ線放射線の並進及び／又は回転変位の動きを固定基準位置に対して実施するための集積アクチュエータ手段と、放射されたｘ線ビームの結果的な平行及び／又は角度シフトを補償するための手段とを具備するｘ線診断システム
FR2939896B1 (fr) * 2008-12-12 2011-05-06 Geoservices Equipements Dispositif d'emission d'un premier faisceau de photons gamma de haute energie et d'un deuxieme faisceau de photons gamma de plus basse energie, ensemble de mesure et procede associe
US8080791B2 (en) * 2008-12-12 2011-12-20 Fei Company X-ray detector for electron microscope
CN102307527B (zh) * 2009-02-10 2013-08-21 皇家飞利浦电子股份有限公司 用于显示x射线图像的医学查看系统
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
JP5740078B2 (ja) * 2009-03-06 2015-06-24 株式会社東芝 Ｘ線管装置
WO2011100222A2 (en) * 2010-02-09 2011-08-18 X-Ray Optical Systems, Inc. Sample module with sample stream supported and spaced from window, for x-ray analysis system
US9244026B2 (en) 2010-02-10 2016-01-26 Schlumberger Norge As X-ray fluorescence analyzer
MY178416A (en) * 2010-02-10 2020-10-12 Schlumberger Norge As Automated drilling fluid analyzer
US8223925B2 (en) 2010-04-15 2012-07-17 Bruker Axs Handheld, Inc. Compact collimating device
JP2013528804A (ja) * 2010-05-19 2013-07-11 シルヴァー，エリック，エイチ ハイブリッドｘ線光学機器および方法
US9599577B2 (en) 2010-09-06 2017-03-21 Koninklijke Philips N.V. X-ray imaging with pixelated detector
US8526574B2 (en) * 2010-09-24 2013-09-03 Moxtek, Inc. Capacitor AC power coupling across high DC voltage differential
WO2012177472A2 (en) * 2011-06-20 2012-12-27 X-Ray Optical Systems, Inc. Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof
JP2013020792A (ja) * 2011-07-11 2013-01-31 Canon Inc 放射線発生装置及びそれを用いた放射線撮影装置
EP2740127B1 (de) 2011-08-06 2017-11-29 Rigaku Innovative Technologies, Inc. Nanoröhrchenbasierte vorrichtung zum lenken von röntgenphotonen und neutronen
JP6084222B2 (ja) 2011-08-15 2017-02-22 エックス−レイ オプティカル システムズ インコーポレーテッド 重質試料用の試料粘度／流量制御およびそのｘ線分析応用
DE102011083729A1 (de) * 2011-09-29 2013-04-04 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Bestimmung des Verschleißes einer Röntgenanode
WO2013051594A1 (ja) * 2011-10-04 2013-04-11 株式会社ニコン Ｘ線装置、ｘ線照射方法、及び構造物の製造方法
CN103946693B (zh) 2011-10-06 2017-05-03 X射线光学系统公司 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置
EP3168606A1 (de) 2011-10-26 2017-05-17 X-Ray Optical Systems, Inc. Röntgenmonochromator und halterung
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
CN102595754B (zh) * 2012-01-06 2015-05-13 同方威视技术股份有限公司 辐射器件安装箱、油冷循环系统以及x射线发生器
CN103414050A (zh) * 2012-02-14 2013-11-27 通用电气传感与检测科技股份有限公司 用于高电压电缆的高电压连接器组件、高电压连接器、以及制造高电压连接器组件的方法
JP6468844B2 (ja) * 2012-02-28 2019-02-13 エックス−レイ オプティカル システムズ インコーポレーテッド Ｘ線管陽極および単色化光学部品を使用して複数の励起エネルギー帯が生成されるｘ線分析器
EP2690645A1 (de) * 2012-07-26 2014-01-29 Agilent Technologies, Inc. Gespanntes flaches Elektronenemitterband
GB201213789D0 (en) 2012-08-02 2012-09-12 Commw Scient Ind Res Org An X-ray fluorescence analyser
CN103635002B (zh) * 2012-08-21 2016-03-16 同方威视技术股份有限公司 一体式飞点x光机
CN104662644B (zh) * 2012-09-27 2018-11-27 斯克林集团公司 处理液供给装置及方法、处理液及基板处理装置及方法
US9068927B2 (en) * 2012-12-21 2015-06-30 General Electric Company Laboratory diffraction-based phase contrast imaging technique
CN103175857B (zh) * 2013-03-14 2015-06-03 中国科学院高能物理研究所 专用于掠入射xafs实验的装置及其调整方法
JP6082634B2 (ja) 2013-03-27 2017-02-15 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
JP6081260B2 (ja) * 2013-03-28 2017-02-15 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
US9173623B2 (en) 2013-04-19 2015-11-03 Samuel Soonho Lee X-ray tube and receiver inside mouth
JP2014232579A (ja) * 2013-05-28 2014-12-11 株式会社日立メディコ Ｘ線管装置
US9883793B2 (en) 2013-08-23 2018-02-06 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
CN103731966B (zh) * 2014-01-03 2015-12-30 中国原子能科学研究院 一体化荧光发生装置
USD727507S1 (en) * 2014-01-17 2015-04-21 Kabushiki Kaisha Toshiba X-ray tube for medical device
USD726920S1 (en) * 2014-01-17 2015-04-14 Kabushiki Kaisha Toshiba X-ray tube for medical device
USD726922S1 (en) * 2014-01-17 2015-04-14 Kabushiki Kaisha Toshiba X-ray tube for medical device
USD726921S1 (en) * 2014-01-17 2015-04-14 Kabushiki Kaisha Toshiba X-ray tube for medical device
USD727508S1 (en) * 2014-01-17 2015-04-21 Kabushiki Kaisha Toshiba X-ray tube for medical device
USD750783S1 (en) * 2014-02-19 2016-03-01 Rigaku Corporation X-ray residual stress measuring instrument
JP6328451B2 (ja) * 2014-03-17 2018-05-23 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置及びその制御方法
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
JP6320898B2 (ja) * 2014-10-27 2018-05-09 株式会社日立ハイテクサイエンス Ｘ線発生源及び蛍光ｘ線分析装置
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
CN105126808A (zh) * 2015-07-03 2015-12-09 河海大学 一种氧化铝担载型二氧化铈粉体材料的制备方法
JP2017037774A (ja) 2015-08-10 2017-02-16 東芝電子管デバイス株式会社 Ｘ線管、ｘ線管装置、及びｘ線管装置の製造方法
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN105204059B (zh) * 2015-09-11 2017-12-15 中国工程物理研究院激光聚变研究中心 一种局部区域软x射线辐射流定量测量装置与测量方法
US10178748B1 (en) * 2016-06-20 2019-01-08 Moxtek, Inc. X-ray spot stability
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
EP3416181A1 (de) * 2017-06-15 2018-12-19 Koninklijke Philips N.V. Röntgenstrahlquelle und verfahren zur herstellung einer röntgenstrahlquelle
CN107228871B (zh) * 2017-07-21 2023-07-04 中国地质大学（武汉） 一种便携式x射线分析装置
WO2019027761A1 (en) * 2017-07-31 2019-02-07 Sigray, Inc. SPECTROMETER SYSTEM WITH X-RAY TRANSMISSION
EP3462150A1 (de) * 2017-09-27 2019-04-03 Rolls-Royce Corporation Temperaturbestimmung unter verwendung von strahlungsdiffraktion
CN109725343A (zh) * 2017-10-27 2019-05-07 曲阜师范大学 离轴抛线型x射线平行弯晶谱仪装置
CN108088862B (zh) * 2018-02-09 2023-05-23 丹东市祯晟科技有限公司 一种无线集成化x射线探伤机控制系统
US10502701B2 (en) * 2018-03-30 2019-12-10 General Electric Company Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7048396B2 (ja) 2018-04-12 2022-04-05 浜松ホトニクス株式会社 Ｘ線管
CA3097466A1 (en) 2018-04-20 2019-10-24 Outotec (Finland) Oy X-ray fluorescence analyzer, and a method for performing x-ray fluorescence analysis
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN109029310B (zh) * 2018-08-10 2021-07-30 深圳市善时仪器有限公司 一种高性能微焦点x射线测厚仪
US11644431B2 (en) * 2018-08-17 2023-05-09 Microtrace Pty Limited X-ray fluoresence apparatus for a measurement of mineral slurries
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
JP7270637B2 (ja) 2018-10-25 2023-05-10 株式会社堀場製作所 Ｘ線分析装置及びｘ線発生ユニット
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
JP7640682B2 (ja) 2020-09-17 2025-03-05 シグレイ、インコーポレイテッド Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
KR102927910B1 (ko) 2020-12-07 2026-02-19 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
JP7659168B2 (ja) * 2021-03-16 2025-04-09 株式会社不二越 Ｘ線回折測定装置
US11701072B2 (en) * 2021-04-02 2023-07-18 AlxSCAN, Inc. Modular X-ray source and method of X-ray source tube replacement for motion compensated tomosynthesis imaging system
GB202106959D0 (en) * 2021-05-14 2021-06-30 Malvern Panalytical Bv Apparatus and method for x-ray fluorescence analysis
US11892421B2 (en) 2021-12-06 2024-02-06 Schlumberger Technology Corporation System and method for cleaning electrical stability probe
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE102022202726B4 (de) 2022-03-21 2024-02-15 Siemens Healthcare Gmbh Röntgenhochspannungsgenerator mit einem Zwei-Phasen-Kühlsystem
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
US12247934B2 (en) 2022-07-29 2025-03-11 X-Ray Optical Systems, Inc. Polarized, energy dispersive x-ray fluorescence system and method
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Family Cites Families (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE692555C (de) * 1933-10-20 1940-06-21 Ernst Pohl Wassergekuehlte hochspannungs- und strahlensichere Roentgenroehre mit an Hochspannung liegender Anode
US2121630A (en) * 1936-05-11 1938-06-21 Gen Electric X Ray Corp X-ray apparatus
US2825816A (en) * 1952-11-13 1958-03-04 Machlett Lab Inc System for maintaining constant quantity rate and constant quality of x-radiation from an x-ray generator
US2831977A (en) * 1954-03-11 1958-04-22 California Inst Of Techn Low angle x-ray diffraction
US3246146A (en) * 1963-07-11 1966-04-12 Ass Elect Ind Apparatus for the X-ray analysis of a liquid suspension of specimen material
US4039811A (en) * 1975-03-21 1977-08-02 Sybron Corporation Method of operating and power supply for x-ray tubes
JPS5391A (en) * 1976-06-23 1978-01-05 Seiko Instr & Electronics Ltd Agc circuit for x-ray generator
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
US4355410A (en) * 1980-10-27 1982-10-19 X-Ray Manufacturing & Supply, Inc. Industrial X-ray machine
JPS5879900U (ja) * 1981-11-18 1983-05-30 株式会社東芝 回転陽極形ｘ線管装置
JPS58111000U (ja) * 1982-01-25 1983-07-28 セイコーインスツルメンツ株式会社 Ｘ線管放射軸調整装置
US4674109A (en) * 1984-09-29 1987-06-16 Kabushiki Kaisha Toshiba Rotating anode x-ray tube device
US4694480A (en) * 1985-07-30 1987-09-15 Kevex Corporation Hand held precision X-ray source
US4810776A (en) * 1986-07-14 1989-03-07 Ciba-Geigy Corporation Process for producing epoxy resin having a low-EHC-content from chlorine-substituted crude epoxy resin of high EHC-content and apparatus for automatically controlling such process
DE3785763T2 (de) * 1986-08-15 1993-10-21 Commw Scient Ind Res Org Instrumente zur konditionierung von röntgen- oder neutronenstrahlen.
US4891829A (en) * 1986-11-19 1990-01-02 Exxon Research And Engineering Company Method and apparatus for utilizing an electro-optic detector in a microtomography system
DE8704182U1 (de) * 1987-03-20 1987-07-09 Siemens AG, 1000 Berlin und 8000 München Computertomograph
US4916721A (en) * 1987-08-05 1990-04-10 The United States Of America As Represented By The United States Department Of Energy Normal incidence X-ray mirror for chemical microanalysis
US4964148A (en) * 1987-11-30 1990-10-16 Meicor, Inc. Air cooled metal ceramic x-ray tube construction
GB2214769A (en) * 1988-03-04 1989-09-06 Le N Proizv Ob Burevestnik Multichannel x-ray spectrometer
US4930145A (en) * 1988-08-15 1990-05-29 General Electric Company X-ray exposure regulator
JPH0291200U (de) * 1988-12-28 1990-07-19
US5012499A (en) * 1989-10-19 1991-04-30 Hughes Aircraft Company γ-ray detecting device using dislocation-free crystal
US4979199A (en) * 1989-10-31 1990-12-18 General Electric Company Microfocus X-ray tube with optical spot size sensing means
EP0426897B1 (de) * 1989-11-09 1993-10-13 Siemens Aktiengesellschaft Röngenstrahler
US5281822A (en) * 1990-07-11 1994-01-25 Mcdonnell Douglas Corporation Advanced neutron detector
US5497008A (en) * 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
US5177774A (en) * 1991-08-23 1993-01-05 Trustees Of Princeton University Reflection soft X-ray microscope and method
US5581591A (en) * 1992-01-06 1996-12-03 Picker International, Inc. Focal spot motion control for rotating housing and anode/stationary cathode X-ray tubes
US5461654A (en) * 1992-04-07 1995-10-24 Grodzins; Lee X-ray fluorescence detector
JPH05329143A (ja) * 1992-06-01 1993-12-14 Toshiba Corp Ｃｔスキャナ
US5272618A (en) * 1992-07-23 1993-12-21 General Electric Company Filament current regulator for an X-ray system
JPH08136480A (ja) * 1994-11-11 1996-05-31 Dkk Corp 油中硫黄分測定装置
US5550889A (en) * 1994-11-28 1996-08-27 General Electric Alignment of an x-ray tube focal spot using a deflection coil
JP3628749B2 (ja) * 1995-03-17 2005-03-16 株式会社東芝 Ｘ線管制御装置
US5650635A (en) * 1995-07-14 1997-07-22 Northwestern University Multiple stacked Sb-based heterostructures
WO1997011494A1 (en) * 1995-09-19 1997-03-27 Astralux, Incorporated X-ray detector
DE19540195C2 (de) * 1995-10-30 2000-01-20 Fraunhofer Ges Forschung Verfahren der Röntgenfluoreszenzmikroskopie
US5693948A (en) * 1995-11-21 1997-12-02 Loral Fairchild Corporation Advanced CCD-based x-ray image sensor system
US5778039A (en) * 1996-02-21 1998-07-07 Advanced Micro Devices, Inc. Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)
JPH1064695A (ja) * 1996-08-21 1998-03-06 Rigaku Corp Ｘ線発生装置及びそれを用いたｘ線装置
US5982847A (en) * 1996-10-28 1999-11-09 Utah State University Compact X-ray fluorescence spectrometer for real-time wear metal analysis of lubrucating oils
JP2885398B2 (ja) * 1997-04-01 1999-04-19 株式会社東芝 Ｘ線装置
DE69727370T2 (de) * 1997-06-11 2004-12-09 Istituto Nazionale Di Fisica Nucleare Mehrstufiger Diffraktor hergestellt mit konstantem Stufenbreite Winkel (mehrstufiger Monochromator)
JP4043571B2 (ja) * 1997-12-04 2008-02-06 浜松ホトニクス株式会社 Ｘ線管
DE19810346C1 (de) * 1998-03-10 1999-10-07 Siemens Ag Röntgenröhre und deren Verwendung
DE19820321B4 (de) * 1998-05-07 2004-09-16 Bruker Axs Gmbh Kompaktes Röntgenspektrometer
DE19820861B4 (de) * 1998-05-09 2004-09-16 Bruker Axs Gmbh Simultanes Röntgenfluoreszenz-Spektrometer
JP3062685B2 (ja) * 1998-07-23 2000-07-12 セイコーインスツルメンツ株式会社 蛍光ｘ線分析計
US6206565B1 (en) * 1998-08-19 2001-03-27 General Electric Company Continuous conditioning of dielectric fluid in an x-ray tube
FR2784261B1 (fr) * 1998-10-05 2001-07-27 Ge Medical Syst Sa Materiau d'isolation electrique et de refroidissement de conductivite thermique accrue et application a l'isolation d'un dispositif d'alimentation haute tension
US6185276B1 (en) * 1999-02-02 2001-02-06 Thermal Corp. Collimated beam x-ray tube
US6498830B2 (en) * 1999-02-12 2002-12-24 David B. Wittry Method and apparatus for fabricating curved crystal x-ray optics
DE19932275B4 (de) * 1999-07-06 2005-08-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Röntgenfluoreszenzanalyse
US6345086B1 (en) * 1999-09-14 2002-02-05 Veeco Instruments Inc. X-ray fluorescence system and method
US6361208B1 (en) * 1999-11-26 2002-03-26 Varian Medical Systems Mammography x-ray tube having an integral housing assembly
JP2001281345A (ja) * 2000-03-31 2001-10-10 Fuji Photo Film Co Ltd エネルギー線検出装置およびその温度調整方法
IL140025A0 (en) * 2000-11-30 2002-02-10 Medirad I R T Ltd X-ray tube with fluid cooling
DE10143668C1 (de) * 2001-09-06 2003-04-03 Instrumentarium Imaging Ziehm Halterung für eine Röntgenröhre einer Röntgendiagnostikeinrichtung
ATE476088T1 (de) * 2001-12-04 2010-08-15 X Ray Optical Sys Inc Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten
DE10159828B4 (de) * 2001-12-06 2007-09-20 Rigaku Industrial Corporation, Takatsuki Röntgenfluoreszenzspektrometer
US6668039B2 (en) * 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis

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AU2002357069A8 (en) 2003-06-17
AU2002364525A8 (en) 2003-06-17
US7072439B2 (en) 2006-07-04
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WO2003048745A3 (en) 2004-02-12
US20050041773A1 (en) 2005-02-24
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US20050031073A1 (en) 2005-02-10
JP4999256B2 (ja) 2012-08-15
US7209545B2 (en) 2007-04-24
WO2003049138A3 (en) 2004-04-15
JP2005512288A (ja) 2005-04-28
JP2011071120A (ja) 2011-04-07
WO2003049510A3 (en) 2004-01-22
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AU2002357069A1 (en) 2003-06-17
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