ATE494629T1 - Halbleitergehäuse und dessen herstellungsverfahren - Google Patents
Halbleitergehäuse und dessen herstellungsverfahrenInfo
- Publication number
- ATE494629T1 ATE494629T1 AT02717346T AT02717346T ATE494629T1 AT E494629 T1 ATE494629 T1 AT E494629T1 AT 02717346 T AT02717346 T AT 02717346T AT 02717346 T AT02717346 T AT 02717346T AT E494629 T1 ATE494629 T1 AT E494629T1
- Authority
- AT
- Austria
- Prior art keywords
- manufacturing process
- semiconductor housing
- silicone layer
- wafer
- integrated circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0012—Processes making use of the tackiness of the photolithographic materials, e.g. for mounting; Packaging for photolithographic material; Packages obtained by processing photolithographic materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/137—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being directly on the semiconductor body
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Paints Or Removers (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/789,083 US6617674B2 (en) | 2001-02-20 | 2001-02-20 | Semiconductor package and method of preparing same |
| PCT/US2002/001263 WO2002067292A2 (en) | 2001-02-20 | 2002-01-17 | Semiconductor package and method of preparing same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE494629T1 true ATE494629T1 (de) | 2011-01-15 |
Family
ID=25146536
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02717346T ATE494629T1 (de) | 2001-02-20 | 2002-01-17 | Halbleitergehäuse und dessen herstellungsverfahren |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US6617674B2 (de) |
| EP (1) | EP1362364B1 (de) |
| JP (1) | JP4226905B2 (de) |
| KR (1) | KR100813821B1 (de) |
| CN (3) | CN101581880B (de) |
| AT (1) | ATE494629T1 (de) |
| AU (1) | AU2002248357A1 (de) |
| CA (1) | CA2438126A1 (de) |
| DE (1) | DE60238823D1 (de) |
| TW (1) | TW563210B (de) |
| WO (2) | WO2002067292A2 (de) |
Families Citing this family (53)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6617674B2 (en) * | 2001-02-20 | 2003-09-09 | Dow Corning Corporation | Semiconductor package and method of preparing same |
| DE10144467B4 (de) * | 2001-09-10 | 2006-07-27 | Infineon Technologies Ag | Elektronisches Sensorbauteil und Verfahren zu seiner Herstellung |
| US6836023B2 (en) * | 2002-04-17 | 2004-12-28 | Fairchild Semiconductor Corporation | Structure of integrated trace of chip package |
| US6905904B2 (en) | 2002-06-24 | 2005-06-14 | Dow Corning Corporation | Planar optical waveguide assembly and method of preparing same |
| US6907176B2 (en) * | 2002-06-24 | 2005-06-14 | Dow Corning Corporation | Planar optical waveguide assembly and method of preparing same |
| JP3910907B2 (ja) * | 2002-10-29 | 2007-04-25 | 新光電気工業株式会社 | キャパシタ素子及びこの製造方法、半導体装置用基板、並びに半導体装置 |
| JP3910908B2 (ja) * | 2002-10-29 | 2007-04-25 | 新光電気工業株式会社 | 半導体装置用基板及びこの製造方法、並びに半導体装置 |
| US7145229B2 (en) * | 2002-11-14 | 2006-12-05 | The Regents Of The University Of California | Silicone metalization |
| US20040102022A1 (en) * | 2002-11-22 | 2004-05-27 | Tongbi Jiang | Methods of fabricating integrated circuitry |
| ATE539380T1 (de) * | 2003-06-23 | 2012-01-15 | Dow Corning | Verklebungsverfahren mit grauskala photolithographie |
| JP4308821B2 (ja) * | 2003-07-28 | 2009-08-05 | ダウ・コーニング・コーポレイション | パターン形成されたシリコーン層をエッチングする方法 |
| EP1687130B1 (de) * | 2003-11-17 | 2007-11-28 | Dow Corning Corporation | Verfahren zum prägen von ausgehärteten silikonharzsubstraten |
| DE102004005562A1 (de) * | 2004-02-03 | 2005-08-25 | Kettenbach Gmbh & Co. Kg | Über Hydrosilylierungs-Reaktion additionsvernetzende Zweikomponenten-Dentalmaterial mit starren und/oder voluminösen Gruppen sowie mit hoher Biegefestigkeit und E-Modul |
| US7208344B2 (en) * | 2004-03-31 | 2007-04-24 | Aptos Corporation | Wafer level mounting frame for ball grid array packaging, and method of making and using the same |
| DE102004036573A1 (de) * | 2004-07-28 | 2006-03-23 | Ge Bayer Silicones Gmbh & Co. Kg | Verwendung lichtaktivierbarer, härtbarer Silikonzusammensetzungen zur Herstellung von dickwandigen Formartikeln oder dickwandigen Beschichtungen |
| EP1820065A2 (de) | 2004-08-11 | 2007-08-22 | Dow Corning Corporation | Halbdurchlässige membranen bildende photopolymerisierbare silikonmaterialien für sensoranwendungen |
| KR101216576B1 (ko) * | 2004-11-19 | 2012-12-31 | 다우 코닝 코포레이션 | 오가노하이드로겐폴리실록산 수지 및 실리콘 조성물 |
| EP1858981B1 (de) * | 2005-02-16 | 2012-03-28 | Dow Corning Corporation | Verstärkte silikonharzfolie und herstellungsverfahren dafür |
| US8092910B2 (en) * | 2005-02-16 | 2012-01-10 | Dow Corning Toray Co., Ltd. | Reinforced silicone resin film and method of preparing same |
| KR101278460B1 (ko) | 2005-03-01 | 2013-07-02 | 다우 코닝 코포레이션 | 반도체 가공을 위한 임시 웨이퍼 접착방법 |
| JP2006303452A (ja) * | 2005-03-25 | 2006-11-02 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
| JP4055015B2 (ja) * | 2005-04-04 | 2008-03-05 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| US8691389B2 (en) * | 2005-06-02 | 2014-04-08 | Dow Corning Corporation | Method of nanopatterning, a cured resist film use therein, and an article including the resist film |
| WO2007092032A2 (en) * | 2005-06-14 | 2007-08-16 | Dow Corning Corporation | Reinforced silicone resin film and method of preparing same |
| CN101238181B (zh) | 2005-08-04 | 2011-10-05 | 陶氏康宁公司 | 增强的有机硅树脂膜及其制备方法 |
| KR100647483B1 (ko) * | 2005-08-19 | 2006-11-23 | 삼성전자주식회사 | 반도체 패키지의 배선 구조물 및 이의 제조 방법, 이를이용한 웨이퍼 레벨 패키지 및 이의 제조 방법 |
| WO2008045104A2 (en) | 2005-12-21 | 2008-04-17 | Dow Corning Corporation | Silicone resin film, method of preparing same, and nanomaterial-filled silicone composition |
| WO2008051242A2 (en) | 2006-01-19 | 2008-05-02 | Dow Corning Corporation | Silicone resin film, method of preparing same, and nanomaterial-filled silicone compositon |
| CN101379153B (zh) * | 2006-02-02 | 2011-12-28 | 陶氏康宁公司 | 有机硅树脂膜,其制备方法和纳米材料填充的有机硅组合物 |
| US7449785B2 (en) * | 2006-02-06 | 2008-11-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Solder bump on a semiconductor substrate |
| US8084097B2 (en) * | 2006-02-20 | 2011-12-27 | Dow Corning Corporation | Silicone resin film, method of preparing same, and nanomaterial-filled silicone composition |
| JP2007258317A (ja) * | 2006-03-22 | 2007-10-04 | Shin Etsu Chem Co Ltd | 半導体装置の製造方法 |
| JP2007266191A (ja) * | 2006-03-28 | 2007-10-11 | Nec Electronics Corp | ウェハ処理方法 |
| EP2005248A2 (de) * | 2006-04-11 | 2008-12-24 | Dow Corning Corporation | Silikonverbundformen mit geringer thermischer verformung |
| JP2009540562A (ja) * | 2006-06-05 | 2009-11-19 | ダウ・コーニング・コーポレイション | 電子パッケージ及びその製造方法 |
| WO2008021125A2 (en) * | 2006-08-14 | 2008-02-21 | Dow Corning Corporation | Method of preparing a patterned film with a developing solvent |
| US7538021B2 (en) * | 2006-09-20 | 2009-05-26 | Intel Corporation | Removing dry film resist residues using hydrolyzable membranes |
| SG175559A1 (en) * | 2006-09-25 | 2011-11-28 | Advanced Tech Materials | Compositions and methods for the removal of photoresist for a wafer rework application |
| EP2117835A1 (de) | 2007-02-22 | 2009-11-18 | Dow Corning Corporation | Verstärkte silikonharzfolien |
| EP2117836B1 (de) | 2007-02-22 | 2012-11-07 | Dow Corning Corporation | Verstärkte silikonharzfolien |
| US7834449B2 (en) * | 2007-04-30 | 2010-11-16 | Broadcom Corporation | Highly reliable low cost structure for wafer-level ball grid array packaging |
| EP2142588A1 (de) * | 2007-05-01 | 2010-01-13 | Dow Corning Corporation | Nanomaterialgefüllte silikonzusammensetzung und verstärkte silikonharzfolie |
| US7872347B2 (en) * | 2007-08-09 | 2011-01-18 | Broadcom Corporation | Larger than die size wafer-level redistribution packaging process |
| US8017246B2 (en) * | 2007-11-08 | 2011-09-13 | Philips Lumileds Lighting Company, Llc | Silicone resin for protecting a light transmitting surface of an optoelectronic device |
| US20100264522A1 (en) * | 2009-04-20 | 2010-10-21 | Chien-Pin Chen | Semiconductor device having at least one bump without overlapping specific pad or directly contacting specific pad |
| US8643164B2 (en) * | 2009-06-11 | 2014-02-04 | Broadcom Corporation | Package-on-package technology for fan-out wafer-level packaging |
| KR20120132624A (ko) | 2010-02-12 | 2012-12-06 | 다우 코닝 코포레이션 | 반도체 가공을 위한 임시 웨이퍼 접합 방법 |
| DE102010043149A1 (de) * | 2010-10-29 | 2012-05-03 | Wacker Chemie Ag | Hochtransparente durch Licht vernetzbare Siliconmischungen |
| EP2695745B1 (de) | 2012-08-06 | 2015-08-26 | Unilin BVBA | Verfahren zur Herstellung von Tafeln mit einer dekorativen Oberfläche |
| ES2762235T3 (es) | 2014-02-06 | 2020-05-22 | Unilin Bvba | Procedimiento de fabricación de paneles de piso que tienen una superficie decorativa |
| TW201601358A (zh) * | 2014-06-19 | 2016-01-01 | 道康寧公司 | 用於晶圓級z軸熱中介層的可光圖案化聚矽氧 |
| CN107438646A (zh) * | 2015-02-03 | 2017-12-05 | 美国道康宁公司 | 可固化硅氧烷制剂和相关的固化产物、方法、制品和器件 |
| TWI678551B (zh) | 2015-07-28 | 2019-12-01 | 美商道康寧公司 | 智慧型光學材料、配方、方法、用途、物品、及裝置 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1369989A (en) | 1970-11-27 | 1974-10-09 | Dow Corning Ltd | Organopolysiloxane elastomers |
| US3723497A (en) | 1971-11-19 | 1973-03-27 | Dow Corning | Silicone compositions catalyzed with platinum ii diacetylacetonate |
| US4064027A (en) | 1973-09-28 | 1977-12-20 | Dow Corning Corporation | UV curable composition |
| DE2736499C2 (de) | 1977-08-12 | 1990-03-29 | Wacker-Chemie GmbH, 8000 München | Verfahren zum Herstellen von klebrige Stoffe abweisenden Überzügen |
| JPS5987840A (ja) | 1982-11-10 | 1984-05-21 | Toray Silicone Co Ltd | 半導体装置 |
| FR2597110A1 (fr) * | 1986-04-14 | 1987-10-16 | Rhone Poulenc Multi Tech | Composition organopolysiloxane, potentiellement reticulable et utilisable notamment en microlithographie, et son procede d'application |
| US5045918A (en) | 1986-12-19 | 1991-09-03 | North American Philips Corp. | Semiconductor device with reduced packaging stress |
| US5171716A (en) | 1986-12-19 | 1992-12-15 | North American Philips Corp. | Method of manufacturing semiconductor device with reduced packaging stress |
| US5145886A (en) | 1988-05-19 | 1992-09-08 | Minnesota Mining And Manufacturing Company | Radiation activated hydrosilation reaction |
| US5091103A (en) * | 1990-05-01 | 1992-02-25 | Alicia Dean | Photoresist stripper |
| DE69131658T2 (de) | 1990-06-25 | 2000-04-27 | Matsushita Electronics Corp., Kadoma | Licht- oder strahlungsempfindliche Zusammensetzung |
| US5679977A (en) * | 1990-09-24 | 1997-10-21 | Tessera, Inc. | Semiconductor chip assemblies, methods of making same and components for same |
| US5678301A (en) * | 1991-06-04 | 1997-10-21 | Micron Technology, Inc. | Method for forming an interconnect for testing unpackaged semiconductor dice |
| US5290397A (en) * | 1992-08-21 | 1994-03-01 | Cornell Research Foundation, Inc. | Bilayer resist and process for preparing same |
| US5854302A (en) * | 1993-04-29 | 1998-12-29 | The Dow Chemical Company | Partially polymerized divinylsiloxane linked bisbenzocyclobutene resins and methods for making said resins |
| US5834339A (en) * | 1996-03-07 | 1998-11-10 | Tessera, Inc. | Methods for providing void-free layers for semiconductor assemblies |
| US6284563B1 (en) | 1995-10-31 | 2001-09-04 | Tessera, Inc. | Method of making compliant microelectronic assemblies |
| US6211572B1 (en) * | 1995-10-31 | 2001-04-03 | Tessera, Inc. | Semiconductor chip package with fan-in leads |
| CN1178230A (zh) * | 1996-07-30 | 1998-04-08 | 日本化药株式会社 | 半导体封装用环氧树脂液体组合物 |
| JP3639088B2 (ja) * | 1997-06-06 | 2005-04-13 | 株式会社ルネサステクノロジ | 半導体装置及び配線テープ |
| CN1244038A (zh) * | 1998-08-04 | 2000-02-09 | 长兴化学工业股份有限公司 | 半导体封装用树脂组合物 |
| US6103552A (en) | 1998-08-10 | 2000-08-15 | Lin; Mou-Shiung | Wafer scale packaging scheme |
| JP4174174B2 (ja) * | 2000-09-19 | 2008-10-29 | 株式会社ルネサステクノロジ | 半導体装置およびその製造方法並びに半導体装置実装構造体 |
| US6617674B2 (en) * | 2001-02-20 | 2003-09-09 | Dow Corning Corporation | Semiconductor package and method of preparing same |
-
2001
- 2001-02-20 US US09/789,083 patent/US6617674B2/en not_active Expired - Lifetime
-
2002
- 2002-01-17 JP JP2002566524A patent/JP4226905B2/ja not_active Expired - Lifetime
- 2002-01-17 CA CA002438126A patent/CA2438126A1/en not_active Abandoned
- 2002-01-17 EP EP02717346A patent/EP1362364B1/de not_active Expired - Lifetime
- 2002-01-17 AT AT02717346T patent/ATE494629T1/de not_active IP Right Cessation
- 2002-01-17 CN CN2009101456222A patent/CN101581880B/zh not_active Expired - Lifetime
- 2002-01-17 AU AU2002248357A patent/AU2002248357A1/en not_active Abandoned
- 2002-01-17 KR KR1020037010941A patent/KR100813821B1/ko not_active Expired - Lifetime
- 2002-01-17 WO PCT/US2002/001263 patent/WO2002067292A2/en not_active Ceased
- 2002-01-17 CN CNA028052404A patent/CN1514954A/zh active Pending
- 2002-01-17 DE DE60238823T patent/DE60238823D1/de not_active Expired - Lifetime
- 2002-01-25 TW TW091101261A patent/TW563210B/zh not_active IP Right Cessation
-
2003
- 2003-07-28 CN CNA038269651A patent/CN1820230A/zh active Pending
- 2003-07-28 WO PCT/US2003/023601 patent/WO2005017627A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2002067292A2 (en) | 2002-08-29 |
| US20020158317A1 (en) | 2002-10-31 |
| WO2002067292A3 (en) | 2002-12-19 |
| US6617674B2 (en) | 2003-09-09 |
| JP4226905B2 (ja) | 2009-02-18 |
| KR20030080012A (ko) | 2003-10-10 |
| CN101581880B (zh) | 2011-12-14 |
| KR100813821B1 (ko) | 2008-03-17 |
| TW563210B (en) | 2003-11-21 |
| JP2004530288A (ja) | 2004-09-30 |
| DE60238823D1 (de) | 2011-02-17 |
| CA2438126A1 (en) | 2002-08-29 |
| CN101581880A (zh) | 2009-11-18 |
| AU2002248357A1 (en) | 2002-09-04 |
| EP1362364B1 (de) | 2011-01-05 |
| CN1514954A (zh) | 2004-07-21 |
| WO2005017627A1 (en) | 2005-02-24 |
| CN1820230A (zh) | 2006-08-16 |
| EP1362364A2 (de) | 2003-11-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |