ATE481714T1 - Segmentierte bit-abtastung zur programmierungsprüfung - Google Patents

Segmentierte bit-abtastung zur programmierungsprüfung

Info

Publication number
ATE481714T1
ATE481714T1 AT07864477T AT07864477T ATE481714T1 AT E481714 T1 ATE481714 T1 AT E481714T1 AT 07864477 T AT07864477 T AT 07864477T AT 07864477 T AT07864477 T AT 07864477T AT E481714 T1 ATE481714 T1 AT E481714T1
Authority
AT
Austria
Prior art keywords
programming
volatile storage
storage elements
bit sampling
segmented bit
Prior art date
Application number
AT07864477T
Other languages
English (en)
Inventor
Yan Li
Teruhiko Kamei
Jeffrey W Lutze
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/563,590 external-priority patent/US7440319B2/en
Priority claimed from US11/563,585 external-priority patent/US7545681B2/en
Application filed by Sandisk Corp filed Critical Sandisk Corp
Application granted granted Critical
Publication of ATE481714T1 publication Critical patent/ATE481714T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628—Programming or writing circuits; Data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/562—Multilevel memory programming aspects
    • G11C2211/5621—Multilevel programming verification

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Image Processing (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
AT07864477T 2006-11-27 2007-11-15 Segmentierte bit-abtastung zur programmierungsprüfung ATE481714T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/563,590 US7440319B2 (en) 2006-11-27 2006-11-27 Apparatus with segmented bitscan for verification of programming
US11/563,585 US7545681B2 (en) 2006-11-27 2006-11-27 Segmented bitscan for verification of programming
PCT/US2007/084872 WO2008067185A1 (en) 2006-11-27 2007-11-15 Segmented bitscan for verification of programming

Publications (1)

Publication Number Publication Date
ATE481714T1 true ATE481714T1 (de) 2010-10-15

Family

ID=39167421

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07864477T ATE481714T1 (de) 2006-11-27 2007-11-15 Segmentierte bit-abtastung zur programmierungsprüfung

Country Status (8)

Country Link
EP (1) EP2074627B1 (de)
JP (1) JP5067645B2 (de)
KR (1) KR101100358B1 (de)
CN (1) CN101589437B (de)
AT (1) ATE481714T1 (de)
DE (1) DE602007009277D1 (de)
TW (1) TWI369686B (de)
WO (1) WO2008067185A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7545681B2 (en) 2006-11-27 2009-06-09 Sandisk Corporation Segmented bitscan for verification of programming
CO6170067A1 (es) * 2008-12-12 2010-06-18 Ecopetrol Sa Unidad de drenaje auto-sellante para separacion de fluidos inmiscibles de diferente densidad
US8400854B2 (en) * 2009-09-11 2013-03-19 Sandisk Technologies Inc. Identifying at-risk data in non-volatile storage
JP2011123964A (ja) * 2009-12-11 2011-06-23 Toshiba Corp 半導体記憶装置
US8174895B2 (en) * 2009-12-15 2012-05-08 Sandisk Technologies Inc. Programming non-volatile storage with fast bit detection and verify skip
EP2513795B1 (de) 2009-12-16 2014-03-12 SanDisk IL Ltd Hilfsparitätsbits für in mehrstufige zellen geschriebene daten
US8427875B2 (en) * 2010-12-07 2013-04-23 Silicon Motion Inc. Method and memory controller for reading data stored in flash memory by referring to binary digit distribution characteristics of bit sequences read from flash memory
CN103258570B (zh) * 2012-02-15 2016-05-11 旺宏电子股份有限公司 一种记忆装置及产生程序化偏压脉冲的方法和集成电路
JP6088675B1 (ja) 2016-02-02 2017-03-01 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置
KR102781462B1 (ko) * 2019-01-23 2025-03-17 에스케이하이닉스 주식회사 반도체 메모리 장치, 컨트롤러 및 이들의 동작 방법
US10714198B1 (en) 2019-06-04 2020-07-14 Sandisk Technologies Llc Dynamic 1-tier scan for high performance 3D NAND
US12499953B2 (en) 2023-11-02 2025-12-16 Nxp B.V. Wipe-out and verification of a non-volatile memory

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2787601A1 (fr) * 1998-12-22 2000-06-23 Gemplus Card Int Systeme de memorisation comprenant des moyens de gestion d'une memoire avec anti-usure et procede de gestion anti-usure d'une memoire
US6426893B1 (en) * 2000-02-17 2002-07-30 Sandisk Corporation Flash eeprom system with simultaneous multiple data sector programming and storage of physical block characteristics in other designated blocks
JP4250325B2 (ja) * 2000-11-01 2009-04-08 株式会社東芝 半導体記憶装置
CN1466150A (zh) * 2002-06-05 2004-01-07 力旺电子股份有限公司 快闪存储器的分页缓冲器
JP4135680B2 (ja) * 2004-05-31 2008-08-20 ソニー株式会社 半導体記憶装置および信号処理システム
JP2005353242A (ja) * 2004-06-14 2005-12-22 Toshiba Corp 不揮発性半導体記憶装置及びそのデータ書き込み方法
US7437653B2 (en) * 2004-12-22 2008-10-14 Sandisk Corporation Erased sector detection mechanisms
JP4874721B2 (ja) * 2006-06-23 2012-02-15 株式会社東芝 半導体記憶装置
US7355892B2 (en) * 2006-06-30 2008-04-08 Sandisk Corporation Partial page fail bit detection in flash memory devices

Also Published As

Publication number Publication date
WO2008067185A1 (en) 2008-06-05
DE602007009277D1 (de) 2010-10-28
EP2074627A1 (de) 2009-07-01
JP5067645B2 (ja) 2012-11-07
KR20090098844A (ko) 2009-09-17
TWI369686B (en) 2012-08-01
CN101589437A (zh) 2009-11-25
EP2074627B1 (de) 2010-09-15
CN101589437B (zh) 2012-08-29
JP2010511263A (ja) 2010-04-08
TW200839771A (en) 2008-10-01
KR101100358B1 (ko) 2011-12-30

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