ATE477585T1 - Vorrichtung und verfahren zur stromversorgung einer elektronenquelle und elektronenquelle mit sekundäremission unter ionenbombardierung - Google Patents

Vorrichtung und verfahren zur stromversorgung einer elektronenquelle und elektronenquelle mit sekundäremission unter ionenbombardierung

Info

Publication number
ATE477585T1
ATE477585T1 AT08290026T AT08290026T ATE477585T1 AT E477585 T1 ATE477585 T1 AT E477585T1 AT 08290026 T AT08290026 T AT 08290026T AT 08290026 T AT08290026 T AT 08290026T AT E477585 T1 ATE477585 T1 AT E477585T1
Authority
AT
Austria
Prior art keywords
electron source
generating unit
pulse
secondary emission
bombardation
Prior art date
Application number
AT08290026T
Other languages
English (en)
Inventor
Maxime Makarov
Original Assignee
Excico Group
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39494285&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE477585(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Excico Group filed Critical Excico Group
Application granted granted Critical
Publication of ATE477585T1 publication Critical patent/ATE477585T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00Details of electron-optical or ion-optical arrangements common to two or more basic types of discharge tubes or lamps
    • H01J3/02Electron guns
    • H01J3/021Electron guns using a field emission, photo emission, or secondary emission electron source
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/20Ion sources; Ion guns using particle beam bombardment, e.g. ionisers
    • H01J27/205Ion sources; Ion guns using particle beam bombardment, e.g. ionisers with electrons, e.g. electron impact ionisation, electron attachment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J33/00Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26Electron or ion microscopes
    • H01J2237/262Non-scanning techniques
    • H01J2237/2623Field-emission microscopes
    • H01J2237/2626Pulsed source

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Sources, Ion Sources (AREA)
AT08290026T 2008-01-11 2008-01-11 Vorrichtung und verfahren zur stromversorgung einer elektronenquelle und elektronenquelle mit sekundäremission unter ionenbombardierung ATE477585T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP08290026A EP2079092B1 (de) 2008-01-11 2008-01-11 Vorrichtung und Verfahren zur Stromversorgung einer Elektronenquelle und Elektronenquelle mit Sekundäremission unter Ionenbombardierung

Publications (1)

Publication Number Publication Date
ATE477585T1 true ATE477585T1 (de) 2010-08-15

Family

ID=39494285

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08290026T ATE477585T1 (de) 2008-01-11 2008-01-11 Vorrichtung und verfahren zur stromversorgung einer elektronenquelle und elektronenquelle mit sekundäremission unter ionenbombardierung

Country Status (9)

Country Link
US (1) US8664863B2 (de)
EP (1) EP2079092B1 (de)
JP (1) JP5340309B2 (de)
KR (1) KR20100134558A (de)
CN (1) CN101952927B (de)
AT (1) ATE477585T1 (de)
DE (1) DE602008002138D1 (de)
TW (1) TWI470919B (de)
WO (1) WO2009112668A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10338131B2 (en) * 2015-11-24 2019-07-02 Texas Instruments Incorporated System and method for high voltage stress testing plurality of parallel units
EP3196918B1 (de) 2016-01-19 2019-02-27 Laser Systems and Solutions of Europe Gepulste röntgenquelle umfassend eine niederdruckionenplasmaentladungsquelle mit drähten
CN108173450B (zh) * 2018-02-06 2024-03-12 中国工程物理研究院流体物理研究所 一种集高压短脉冲预电离一体化高功率双极性脉冲形成电路

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2204882B1 (de) 1972-10-30 1976-10-29 Onera (Off Nat Aerospatiale)
US3970892A (en) 1975-05-19 1976-07-20 Hughes Aircraft Company Ion plasma electron gun
FR2591035B1 (fr) 1985-11-29 1988-02-26 Onera (Off Nat Aerospatiale) Canon a electrons operant par emission secondaire sous bombardement ionique
US4786844A (en) * 1987-03-30 1988-11-22 Rpc Industries Wire ion plasma gun
DE58901620D1 (de) * 1988-04-08 1992-07-16 Siemens Ag Plasma-roentgenroehre, insbesondere zur roentgen-vorionisierung von gaslasern, verfahren zur erzeugung von roentgenstrahlung mit einer solchen roentgenroehre und verwendung letzterer.
US5055748A (en) * 1990-05-30 1991-10-08 Integrated Applied Physics Inc. Trigger for pseudospark thyratron switch
US5057740A (en) * 1990-05-31 1991-10-15 Integrated Applied Physics, Inc. Photoemissive trigger for backlighted thyratron switches
JPH05211052A (ja) * 1992-01-30 1993-08-20 Toshiba Corp パルス電子銃
JPH08236053A (ja) * 1995-02-28 1996-09-13 Toshiba Corp 電子銃
DE19621874C2 (de) * 1996-05-31 2000-10-12 Karlsruhe Forschzent Quelle zur Erzeugung von großflächigen, gepulsten Ionen- und Elektronenstrahlen
JP3135864B2 (ja) * 1997-05-27 2001-02-19 住友重機械工業株式会社 イオン・プラズマ型電子銃とその制御方法
US5910886A (en) * 1997-11-07 1999-06-08 Sierra Applied Sciences, Inc. Phase-shift power supply
US6182604B1 (en) * 1999-10-27 2001-02-06 Varian Semiconductor Equipment Associates, Inc. Hollow cathode for plasma doping system
US7663319B2 (en) * 2004-02-22 2010-02-16 Zond, Inc. Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities
US20060121704A1 (en) * 2004-12-07 2006-06-08 Varian Semiconductor Equipment Associates, Inc. Plasma ion implantation system with axial electrostatic confinement

Also Published As

Publication number Publication date
KR20100134558A (ko) 2010-12-23
EP2079092A1 (de) 2009-07-15
CN101952927A (zh) 2011-01-19
JP5340309B2 (ja) 2013-11-13
US20110057565A1 (en) 2011-03-10
US8664863B2 (en) 2014-03-04
CN101952927B (zh) 2012-10-17
DE602008002138D1 (de) 2010-09-23
EP2079092B1 (de) 2010-08-11
WO2009112668A1 (fr) 2009-09-17
TWI470919B (zh) 2015-01-21
JP2011509512A (ja) 2011-03-24
TW200939611A (en) 2009-09-16

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Legal Events

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