ATE494662T1 - Sar-analog-digital-umsetzer mit grossem eingangsbereich - Google Patents

Sar-analog-digital-umsetzer mit grossem eingangsbereich

Info

Publication number
ATE494662T1
ATE494662T1 AT08775221T AT08775221T ATE494662T1 AT E494662 T1 ATE494662 T1 AT E494662T1 AT 08775221 T AT08775221 T AT 08775221T AT 08775221 T AT08775221 T AT 08775221T AT E494662 T1 ATE494662 T1 AT E494662T1
Authority
AT
Austria
Prior art keywords
capacitors
capacitor
floating
digital converter
input range
Prior art date
Application number
AT08775221T
Other languages
English (en)
Inventor
Frank Ohnhaeuser
Andreas Wickmann
Original Assignee
Texas Instruments Deutschland
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Deutschland filed Critical Texas Instruments Deutschland
Application granted granted Critical
Publication of ATE494662T1 publication Critical patent/ATE494662T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/129—Means for adapting the input signal to the range the converter can handle, e.g. limiting, pre-scaling ; Out-of-range indication
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
    • H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • High-Pressure Fuel Injection Pump Control (AREA)
AT08775221T 2007-07-19 2008-07-18 Sar-analog-digital-umsetzer mit grossem eingangsbereich ATE494662T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102007033689A DE102007033689B4 (de) 2007-07-19 2007-07-19 Analog-Digital-Wandler mit sukzessivem Approximationsregister und großem Eingangsbereich
US1674007P 2007-12-26 2007-12-26
US12/173,283 US7773024B2 (en) 2007-07-19 2008-07-15 SAR analog-to-digital converter with large input range
PCT/EP2008/059446 WO2009010581A1 (en) 2007-07-19 2008-07-18 Sar analog-to-digital converter with large input range

Publications (1)

Publication Number Publication Date
ATE494662T1 true ATE494662T1 (de) 2011-01-15

Family

ID=40091980

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08775221T ATE494662T1 (de) 2007-07-19 2008-07-18 Sar-analog-digital-umsetzer mit grossem eingangsbereich

Country Status (5)

Country Link
US (1) US7773024B2 (de)
EP (1) EP2171853B1 (de)
AT (1) ATE494662T1 (de)
DE (2) DE102007033689B4 (de)
WO (1) WO2009010581A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008035215B4 (de) 2008-07-29 2010-09-09 Texas Instruments Deutschland Gmbh Elektronisches Bauelement und Verfahren zur Analog-Digital-Wandlung unter Verwendung von sukzessiver Approximation
DE102009004564B4 (de) * 2009-01-14 2013-08-22 Texas Instruments Deutschland Gmbh ADC mit energiesparender Abtastung
US8378864B2 (en) * 2011-03-16 2013-02-19 Integrated Device Technology, Inc. Apparatuses and methods for reducing errors in analog to digital converters
US8395538B2 (en) 2011-06-20 2013-03-12 Texas Instruments Incorporated High speed resistor-DAC for SAR DAC
US20130002468A1 (en) * 2011-06-28 2013-01-03 International Business Machines Corporation Analog-digital converter
US8633847B2 (en) * 2011-06-28 2014-01-21 International Business Machines Corporation Analog-digital converter
US9154152B1 (en) * 2014-03-14 2015-10-06 Mediatek Inc. Calibration and noise reduction of analog to digital converters
JP6287433B2 (ja) * 2014-03-25 2018-03-07 セイコーエプソン株式会社 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法
CN106603077B (zh) * 2016-11-22 2019-11-05 电子科技大学 一种逐次逼近全差分模数转换器及其工作流程
WO2018176326A1 (zh) 2017-03-30 2018-10-04 深圳市汇顶科技股份有限公司 模数转换电路和方法
JP7288645B2 (ja) * 2018-04-16 2023-06-08 ザインエレクトロニクス株式会社 Ａｄ変換器
TWI650952B (zh) * 2018-08-28 2019-02-11 新唐科技股份有限公司 連續漸近式類比數位轉換器
TWI672006B (zh) * 2018-09-28 2019-09-11 新唐科技股份有限公司 連續漸近式類比數位轉換器及控制方法
US11031946B1 (en) * 2020-02-19 2021-06-08 Dialog Semiconductor Apparatus and method for low-latency low-power analog-to-digital conversion with high input signals

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6720903B2 (en) * 2002-06-14 2004-04-13 Stmicroelectronics S.R.L. Method of operating SAR-type ADC and an ADC using the method
US7167121B2 (en) * 2002-10-16 2007-01-23 Analog Devices, Inc. Method and apparatus for split reference sampling
US6940445B2 (en) * 2002-12-27 2005-09-06 Analog Devices, Inc. Programmable input range ADC
JP3902778B2 (ja) * 2004-01-07 2007-04-11 株式会社半導体理工学研究センター アナログディジタル変換回路
US7023372B1 (en) * 2005-02-09 2006-04-04 Analog Devices, Inc. Method and apparatus for segmented, switched analog/digital converter
US7271758B2 (en) * 2005-06-29 2007-09-18 Silicon Laboratories Inc. Gain adjust for SAR ADC
JP4751667B2 (ja) 2005-08-12 2011-08-17 富士通セミコンダクター株式会社 逐次比較型ａｄ変換器。
JP4652214B2 (ja) * 2005-11-18 2011-03-16 富士通セミコンダクター株式会社 アナログデジタル変換器
US7746262B2 (en) * 2005-12-19 2010-06-29 Silicon Laboratories Inc. Coding method for digital to analog converter of a SAR analog to digital converter

Also Published As

Publication number Publication date
DE102007033689A1 (de) 2009-01-22
DE102007033689B4 (de) 2009-03-19
WO2009010581A1 (en) 2009-01-22
US20090027251A1 (en) 2009-01-29
DE602008004353D1 (de) 2011-02-17
EP2171853B1 (de) 2011-01-05
US7773024B2 (en) 2010-08-10
EP2171853A1 (de) 2010-04-07

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