ATE492801T1 - Vorrichtung und verfahren zur röntgenstrahlfluoreszenz-analyse einer mineralprobe - Google Patents

Vorrichtung und verfahren zur röntgenstrahlfluoreszenz-analyse einer mineralprobe

Info

Publication number
ATE492801T1
ATE492801T1 AT08151006T AT08151006T ATE492801T1 AT E492801 T1 ATE492801 T1 AT E492801T1 AT 08151006 T AT08151006 T AT 08151006T AT 08151006 T AT08151006 T AT 08151006T AT E492801 T1 ATE492801 T1 AT E492801T1
Authority
AT
Austria
Prior art keywords
sample
mineral sample
analysis
mineral
irradiation
Prior art date
Application number
AT08151006T
Other languages
English (en)
Original Assignee
Orexplore Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orexplore Ab filed Critical Orexplore Ab
Application granted granted Critical
Publication of ATE492801T1 publication Critical patent/ATE492801T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT08151006T 2008-02-04 2008-02-04 Vorrichtung und verfahren zur röntgenstrahlfluoreszenz-analyse einer mineralprobe ATE492801T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP08151006A EP2085772B8 (de) 2008-02-04 2008-02-04 Vorrichtung und Verfahren zur Röntgenstrahlfluoreszenz-Analyse einer Mineralprobe

Publications (1)

Publication Number Publication Date
ATE492801T1 true ATE492801T1 (de) 2011-01-15

Family

ID=39523322

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08151006T ATE492801T1 (de) 2008-02-04 2008-02-04 Vorrichtung und verfahren zur röntgenstrahlfluoreszenz-analyse einer mineralprobe

Country Status (10)

Country Link
US (1) US8515008B2 (de)
EP (1) EP2085772B8 (de)
AT (1) ATE492801T1 (de)
AU (1) AU2009211833B2 (de)
CA (1) CA2713383C (de)
DE (1) DE602008004079D1 (de)
ES (1) ES2359472T3 (de)
RU (1) RU2499252C2 (de)
WO (1) WO2009098009A1 (de)
ZA (1) ZA201004649B (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9373478B2 (en) * 2010-12-10 2016-06-21 Canon Kabushiki Kaisha Radiation generating apparatus and radiation imaging apparatus
WO2012177472A2 (en) * 2011-06-20 2012-12-27 X-Ray Optical Systems, Inc. Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof
AU2012277493B2 (en) 2011-06-29 2017-04-27 Minesense Technologies Ltd. Extracting mined ore, minerals or other materials using sensor-based sorting
US11219927B2 (en) 2011-06-29 2022-01-11 Minesense Technologies Ltd. Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods
US9316537B2 (en) 2011-06-29 2016-04-19 Minesense Technologies Ltd. Sorting materials using a pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods
EP2844403B1 (de) 2012-05-01 2018-06-20 Minesense Technologies Ltd. Maschine zur kaskadenförmigen sortierung von mineralien
EP2677303B1 (de) * 2012-06-19 2016-01-20 Mantex AB Verfahren und Vorrichtung zum Messen der Konzentration eines spezifischen Analyten in einem biologischen Material
US8937282B2 (en) * 2012-10-26 2015-01-20 Fei Company Mineral identification using mineral definitions including variability
US9091635B2 (en) 2012-10-26 2015-07-28 Fei Company Mineral identification using mineral definitions having compositional ranges
US9048067B2 (en) 2012-10-26 2015-06-02 Fei Company Mineral identification using sequential decomposition into elements from mineral definitions
PL3055685T3 (pl) * 2013-10-11 2018-03-30 Mantex Ab Sposób i urządzenie do szacowania wartości ciepła z zastosowaniem pomiarów przenikania dwuenergetycznego promieniowania rentgenowskiego i pomiarów fluorescencji rentgenowskiej
US9714908B2 (en) 2013-11-06 2017-07-25 Fei Company Sub-pixel analysis and display of fine grained mineral samples
CN103604823A (zh) * 2013-11-13 2014-02-26 宣化钢铁集团有限责任公司 铁矿石中钾钠铅锌含量的测定方法
US9522415B2 (en) 2014-07-21 2016-12-20 Minesense Technologies Ltd. Mining shovel with compositional sensors
CN110090812B (zh) 2014-07-21 2021-07-09 感矿科技有限公司 来自废物矿物的粗矿石矿物的高容量分离
CN107402196B (zh) * 2016-05-18 2020-09-25 株式会社岛津制作所 X射线荧光分析仪器及用于其的样品容器
EP3509907B1 (de) 2016-09-09 2022-06-15 Bly IP Inc. Systeme und verfahren zur analyse eines kerns mittels röntgenfluoreszenz
CN106442591A (zh) * 2016-09-14 2017-02-22 钢研纳克检测技术有限公司 用于wedxrf光谱仪的部件控制及信号探测系统
SE540371C2 (en) * 2017-02-06 2018-08-21 Orexplore Ab A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder
CN111855719B (zh) * 2020-07-29 2023-03-24 河北南玻玻璃有限公司 一种用于x射线荧光光谱法分析石英砂岩化学成分的制样方法
CN112697822B (zh) * 2020-12-04 2021-08-17 武汉微束检测科技有限公司 一种矿物成分检测装置
CN113049620A (zh) * 2021-03-03 2021-06-29 中国原子能科学研究院 一种分析设备以及方法
AU2022390822A1 (en) 2021-11-22 2024-07-04 Minesense Technologies Ltd. Compositional multispectral and hyperspectral imaging systems for mining shovels and associated methods
CN115078423B (zh) * 2022-06-24 2026-03-17 中国航发北京航空材料研究院 合金粉末内孔缺陷样品，其表征方法、装置、介质及设备

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US3394263A (en) * 1964-12-28 1968-07-23 Owens Illinois Inc Method and apparatus for inspecting transparent articles for defects by fluorescent radiation
US3927318A (en) 1974-05-06 1975-12-16 Albert Macovski Cross-sectional fluorescent imaging system
EP0014580B1 (de) 1979-02-09 1983-03-02 Martin Marietta Corporation Element-Analyse-Einheit
JPS646850A (en) 1987-06-30 1989-01-11 Nippon Atomic Ind Group Co Method and instrument for measuring element concentration distribution
SU1672325A1 (ru) 1988-05-30 1991-08-23 Алма-Атинский научно-исследовательский и проектный институт строительных материалов Образец дл проведени рентгенофлуоресцентного анализа горных пород
US6668039B2 (en) * 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis
JP2004321046A (ja) * 2003-04-23 2004-11-18 Shimano Inc スピニングリールの釣り糸案内機構
US7366282B2 (en) * 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
CA2589047C (en) * 2003-11-24 2014-02-11 Passport Systems, Inc. Adaptive scanning of materials using nuclear resonance fluorescence imaging
US7215733B2 (en) * 2004-07-23 2007-05-08 Kabushiki Kaisha Toshiba X-ray computed tomography apparatus
JP4874118B2 (ja) * 2004-11-08 2012-02-15 エスアイアイ・ナノテクノロジー株式会社 蛍光ｘ線分析装置
JP4854005B2 (ja) * 2006-02-24 2012-01-11 エスアイアイ・ナノテクノロジー株式会社 蛍光ｘ線分析装置
JP4849957B2 (ja) * 2006-05-26 2012-01-11 エスアイアイ・ナノテクノロジー株式会社 蛍光ｘ線分析装置

Also Published As

Publication number Publication date
AU2009211833B2 (en) 2013-03-28
US20110044426A1 (en) 2011-02-24
DE602008004079D1 (de) 2011-02-03
RU2010136936A (ru) 2012-03-20
EP2085772A1 (de) 2009-08-05
CA2713383A1 (en) 2009-08-13
ZA201004649B (en) 2011-09-28
US8515008B2 (en) 2013-08-20
RU2499252C2 (ru) 2013-11-20
CA2713383C (en) 2016-04-05
EP2085772B8 (de) 2011-01-26
ES2359472T3 (es) 2011-05-23
AU2009211833A1 (en) 2009-08-13
EP2085772B1 (de) 2010-12-22
WO2009098009A1 (en) 2009-08-13

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